NO20051850D0 - Infrarod deteksjon av gass - diffraktiv. - Google Patents
Infrarod deteksjon av gass - diffraktiv.Info
- Publication number
- NO20051850D0 NO20051850D0 NO20051850A NO20051850A NO20051850D0 NO 20051850 D0 NO20051850 D0 NO 20051850D0 NO 20051850 A NO20051850 A NO 20051850A NO 20051850 A NO20051850 A NO 20051850A NO 20051850 D0 NO20051850 D0 NO 20051850D0
- Authority
- NO
- Norway
- Prior art keywords
- diffractive
- gas detection
- infrared gas
- infrared
- detection
- Prior art date
Links
- 238000001514 detection method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/28—Interference filters
- G02B5/284—Interference filters of etalon type comprising a resonant cavity other than a thin solid film, e.g. gas, air, solid plates
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Spectrometry And Color Measurement (AREA)
- Diffracting Gratings Or Hologram Optical Elements (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NO20051850A NO20051850A (no) | 2005-04-15 | 2005-04-15 | Infrarød deteksjon av gass - diffraktiv. |
JP2008506393A JP5512967B2 (ja) | 2005-04-15 | 2006-04-03 | 干渉フィルター |
US11/911,627 US7957004B2 (en) | 2005-04-15 | 2006-04-03 | Interference filter |
PCT/NO2006/000123 WO2006110041A1 (en) | 2005-04-15 | 2006-04-03 | Interference filter |
EP06733102.5A EP1875205B1 (en) | 2005-04-15 | 2006-04-03 | Interference filter |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NO20051850A NO20051850A (no) | 2005-04-15 | 2005-04-15 | Infrarød deteksjon av gass - diffraktiv. |
Publications (3)
Publication Number | Publication Date |
---|---|
NO20051850D0 true NO20051850D0 (no) | 2005-04-15 |
NO322368B1 NO322368B1 (no) | 2006-09-25 |
NO20051850A NO20051850A (no) | 2006-09-25 |
Family
ID=35267056
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NO20051850A NO20051850A (no) | 2005-04-15 | 2005-04-15 | Infrarød deteksjon av gass - diffraktiv. |
Country Status (5)
Country | Link |
---|---|
US (1) | US7957004B2 (no) |
EP (1) | EP1875205B1 (no) |
JP (1) | JP5512967B2 (no) |
NO (1) | NO20051850A (no) |
WO (1) | WO2006110041A1 (no) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NO20051851A (no) * | 2005-04-15 | 2006-10-02 | Sinvent As | Justerbart interferensfilter |
NL2002968A1 (nl) * | 2008-06-30 | 2009-12-31 | Asml Netherlands Bv | Optical element, lithographic apparatus including such an optical element, device manufacturing method, and device manufactured thereby. |
JP5136250B2 (ja) * | 2008-07-11 | 2013-02-06 | 三菱電機株式会社 | 光学フィルターの製造方法 |
US8896839B2 (en) * | 2008-07-30 | 2014-11-25 | Pason Systems Corp. | Multiplex tunable filter spectrometer |
CA2732978C (en) | 2008-07-30 | 2017-06-13 | Pason Systems Corp. | Methods and systems for chemical composition measurement and monitoring using a rotating filter spectrometer |
JP5810512B2 (ja) * | 2010-11-12 | 2015-11-11 | セイコーエプソン株式会社 | 光学装置 |
JP2012150353A (ja) * | 2011-01-20 | 2012-08-09 | Seiko Epson Corp | 波長可変干渉フィルター、光モジュール、および光分析装置 |
US9019501B2 (en) | 2012-04-26 | 2015-04-28 | Halliburton Energy Services, Inc. | Methods and devices for optically determining a characteristic of a substance |
US9013702B2 (en) | 2012-04-26 | 2015-04-21 | Halliburton Energy Services, Inc. | Imaging systems for optical computing devices |
US8941046B2 (en) | 2012-04-26 | 2015-01-27 | Halliburton Energy Services, Inc. | Methods and devices for optically determining a characteristic of a substance |
US9658149B2 (en) * | 2012-04-26 | 2017-05-23 | Halliburton Energy Services, Inc. | Devices having one or more integrated computational elements and methods for determining a characteristic of a sample by computationally combining signals produced therewith |
US9702811B2 (en) | 2012-04-26 | 2017-07-11 | Halliburton Energy Services, Inc. | Methods and devices for optically determining a characteristic of a substance using integrated computational elements |
US8912477B2 (en) | 2012-04-26 | 2014-12-16 | Halliburton Energy Services, Inc. | Methods and devices for optically determining a characteristic of a substance |
US8879053B2 (en) | 2012-04-26 | 2014-11-04 | Halliburton Energy Services, Inc. | Devices having an integrated computational element and a proximal interferent monitor and methods for determining a characteristic of a sample therewith |
JP5987573B2 (ja) * | 2012-09-12 | 2016-09-07 | セイコーエプソン株式会社 | 光学モジュール、電子機器、及び駆動方法 |
NO344002B1 (en) | 2015-09-29 | 2019-08-12 | Sintef Tto As | Optical gas detector |
NL2020622B1 (en) * | 2018-01-24 | 2019-07-30 | Lllumina Cambridge Ltd | Reduced dimensionality structured illumination microscopy with patterned arrays of nanowells |
FR3120452B1 (fr) * | 2021-03-02 | 2023-06-23 | Commissariat Energie Atomique | Emetteur optoélectronique à balayage angulaire rapide |
Family Cites Families (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3930718A (en) * | 1974-04-12 | 1976-01-06 | The United States Of America As Represented By The Secretary Of The Navy | Electro-optic modulator |
US3939348A (en) * | 1974-06-11 | 1976-02-17 | Allied Chemical Corporation | Infrared gas analysis |
US4309108A (en) * | 1977-01-17 | 1982-01-05 | The Perkin-Elmer Corporation | Analyzer for coherent radiation |
ATE29757T1 (de) | 1981-07-08 | 1987-10-15 | Erbsloeh Julius & August | Verfahren zur herstellung von verbundprofilen aus einem strangpressprofil und einem chemiewerkstoff-koerper. |
US4846930A (en) | 1985-10-16 | 1989-07-11 | British Telecommunications Public Limited Company | Mounting a component to a substrate |
US4822998A (en) * | 1986-05-15 | 1989-04-18 | Minolta Camera Kabushiki Kaisha | Spectral sensor with interference filter |
DE3925692C1 (no) * | 1989-08-03 | 1990-08-23 | Hartmann & Braun Ag, 6000 Frankfurt, De | |
US5151585A (en) * | 1991-08-12 | 1992-09-29 | Hughes Danbury Optical Systems, Inc. | Coherent radiation detector |
FI91564C (fi) | 1991-10-31 | 1994-07-11 | Valtion Teknillinen | Anturi |
US5289314A (en) * | 1992-03-25 | 1994-02-22 | Hughes Aircraft Company | Coatings for laser detector etalons |
FI96450C (fi) * | 1993-01-13 | 1996-06-25 | Vaisala Oy | Yksikanavainen kaasun pitoisuuden mittausmenetelmä ja -laitteisto |
DE4334578C2 (de) | 1993-10-11 | 1999-10-07 | Dirk Winfried Rossberg | Spektral abstimmbarer Infrarot-Sensor |
GB2286041B (en) | 1994-01-20 | 1998-04-08 | Marconi Gec Ltd | High resolution infrared spectroscope |
FI98325C (fi) | 1994-07-07 | 1997-05-26 | Vaisala Oy | Selektiivinen infrapunadetektori |
DE4431412C1 (de) * | 1994-08-24 | 1996-03-14 | William Newton | Vorrichtung zur Durchführung spektroskopischer Messungen |
US5550373A (en) | 1994-12-30 | 1996-08-27 | Honeywell Inc. | Fabry-Perot micro filter-detector |
US5920391A (en) * | 1995-10-27 | 1999-07-06 | Schlumberger Industries, S.A. | Tunable Fabry-Perot filter for determining gas concentration |
GB2314617B (en) * | 1996-06-24 | 2000-08-23 | Graviner Ltd Kidde | High sensitivity gas detection |
FI108581B (fi) | 1996-10-03 | 2002-02-15 | Valtion Teknillinen | Sähköisesti säädettävä optinen suodin |
US6500521B2 (en) * | 1999-05-14 | 2002-12-31 | Agere Systems Inc. | Stepped etalon |
US6853654B2 (en) * | 1999-07-27 | 2005-02-08 | Intel Corporation | Tunable external cavity laser |
US6246480B1 (en) * | 1999-09-01 | 2001-06-12 | Lucent Technologies Inc. | Stepped etalon |
JP4158076B2 (ja) | 2000-02-18 | 2008-10-01 | 横河電機株式会社 | 波長選択型赤外線検出素子及び赤外線ガス分析計 |
US6590710B2 (en) * | 2000-02-18 | 2003-07-08 | Yokogawa Electric Corporation | Fabry-Perot filter, wavelength-selective infrared detector and infrared gas analyzer using the filter and detector |
IL136849A (en) * | 2000-06-18 | 2004-09-27 | Beamus Ltd | Optical dynamic devices particularly for beam steering and optical communication |
FR2820513B1 (fr) * | 2001-02-05 | 2004-05-21 | Centre Nat Rech Scient | Dispositif optoelectronique a filtrage de longueur d'onde par couplage de cavites |
US6804429B2 (en) * | 2001-02-09 | 2004-10-12 | The Board Of Trustees Of The Leland Stanford Junior University | Reconfigurable wavelength multiplexers and filters employing micromirror array in a gires-tournois interferometer |
DE60103482T2 (de) * | 2001-08-17 | 2005-06-02 | Agilent Technologies, Inc. (n.d.Ges.d.Staates Delaware), Palo Alto | Lichtinterferenz |
US20040001258A1 (en) * | 2002-06-28 | 2004-01-01 | Mandeep Singh | Solid state etalons with low thermally-induced optical path length change |
JP2005031326A (ja) | 2003-07-11 | 2005-02-03 | Nippon Telegr & Teleph Corp <Ntt> | 光フィルター |
US7142573B2 (en) * | 2003-10-17 | 2006-11-28 | Coronado Technology Group, Llc | Etalon cavity with filler layer for thermal tuning |
US7426040B2 (en) * | 2004-08-19 | 2008-09-16 | University Of Pittsburgh | Chip-scale optical spectrum analyzers with enhanced resolution |
-
2005
- 2005-04-15 NO NO20051850A patent/NO20051850A/no not_active IP Right Cessation
-
2006
- 2006-04-03 WO PCT/NO2006/000123 patent/WO2006110041A1/en active Application Filing
- 2006-04-03 EP EP06733102.5A patent/EP1875205B1/en active Active
- 2006-04-03 JP JP2008506393A patent/JP5512967B2/ja not_active Expired - Fee Related
- 2006-04-03 US US11/911,627 patent/US7957004B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2008537801A (ja) | 2008-09-25 |
WO2006110041A1 (en) | 2006-10-19 |
EP1875205A1 (en) | 2008-01-09 |
JP5512967B2 (ja) | 2014-06-04 |
NO322368B1 (no) | 2006-09-25 |
US7957004B2 (en) | 2011-06-07 |
NO20051850A (no) | 2006-09-25 |
EP1875205B1 (en) | 2018-01-24 |
US20080273208A1 (en) | 2008-11-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
CHAD | Change of the owner's name or address (par. 44 patent law, par. patentforskriften) |
Owner name: SINTEF TTO, NO |
|
MM1K | Lapsed by not paying the annual fees |