KR980005778A - 백금막의 식가방법 및 이를 이용한 백금-폴리실리콘 게이트 형성방법 - Google Patents

백금막의 식가방법 및 이를 이용한 백금-폴리실리콘 게이트 형성방법 Download PDF

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KR980005778A
KR980005778A KR1019960021852A KR19960021852A KR980005778A KR 980005778 A KR980005778 A KR 980005778A KR 1019960021852 A KR1019960021852 A KR 1019960021852A KR 19960021852 A KR19960021852 A KR 19960021852A KR 980005778 A KR980005778 A KR 980005778A
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etching
platinum
platinum film
gas
film
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KR1019960021852A
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KR100224660B1 (ko
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신화숙
남병윤
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김광호
삼성전자 주식회사
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Priority to JP16518497A priority patent/JP3623075B2/ja
Publication of KR980005778A publication Critical patent/KR980005778A/ko
Priority to US09/325,171 priority patent/US6187686B1/en
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F1/00—Etching metallic material by chemical means
    • C23F1/02—Local etching
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F4/00—Processes for removing metallic material from surfaces, not provided for in group C23F1/00 or C23F3/00
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/033—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers
    • H01L21/0332—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers characterised by their composition, e.g. multilayer masks, materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/28008—Making conductor-insulator-semiconductor electrodes
    • H01L21/28017—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon
    • H01L21/28026—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon characterised by the conductor
    • H01L21/28035—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon characterised by the conductor the final conductor layer next to the insulator being silicon, e.g. polysilicon, with or without impurities
    • H01L21/28044—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon characterised by the conductor the final conductor layer next to the insulator being silicon, e.g. polysilicon, with or without impurities the conductor comprising at least another non-silicon conductive layer
    • H01L21/28061—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon characterised by the conductor the final conductor layer next to the insulator being silicon, e.g. polysilicon, with or without impurities the conductor comprising at least another non-silicon conductive layer the conductor comprising a metal or metal silicide formed by deposition, e.g. sputter deposition, i.e. without a silicidation reaction
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/28008—Making conductor-insulator-semiconductor electrodes
    • H01L21/28017—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon
    • H01L21/28026—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon characterised by the conductor
    • H01L21/28123—Lithography-related aspects, e.g. sub-lithography lengths; Isolation-related aspects, e.g. to solve problems arising at the crossing with the side of the device isolation; Planarisation aspects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
    • H01L21/321—After treatment
    • H01L21/3213—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer
    • H01L21/32139—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer using masks
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40—Electrodes ; Multistep manufacturing processes therefor
    • H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/49—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
    • H01L29/4916—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET the conductor material next to the insulator being a silicon layer, e.g. polysilicon doped with boron, phosphorus or nitrogen
    • H01L29/4925—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET the conductor material next to the insulator being a silicon layer, e.g. polysilicon doped with boron, phosphorus or nitrogen with a multiple layer structure, e.g. several silicon layers with different crystal structure or grain arrangement
    • H01L29/4941—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET the conductor material next to the insulator being a silicon layer, e.g. polysilicon doped with boron, phosphorus or nitrogen with a multiple layer structure, e.g. several silicon layers with different crystal structure or grain arrangement with a barrier layer between the silicon and the metal or metal silicide upper layer, e.g. Silicide/TiN/Polysilicon

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  • Crystallography & Structural Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
  • Drying Of Semiconductors (AREA)
  • ing And Chemical Polishing (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)

Abstract

배금막의 식각 방법 및 이를 이용한 백금-폴리실리콘 게이트 형성방법에 대해 기재되어 있다. 백금막의 식각방법은, 티타튬(Ti)또는 티타늄 나이트라이드 (TiN)를 마이크로 사용하여 백금막을 식각하는 것을 특징으로하고, 이를 이용한 백금-폴리실리콘 게이트 형성방법은 반도체기판 상에 형서된 게이트절연막 위에 불순물이 도우프되 폴리실리콘층을 형성하는 단계, 폴리실리콘층 위에 백금을 증착하는 단계, 백금막 위에 티타튬 또는 티타늄 나이트라이트를 증착하여 마스크층을 형성하는 단계, 마스크층을 싯각하는 단계, 마스트층을 식각 마스크로 사용하여 백금막을 삭각하는 단계, 및 폴리실리콘층을 식각하는 단계를 포함하는 것을 특징으로한다. 따라서, 단순한 공정으로 패텅의 측벽침해 및 잔류물의 문제를 해결할 수 있으며, 이를 이용하여 풀리사이드 게이트를 형성하면게이트를 보다 신뢰성 있게 형성할 수 있다.

Description

백금막의 식가방법 및 이를 이용한 백금-폴리실리콘 게이트 형성방법
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제2도 내지 제4도는 본 발명에 의한 백금막 식각방법을 적용한 일실예로서, 배금(Pt)폴리실리콘 게이트 형성방법을 설명하기 위한 단면도들이다.

Claims (7)

  1. 백금막의 식각할 때 티타튬(Ti)또는 티타늄 나이트라이드 (TiN) 중 적어도 어느 한 물질로 이루어진 마스크층을 사용하여 시각하는 것을 특징으로 백금막을 식각방법.
  2. 제1항에 있어서, 상기 백금막 식각시 염소가스/산소가스(Cl2/O2)의 혼합가스를 식각가스로 사용하는 것을 특징으로하는 백금막의 식각방법.
  3. 제2항에 있어서, 상기 백금막 식각시 산소가스(O2)를 전체 식각가스의 40% 이상 혼합하는 것을 특징으로하는 백금막의 식각방법.
  4. 반도체기판 상에 형성된 게이트절연막 위에 불순물이 도우푸된 폴리실리콘층을 형성하는 단계; 상기 폴리실리콘층 위에 백금을 증착하는 단계; 상기 백금막 위에 티나늄(Ti) 및/티나늄 나이트라이드(TiN)중 적어도 어느 한 물질을 증착하여 마스트층을 형성하는 단계; 상기마스크층을 식각하는 단계; 상기 마스크층을 상기마스크로 사용하여 백금막을 식각하는 단계;및 상기 폴리실리콘층을 식각하는 단계를 포함하는 것을 특징으로 하는 백금-폴리실리콘 게디트 형성방법.
  5. 제4항에 있어서, 상기 백금막을 식각하는 단계는, 염소가스/산소가스 (Cl2/O2)의 혼합가스를 식각 가스로 사용하는 것을 특징으로 하는 백금-폴리실리콘 게이트 형성방법.
  6. 제6항에 있어서, 상기 백금막을 식가하는 단계에서, 산소가스(O2)를 전체 식각가스의 40% 이상 혼합하는 것을 특징으로하는 백금-폴리실리콘 케이트 형성방법.
  7. 제4항에 있어서, 상기 백금막을 형성하기 전에, 상기 폴리실리콘층 위에 티나늄(Ti) 또는 티나늄 나이트라이드(TiN)로 이루어진 장벽층을 형성하는 단계를 추가하는 것을 특징으로 하는 백금-폴리실리콘 게이트 형성방법.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019960021852A 1996-06-17 1996-06-17 백금-폴리실리콘 게이트 형성방법 KR100224660B1 (ko)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR1019960021852A KR100224660B1 (ko) 1996-06-17 1996-06-17 백금-폴리실리콘 게이트 형성방법
JP16518497A JP3623075B2 (ja) 1996-06-17 1997-06-06 Ｐｔ膜の蝕刻方法及びこれを用いたＰｔ−ポリシリコンゲートの形成方法
US09/325,171 US6187686B1 (en) 1996-06-17 1999-06-03 Methods for forming patterned platinum layers using masking layers including titanium and related structures

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KR1019960021852A KR100224660B1 (ko) 1996-06-17 1996-06-17 백금-폴리실리콘 게이트 형성방법

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KR100407983B1 (ko) * 1997-12-29 2004-03-20 주식회사 하이닉스반도체 백금식각방법
KR100546275B1 (ko) * 1998-06-15 2006-04-21 삼성전자주식회사 반도체 장치의 백금막 식각방법

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KR100329773B1 (ko) * 1998-12-30 2002-05-09 박종섭 에프램 소자 제조 방법
KR100353807B1 (ko) * 1999-12-28 2002-09-26 주식회사 하이닉스반도체 고유전체 캐패시터의 하부전극 형성방법
KR100367406B1 (ko) * 2000-08-31 2003-01-10 주식회사 하이닉스반도체 고집적 반도체 소자의 게이트 형성방법
US6450654B1 (en) * 2000-11-01 2002-09-17 Jds Uniphase Corporation Polysilicon microelectric reflectors
JP2003224207A (ja) 2002-01-30 2003-08-08 Mitsubishi Electric Corp 半導体装置およびその製造方法
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US10090164B2 (en) 2017-01-12 2018-10-02 International Business Machines Corporation Hard masks for block patterning
US10297497B2 (en) 2017-01-19 2019-05-21 Texas Instruments Incorporated Sacrificial layer for platinum patterning

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US4035208A (en) * 1974-09-03 1977-07-12 Texas Instruments Incorporated Method of patterning Cr-Pt-Au metallization for silicon devices
US4335502A (en) * 1980-10-01 1982-06-22 Standard Microsystems Corporation Method for manufacturing metal-oxide silicon devices
JPH01232729A (ja) * 1988-03-14 1989-09-18 New Japan Radio Co Ltd ドライエッチングによる多層金属層のパターニング法
JPH0794600A (ja) * 1993-06-29 1995-04-07 Mitsubishi Electric Corp 半導体装置およびその製造方法
JP3122579B2 (ja) 1994-07-27 2001-01-09 シャープ株式会社 Ｐｔ膜のエッチング方法
US6093615A (en) 1994-08-15 2000-07-25 Micron Technology, Inc. Method of fabricating a contact structure having a composite barrier layer between a platinum layer and a polysilicon plug
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100407983B1 (ko) * 1997-12-29 2004-03-20 주식회사 하이닉스반도체 백금식각방법
KR100546275B1 (ko) * 1998-06-15 2006-04-21 삼성전자주식회사 반도체 장치의 백금막 식각방법

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KR100224660B1 (ko) 1999-10-15

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