KR970010006B1 - Semiconductor integrated circuit and method of testing the same - Google Patents
Semiconductor integrated circuit and method of testing the same Download PDFInfo
- Publication number
- KR970010006B1 KR970010006B1 KR94002431A KR19940002431A KR970010006B1 KR 970010006 B1 KR970010006 B1 KR 970010006B1 KR 94002431 A KR94002431 A KR 94002431A KR 19940002431 A KR19940002431 A KR 19940002431A KR 970010006 B1 KR970010006 B1 KR 970010006B1
- Authority
- KR
- South Korea
- Prior art keywords
- clock
- integrated circuit
- semiconductor integrated
- input
- test
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 4
- 238000010998 test method Methods 0.000 title abstract 2
- 238000012360 testing method Methods 0.000 abstract 6
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5026613A JPH06242188A (ja) | 1993-02-16 | 1993-02-16 | 半導体集積回路及びそのテスト方法 |
JP93-26613 | 1993-02-16 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR940020127A KR940020127A (ko) | 1994-09-15 |
KR970010006B1 true KR970010006B1 (en) | 1997-06-20 |
Family
ID=12198346
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR94002431A KR970010006B1 (en) | 1993-02-16 | 1994-02-08 | Semiconductor integrated circuit and method of testing the same |
Country Status (4)
Country | Link |
---|---|
US (1) | US5453993A (ko) |
JP (1) | JPH06242188A (ko) |
KR (1) | KR970010006B1 (ko) |
DE (1) | DE4404445C2 (ko) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3193810B2 (ja) * | 1993-08-31 | 2001-07-30 | 富士通株式会社 | 不揮発性半導体記憶装置及びその試験方法 |
US6055658A (en) * | 1995-10-02 | 2000-04-25 | International Business Machines Corporation | Apparatus and method for testing high speed components using low speed test apparatus |
US5793777A (en) * | 1996-04-19 | 1998-08-11 | International Business Machines Corporation | System and method for testing internal nodes of an integrated circuit at any predetermined machine cycle |
US5805611A (en) * | 1996-12-26 | 1998-09-08 | Stmicroelectronics, Inc. | Method and apparatus for testing high-frequency integrated circuits using a lower-frequency tester |
US5757705A (en) * | 1997-01-22 | 1998-05-26 | Micron Technology, Inc. | SDRAM clocking test mode |
KR100222970B1 (ko) * | 1997-01-29 | 1999-10-01 | 윤종용 | 전자장치의 테스트모드 수행방법 |
US5955890A (en) * | 1997-10-31 | 1999-09-21 | Credence Systems Corporation | Backmatch resistor structure for an integrated circuit tester |
EP0953892A1 (en) * | 1998-04-29 | 1999-11-03 | Lsi Logic Corporation | Method of providing clock signals to load circuits in an ASIC device |
US6489819B1 (en) | 1998-10-27 | 2002-12-03 | Mitsubishi Denki Kabushiki Kaisha | Clock synchronous semiconductor memory device allowing testing by low speed tester |
JP3395773B2 (ja) * | 2000-03-16 | 2003-04-14 | セイコーエプソン株式会社 | 半導体装置 |
US6400188B1 (en) * | 2000-06-30 | 2002-06-04 | Cypress Semiconductor Corp. | Test mode clock multiplication |
US6675312B1 (en) | 2000-06-30 | 2004-01-06 | Cypress Semiconductor Corp. | Majority vote circuit for test mode clock multiplication |
KR100422354B1 (ko) * | 2001-08-24 | 2004-03-11 | 주식회사 하이닉스반도체 | 반도체 장치의 테스트 회로 |
DE10200898B4 (de) * | 2002-01-11 | 2004-12-09 | Infineon Technologies Ag | Integrierte Schaltung und Verfahren zum Betrieb einer integrierten Schaltung |
US6917215B2 (en) | 2002-08-30 | 2005-07-12 | Matsushita Electric Industrial Co., Ltd. | Semiconductor integrated circuit and memory test method |
US7295028B2 (en) * | 2002-08-30 | 2007-11-13 | Matsushita Electric Industrial Co., Ltd. | Semiconductor integrated circuit and memory test method |
US7230981B2 (en) * | 2003-05-09 | 2007-06-12 | Stmicroelectronics, Inc. | Integrated data jitter generator for the testing of high-speed serial interfaces |
US20060068054A1 (en) * | 2004-09-30 | 2006-03-30 | Kevin Gearhardt | Technique for high-speed TDF testing on low cost testers using on-chip or off-chip circuitry for RapidChip and ASIC devices |
JP2006170894A (ja) | 2004-12-17 | 2006-06-29 | Nec Electronics Corp | 半導体装置およびクロック生成装置 |
US7305598B1 (en) * | 2005-03-25 | 2007-12-04 | Amit Sanghani | Test clock generation for higher-speed testing of a semiconductor device |
US20060248417A1 (en) * | 2005-04-28 | 2006-11-02 | International Business Machines Corporation | Clock control circuit for test that facilitates an at speed structural test |
US9395414B2 (en) | 2012-12-28 | 2016-07-19 | Nvidia Corporation | System for reducing peak power during scan shift at the local level for scan based tests |
US9222981B2 (en) | 2012-12-28 | 2015-12-29 | Nvidia Corporation | Global low power capture scheme for cores |
US9377510B2 (en) | 2012-12-28 | 2016-06-28 | Nvidia Corporation | System for reducing peak power during scan shift at the global level for scan based tests |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
UST924006I4 (en) * | 1973-10-03 | 1974-07-02 | Functional test method for asynchronous sequential circuits | |
US3931506A (en) * | 1974-12-30 | 1976-01-06 | Zehntel, Inc. | Programmable tester |
US4070565A (en) * | 1976-08-18 | 1978-01-24 | Zehntel, Inc. | Programmable tester method and apparatus |
US4122995A (en) * | 1977-08-02 | 1978-10-31 | Burroughs Corporation | Asynchronous digital circuit testing system |
DE2943552A1 (de) * | 1979-10-27 | 1981-05-21 | Deutsche Itt Industries Gmbh, 7800 Freiburg | Monolithisch integrierte schaltung |
DE3104121A1 (de) * | 1981-02-06 | 1982-09-02 | Robert Bosch Gmbh, 7000 Stuttgart | Verfahren und vorrichtung zur fruehen erkennung von halbleiterausfaellen |
JPS6279379A (ja) * | 1985-10-02 | 1987-04-11 | Ando Electric Co Ltd | タイミング信号発生装置 |
DE3638458A1 (de) * | 1986-11-11 | 1988-05-26 | Schlumberger Messgeraete Gmbh | Schaltungsanordnung zum bestimmen des frequenzverhaltens eines prueflings |
US4855681A (en) * | 1987-06-08 | 1989-08-08 | International Business Machines Corporation | Timing generator for generating a multiplicty of timing signals having selectable pulse positions |
GB2214314B (en) * | 1988-01-07 | 1992-01-02 | Genrad Ltd | Automatic circuit tester |
US5012180A (en) * | 1988-05-17 | 1991-04-30 | Zilog, Inc. | System for testing internal nodes |
US4929889A (en) * | 1988-06-13 | 1990-05-29 | Digital Equipment Corporation | Data path chip test architecture |
US5095483A (en) * | 1989-04-28 | 1992-03-10 | International Business Machines Corporation | Signature analysis in physical modeling |
JPH03170885A (ja) * | 1989-11-30 | 1991-07-24 | Ando Electric Co Ltd | Dc測定部と複数のdutとの順次接続回路 |
US5198759A (en) * | 1990-11-27 | 1993-03-30 | Alcatel N.V. | Test apparatus and method for testing digital system |
IT1244205B (it) * | 1990-12-19 | 1994-07-08 | Sgs Thomson Microelectronics | Circuito di generazione di un clock di scansione in un dispositivo di analisi operativa di tipo seriale per circuito integrato |
JPH0499851U (ko) * | 1991-02-07 | 1992-08-28 |
-
1993
- 1993-02-16 JP JP5026613A patent/JPH06242188A/ja active Pending
-
1994
- 1994-01-25 US US08/186,107 patent/US5453993A/en not_active Expired - Fee Related
- 1994-02-08 KR KR94002431A patent/KR970010006B1/ko not_active IP Right Cessation
- 1994-02-11 DE DE4404445A patent/DE4404445C2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH06242188A (ja) | 1994-09-02 |
KR940020127A (ko) | 1994-09-15 |
US5453993A (en) | 1995-09-26 |
DE4404445C2 (de) | 2000-08-10 |
DE4404445A1 (de) | 1994-08-18 |
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Payment date: 20000614 Year of fee payment: 4 |
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