KR930018757A - 화합물 반도체장치 - Google Patents
화합물 반도체장치 Download PDFInfo
- Publication number
- KR930018757A KR930018757A KR1019930002360A KR930002360A KR930018757A KR 930018757 A KR930018757 A KR 930018757A KR 1019930002360 A KR1019930002360 A KR 1019930002360A KR 930002360 A KR930002360 A KR 930002360A KR 930018757 A KR930018757 A KR 930018757A
- Authority
- KR
- South Korea
- Prior art keywords
- semiconductor device
- compound semiconductor
- epitaxial layer
- donor concentration
- substrate
- Prior art date
Links
- 150000001875 compounds Chemical class 0.000 title abstract description 4
- 239000004065 semiconductor Substances 0.000 title abstract description 4
- 239000000758 substrate Substances 0.000 claims abstract 2
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/80—Field effect transistors with field effect produced by a PN or other rectifying junction gate, i.e. potential-jump barrier
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/778—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface
- H01L29/7786—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface with direct single heterostructure, i.e. with wide bandgap layer formed on top of active layer, e.g. direct single heterostructure MIS-like HEMT
- H01L29/7787—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface with direct single heterostructure, i.e. with wide bandgap layer formed on top of active layer, e.g. direct single heterostructure MIS-like HEMT with wide bandgap charge-carrier supplying layer, e.g. direct single heterostructure MODFET
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Junction Field-Effect Transistors (AREA)
Abstract
게이트길이 Lg를 짧게 해도, 소위 단채널효과가 생기기 어려운 고특성의 화합물 반도체장치를 제공한다.
본 발명의 화합물 반도체장치는 (가)기판(10)상에 형성되고, 도너농도가 1×1015≤p≤1×1016(cm -3)인 제1의 에피택셜층(12)과, (나)이 제1의 에피택셜층(12)상에 형성되고, 도너농도가 n≤1×1014(cm -3)인 2차원 전자가 주행하는 제2의 에피택셜층(14)으로 이루어진다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 화합물 반도체장치의 모식적인 단면도.
제2도는 종래의 HEMT의 모식적인 단면도.
Claims (1)
- (가)기판상에 형성되고, 도너농도가 1×1015≤p≤1×1016(cm-3)인 제1의 에피택셜층과, (나)이 제1의 에피택셜층상에 형성되고, 도너농도가 n≤1×1014(cm-3)인 2차원 전자가 주행하는 제2의 에피택셜층으로 이루어지는 것을 특징으로 하는 화합물 반도체장치.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4073167A JPH05235055A (ja) | 1992-02-25 | 1992-02-25 | 化合物半導体装置 |
JP92-73167 | 1992-02-25 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR930018757A true KR930018757A (ko) | 1993-09-22 |
KR100286093B1 KR100286093B1 (ko) | 2001-09-17 |
Family
ID=13510334
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019930002360A KR100286093B1 (ko) | 1992-02-25 | 1993-02-20 | 화합물반도체장치 |
Country Status (6)
Country | Link |
---|---|
US (1) | US5406099A (ko) |
EP (1) | EP0558011B1 (ko) |
JP (1) | JPH05235055A (ko) |
KR (1) | KR100286093B1 (ko) |
DE (1) | DE69317925T2 (ko) |
TW (1) | TW210399B (ko) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5668387A (en) * | 1995-10-26 | 1997-09-16 | Trw Inc. | Relaxed channel high electron mobility transistor |
JP3123940B2 (ja) * | 1997-03-27 | 2001-01-15 | 日本電気株式会社 | 電界効果トランジスタおよびその製造方法 |
US5981319A (en) * | 1997-09-22 | 1999-11-09 | Lucent Technologies Inc. | Method of forming a T-shaped gate |
US6150680A (en) * | 1998-03-05 | 2000-11-21 | Welch Allyn, Inc. | Field effect semiconductor device having dipole barrier |
RU2597677C1 (ru) * | 2015-05-21 | 2016-09-20 | федеральное государственное автономное образовательное учреждение высшего образования "Южный федеральный университет" (Южный федеральный университет) | Четырехконтактный элемент интегрального коммутатора |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62298179A (ja) * | 1986-06-18 | 1987-12-25 | Hitachi Ltd | 半導体装置 |
US4788156A (en) * | 1986-09-24 | 1988-11-29 | Microwave Technology, Inc. | Subchannel doping to reduce short-gate effects in field effect transistors |
JPH02192737A (ja) * | 1989-01-20 | 1990-07-30 | Nec Corp | 電界効果トランジスタ |
US5028968A (en) * | 1990-01-02 | 1991-07-02 | The Aerospace Corporation | Radiation hard GaAs high electron mobility transistor |
-
1992
- 1992-02-25 JP JP4073167A patent/JPH05235055A/ja active Pending
-
1993
- 1993-02-20 KR KR1019930002360A patent/KR100286093B1/ko not_active IP Right Cessation
- 1993-02-22 TW TW082101245A patent/TW210399B/zh active
- 1993-02-25 EP EP93102986A patent/EP0558011B1/en not_active Expired - Lifetime
- 1993-02-25 DE DE69317925T patent/DE69317925T2/de not_active Expired - Fee Related
-
1994
- 1994-04-20 US US08/230,871 patent/US5406099A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
KR100286093B1 (ko) | 2001-09-17 |
DE69317925T2 (de) | 1998-11-19 |
EP0558011B1 (en) | 1998-04-15 |
US5406099A (en) | 1995-04-11 |
EP0558011A2 (en) | 1993-09-01 |
DE69317925D1 (de) | 1998-05-20 |
TW210399B (ko) | 1993-08-01 |
EP0558011A3 (en) | 1993-12-08 |
JPH05235055A (ja) | 1993-09-10 |
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