KR20060097250A - 자동 광학 검사 시스템 및 방법 - Google Patents
자동 광학 검사 시스템 및 방법 Download PDFInfo
- Publication number
- KR20060097250A KR20060097250A KR1020050018336A KR20050018336A KR20060097250A KR 20060097250 A KR20060097250 A KR 20060097250A KR 1020050018336 A KR1020050018336 A KR 1020050018336A KR 20050018336 A KR20050018336 A KR 20050018336A KR 20060097250 A KR20060097250 A KR 20060097250A
- Authority
- KR
- South Korea
- Prior art keywords
- inspection
- unit
- inspection object
- printed circuit
- camera
- Prior art date
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/342—Sorting according to other particular properties according to optical properties, e.g. colour
- B07C5/3422—Sorting according to other particular properties according to optical properties, e.g. colour using video scanning devices, e.g. TV-cameras
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
- G01N21/5907—Densitometers
- G01N2021/5957—Densitometers using an image detector type detector, e.g. CCD
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- Engineering & Computer Science (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Operations Research (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Multimedia (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020050018336A KR20060097250A (ko) | 2005-03-04 | 2005-03-04 | 자동 광학 검사 시스템 및 방법 |
CN2006100578159A CN1828217B (zh) | 2005-03-04 | 2006-02-27 | 自动光学检测***和方法 |
JP2006053482A JP5203572B2 (ja) | 2005-03-04 | 2006-02-28 | 自動光学検査システム及び方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020050018336A KR20060097250A (ko) | 2005-03-04 | 2005-03-04 | 자동 광학 검사 시스템 및 방법 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20060097250A true KR20060097250A (ko) | 2006-09-14 |
Family
ID=36946723
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020050018336A KR20060097250A (ko) | 2005-03-04 | 2005-03-04 | 자동 광학 검사 시스템 및 방법 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP5203572B2 (zh) |
KR (1) | KR20060097250A (zh) |
CN (1) | CN1828217B (zh) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100772608B1 (ko) * | 2006-05-29 | 2007-11-02 | 아주하이텍(주) | 자동 광학 검사 시스템 |
KR100909944B1 (ko) * | 2007-08-02 | 2009-07-29 | 이용원 | 실체 현미경을 이용한 렌즈 검사 시스템 |
KR100969283B1 (ko) * | 2007-05-16 | 2010-07-09 | 아주하이텍(주) | 광학 검사 장치 |
KR101012633B1 (ko) * | 2008-10-09 | 2011-02-09 | (주) 인텍플러스 | 듀얼 카메라 비전검사 장치 |
KR101031070B1 (ko) * | 2008-07-23 | 2011-04-25 | 충북대학교 산학협력단 | 영상처리기법을 이용한 tcp/cof의 불량 검출 방법 및그 시스템 |
KR101389502B1 (ko) * | 2010-05-20 | 2014-04-28 | 가부시키가이샤 퓨렉스 | 천 조각 검사 장치 및 검사 방법 |
CN104568985A (zh) * | 2014-12-30 | 2015-04-29 | 东莞市合易自动化科技有限公司 | 一种aoi光学检测设备 |
KR102217207B1 (ko) * | 2019-12-06 | 2021-02-18 | (주)청아굿푸드 | 식품 제조 공정 관리 장치 |
KR20230079712A (ko) * | 2021-11-29 | 2023-06-07 | (주) 시온텍 | 탈염 전극 제조 시스템 |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101966627B (zh) * | 2010-08-16 | 2012-08-22 | 东莞市亿铖达焊锡制造有限公司 | 有芯焊丝生产中连续检测助焊剂的方法和设备 |
CN103108153B (zh) * | 2011-11-11 | 2017-08-01 | 赛恩倍吉科技顾问(深圳)有限公司 | 局部分割拍照处理方法及*** |
KR102023581B1 (ko) | 2012-11-23 | 2019-09-24 | 해성디에스 주식회사 | 릴-투-릴 검사장치 및 릴-투-릴 검사방법 |
CN103475812B (zh) * | 2013-07-30 | 2016-05-25 | 宁波迪吉特电子科技发展有限公司 | 一种摄像机阵列 |
TW201514473A (zh) * | 2013-10-15 | 2015-04-16 | Utechzone Co Ltd | 檢測混合類型物件的方法 |
CN104551301A (zh) * | 2014-12-30 | 2015-04-29 | 东莞市合易自动化科技有限公司 | 一种智能化焊接全自动生产线 |
CN105136121B (zh) * | 2015-09-15 | 2018-06-15 | 歌尔股份有限公司 | 确定工装状态的影像检测方法及*** |
JP6829946B2 (ja) * | 2016-04-28 | 2021-02-17 | 川崎重工業株式会社 | 部品検査装置および方法 |
CN106290384B (zh) * | 2016-10-21 | 2018-11-23 | 江苏理工学院 | 无刷直流电机控制线路板在线检测识别方法 |
CN106546607A (zh) * | 2016-11-10 | 2017-03-29 | 佛山市坦斯盯科技有限公司 | 一种光源组件具有遮光结构的线路板检测装置 |
CN106645192A (zh) * | 2016-11-10 | 2017-05-10 | 佛山市坦斯盯科技有限公司 | 一种具有对正送料装置的线路板检测装置 |
CN106500610A (zh) * | 2016-11-10 | 2017-03-15 | 佛山市坦斯盯科技有限公司 | 一种具有辊筒压紧模组的线路板检测装置 |
CN106524928A (zh) * | 2016-11-10 | 2017-03-22 | 佛山市坦斯盯科技有限公司 | 一种光源组件具有隔光功能的线路板检测装置 |
CN107014823A (zh) * | 2016-11-10 | 2017-08-04 | 佛山市坦斯盯科技有限公司 | 一种相机模组具有升降功能的线路板检测装置 |
CN106706518A (zh) * | 2016-12-30 | 2017-05-24 | 佛山市坦斯盯科技有限公司 | 一种模组化电路板检测机 |
CN108956628B (zh) * | 2018-07-27 | 2024-04-05 | 高视科技(苏州)股份有限公司 | 塑料盖板缺陷成像检测*** |
CN110044921A (zh) * | 2019-04-28 | 2019-07-23 | 江苏理工学院 | 锂电池外观缺陷检测***和方法 |
CN112284442B (zh) * | 2020-12-29 | 2021-03-26 | 苏州天准科技股份有限公司 | 一种柔性电路板自动视觉检测装置 |
CN114895666B (zh) * | 2022-04-11 | 2024-04-19 | 广州镭晨智能装备科技有限公司 | 摄像组件的路径规划方法、装置及计算机可读存储介质 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3419118B2 (ja) * | 1994-11-29 | 2003-06-23 | 松下電器産業株式会社 | 外観検査装置 |
JPH0992692A (ja) * | 1995-07-13 | 1997-04-04 | Toray Ind Inc | Tabテープの検査装置および検査方法ならびに実装tabテープの製造方法および製造装置 |
DE69939522D1 (de) * | 1998-07-28 | 2008-10-23 | Matsushita Electric Works Ltd | Prüfsystem für diskrete leiterbahnnen auf kontinuierlichem substrat aus flexiblem material |
JP2001272356A (ja) * | 2000-03-24 | 2001-10-05 | Olympus Optical Co Ltd | ワーク外観検査装置 |
US7075565B1 (en) * | 2000-06-14 | 2006-07-11 | Landrex Technologies Co., Ltd. | Optical inspection system |
JP2005003645A (ja) * | 2003-06-16 | 2005-01-06 | Inspeck Kk | パターン検査装置 |
-
2005
- 2005-03-04 KR KR1020050018336A patent/KR20060097250A/ko active Search and Examination
-
2006
- 2006-02-27 CN CN2006100578159A patent/CN1828217B/zh not_active Expired - Fee Related
- 2006-02-28 JP JP2006053482A patent/JP5203572B2/ja not_active Expired - Fee Related
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100772608B1 (ko) * | 2006-05-29 | 2007-11-02 | 아주하이텍(주) | 자동 광학 검사 시스템 |
KR100969283B1 (ko) * | 2007-05-16 | 2010-07-09 | 아주하이텍(주) | 광학 검사 장치 |
KR100909944B1 (ko) * | 2007-08-02 | 2009-07-29 | 이용원 | 실체 현미경을 이용한 렌즈 검사 시스템 |
KR101031070B1 (ko) * | 2008-07-23 | 2011-04-25 | 충북대학교 산학협력단 | 영상처리기법을 이용한 tcp/cof의 불량 검출 방법 및그 시스템 |
KR101012633B1 (ko) * | 2008-10-09 | 2011-02-09 | (주) 인텍플러스 | 듀얼 카메라 비전검사 장치 |
KR101389502B1 (ko) * | 2010-05-20 | 2014-04-28 | 가부시키가이샤 퓨렉스 | 천 조각 검사 장치 및 검사 방법 |
CN104568985A (zh) * | 2014-12-30 | 2015-04-29 | 东莞市合易自动化科技有限公司 | 一种aoi光学检测设备 |
KR102217207B1 (ko) * | 2019-12-06 | 2021-02-18 | (주)청아굿푸드 | 식품 제조 공정 관리 장치 |
KR20230079712A (ko) * | 2021-11-29 | 2023-06-07 | (주) 시온텍 | 탈염 전극 제조 시스템 |
Also Published As
Publication number | Publication date |
---|---|
JP5203572B2 (ja) | 2013-06-05 |
JP2006242953A (ja) | 2006-09-14 |
CN1828217B (zh) | 2012-05-30 |
CN1828217A (zh) | 2006-09-06 |
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