KR102389136B1 - 신호 손실 방지용 테스트 소켓 - Google Patents

신호 손실 방지용 테스트 소켓 Download PDF

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Publication number
KR102389136B1
KR102389136B1 KR1020210188477A KR20210188477A KR102389136B1 KR 102389136 B1 KR102389136 B1 KR 102389136B1 KR 1020210188477 A KR1020210188477 A KR 1020210188477A KR 20210188477 A KR20210188477 A KR 20210188477A KR 102389136 B1 KR102389136 B1 KR 102389136B1
Authority
KR
South Korea
Prior art keywords
conductive
elastic matrix
test socket
signal loss
terminals
Prior art date
Application number
KR1020210188477A
Other languages
English (en)
Korean (ko)
Inventor
이제형
김석민
박준철
주학재
Original Assignee
주식회사 새한마이크로텍
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 새한마이크로텍 filed Critical 주식회사 새한마이크로텍
Priority to KR1020210188477A priority Critical patent/KR102389136B1/ko
Application granted granted Critical
Publication of KR102389136B1 publication Critical patent/KR102389136B1/ko
Priority to TW111148512A priority patent/TWI852224B/zh
Priority to PCT/KR2022/020559 priority patent/WO2023128428A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Environmental & Geological Engineering (AREA)
KR1020210188477A 2021-12-27 2021-12-27 신호 손실 방지용 테스트 소켓 KR102389136B1 (ko)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR1020210188477A KR102389136B1 (ko) 2021-12-27 2021-12-27 신호 손실 방지용 테스트 소켓
TW111148512A TWI852224B (zh) 2021-12-27 2022-12-16 訊號損失防止測試座
PCT/KR2022/020559 WO2023128428A1 (fr) 2021-12-27 2022-12-16 Prise de test pour protection contre la perte de signaux

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020210188477A KR102389136B1 (ko) 2021-12-27 2021-12-27 신호 손실 방지용 테스트 소켓

Publications (1)

Publication Number Publication Date
KR102389136B1 true KR102389136B1 (ko) 2022-04-21

Family

ID=81437272

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020210188477A KR102389136B1 (ko) 2021-12-27 2021-12-27 신호 손실 방지용 테스트 소켓

Country Status (2)

Country Link
KR (1) KR102389136B1 (fr)
WO (1) WO2023128428A1 (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102478906B1 (ko) * 2022-07-08 2022-12-21 배명철 소자 테스트 소켓 및 그 제조 방법
WO2023128428A1 (fr) * 2021-12-27 2023-07-06 주식회사 새한마이크로텍 Prise de test pour protection contre la perte de signaux

Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100375117B1 (ko) 1998-12-30 2003-08-19 제이에스알 가부시끼가이샤 위치 결정부를 구비한 이방 도전성 시트_
KR20090006326A (ko) 2007-07-11 2009-01-15 주식회사 포스코 강판 코팅용액의 이물 처리장치
KR100985500B1 (ko) * 2009-08-17 2010-10-26 리노공업주식회사 검사용 소켓
JP2011228024A (ja) * 2010-04-15 2011-11-10 Shin Etsu Polymer Co Ltd 異方導電性シート、回路基板の電気的検査方法および回路基板の電気的検査装置
JP2013506265A (ja) * 2010-10-27 2013-02-21 レーザー テクノロジー ソリューション カンパニー リミテッド 両方向導電性シート及びその製造方法、両方向導電性多層シート、半導体検査ソケット
US20150293147A1 (en) * 2012-04-03 2015-10-15 Isc Co., Ltd. Test socket having high-density conductive unit, and method for manufacturing same
KR20150138602A (ko) * 2014-06-02 2015-12-10 배준규 반도체 테스트용 러버 소켓의 제조방법 및 이를 위한 컴퓨터로 판독가능한 기록매체
KR20170066981A (ko) 2015-12-07 2017-06-15 주식회사 아이에스시 테스트용 소켓 및 테스트용 소켓 제조 방법
KR20180031106A (ko) * 2016-09-19 2018-03-28 (주)티에스이 반도체 테스트 소켓
JP2019510348A (ja) * 2016-03-23 2019-04-11 リーノ インダストリアル インコーポレイテッド テストソケット組立体
KR20190052726A (ko) * 2017-11-08 2019-05-17 주식회사 이노글로벌 양방향 도전성 모듈
KR102133675B1 (ko) 2019-07-03 2020-07-13 주식회사 새한마이크로텍 테스트용 소켓
KR102211358B1 (ko) * 2020-03-19 2021-02-03 (주)티에스이 테스트 소켓 및 이를 포함하는 테스트 장치와, 테스트 소켓의 제조방법
KR20210014051A (ko) * 2019-09-16 2021-02-08 주식회사 새한마이크로텍 이방 전도성 시트

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102389136B1 (ko) * 2021-12-27 2022-04-21 주식회사 새한마이크로텍 신호 손실 방지용 테스트 소켓

Patent Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100375117B1 (ko) 1998-12-30 2003-08-19 제이에스알 가부시끼가이샤 위치 결정부를 구비한 이방 도전성 시트_
KR20090006326A (ko) 2007-07-11 2009-01-15 주식회사 포스코 강판 코팅용액의 이물 처리장치
KR100985500B1 (ko) * 2009-08-17 2010-10-26 리노공업주식회사 검사용 소켓
JP2011228024A (ja) * 2010-04-15 2011-11-10 Shin Etsu Polymer Co Ltd 異方導電性シート、回路基板の電気的検査方法および回路基板の電気的検査装置
JP2013506265A (ja) * 2010-10-27 2013-02-21 レーザー テクノロジー ソリューション カンパニー リミテッド 両方向導電性シート及びその製造方法、両方向導電性多層シート、半導体検査ソケット
US20150293147A1 (en) * 2012-04-03 2015-10-15 Isc Co., Ltd. Test socket having high-density conductive unit, and method for manufacturing same
KR20150138602A (ko) * 2014-06-02 2015-12-10 배준규 반도체 테스트용 러버 소켓의 제조방법 및 이를 위한 컴퓨터로 판독가능한 기록매체
KR20170066981A (ko) 2015-12-07 2017-06-15 주식회사 아이에스시 테스트용 소켓 및 테스트용 소켓 제조 방법
JP2019510348A (ja) * 2016-03-23 2019-04-11 リーノ インダストリアル インコーポレイテッド テストソケット組立体
KR20180031106A (ko) * 2016-09-19 2018-03-28 (주)티에스이 반도체 테스트 소켓
KR20190052726A (ko) * 2017-11-08 2019-05-17 주식회사 이노글로벌 양방향 도전성 모듈
KR102133675B1 (ko) 2019-07-03 2020-07-13 주식회사 새한마이크로텍 테스트용 소켓
KR20210014051A (ko) * 2019-09-16 2021-02-08 주식회사 새한마이크로텍 이방 전도성 시트
KR102211358B1 (ko) * 2020-03-19 2021-02-03 (주)티에스이 테스트 소켓 및 이를 포함하는 테스트 장치와, 테스트 소켓의 제조방법

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023128428A1 (fr) * 2021-12-27 2023-07-06 주식회사 새한마이크로텍 Prise de test pour protection contre la perte de signaux
KR102478906B1 (ko) * 2022-07-08 2022-12-21 배명철 소자 테스트 소켓 및 그 제조 방법

Also Published As

Publication number Publication date
TW202338358A (zh) 2023-10-01
WO2023128428A1 (fr) 2023-07-06

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