KR101661533B1 - 입체 표시 장치 검출 시스템 및 그 검출 방법 - Google Patents
입체 표시 장치 검출 시스템 및 그 검출 방법 Download PDFInfo
- Publication number
- KR101661533B1 KR101661533B1 KR1020140191759A KR20140191759A KR101661533B1 KR 101661533 B1 KR101661533 B1 KR 101661533B1 KR 1020140191759 A KR1020140191759 A KR 1020140191759A KR 20140191759 A KR20140191759 A KR 20140191759A KR 101661533 B1 KR101661533 B1 KR 101661533B1
- Authority
- KR
- South Korea
- Prior art keywords
- stereoscopic
- image
- correction parameter
- display
- stereoscopic display
- Prior art date
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Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
- H04N13/30—Image reproducers
- H04N13/327—Calibration thereof
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
- H04N13/20—Image signal generators
- H04N13/204—Image signal generators using stereoscopic image cameras
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Stereoscopic And Panoramic Photography (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410535242.0 | 2014-10-11 | ||
CN201410535242.0A CN105578175B (zh) | 2014-10-11 | 2014-10-11 | 立体显示装置检测***及其检测方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20160042738A KR20160042738A (ko) | 2016-04-20 |
KR101661533B1 true KR101661533B1 (ko) | 2016-09-30 |
Family
ID=55887773
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020140191759A KR101661533B1 (ko) | 2014-10-11 | 2014-12-29 | 입체 표시 장치 검출 시스템 및 그 검출 방법 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP6213966B2 (zh) |
KR (1) | KR101661533B1 (zh) |
CN (1) | CN105578175B (zh) |
TW (1) | TWI583967B (zh) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10091496B2 (en) * | 2016-11-28 | 2018-10-02 | X Development Llc | Systems, devices, and methods for calibrating a light field projection system |
CN108259888A (zh) * | 2016-12-29 | 2018-07-06 | 深圳超多维光电子有限公司 | 立体显示效果的测试方法及*** |
CN107202680B (zh) * | 2017-06-23 | 2019-12-24 | 深圳超多维科技有限公司 | 一种模组检测设备及检测方法 |
CN108195563B (zh) * | 2017-12-29 | 2020-04-28 | 深圳超多维科技有限公司 | 一种立体显示装置的显示效果测评方法、装置和测评终端 |
CN109005400B (zh) * | 2018-07-02 | 2020-06-23 | 深圳超多维科技有限公司 | 一种检测光栅贴合偏移的方法、***及存储介质 |
Family Cites Families (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2920051B2 (ja) * | 1993-09-01 | 1999-07-19 | シャープ株式会社 | 3次元ディスプレイ装置 |
JP2000152285A (ja) * | 1998-11-12 | 2000-05-30 | Mr System Kenkyusho:Kk | 立体画像表示装置 |
TW546603B (en) * | 2000-07-28 | 2003-08-11 | Nichia Corp | Display, display drive circuit and display drive method |
JP2003194669A (ja) * | 2001-12-27 | 2003-07-09 | Seiko Epson Corp | 液晶装置の検査方法及び検査装置 |
JP4281622B2 (ja) * | 2004-05-31 | 2009-06-17 | ソニー株式会社 | 表示装置及び検査方法 |
KR100932977B1 (ko) * | 2005-07-05 | 2009-12-21 | 삼성모바일디스플레이주식회사 | 입체 영상 표시 장치 |
US20070165942A1 (en) * | 2006-01-18 | 2007-07-19 | Eastman Kodak Company | Method for rectifying stereoscopic display systems |
JP4881030B2 (ja) * | 2006-02-18 | 2012-02-22 | セイコーインスツル株式会社 | 表示装置 |
US8106865B2 (en) * | 2006-06-02 | 2012-01-31 | Semiconductor Energy Laboratory Co., Ltd. | Display device and driving method thereof |
US7980702B2 (en) * | 2006-06-08 | 2011-07-19 | Panasonic Electric Works Co., Ltd. | Image display device |
KR101213859B1 (ko) * | 2006-06-29 | 2012-12-18 | 엘지디스플레이 주식회사 | 평판표시장치의 데이터 보상방법 및 장치 |
KR100837259B1 (ko) * | 2007-07-18 | 2008-06-12 | 한국과학기술원 | 3차원 모니터에서 영상왜곡을 보상하는 방법 |
JP5354252B2 (ja) * | 2008-05-13 | 2013-11-27 | 独立行政法人情報通信研究機構 | 立体ディスプレイ製造システム、立体ディスプレイシステムおよび立体ディスプレイシステムの製造方法 |
JP2009300816A (ja) * | 2008-06-16 | 2009-12-24 | Seiko Epson Corp | 表示装置の製造方法および製造装置 |
JP5673008B2 (ja) * | 2010-08-11 | 2015-02-18 | ソニー株式会社 | 画像処理装置、立体画像表示装置および立体画像表示システム、ならびに立体画像表示装置の視差ずれ検出方法および立体画像表示装置の製造方法 |
JP5656059B2 (ja) * | 2010-08-25 | 2015-01-21 | Nltテクノロジー株式会社 | 実装精度検査方法及びその検査方法を用いる検査装置 |
JP5127901B2 (ja) * | 2010-09-17 | 2013-01-23 | 株式会社東芝 | セル基板の検査システム及び検査方法 |
US8624501B2 (en) * | 2010-12-08 | 2014-01-07 | Mks Instruments, Inc. | Measuring and controlling parameters of a plasma generator |
CN102207424B (zh) * | 2010-12-29 | 2013-01-23 | 深圳超多维光电子有限公司 | 立体显示装置的参数测量***和方法 |
WO2012169448A1 (ja) * | 2011-06-08 | 2012-12-13 | シャープ株式会社 | 検査装置 |
JP5924046B2 (ja) * | 2012-03-15 | 2016-05-25 | ソニー株式会社 | 表示装置および方法、情報処理装置および方法、並びにプログラム |
CN102595182B (zh) * | 2012-03-16 | 2015-02-11 | 深圳超多维光电子有限公司 | 立体显示设备及其校正方法、装置和*** |
CN202634618U (zh) * | 2012-04-06 | 2012-12-26 | 南昌大学 | 裸眼3d设备质量检测装置 |
CN102662283B (zh) * | 2012-05-25 | 2015-04-29 | 天马微电子股份有限公司 | 液晶狭缝光栅、立体显示装置及其校正方法 |
TWI508524B (zh) * | 2012-10-26 | 2015-11-11 | Quanta Comp Inc | 裸視立體顯示裝置之自動調校方法及系統 |
WO2014097456A1 (ja) * | 2012-12-20 | 2014-06-26 | 富士通株式会社 | 立体画像表示体、その製造方法および製造システム |
CN103676174B (zh) * | 2013-12-24 | 2016-02-03 | 北京邮电大学 | Led显示器3d显示方法 |
CN103838030A (zh) * | 2014-03-28 | 2014-06-04 | 信利半导体有限公司 | 双方向立体显示装置 |
-
2014
- 2014-10-11 CN CN201410535242.0A patent/CN105578175B/zh active Active
- 2014-12-19 TW TW103144570A patent/TWI583967B/zh not_active IP Right Cessation
- 2014-12-25 JP JP2014262002A patent/JP6213966B2/ja not_active Expired - Fee Related
- 2014-12-29 KR KR1020140191759A patent/KR101661533B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
KR20160042738A (ko) | 2016-04-20 |
CN105578175B (zh) | 2018-03-30 |
JP2016082558A (ja) | 2016-05-16 |
CN105578175A (zh) | 2016-05-11 |
JP6213966B2 (ja) | 2017-10-18 |
TWI583967B (zh) | 2017-05-21 |
TW201614243A (en) | 2016-04-16 |
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