KR101565123B1 - Base block of measuring apparatus for curvature - Google Patents

Base block of measuring apparatus for curvature Download PDF

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Publication number
KR101565123B1
KR101565123B1 KR1020150079692A KR20150079692A KR101565123B1 KR 101565123 B1 KR101565123 B1 KR 101565123B1 KR 1020150079692 A KR1020150079692 A KR 1020150079692A KR 20150079692 A KR20150079692 A KR 20150079692A KR 101565123 B1 KR101565123 B1 KR 101565123B1
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KR
South Korea
Prior art keywords
block
probe
guide
main
main block
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KR1020150079692A
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Korean (ko)
Inventor
이무우
Original Assignee
(주)판도라
이무우
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Priority to KR1020150079692A priority Critical patent/KR101565123B1/en
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Publication of KR101565123B1 publication Critical patent/KR101565123B1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B3/00—Measuring instruments characterised by the use of mechanical techniques
    • G01B3/22—Feeler-pin gauges, e.g. dial gauges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/08—Measuring arrangements characterised by the use of mechanical techniques for measuring diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/08—Measuring arrangements characterised by the use of mechanical techniques for measuring diameters
    • G01B5/12—Measuring arrangements characterised by the use of mechanical techniques for measuring diameters internal diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G01B5/213—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures for measuring radius of curvature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G01B5/22—Spherometers

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)

Abstract

The present invention relates to a base block of a curved surface measuring instrument for measuring a curvature, a radius, an inner diameter or an outer diameter of a three-dimensional object, wherein three points measured by three probe tips are measured, Dimensional information on the three-dimensional object to be measured, and acquires information on the curvature, radius, inner diameter, outer diameter, and the like of the measured three-dimensional object by analyzing the information on the three- To a base block of a curved surface measuring instrument for precisely positioning the tip.
In the present invention, the first probe block and the second probe block, each having the other two probe tips, are mounted on a main block having a probe team positioned at the center of the three probe tips, The length of the base block provided with the two probe tips can be freely adjusted according to the size of the portion to be measured of the three-dimensional object; It is possible to obtain the effect of measuring the curvature of the portion to be measured having various shapes and sizes by a single base block whose length is adjustable.

Description

A base block of a measuring apparatus for curvature

The present invention relates to a base block of a curved surface measuring instrument for measuring a curvature, a radius, an inner diameter or an outer diameter of a three-dimensional object, wherein three points measured by three probe tips are measured, Dimensional information on the three-dimensional object to be measured, and acquires information on the curvature, radius, inner diameter, outer diameter, and the like of the measured three-dimensional object by analyzing the information on the three- To a base block of a curved surface measuring instrument for precisely positioning the tip.

A variety of types of three-dimensional objects are handled in an industrial field, a laboratory, a construction site, or a furniture design field, and if necessary, information about the curvature, radius, inner diameter, outer diameter, etc. of all or a part of the three- .

On the other hand, in recent years, information on the curvature, radius, inner diameter, outer diameter, and the like of the portion to be measured of the three-dimensional object can be obtained by using a curved surface measuring instrument.

A typical curved surface measuring instrument includes a curved surface measuring instrument body (not shown) as shown in FIG. 1, a gauge (not shown) equipped with a probe bar 62 'having a probe tip 61' (60 ') and a base block (80').

As shown in FIG. 1, the base block 80 'has top tip tips 21' and 31 'on the lower ends thereof, and a probe 62' mounted on the gauge 60 ' The three probe tips 21 ', 61', 31 'are positioned in any triangular shape having various angles and sides depending on the degree of flexion of the portion to be measured.

In addition, the control and determination unit configured in the main body of the curved surface measuring apparatus calculates the curvature and the curvature of the measured portion using the information about the length value and the cabinet value of the base of the triangle input into the database, Such as a radius, an inner diameter, an outer diameter, and the like.

This is a typical conventional technique for the following curved surface measuring instrument.

Korean Patent No. 10-0669040 relates to an apparatus and method for measuring a curvature using multiple beams, and a method of measuring a curvature from an mxn vertical cavity surface emitting laser (VCSEL) array or a mxn LD (laser diode) array having a constant pitch pitch Making the generated mxn multiple light flux into non-parallel multiple light flux or parallel multiple light flux; These multiple light fluxes are incident on a thin film surface formed on a substrate, reflected and detected as an m x n spot array in a detector such as a CCD or a CMOS image sensor, and measure the beam interval of the array in a direction parallel to the incident surface; The curvature of the substrate causes a change in the beam spacing in this direction, and the curvature in this direction can be expressed as a function of the beam spacing change, the angle of incidence, the distance between the thin film surface and the detector, and the like; All of these values are measurable and are configured to obtain the curvature of the thin film surface from these values.

Since the prior art of the above configuration uses an mxn light source array (mxn VCSEL array or mxn LD array) to obtain multiple beams, the intensity of the laser beam is reduced as in the case of a multi beam flux measuring method using a conventional high reflectance etalon It is possible to obtain an effect that can be free from the problem. However, there is a problem that the configuration is complicated and an expensive manufacturing cost is required, and a continuous research and development is required to solve the problem.

Korean Registered Patent No. 10-0669040 (2007.01.09) Korean Patent Publication No. 10-2012-0121248 (2012.11.05) Korean Patent Publication No. 10-2007-0088042 (2007.08.29) Korean Registered Patent No. 10-1422695 (Jul. 17, 2014)

The present invention relates to a conventional curved surface measuring apparatus, in which a probe tip positioned at both ends of a base block is fixed, and a length of a base block is adjusted A problem has arisen that a plurality of base blocks have to be prepared according to the size of the portion to be measured of the three-dimensional object;

When the base block to which the size of the measured portion of the three-dimensional object is appropriately estimated is not suitable, the base block having the different length has to be combined with the measurement gauge again. Therefore, .

The present invention has been made to solve the above-

A main block having a through hole for penetrating a probe provided with a sensing probe tip at the center and having an elongated guide formed in a horizontal direction; A probe block having a probe tip at a lower portion thereof, a first probe block disposed at one side of the main block so as to be movable in a horizontal direction, A second probe block having a probe tip at a lower portion thereof, the second probe block being disposed on the other side of the main block so as to be movable in a horizontal direction, And a length adjusting unit fastened to the main block so that the handle is rotatable, and both ends of the length-adjustable screw extending from the handle are fastened to the first probe block and the second probe block, respectively Of the curvature measuring instrument.

The base block of the curved surface measuring instrument according to the present invention has the first probe block having the other two probe tips and the second probe block having the second probe tip, The length of the base block having two probe tips can be freely adjusted according to the size of the portion to be measured of the three-dimensional object, because the probe block is fastened to be movable in the horizontal direction;

It is possible to obtain the effect of measuring the curvature of the portion to be measured having various shapes and sizes by a single base block whose length is adjustable.

BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a front view showing a curved surface measuring instrument according to the prior art; Fig.
2 is a perspective view showing a base block of a curved surface measuring instrument according to a preferred embodiment of the present invention.
Fig. 3 (a) is a front view showing a use state of the base block of the curved surface measuring instrument according to a preferred embodiment of the present invention (when the measured portion is concave). Fig.
Fig. 3 (b) is a front view showing the use state of the base block of the curved surface measuring instrument according to the preferred embodiment of the present invention (when the measured portion is convex). Fig.
Fig. 4 is a front view showing a use state of the base block of the curved surface measuring instrument according to a preferred embodiment of the present invention (when the curvatures of the convex measured parts are different). Fig.
5 is an exploded front perspective view showing a base block of a curved surface measuring instrument according to a preferred embodiment of the present invention.
FIG. 6 is a rear perspective view illustrating a base block of a curved surface measuring apparatus according to a preferred embodiment of the present invention. FIG.
7 is a front perspective view showing a horizontal movement state of a first probe block and a second probe block in a base block of a curved surface measuring instrument according to a preferred embodiment of the present invention.
FIG. 8 is a rear perspective view showing a horizontal movement state of a first probe block and a second probe block in a base block of a curved surface measuring instrument according to a preferred embodiment of the present invention. FIG.
FIG. 9 is a perspective view showing a case where a gap number display and a reference display are formed on a base block of a curved surface measuring apparatus according to a preferred embodiment of the present invention. FIG.

The present invention relates to a base block of a curved surface measuring instrument for measuring a curvature, a radius, an inner diameter, an outer diameter, and the like of a three-dimensional object and includes a through hole 11 for penetrating a probe 62 having a sensing probe tip 61, A main block (10) having an L-shaped guide (40) having a length in a horizontal direction; A first probe block 20 having a probe tip 21 at a lower portion thereof and having one side connected to the LM guide 40 and positioned at one side of the main block 10 so as to be movable in a horizontal direction; A second probe block 30 having a probe tip 31 at its bottom and connected to the LM guide 40 at one side thereof and positioned at the other side of the main block 10 so as to be movable in a horizontal direction; The handle 51 is rotatably coupled to the main block 10 and both ends of the length adjustable screw 52 extending from the handle 51 are connected to the first probe block 20 and the second probe block 50, And a length adjusting unit (50) fastened to the base block (30), respectively.

First, the base block according to the present invention is one of the configurations of a curved surface measuring instrument including a curved surface measuring instrument, a gage 60 equipped with a probe 62 having a sensing probe tip 61 at its distal end, and a base block .

That is, the base block includes top tip tips 21 and 31 at both lower portions of a base block having a predetermined length as shown in FIG. 1, and a gauge 60 is formed in a through hole 11 formed at the center of the base block. And a probe tip 61 for sensing is provided at the distal end of the probe bar 62. The other two top tip tips 21 and 31 provided at both lower portions of the base block, And an arbitrary triangle.

Specifically, three vertexes (a, b, c) of arbitrary triangles formed by the three probe tips 21, 61, 31 as shown in FIG. 3 (a) And is used as information on three points for measuring the degree of flexion.

At this time, the points formed by the top tip tips (21, 31) provided in the base block among the information on the three points correspond to both vertexes (a, c) of the base of any triangle, The point b formed by the sensing probe tip 61 provided on the probe 62 corresponds to the upper vertex b of the arbitrary triangle and the vertexes on both sides of the base the information on the upper cabinet angle of an arbitrary triangle can be obtained as two sides connected to the vertex a and c, or information on the vertical length from the upper vertex b to the base can be obtained.

That is, the top tip tips (21, 31) provided at both ends of the base block are maintained in a fixed state (provided that the length between the top tip tips (21, 31) (A, c) located at both ends of the three vertexes of the triangle of the triangle of FIG.

The sensing probe tip 61 provided at the distal end of the probe 62 and positioned between the two top tip tips 21 and 31 is moved upward and downward by the vertical movement of the probe 62 with respect to the base block. And moves the position of the central vertex (b) among the three vertexes (a, b, c) of the arbitrary triangle to change the position of the vertex (b) of the center according to the degree of curvature of the measured portion.

Further, the gauge 60 measures the position of the sensing probe tip 61 which is moved up and down in accordance with the bending of the part to be measured by a change in the length of the probe 62 with respect to the gauge 60, And transmits the obtained information to the curved surface measuring apparatus main body.

At this time, the gauge 60 and the curved surface measuring instrument main body can be connected by a cable. In the curved surface measuring instrument main body, information about the length value and the cabinet value of the triangle bottom line varying according to the degree of bending with reference to the garden (complete circle) .

That is, the main body of the curved surface measuring apparatus is constituted by a control / judgment unit, a database unit, a display unit, and an input unit. The database unit stores information on length values and cabinet values of a triangle base line according to the degree of curvature, Various information such as a curvature calculated using information on the length value and the cabinet value of the triangle base line, information on the radius, inner diameter, or outer diameter according to the curvature, and the like are stored in advance; The control and determination unit is configured to receive information on the vertices of an arbitrary triangle measured by the sensing tip 61 for sensing and to compare and determine various information stored in the database unit; The display unit is connected to the control and determination unit and the following input unit, and displays various information such as information measured by the sensing probe tip 61, information on radius, radius, outer diameter, etc. according to the curvature and curvature, Lt; / RTI > The input unit is connected to the control / determination unit and the display unit, and can input the interval between the two top tip tips (21, 31) located at both ends of the base block, the correction value according to the shape of the tip, and the like.

Hereinafter, a known technique can be applied to the curved surface measuring instrument body, the gauge 60, and the method of calculating the curvature, radius, inner diameter, or outer diameter, which are applied to the present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail with reference to FIGS. 1 to 9 showing embodiments of the present invention.

Specifically, the main block 10 includes a through hole 11 passing through a probe 62 having a sensing probe tip 61 at its center, and an LM guide 40 having a length in the horizontal direction. And serves as a support for the base block.

That is, the through hole 11 is configured to penetrate the probe bar 62 provided in the gauge 60. The through hole 11 ensures the vertical mobility of the probe bar 62 that changes according to the degree of bending of the portion to be measured of the three- And the gauge 60 is fastened to the main block 10.

The through hole 11 is formed in a portion corresponding to the center of the main block 10 having a bar shape and vertically penetrating the upper and lower portions of the main block 10, The lower part of the gauge 60 is fastened. And the probe 62 can be moved up and down in the vertical direction into the through-hole 11.

The probe tip 61 for sensing is provided at the distal end of the probe 62 as shown in Fig. 3, and a probe tip 61 for sensing according to a known technique is applicable. The probe tip 61 includes a gage 60, a probe 62 And probe tip 61 for sensing are well known in the art.

The LM guide 40 is provided at one side of the main block 10 to allow the first probe block 20 and the second probe block 30 to horizontally move by the LM guide 40, It may be provided at any part of the main block 10, either outside or inside, as long as it can form a length in the same horizontal direction as the longitudinal direction of the main block 10. Hereinafter, the LMP guide 40 will be described on the assumption that the LMP guide 40 is provided at the rear portion of the main block 10.

In addition, the LM guide 40 includes a guide rail and a guide block as shown in FIG. Since the first probe block 20 and the second probe block 30 are both fastened to each other, the single guide rail is fastened to the main block 10, and the plurality of guide blocks The plurality of LM guides 40 may be fastened to the first probe block 20 and the second probe block 30 respectively and include guide rails and guide blocks, The first probe block 20 and the second probe block 30 may be fastened to each other.

The first probe block 20 is provided with a probe tip 21 at a lower portion thereof and is disposed at one side of the main block 10 so that one end thereof is connected to the LM guide 40 and is movable in a horizontal direction. And a probe tip 21 corresponding to one of the two top tip tips 21 and 31 provided in the base block. The probe tip 21 has a length in the horizontal direction of one side of the center of the main block 10 Is a controlled configuration.

That is, one side of the first probe block 20 is located at one side of both ends of the main block 10 and is horizontally movable in one direction from the main block 10, so that the length of the base block is expanded or contracted in one direction .

The guide rail or the guide block of the LM Guide 40 provided in the main block 10 is interlocked with one side of the first probe block 20 to be guided by the LM Guide 40 at the longitudinal center of the main block 10. [ So that the first probe block 20 can move horizontally without shaking.

The probe tip 21 provided at the lower portion of the first probe block 20 may be of a ball type or a column type according to the shape of a portion to be mounted on the portion to be measured, (D) difference of the probe tip 21 that can be changed according to the type of the probe tip 21 can be applied to the curved surface measuring instrument 21, Can be input to the main body or the gauge 60.

The radius d 'of the probe tip 31 provided in the second probe block 30 and the radius d' of the probe tip 61 for sensing provided in the probe 62 are also different from each other Can be input to the curved surface measuring instrument body or the gauge 60.)

The second probe block 30 has a probe tip 31 at a lower portion thereof and is disposed on the other side of the main block 10 so as to be connected to one side of the LM guide 40 and move in the horizontal direction. And is positioned on the opposite side of the first probe block 20 with respect to the main block 10.

Specifically, since the second probe block 30 has the same configuration except that the length of the second probe block 30 is adjusted in the horizontal direction on the other side of the center of the main block 10, And there is a difference from the first probe block 20 will be described in detail.

That is, as described above, the probing tip 21 provided in the first probe block 20 and the probe tip 31 provided in the second probe block 30 have the degree of curvature of the portion to be measured The first probe block 20 and the second probe block 30 function as vertexes a and c of the base of the arbitrary triangle for measuring the distance between the first probe block 20 and the second probe block 30, (The change in the length of the base of the arbitrary triangle) between the tip ends 21 and 31 is input to the body of the curved surface measuring instrument or the gauge 60 so that the information about the upper internal angle of an arbitrary triangle Or a correction value for information on the vertical length from the upper vertex to the base.

In addition, the LM guide 40 includes an upper LM guide 41 provided at an upper portion of one side of the main block 10; A first probe block 20 is connected to the upper LM guide 41 and a second probe block 40 is connected to the lower LM guide 42, The second probe block 30 may be connected.

Specifically, when a single LM guide 40 is provided in the main block 10, since two guide blocks are to be fastened to a single guide rail so as to be horizontally movable on both sides, a length corresponding to half of the guide rail And the first probe block 20 and the second probe block 30 fastened to the respective guide blocks are extended or extended horizontally by a length corresponding to half of the guide rails, It is possible to reduce.

The upper and lower LM guides 41 and 42 are fastened to the main block 10 so that the first probe block 20 and the second probe block 30 can move horizontally When the guide rail of the upper LM guide 41 and the guide rail of the lower LM guide 42 have a length similar to the length of the main block 10, the first probe block 20, Each of the blocks 30 can be extended or contracted as much as possible by a length similar to the length of the main block 10 in one direction and the other direction of the main block 10.

The first probe block 20 and the second probe block 30 have insertion grooves 22 and 32 into which a distal end portion of the main block 10 can be inserted at the center of a portion adjacent to the main block 10, As shown in FIG.

That is, since the insertion groove 22 formed in the first probe block 20 can insert one side of the main block 10, when the first probe block 20 is reduced toward the center of the main block 10, Allowing the probe tip 21 of the first probe block 20 to be located at a closer distance in the central portion of the block 10; Since the insertion groove 32 formed in the second probe block 30 can insert the other side of the main block 10 into the main block 10 when the second probe block 30 is reduced toward the center of the main block 10, 10 so that the probe tip 31 of the second probe block 30 can be located at a closer distance.

As a result, the insertion grooves 22 and 32 of the above-described configuration are effective to narrow the gap between the probe tip 21 of the first probe block 20 and the probe tip 31 of the second probe block 30 .

The length adjusting unit 50 is also fastened to the main block 10 such that the handle 51 is rotatable so that both ends of the length adjustable screw 52 extend from the handle 51, The first probe block 20 and the second probe block 30 can be easily extended or extended in both horizontal directions about the main block 10 or the second probe block 30 by being fastened to the first probe block 20 and the second probe block 30, The length adjusting means for reducing the length.

More specifically, the handle 51 is provided at one or more portions of the main block 10, that is, preferably at a portion corresponding to the front of the main block 10, So that the first probe block 20 and the second probe block 30 can be moved in the horizontal direction in the main block 10.

That is, when the handle 51 is rotated, the screw 52 rotates and the first probe block 20 and the second probe block 30, which are respectively fastened to both ends of the screw 52, And horizontally moves in the direction of expanding or contracting about the center.

7 to 8, the screw 52 may be connected to the handle 51, the screw 52, and the first and second probe blocks by a variety of methods. However, Wherein threading in different directions is formed on the outer periphery; The first probe block 20 and the second probe block 30 are formed such that threaded grooves 23 and 33 to which both portions of the screw 52 are connected are formed respectively. The main block 10 can be horizontally moved by the same length at the same time.

That is, the handle 51 of the above-described structure is configured to simultaneously rotate the screws 52 provided on both sides of the handle 51, and the screw 52 provided on both sides of the handle 51, The first probe block 20 and the second probe block 30 can be simultaneously moved to the main block (the first probe block 20 and the second probe block 30) with the handle 51 as the center, 10 of the present invention.

At this time, the first probe block 20 and the second probe block 30 should be provided with screw grooves 23 and 33, respectively, so that both portions of the screw 52 having different threading directions can be connected to each other Will be self-evident.

6, a screw hole 52 is formed at one side of the main block 10 so as to allow the screw 52 to pass through the main block 10, (13), and further comprising a pair of support diaphragms (12) projecting in a state of being spaced apart from each other, the handle (51) being positioned between the pair of support diaphragms (12) The screw 52 may be fixedly coupled with the screw 52 in a symmetrical manner.

Specifically, the pair of support partition plates 12 protrude from a portion corresponding to one side of the main block 10, so that the handle 51 can be positioned between the support partition plates 12, A screw 52 connected to the handle 51 is passed through the handle 13 so that the handle 51 can be rotatably coupled to the main block 10.

The screw 52 connected to both ends of the handle 51 is fixed to the handle 51 and the rotational force of the handle 51 is transmitted to the screw 52, And a pair of screws 52 provided at both ends of the handle 51 are connected to the screw grooves 23 and 33 of the first probe block 20 and the second probe block 30, And is rotated in the thread groove (23, 33).

As shown in FIG. 9, the upper or the front portion of the main block 10 indicates the distance between the probe tips 2.3 extending or narrowed by the horizontal movement of the first probe block 20 and the second probe block 30 The interval number display 70 can be displayed.

The interval between the first probe block 20 and the second probe block 30 is indicated by an interval number displayed on the main block 10, A reference mark 71 such as an arrow indicating the first probe block 20 and the second probe block 30 is displayed so that the top tip tip 21 , 31 can be easily grasped.

The base block of the curved surface measuring instrument according to the present invention having the above-described structure is provided with the first probe block 20 and the second probe block 30 each having the two top tip tips 21 and 31, The first probe block 20 and the second probe block 30 can be moved horizontally to be reduced toward the main block 10 so that the first probe block 20 and the second probe block 30 can be moved horizontally. The first probe block 20 and the second probe block 30 are horizontally moved so as to extend to the outside of the main block 10 when the portion to be measured is large Thereby realizing the effect of measuring the curvature under the wide-angle bending.

The following is a preferred embodiment of measuring the outer curvature of an elliptical tube using a base block of a curved surface measuring instrument according to the present invention.

First, the elliptical tube is in a state of being distorted in the form of shortening the vertical direction from the center with respect to the garden from the center in the horizontal direction, and the portion to be measured of the elliptical tube which is a three-dimensional object is the upper portion in the vertical direction having the short axis.

Specifically, the operator connects the curved surface measuring instrument main body and the gauge 60 with a cable, and inserts the gauge 60 into the through hole 11 of the base block. The operator rotates the handle 51 provided on the main block 10 of the base block so that the first probe block 20 and the second probe block 30 provided on both sides of the main block 10 are rotated The horizontal length of the first probe block 20 and the second probe block 30 with respect to the main block 10 is adjusted so that the first probe block 20 and the second probe block 30 can be properly positioned.

Thereafter, the operator confirms the interval number mark 70 displayed on the main block 10 indicated by the reference mark 71 displayed on the first probe block 20 and the second probe block 30, The operator inputs the interval between the top tip tips 21 and 31 identified in Fig. At this time, the interval between the input top tip tips 21 and 31 is used as the length value of the base of an arbitrary triangle for calculating the curvature.

Thereafter, the operator moves the probe 62 mounted on the gauge 60 up or down to seat the probe tip 61 for sensing on the portion to be measured, and measures the position of the vertex corresponding to the center of the arbitrary triangle.

The curvature, the radius, the inner diameter, and the outer diameter of the portion to be measured of the three-dimensional object can be known in the curved surface measuring instrument body using the length value information of the base of the arbitrary triangle measured in the above and the position information of the vertex corresponding to the center.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed exemplary embodiments, but, on the contrary, It is possible to carry out various changes in the present invention.

10: main block 11: through hole
12: Supporting diaphragm 13: Screw hole
20: first probe block 21: probe tip
22: insertion groove 23: screw groove
30: second probe block 31: probe tip
32: insertion groove 33: screw groove
40: LM Guide 41: Top LM Guide
42: lower elm guide 50: length adjusting unit
51: handle 52: screw
60: Gauge 61: Sensor tip for sensing
62: probe 70: interval number display
71: Base table

Claims (5)

A main block 10 having a through hole 11 passing through a probe 62 having a sensing probe tip 61 at the center and having an elongated guide 40 having a length in a horizontal direction; A first probe block 20 having a probe tip 21 at a lower portion thereof and having one side connected to the LM guide 40 and positioned at one side of the main block 10 so as to be movable in a horizontal direction; A second probe block 30 having a probe tip 31 at its bottom and connected to the LM guide 40 at one side thereof and positioned at the other side of the main block 10 so as to be movable in a horizontal direction; A handle 51 is fastened to the main block 10 so that both ends of the screw 52 extend from the handle 51 and the length of the screw 52 is adjusted by the first probe block 20, And a length adjusting unit (50) fastened to the block (30), respectively,
The screw 52 is configured such that threads in different directions are formed on the periphery around a single handle 51;
The first probe block 20 and the second probe block 30 are formed such that threaded grooves 23 and 33 to which both portions of the screw 52 are connected are formed respectively. And is configured to be horizontally movable by the same length simultaneously with the main block (10) as a center.
The method according to claim 1,
The LM guide (40)
An upper LM guide 41 provided on one side of the main block 10;
And a lower LM guide (42) provided at a lower portion of one side of the main block (10)
Wherein a first probe block (20) is connected to the upper LM guide (41), and a second probe block (30) is connected to the lower LM guide (42).
The method according to claim 1,
The first probe block 20 and the second probe block 30,
(22, 32) into which a portion of a distal end of the main block (10) can be inserted is formed at the center of a portion adjacent to the main block (10).
delete The method according to claim 1,
On one side of the main block 10,
Further comprising a pair of support diaphragms (12) provided with screw holes (13) through which the screws (52) penetrate, and protruding in a state of being spaced apart from each other,
The handle (51)
Is arranged between the pair of supporting diaphragms (12), and the screws (52) are symmetrically fastened to the both ends.
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Cited By (5)

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KR101726551B1 (en) 2016-12-16 2017-04-17 하주영 Apparatus and method for measuring radius of curvature for cable
KR20180069595A (en) * 2016-12-15 2018-06-25 한국항공우주연구원 Apparatus and method to measure diameter of structure
CN113624103A (en) * 2021-08-20 2021-11-09 中邮通建设咨询有限公司 Cable bending radius detection ruler
CN113720240A (en) * 2021-08-27 2021-11-30 中车青岛四方机车车辆股份有限公司 Rail vehicle axle measuring device and measuring method thereof
KR102677247B1 (en) * 2021-10-20 2024-06-21 인하대학교 산학협력단 Radius of curvature measuring device and method of measuring parental radius of curvature of off-axis parabolic surface using the same

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KR101287483B1 (en) * 2012-10-05 2013-08-21 황재은 Circle diameter measurement device

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KR101287483B1 (en) * 2012-10-05 2013-08-21 황재은 Circle diameter measurement device

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20180069595A (en) * 2016-12-15 2018-06-25 한국항공우주연구원 Apparatus and method to measure diameter of structure
KR101961992B1 (en) 2016-12-15 2019-07-17 한국항공우주연구원 Apparatus and method to measure diameter of structure
KR101726551B1 (en) 2016-12-16 2017-04-17 하주영 Apparatus and method for measuring radius of curvature for cable
CN113624103A (en) * 2021-08-20 2021-11-09 中邮通建设咨询有限公司 Cable bending radius detection ruler
CN113624103B (en) * 2021-08-20 2024-03-29 中邮通建设咨询有限公司 Cable bending radius detecting ruler
CN113720240A (en) * 2021-08-27 2021-11-30 中车青岛四方机车车辆股份有限公司 Rail vehicle axle measuring device and measuring method thereof
KR102677247B1 (en) * 2021-10-20 2024-06-21 인하대학교 산학협력단 Radius of curvature measuring device and method of measuring parental radius of curvature of off-axis parabolic surface using the same

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