KR100927964B1 - 플라스틱 기판의 제조방법 - Google Patents
플라스틱 기판의 제조방법 Download PDFInfo
- Publication number
- KR100927964B1 KR100927964B1 KR1020060138570A KR20060138570A KR100927964B1 KR 100927964 B1 KR100927964 B1 KR 100927964B1 KR 1020060138570 A KR1020060138570 A KR 1020060138570A KR 20060138570 A KR20060138570 A KR 20060138570A KR 100927964 B1 KR100927964 B1 KR 100927964B1
- Authority
- KR
- South Korea
- Prior art keywords
- film
- thin film
- inorganic
- nitrogen flow
- plastic substrate
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 51
- 229920003023 plastic Polymers 0.000 title claims abstract description 42
- 239000004033 plastic Substances 0.000 title claims abstract description 35
- 238000004519 manufacturing process Methods 0.000 title abstract description 9
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims abstract description 63
- 239000010408 film Substances 0.000 claims abstract description 56
- 239000010409 thin film Substances 0.000 claims abstract description 40
- 229910052757 nitrogen Inorganic materials 0.000 claims abstract description 31
- 238000000034 method Methods 0.000 claims abstract description 26
- 239000011248 coating agent Substances 0.000 claims abstract description 14
- 238000000576 coating method Methods 0.000 claims abstract description 13
- 238000000151 deposition Methods 0.000 claims abstract description 11
- 238000005229 chemical vapour deposition Methods 0.000 claims abstract description 9
- 239000012495 reaction gas Substances 0.000 claims abstract description 7
- 239000002243 precursor Substances 0.000 claims abstract description 6
- 239000004215 Carbon black (E152) Substances 0.000 claims abstract description 5
- 239000002131 composite material Substances 0.000 claims abstract description 5
- 229930195733 hydrocarbon Natural products 0.000 claims abstract description 5
- 150000002430 hydrocarbons Chemical class 0.000 claims abstract description 5
- -1 Transmittance Substances 0.000 claims abstract description 4
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 14
- UQEAIHBTYFGYIE-UHFFFAOYSA-N hexamethyldisiloxane Chemical group C[Si](C)(C)O[Si](C)(C)C UQEAIHBTYFGYIE-UHFFFAOYSA-N 0.000 claims description 12
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 11
- 239000001301 oxygen Substances 0.000 claims description 11
- 229910052760 oxygen Inorganic materials 0.000 claims description 11
- 239000004695 Polyether sulfone Substances 0.000 claims description 8
- 229920006393 polyether sulfone Polymers 0.000 claims description 8
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 claims description 7
- 229910052786 argon Inorganic materials 0.000 claims description 7
- 229910052751 metal Inorganic materials 0.000 claims description 6
- 239000002184 metal Substances 0.000 claims description 6
- 229910044991 metal oxide Inorganic materials 0.000 claims description 6
- 150000004706 metal oxides Chemical class 0.000 claims description 6
- 229920000139 polyethylene terephthalate Polymers 0.000 claims description 6
- 239000005020 polyethylene terephthalate Substances 0.000 claims description 6
- 239000004417 polycarbonate Substances 0.000 claims description 5
- 229920000515 polycarbonate Polymers 0.000 claims description 5
- 229920005989 resin Polymers 0.000 claims description 5
- 239000011347 resin Substances 0.000 claims description 5
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 claims description 4
- 229920000089 Cyclic olefin copolymer Polymers 0.000 claims description 4
- 239000004713 Cyclic olefin copolymer Substances 0.000 claims description 4
- GQPLMRYTRLFLPF-UHFFFAOYSA-N Nitrous Oxide Chemical compound [O-][N+]#N GQPLMRYTRLFLPF-UHFFFAOYSA-N 0.000 claims description 4
- IJOOHPMOJXWVHK-UHFFFAOYSA-N chlorotrimethylsilane Chemical compound C[Si](C)(C)Cl IJOOHPMOJXWVHK-UHFFFAOYSA-N 0.000 claims description 4
- FFUAGWLWBBFQJT-UHFFFAOYSA-N hexamethyldisilazane Chemical compound C[Si](C)(C)N[Si](C)(C)C FFUAGWLWBBFQJT-UHFFFAOYSA-N 0.000 claims description 4
- VXUYXOFXAQZZMF-UHFFFAOYSA-N titanium(IV) isopropoxide Chemical compound CC(C)O[Ti](OC(C)C)(OC(C)C)OC(C)C VXUYXOFXAQZZMF-UHFFFAOYSA-N 0.000 claims description 4
- 229920001230 polyarylate Polymers 0.000 claims description 3
- BGGIUGXMWNKMCP-UHFFFAOYSA-N 2-methylpropan-2-olate;zirconium(4+) Chemical compound CC(C)(C)O[Zr](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C BGGIUGXMWNKMCP-UHFFFAOYSA-N 0.000 claims description 2
- 239000004642 Polyimide Substances 0.000 claims description 2
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 claims description 2
- 229910021529 ammonia Inorganic materials 0.000 claims description 2
- YHWCPXVTRSHPNY-UHFFFAOYSA-N butan-1-olate;titanium(4+) Chemical compound [Ti+4].CCCC[O-].CCCC[O-].CCCC[O-].CCCC[O-] YHWCPXVTRSHPNY-UHFFFAOYSA-N 0.000 claims description 2
- QABCGOSYZHCPGN-UHFFFAOYSA-N chloro(dimethyl)silicon Chemical compound C[Si](C)Cl QABCGOSYZHCPGN-UHFFFAOYSA-N 0.000 claims description 2
- VSLPMIMVDUOYFW-UHFFFAOYSA-N dimethylazanide;tantalum(5+) Chemical compound [Ta+5].C[N-]C.C[N-]C.C[N-]C.C[N-]C.C[N-]C VSLPMIMVDUOYFW-UHFFFAOYSA-N 0.000 claims description 2
- LIKFHECYJZWXFJ-UHFFFAOYSA-N dimethyldichlorosilane Chemical compound C[Si](C)(Cl)Cl LIKFHECYJZWXFJ-UHFFFAOYSA-N 0.000 claims description 2
- 239000003822 epoxy resin Substances 0.000 claims description 2
- 150000002148 esters Chemical class 0.000 claims description 2
- 150000002739 metals Chemical class 0.000 claims description 2
- POPACFLNWGUDSR-UHFFFAOYSA-N methoxy(trimethyl)silane Chemical compound CO[Si](C)(C)C POPACFLNWGUDSR-UHFFFAOYSA-N 0.000 claims description 2
- 150000004767 nitrides Chemical class 0.000 claims description 2
- 239000001272 nitrous oxide Substances 0.000 claims description 2
- 229920000647 polyepoxide Polymers 0.000 claims description 2
- 229920001721 polyimide Polymers 0.000 claims description 2
- FDNAPBUWERUEDA-UHFFFAOYSA-N silicon tetrachloride Chemical compound Cl[Si](Cl)(Cl)Cl FDNAPBUWERUEDA-UHFFFAOYSA-N 0.000 claims description 2
- 229910052715 tantalum Inorganic materials 0.000 claims description 2
- HSXKFDGTKKAEHL-UHFFFAOYSA-N tantalum(v) ethoxide Chemical compound [Ta+5].CC[O-].CC[O-].CC[O-].CC[O-].CC[O-] HSXKFDGTKKAEHL-UHFFFAOYSA-N 0.000 claims description 2
- LFQCEHFDDXELDD-UHFFFAOYSA-N tetramethyl orthosilicate Chemical compound CO[Si](OC)(OC)OC LFQCEHFDDXELDD-UHFFFAOYSA-N 0.000 claims description 2
- CZDYPVPMEAXLPK-UHFFFAOYSA-N tetramethylsilane Chemical compound C[Si](C)(C)C CZDYPVPMEAXLPK-UHFFFAOYSA-N 0.000 claims description 2
- 229910052719 titanium Inorganic materials 0.000 claims description 2
- 239000010936 titanium Substances 0.000 claims description 2
- 239000005051 trimethylchlorosilane Substances 0.000 claims description 2
- AKQNYQDSIDKVJZ-UHFFFAOYSA-N triphenylsilane Chemical compound C1=CC=CC=C1[SiH](C=1C=CC=CC=1)C1=CC=CC=C1 AKQNYQDSIDKVJZ-UHFFFAOYSA-N 0.000 claims description 2
- 229910052726 zirconium Inorganic materials 0.000 claims description 2
- DUNKXUFBGCUVQW-UHFFFAOYSA-J zirconium tetrachloride Chemical compound Cl[Zr](Cl)(Cl)Cl DUNKXUFBGCUVQW-UHFFFAOYSA-J 0.000 claims description 2
- UIUXUFNYAYAMOE-UHFFFAOYSA-N methylsilane Chemical compound [SiH3]C UIUXUFNYAYAMOE-UHFFFAOYSA-N 0.000 claims 1
- 239000007789 gas Substances 0.000 abstract description 26
- 230000004888 barrier function Effects 0.000 abstract description 18
- 238000002834 transmittance Methods 0.000 abstract description 15
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract 1
- 239000010703 silicon Substances 0.000 abstract 1
- 239000010410 layer Substances 0.000 description 14
- 230000000052 comparative effect Effects 0.000 description 11
- 239000002585 base Substances 0.000 description 8
- 230000008021 deposition Effects 0.000 description 8
- 239000002985 plastic film Substances 0.000 description 8
- 229920006255 plastic film Polymers 0.000 description 8
- 239000011521 glass Substances 0.000 description 7
- 230000008859 change Effects 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- 229910052799 carbon Inorganic materials 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000004973 liquid crystal related substance Substances 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 239000011241 protective layer Substances 0.000 description 4
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 3
- 229910001882 dioxygen Inorganic materials 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 238000007740 vapor deposition Methods 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 230000003667 anti-reflective effect Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 229910052809 inorganic oxide Inorganic materials 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000012788 optical film Substances 0.000 description 2
- 230000035699 permeability Effects 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 229920001296 polysiloxane Polymers 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- 229920012266 Poly(ether sulfone) PES Polymers 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- 239000006087 Silane Coupling Agent Substances 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 239000011247 coating layer Substances 0.000 description 1
- 230000000593 degrading effect Effects 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 150000002576 ketones Chemical class 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 229920005992 thermoplastic resin Polymers 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 125000003866 trichloromethyl group Chemical group ClC(Cl)(Cl)* 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/18—Manufacture of films or sheets
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02263—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase
- H01L21/02271—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
- H01L21/02274—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition in the presence of a plasma [PECVD]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
- H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
- H01L21/28512—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
- H01L21/28556—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table by chemical means, e.g. CVD, LPCVD, PECVD, laser CVD
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Nonlinear Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Materials Engineering (AREA)
- Power Engineering (AREA)
- Inorganic Chemistry (AREA)
- Optics & Photonics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Plasma & Fusion (AREA)
- Health & Medical Sciences (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Chemical Vapour Deposition (AREA)
- Laminated Bodies (AREA)
- Liquid Crystal (AREA)
Abstract
Description
Claims (11)
- 탄화수소를 포함하는 복합 무기 전구체 및 반응가스를 플라즈마 화학증착법으로 투명 플라스틱 기재필름의 일면 또는 양면에 증착시켜 무기박막을 형성하는 단계를 포함하되,상기 단계는 플라즈마 챔버 내의 질소유량을 증가시키는 조건하에서 수행되는 것을 특징으로 하는 플라스틱 기판의 제조방법.
- 제1항에 있어서, 증가된 질소유량은 최대 500 sccm이고, 질소유량은 연속적으로 또는 불연속적으로 증가되는 것을 특징으로 하는 플라스틱 기판의 제조방법.
- 제1항에 있어서, 질소유량의 증가속도는 20~30 sccm/분인 것을 특징으로 하는 플라스틱 기판의 제조방법.
- 제1항에 있어서, 복합무기 전구체는 헥사메틸디실록산, 헥사메틸디실라잔, 테트라에톡시실란, 테트라메톡시실란, 메톡시트리메틸실란, 테트라메틸실란, 트리페닐실란, 테트라클로로실란, 트리클로로메틸실란, 트리메틸클로로실란, 디메틸디 클로로실란, 디메틸클로로실란, 펜타키스디메틸아미노 탄탈륨, 펜타에톡시 탄탈륨, 티타늄 아이소프로폭사이드, 티타늄 부톡사이드, 지르코늄 테트라클로라이드 및 지르코늄 테트라-tert-부톡사이드로 이루어진 그룹으로부터 선택된 하나 이상인 것을 특징으로 하는 플라스틱 기판의 제조방법.
- 제1항에 있어서, 반응 가스는 산소, 아산화질소 또는 암모니아를 포함하는 것을 특징으로 하는 플라스틱 기판의 제조방법.
- 제1항에 있어서, 플라스틱 기재필름은 폴리에틸렌테레프탈레이트, 폴리에테르술폰, 폴리카보네이트, 폴리이미드, 폴리아릴레이트, 사이클릭 올레핀 코폴리머, 에폭시 수지 또는 불포화 에스테르 수지로 형성된 것을 특징으로 하는 플라스틱 기판의 제조방법.
- 제1항에 있어서, 플라즈마 화학증착법은 전자 사이클로트론 공진 플라즈마 화학증착법을 이용하는 것을 특징으로 하는 플라스틱 기판의 제조방법.
- 제1항에 있어서, 무기박막은 Si, Ta, Ti 및 Zr로 이루어진 그룹에서 선택되는 1종 또는 2종 이상의 금속을 포함하는 금속산화물, 금속질산화물 또는 금속질화물인 것을 특징으로 하는 플라스틱 기판의 제조방법.
- 제1항에 있어서, 무기박막을 형성하는 단계 전에 투명 플라스틱 기재필름의 일면 또는 양면을 산소, 아르곤, 질소 플라즈마로 전처리하는 단계를 추가로 포함하는 것을 특징으로 하는 플라스틱 기판의 제조방법.
- 제1항에 있어서, 무기박막을 형성하는 단계 전에 투명 플라스틱 기재필름의 일면 또는 양면에 아크릴레이트계 수지로 코팅하는 단계를 추가로 포함하는 것을 특징으로 하는 플라스틱 기판의 제조방법.
- 제1항 내지 제10항 중 어느 한 항의 방법에 의해 제조된 플라스틱 기판.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020060138570A KR100927964B1 (ko) | 2006-12-29 | 2006-12-29 | 플라스틱 기판의 제조방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020060138570A KR100927964B1 (ko) | 2006-12-29 | 2006-12-29 | 플라스틱 기판의 제조방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20080062597A KR20080062597A (ko) | 2008-07-03 |
KR100927964B1 true KR100927964B1 (ko) | 2009-11-24 |
Family
ID=39814713
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020060138570A KR100927964B1 (ko) | 2006-12-29 | 2006-12-29 | 플라스틱 기판의 제조방법 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100927964B1 (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101040175B1 (ko) * | 2008-12-11 | 2011-06-16 | 한국전자통신연구원 | 연성 기판 및 그의 제조 방법 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20040078329A (ko) * | 2003-03-04 | 2004-09-10 | (주)아이컴포넌트 | 디스플레이 패널용 플라스틱 필름 및 그 제조방법 |
KR20040099599A (ko) * | 2003-05-19 | 2004-12-02 | (주)아이컴포넌트 | 디스플레이 패널용 플라스틱 필름의 제조방법 |
JP2005320583A (ja) | 2004-05-10 | 2005-11-17 | Konica Minolta Holdings Inc | ガスバリア性透明プラスチックフィルムとその製造方法および該ガスバリア性透明プラスチックフィルムを用いた有機el素子 |
KR20060071452A (ko) * | 2004-12-22 | 2006-06-27 | (주)아이컴포넌트 | 기체 투과 방지막을 구비한 디스플레이 패널용 플라스틱필름의 제조방법 |
-
2006
- 2006-12-29 KR KR1020060138570A patent/KR100927964B1/ko active IP Right Grant
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20040078329A (ko) * | 2003-03-04 | 2004-09-10 | (주)아이컴포넌트 | 디스플레이 패널용 플라스틱 필름 및 그 제조방법 |
KR20040099599A (ko) * | 2003-05-19 | 2004-12-02 | (주)아이컴포넌트 | 디스플레이 패널용 플라스틱 필름의 제조방법 |
JP2005320583A (ja) | 2004-05-10 | 2005-11-17 | Konica Minolta Holdings Inc | ガスバリア性透明プラスチックフィルムとその製造方法および該ガスバリア性透明プラスチックフィルムを用いた有機el素子 |
KR20060071452A (ko) * | 2004-12-22 | 2006-06-27 | (주)아이컴포넌트 | 기체 투과 방지막을 구비한 디스플레이 패널용 플라스틱필름의 제조방법 |
Also Published As
Publication number | Publication date |
---|---|
KR20080062597A (ko) | 2008-07-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI732242B (zh) | 蓋板透鏡膜及形成蓋板透鏡膜的方法 | |
JP5394867B2 (ja) | ガスバリア膜およびガスバリアフィルム | |
CA2587922C (en) | High integrity protective coatings | |
KR101013413B1 (ko) | 플라즈마 표면 처리를 이용한 투명 기체 차단 필름의 제조방법 및 이로부터 제조된 투명 기체 차단 필름 | |
US8227984B2 (en) | Barrier coatings | |
TWI486973B (zh) | 透明導電層壓薄膜、其製造方法以及包含該透明導電層壓薄膜的觸控螢幕 | |
KR102606648B1 (ko) | 폴더블 디스플레이들을 위한 플렉서블 다층 커버 렌즈 스택들 | |
US6838197B2 (en) | Silica layers and antireflection film using same | |
JP5245892B2 (ja) | 積層フィルム及びその製造方法 | |
TWI674192B (zh) | 硬塗層系統及用以於一連續卷對卷製程中製造一硬塗層系統之方法 | |
JP2010069675A (ja) | 機能性フィルム、その製造方法、積層体および電子デバイス | |
JP2005017544A (ja) | 反射防止フィルム、および画像表示装置 | |
JP3699877B2 (ja) | 積層フィルムの製造方法 | |
JP2004258394A (ja) | 光学機能性膜、反射防止フィルム、偏光板および表示装置 | |
KR100927964B1 (ko) | 플라스틱 기판의 제조방법 | |
JP3751922B2 (ja) | 反射防止フィルム、およびこれを用いたディスプレイ装置、液晶ディスプレイ装置 | |
JP4332310B2 (ja) | 酸化チタン層の製造方法、この方法により製造された酸化チタン層、及び酸化チタンを用いた反射防止フィルム | |
JP2004223769A (ja) | 透明積層フィルム、反射防止フィルム及びそれを用いた偏光板、液晶表示装置 | |
KR102680576B1 (ko) | 가요성 커버 렌즈용 다층 습식-건식 하드코트들 | |
JP2004255635A (ja) | 透明積層フィルム、反射防止フィルム及びそれを用いた偏光板、液晶表示装置 | |
WO2022181371A1 (ja) | 多層膜付透明基体及び画像表示装置 | |
WO2023121646A1 (en) | Improved adhesion layer in flexible coverlens | |
KR101894788B1 (ko) | 플렉시블 oled 기판용 투명 배리어 필름 제조방법 및 이로부터 제조된 투명 배리어 필름 | |
JP2002200692A (ja) | 酸化チタン層、およびこれを用いた反射防止フィルム | |
KR20240107376A (ko) | 가요성 커버 렌즈용 다층 습식-건식 하드코트들 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20120831 Year of fee payment: 4 |
|
FPAY | Annual fee payment |
Payment date: 20130830 Year of fee payment: 5 |
|
FPAY | Annual fee payment |
Payment date: 20140919 Year of fee payment: 6 |
|
FPAY | Annual fee payment |
Payment date: 20150903 Year of fee payment: 7 |
|
FPAY | Annual fee payment |
Payment date: 20160902 Year of fee payment: 8 |
|
FPAY | Annual fee payment |
Payment date: 20170905 Year of fee payment: 9 |