JPWO2013099729A1 - 情報記録媒体用ガラス基板の製造方法 - Google Patents
情報記録媒体用ガラス基板の製造方法 Download PDFInfo
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- 239000000758 substrate Substances 0.000 title claims abstract description 142
- 239000011521 glass Substances 0.000 title claims abstract description 141
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 24
- 238000004140 cleaning Methods 0.000 claims abstract description 102
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 29
- 238000005498 polishing Methods 0.000 claims abstract description 24
- 239000010453 quartz Substances 0.000 claims abstract description 24
- 239000011347 resin Substances 0.000 claims abstract description 24
- 229920005989 resin Polymers 0.000 claims abstract description 24
- 239000010935 stainless steel Substances 0.000 claims abstract description 24
- 229910001220 stainless steel Inorganic materials 0.000 claims abstract description 24
- 238000004506 ultrasonic cleaning Methods 0.000 claims abstract description 13
- 238000000034 method Methods 0.000 claims description 32
- 239000010410 layer Substances 0.000 description 37
- 230000007547 defect Effects 0.000 description 23
- 230000000052 comparative effect Effects 0.000 description 16
- 230000008569 process Effects 0.000 description 13
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- 239000011241 protective layer Substances 0.000 description 9
- 239000000463 material Substances 0.000 description 8
- 239000010408 film Substances 0.000 description 6
- 239000007788 liquid Substances 0.000 description 5
- 229910052804 chromium Inorganic materials 0.000 description 4
- 230000007246 mechanism Effects 0.000 description 4
- 238000007517 polishing process Methods 0.000 description 4
- 238000004544 sputter deposition Methods 0.000 description 4
- 229910000943 NiAl Inorganic materials 0.000 description 3
- NPXOKRUENSOPAO-UHFFFAOYSA-N Raney nickel Chemical compound [Al].[Ni] NPXOKRUENSOPAO-UHFFFAOYSA-N 0.000 description 3
- 239000006061 abrasive grain Substances 0.000 description 3
- 229910045601 alloy Inorganic materials 0.000 description 3
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- 238000003426 chemical strengthening reaction Methods 0.000 description 3
- 239000012535 impurity Substances 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 229910001149 41xx steel Inorganic materials 0.000 description 2
- 229910000599 Cr alloy Inorganic materials 0.000 description 2
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 229910000420 cerium oxide Inorganic materials 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 239000008119 colloidal silica Substances 0.000 description 2
- 239000010432 diamond Substances 0.000 description 2
- 229910003460 diamond Inorganic materials 0.000 description 2
- 238000007772 electroless plating Methods 0.000 description 2
- 239000000314 lubricant Substances 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 description 2
- 239000010702 perfluoropolyether Substances 0.000 description 2
- 239000004800 polyvinyl chloride Substances 0.000 description 2
- FGIUAXJPYTZDNR-UHFFFAOYSA-N potassium nitrate Chemical compound [K+].[O-][N+]([O-])=O FGIUAXJPYTZDNR-UHFFFAOYSA-N 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 229910001415 sodium ion Inorganic materials 0.000 description 2
- VWDWKYIASSYTQR-UHFFFAOYSA-N sodium nitrate Chemical compound [Na+].[O-][N+]([O-])=O VWDWKYIASSYTQR-UHFFFAOYSA-N 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 238000005406 washing Methods 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910019222 CoCrPt Inorganic materials 0.000 description 1
- 229910005335 FePt Inorganic materials 0.000 description 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 1
- HBBGRARXTFLTSG-UHFFFAOYSA-N Lithium ion Chemical compound [Li+] HBBGRARXTFLTSG-UHFFFAOYSA-N 0.000 description 1
- 239000004743 Polypropylene Substances 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- FKNQFGJONOIPTF-UHFFFAOYSA-N Sodium cation Chemical compound [Na+] FKNQFGJONOIPTF-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- 239000005456 alcohol based solvent Substances 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000005354 aluminosilicate glass Substances 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 150000001721 carbon Chemical class 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 230000003749 cleanliness Effects 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 239000003599 detergent Substances 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000007865 diluting Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- 239000005357 flat glass Substances 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000011086 high cleaning Methods 0.000 description 1
- 229910000040 hydrogen fluoride Inorganic materials 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 229910001416 lithium ion Inorganic materials 0.000 description 1
- 230000001050 lubricating effect Effects 0.000 description 1
- 239000010687 lubricating oil Substances 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 239000006249 magnetic particle Substances 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000006060 molten glass Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000379 polypropylene carbonate Polymers 0.000 description 1
- -1 polytetrafluoroethylene Polymers 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 229910001414 potassium ion Inorganic materials 0.000 description 1
- 235000010333 potassium nitrate Nutrition 0.000 description 1
- 239000004323 potassium nitrate Substances 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000003014 reinforcing effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 235000010344 sodium nitrate Nutrition 0.000 description 1
- 239000004317 sodium nitrate Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/10—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
- B08B3/12—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration by sonic or ultrasonic vibrations
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/08—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for double side lapping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B9/00—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor
- B24B9/02—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground
- B24B9/06—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain
- B24B9/065—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain of thin, brittle parts, e.g. semiconductors, wafers
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C23/00—Other surface treatment of glass not in the form of fibres or filaments
- C03C23/0075—Cleaning of glass
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/84—Processes or apparatus specially adapted for manufacturing record carriers
- G11B5/8404—Processes or apparatus specially adapted for manufacturing record carriers manufacturing base layers
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Inorganic Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Ceramic Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
- Cleaning In General (AREA)
- Cleaning By Liquid Or Steam (AREA)
Abstract
Description
図1および図2を参照して、情報記録媒体用ガラス基板1Gおよび情報記録媒体1の構成について説明する。図1は、情報記録媒体用ガラス基板1Gの斜視図、図2は、情報記録媒体の斜視図である。
次に、図3を参照して、本実施の形態に係るガラス基板1Gおよび情報記録媒体1の製造方法を説明する。図3は、ガラス基板1Gおよび情報記録媒体1の製造方法を示すフロー図である。
以下、上述した最終洗浄工程(S19)の具体的な実施形態について説明する。最終洗浄工程(S19)は、槽内面(洗浄液と接する面)がステンレスまたは樹脂からなる第1槽の中でガラス基板の洗浄を行なう工程と、槽内面が石英からなる第2槽の中でガラス基板の洗浄を行なう工程とを含む。第1槽は複数設けられており、ガラス基板は、複数の第1槽の各々において洗浄される。第2槽は、複数設けられていてもよいし、1つであってもよい。
以下、上述した最終洗浄工程(S19)の具体的な洗浄工程を、実施例および比較例として説明する。
Claims (5)
- 情報記録媒体用ガラス基板の製造方法であって、
ガラス基板の研磨を行なう工程と、
前記ガラス基板の研磨を行なった後に、前記ガラス基板の洗浄を行なう工程とを備え、
前記ガラス基板の洗浄を行なう工程は、
槽内面がステンレスまたは樹脂からなる複数の第1槽の中で前記ガラス基板の洗浄を各々行なう工程と、
槽内面が石英からなる第2槽の中で前記ガラス基板の洗浄を行なう工程とを含み、
前記複数の第1槽の中で前記ガラス基板の洗浄を各々行なう工程は、少なくとも1回の超音波洗浄を含み、
前記第2槽の中で前記ガラス基板の洗浄を行なう工程は、前記複数の第1槽の中で前記ガラス基板の洗浄を各々行なう工程が完了した後に行なわれる、情報記録媒体用ガラス基板の製造方法。 - 前記ガラス基板の洗浄を行なう工程は、前記第2槽の中で前記ガラス基板の洗浄を行なう工程を行なう前に、前記ガラス基板に対してスクラブ洗浄を行なう工程を含む、請求項1に記載の情報記録媒体用ガラス基板の製造方法。
- 前記第2槽の中で前記ガラス基板の洗浄を行なう工程は、900kHz以上の周波数の超音波を前記ガラス基板に印加することを含む、請求項1または請求項2に記載の情報記録媒体用ガラス基板の製造方法。
- 前記複数の第1槽の中で前記ガラス基板の洗浄を各々行なう工程は、78kHz以上500kHz以下の周波数の超音波を前記ガラス基板に印加することを含む、請求項1から請求項3のいずれかに記載の情報記録媒体用ガラス基板の製造方法。
- 前記第2槽の中で前記ガラス基板の洗浄を行なう工程は、第1周波数の超音波を前記ガラス基板に印加することを含み、
前記複数の第1槽の中で前記ガラス基板の洗浄を各々行なう工程は、前記第1周波数よりも小さい第2周波数の超音波を前記ガラス基板に印加することを含む、請求項1から請求項4のいずれかに記載の情報記録媒体用ガラス基板の製造方法。
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JP2011289079 | 2011-12-28 | ||
JP2011289079 | 2011-12-28 | ||
PCT/JP2012/082897 WO2013099729A1 (ja) | 2011-12-28 | 2012-12-19 | 情報記録媒体用ガラス基板の製造方法 |
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JPWO2013099729A1 true JPWO2013099729A1 (ja) | 2015-05-07 |
JP6105488B2 JP6105488B2 (ja) | 2017-03-29 |
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JP (1) | JP6105488B2 (ja) |
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CN104616672B (zh) * | 2015-01-22 | 2017-08-11 | 上海光和光学制造股份有限公司 | 一种玻璃母盘基片的制造工艺 |
CN106269692A (zh) * | 2016-08-19 | 2017-01-04 | 湖北仁齐科技有限公司 | 一种cnc玻璃盖板的清洗方法 |
CN107096782A (zh) * | 2017-05-20 | 2017-08-29 | 合肥市惠科精密模具有限公司 | 一种MicroLED玻璃基板超声波清洗方法 |
Citations (4)
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JP2001098298A (ja) * | 1999-09-27 | 2001-04-10 | Hitachi Plant Eng & Constr Co Ltd | アルミノシリケートガラス基板又はセラミックガラス基板の洗浄液及び洗浄方法 |
JP2004335081A (ja) * | 2003-04-18 | 2004-11-25 | Hoya Corp | 磁気ディスク用ガラス基板の洗浄方法及び磁気ディスク用ガラス基板の製造方法並びに磁気ディスクの製造方法 |
JP2008043842A (ja) * | 2006-08-11 | 2008-02-28 | Kaijo Corp | 超音波洗浄装置 |
JP2008243342A (ja) * | 2007-03-29 | 2008-10-09 | Hoya Corp | 磁気ディスク用ガラス基板の超音波洗浄装置および超音波洗浄方法、磁気ディスク製造方法ならびに磁気ディスク |
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JP2005108306A (ja) * | 2003-09-29 | 2005-04-21 | Hoya Corp | 磁気ディスク用ガラス基板の化学強化処理方法、磁気ディスク用化学強化ガラス基板の製造方法及び磁気ディスクの製造方法 |
CN101356134B (zh) * | 2006-03-24 | 2011-12-07 | Hoya株式会社 | 磁盘用玻璃衬底的制造方法以及磁盘的制造方法 |
CN102473423B (zh) * | 2010-03-31 | 2016-03-30 | Hoya株式会社 | 磁盘用玻璃基板的制造方法 |
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2001098298A (ja) * | 1999-09-27 | 2001-04-10 | Hitachi Plant Eng & Constr Co Ltd | アルミノシリケートガラス基板又はセラミックガラス基板の洗浄液及び洗浄方法 |
JP2004335081A (ja) * | 2003-04-18 | 2004-11-25 | Hoya Corp | 磁気ディスク用ガラス基板の洗浄方法及び磁気ディスク用ガラス基板の製造方法並びに磁気ディスクの製造方法 |
JP2008043842A (ja) * | 2006-08-11 | 2008-02-28 | Kaijo Corp | 超音波洗浄装置 |
JP2008243342A (ja) * | 2007-03-29 | 2008-10-09 | Hoya Corp | 磁気ディスク用ガラス基板の超音波洗浄装置および超音波洗浄方法、磁気ディスク製造方法ならびに磁気ディスク |
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CN104160444A (zh) | 2014-11-19 |
JP6105488B2 (ja) | 2017-03-29 |
WO2013099729A1 (ja) | 2013-07-04 |
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