JPS6418261A - Multigate-type metal insulator semiconductor device - Google Patents

Multigate-type metal insulator semiconductor device

Info

Publication number
JPS6418261A
JPS6418261A JP17515087A JP17515087A JPS6418261A JP S6418261 A JPS6418261 A JP S6418261A JP 17515087 A JP17515087 A JP 17515087A JP 17515087 A JP17515087 A JP 17515087A JP S6418261 A JPS6418261 A JP S6418261A
Authority
JP
Japan
Prior art keywords
layer insulation
films
insulation films
gate insulating
film thicknesses
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17515087A
Other languages
Japanese (ja)
Inventor
Tadashi Horii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP17515087A priority Critical patent/JPS6418261A/en
Publication of JPS6418261A publication Critical patent/JPS6418261A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To satisfy the requirement for incocsistent characteristics of the second gate electrodes and layer insulation films simultaneously by setting up separately film thicknesses of both layer insulation films and gate insulating films located at lower layers of the second gate electrodes. CONSTITUTION:Film thicknesses between layer insulation films 5 end the first gate electrodes 3 located at lower layers of the second gate electrodes 4 and those of the second gate insulating film 6 located at the second gate region of a semiconductor substrate 1 are separately established. In other words, respective film thicknesses of the layer insulation films end the second gate insulating films are individually controlled by forming individually the layer insulation films 5 and a part of the second gate insulating films 6 at least which have been formed so far simultaneously with the formation of the first gate electrodes 3. Then the film thicknesses of layer insulation films 5 are established to values that satisfy the requirement for the layer insulation films 5 without being restricted by the film thicknesses of the second gate insulating films 6. Thus the resultant set values satisfy the requirement for characteristics of the second gate insulating films and layer insulation films simultaneously.
JP17515087A 1987-07-14 1987-07-14 Multigate-type metal insulator semiconductor device Pending JPS6418261A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17515087A JPS6418261A (en) 1987-07-14 1987-07-14 Multigate-type metal insulator semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17515087A JPS6418261A (en) 1987-07-14 1987-07-14 Multigate-type metal insulator semiconductor device

Publications (1)

Publication Number Publication Date
JPS6418261A true JPS6418261A (en) 1989-01-23

Family

ID=15991146

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17515087A Pending JPS6418261A (en) 1987-07-14 1987-07-14 Multigate-type metal insulator semiconductor device

Country Status (1)

Country Link
JP (1) JPS6418261A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0705846A1 (en) 1994-10-04 1996-04-10 Immuno Ag High molecular weight and low molecular weight fractions of von Willebrand factor
US6791156B2 (en) 2001-10-26 2004-09-14 Denso Corporation Semiconductor device and method for manufacturing it

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0705846A1 (en) 1994-10-04 1996-04-10 Immuno Ag High molecular weight and low molecular weight fractions of von Willebrand factor
US6791156B2 (en) 2001-10-26 2004-09-14 Denso Corporation Semiconductor device and method for manufacturing it

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