JPS6329261Y2 - - Google Patents
Info
- Publication number
- JPS6329261Y2 JPS6329261Y2 JP13236087U JP13236087U JPS6329261Y2 JP S6329261 Y2 JPS6329261 Y2 JP S6329261Y2 JP 13236087 U JP13236087 U JP 13236087U JP 13236087 U JP13236087 U JP 13236087U JP S6329261 Y2 JPS6329261 Y2 JP S6329261Y2
- Authority
- JP
- Japan
- Prior art keywords
- prober
- automatic
- circuit
- connector
- points
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 21
- 238000005259 measurement Methods 0.000 claims description 9
- 238000000034 method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Description
【考案の詳細な説明】
本考案は多種小ロツトのプリント板の回路のイ
ンピーダンステストに適したインサーキツトテス
ト装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an in-circuit test device suitable for impedance testing of printed circuit board circuits produced in small lots of various types.
従来、プリント板の製造試験工程等において、
インサーキツトテスト装置による測定は回路の被
測定点間のインピーダンスを自動走査で切換える
ことにより行なわれる。第１図はその１例を示す
ものである。すなわち、被試験プリント板１に回
路７に接続された複数個の接触点８を設けてお
く。一方、この接触点８に対応するピン６を下面
に設け、リード線によりコネクタ端子に取出すよ
うにしたフイクスチヤ２を用意し、これを被試験
プリント板１上に合せて、ピン６を接触点８に接
触させて試験を行なう。コネクタ３からのリード
線はスキヤナ４に接続され、中央処理装置
（CPU）１０のプログラムで自動走査され、順次
リード線間が選択されて試験機５でインピーダン
ス測定が行なわれ、その結果の良否がCPU１０
のデータと比較され、良ならば先に進められ不良
ならば不良結果を通知する。 Traditionally, in the manufacturing test process of printed circuit boards, etc.
Measurements by in-circuit test equipment are performed by automatically scanning and switching the impedance between the points to be measured on the circuit. FIG. 1 shows one example. That is, a plurality of contact points 8 connected to the circuit 7 are provided on the printed board 1 under test. On the other hand, a fixture 2 is prepared in which a pin 6 corresponding to this contact point 8 is provided on the bottom surface and can be taken out to a connector terminal by a lead wire. Test by contacting with. The lead wires from the connector 3 are connected to the scanner 4, and are automatically scanned by a program in the central processing unit (CPU) 10. The lead wires are sequentially selected and the impedance is measured by the tester 5, and the results are checked. CPU10
If the data is good, the process is advanced, and if it is bad, a bad result is notified.
この方法は少種大ロツトのプリント板には極め
て有効であり、測定時間が短いという長所がある
が、プリント板の種類毎にフイクスチヤを作成し
なければならないから、多種小ロツトの場合には
試験費用が著しく嵩むという欠点がある。 This method is extremely effective for large lots of printed boards with a small number of different types, and has the advantage of short measurement time. However, since a fixture must be created for each type of printed board, it is difficult to test in the case of small lots of many different types. The disadvantage is that the cost increases significantly.
本考案の目的は多種小ロツトのプリント板の回
路のインピーダンス測定に適したインサーキツト
テスト装置を提供することである。 The object of the present invention is to provide an in-circuit test device suitable for measuring the impedance of circuits of printed circuit boards of various types and small lots.
前記目的を達成するため、本考案のインサーキ
ツトテスト装置は被試験プリント板回路の被測定
点間を自動走査してインピーダンスを測定するイ
ンサーキツトテスト装置において、
該プリント板上方に配線上の接触点に対し選択
的に位置が設定できる複数の自動プローバを有す
るプローバ駆動テーブルと、測定時プリント板の
テストの必要な箇所全てにプローバ駆動テーブル
の自動プローバを予め移動させて接触させるプロ
ーバ制御部と、プリント板のコネクタ端子を自動
走査するスキヤナと、該スキヤナによつて組合わ
された自動プローバとコネクタを用いて測定を行
なう試験機を具備することを特徴とするものであ
る。 In order to achieve the above object, the in-circuit test device of the present invention is an in-circuit test device that measures impedance by automatically scanning between measurement points of a printed circuit board under test. a prober drive table having a plurality of automatic probers whose positions can be selectively set relative to the position of the prober; The present invention is characterized by comprising a scanner that automatically scans connector terminals on a printed circuit board, and a testing machine that performs measurements using an automatic prober and connector combined with the scanner.
以下本考案を実施例につき詳述する。 The present invention will be described in detail below with reference to examples.
第２図は本考案の実施例の構成を示す説明図で
ある。。 FIG. 2 is an explanatory diagram showing the configuration of an embodiment of the present invention. .
本考案は第１図のフイクスチヤの代りに所定範
囲の接触点を選択的にXY方向に可変設定しうる
自動プローバ１２1〜１２3を設けたプローバ駆動
テーブル１１をプリント板１の上方にセツト自在
に設ける。 In the present invention, instead of the fixture shown in FIG. 1, a prober drive table 11 equipped with automatic probers 12 1 to 12 3 that can selectively and variably set contact points in a predetermined range in the X and Y directions can be freely set above the printed board 1. Provided for.
この自動プローバ１２1〜１２3はプリント板１
にセツトする前に、プリント板１の種類による
CPU１０のプログラムに基づきプローバ制御部
１４により所定の位置設定が行なわれる。一方プ
リント板１のコネクタ端子をコネクタ１５に接続
し、このコネクタ１５からのリード線をスキヤナ
４に入れ、このリード線間でCPU１０のプログ
ラムに基づき自動走査が行なわれる。そして自動
プローバ１２1〜１２3から取出したリード線１３
１〜１３3を試験機５に入れ、これらのリード線１
３1〜１３3およびコネクタ１５のリード線の中か
らプログラムに従い選択された任意の数箇所間で
インピーダンスの測定が行なわれる。 These automatic probers 12 1 to 12 3 are printed board 1
Depending on the type of printed board 1,
A predetermined position setting is performed by the prober control section 14 based on the program of the CPU 10. On the other hand, the connector terminal of the printed circuit board 1 is connected to the connector 15, the lead wire from the connector 15 is put into the scanner 4, and automatic scanning is performed between the lead wires based on the program of the CPU 10. And the lead wires 13 taken out from the automatic probers 12 1 to 12 3
1 to 13 3 into the testing machine 5, and these lead wires 1
The impedance is measured between any number of points selected from among the leads 3 1 to 13 3 and the lead wires of the connector 15 according to the program.
このような構成で、各種のプリント板をテスト
する場合、まずプリント板の種類に応じ、プロー
バ制御部１４で自動プローバ１２1〜１２3の位置
設定を行なつた後、プリント板１にセツトして測
定に入る。スキヤナ４によりコネクタ１５の端子
を切換え、試験機５において切換えられたコネク
タのリード線と自動プローバのリード線１３1〜
１３3とをプログラムに従い組合せ、試験機５に
よりインピーダンステストが行なわれる。その結
果をCPU１０で判定することは第１図と同様で
ある。なお自動プローバの数は３個に限定されな
い。 When testing various printed boards with this configuration, first set the positions of the automatic probers 12 1 to 12 3 using the prober control unit 14 according to the type of printed board, and then set them on the printed board 1. and start measurement. The terminals of the connector 15 are switched by the scanner 4, and the lead wires of the switched connector and the lead wires of the automatic prober 13 1 -
13 and 3 are combined according to the program, and an impedance test is performed by the tester 5. The determination of the result by the CPU 10 is the same as in FIG. Note that the number of automatic probers is not limited to three.
この自動プローバの数を多くすれば、プリント
板試験単位における可変位置の設定回数を減少し
測定時間を短縮することができる。 By increasing the number of automatic probers, it is possible to reduce the number of times variable positions are set in each printed board test unit and to shorten measurement time.
以上説明したように、本考案によれば、接触点
の１部をコネクタに分担させることにより、位置
可変の自動プローバ数個で第１図のフイクスチヤ
と等価の機能を十分もたせることができる。かつ
これらの自動プローバの位置を可変設定すること
により、各種のプリント板に適合させることがで
きる。測定時間はフイクスチヤ方式に比べ若干長
くなるがテストに要する費用は格段に少なくて済
むことが大きな利点である。 As explained above, according to the present invention, by assigning some of the contact points to the connector, it is possible to sufficiently provide the same function as the fixture shown in FIG. 1 with several variable-position automatic probers. Moreover, by variably setting the positions of these automatic probers, it is possible to adapt to various printed boards. Although the measurement time is slightly longer than that of the fixture method, the major advantage is that the cost required for testing is much lower.
第１図は従来例の説明図、第２図は本考案の実
施例の構成を示す説明図であり、図中、１はプリ
ント板、４はスキヤナ、５は試験機、７は回路、
８は接触点、１０はCPU、１１はプローバ駆動
テーブル、１２1〜１２3は自動プローバ、１３1
〜１３3は同リード線、１４はプローバ制御部、
１５はコネクタを示す。
FIG. 1 is an explanatory diagram of a conventional example, and FIG. 2 is an explanatory diagram showing the configuration of an embodiment of the present invention, in which 1 is a printed board, 4 is a scanner, 5 is a testing machine, 7 is a circuit,
8 is a contact point, 10 is a CPU, 11 is a prober drive table, 12 1 to 12 3 are automatic probers, 13 1
~13 3 is the same lead wire, 14 is the prober control unit,
15 indicates a connector.
Claims (1)
査してインピーダンスを測定するインサーキツト
テスト装置において、 該プリント板上方に配線上の接触点に対し選択
的に位置が設定できる複数の自動プローバ１２を
有するプローバ駆動テーブル１１と、 測定時プリント板のテストの必要な箇所全てに
プローバ駆動テーブルの自動プローバを予め移動
させて接触させるプローバ制御部１４と、 プリント板のコネクタ端子を自動走査するスキ
ヤナ４と、 該スキヤナによつて組合わされた自動プローバ
とコネクタを用いて測定を行なう試験機５を具備
することを特徴とするインサーキツトテスト装
置。[Scope of Claim for Utility Model Registration] In an in-circuit test device that measures impedance by automatically scanning between the points to be measured on a printed circuit board under test 1, the circuit is selectively located above the printed board with respect to the contact points on the wiring. a prober drive table 11 that has a plurality of automatic probers 12 that can be set; a prober control unit 14 that moves the automatic prober of the prober drive table in advance to contact all the points that need to be tested on the printed board during measurement; An in-circuit test device comprising a scanner 4 that automatically scans connector terminals, and a tester 5 that performs measurements using an automatic prober and connector combined by the scanner.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13236087U JPS6329261Y2 (en) | 1987-08-31 | 1987-08-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13236087U JPS6329261Y2 (en) | 1987-08-31 | 1987-08-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6350077U JPS6350077U (en) | 1988-04-05 |
| JPS6329261Y2 true JPS6329261Y2 (en) | 1988-08-05 |
Family
ID=31031674
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13236087U Expired JPS6329261Y2 (en) | 1987-08-31 | 1987-08-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6329261Y2 (en) |
-
1987
- 1987-08-31 JP JP13236087U patent/JPS6329261Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6350077U (en) | 1988-04-05 |
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