JPS62139050A - Instruction test system by control of maintenance and diagnosis processor - Google Patents

Instruction test system by control of maintenance and diagnosis processor

Info

Publication number
JPS62139050A
JPS62139050A JP60280649A JP28064985A JPS62139050A JP S62139050 A JPS62139050 A JP S62139050A JP 60280649 A JP60280649 A JP 60280649A JP 28064985 A JP28064985 A JP 28064985A JP S62139050 A JPS62139050 A JP S62139050A
Authority
JP
Japan
Prior art keywords
test
instruction
processing unit
maintenance
result
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60280649A
Other languages
Japanese (ja)
Inventor
Mamoru Ishibashi
石橋 守
Kiyoaki Takahashi
高橋 清昭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
NEC Solution Innovators Ltd
Original Assignee
NEC Corp
NEC Software Hokuriku Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, NEC Software Hokuriku Ltd filed Critical NEC Corp
Priority to JP60280649A priority Critical patent/JPS62139050A/en
Publication of JPS62139050A publication Critical patent/JPS62139050A/en
Pending legal-status Critical Current

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  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To set the test environment and to check the test result through a maintenance/diagnosis processor by providing a check means to check the result of execution of a function evaluating program and using a central processing unit to execute only the test of an instruction. CONSTITUTION:When a user gives a request to a maintenance/diagnosis processor 2 to store a function evaluating program of a central processing unit 12 to a main memory 11, the processor 2 stores said evaluating program into the memory 11 via an auxiliary memory device (not shown here) of the processor 2 via a storing means 22. Then the evaluation program stored in the memory 11 is started by a start means 23 and the unit 12 executes an instruction test and stores the result of this test in the memory 11. A monitor means 24 for end of the test reads the contents of an instruction counter of the unit 12 and checks the end of the test. When the end of the test is checked, a check means 21 for result of execution checks the result of execution of the test stored in the memory 11.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は情報処理装置の命令試験方式に関し、特に主記
憶装置とこの主記憶装置に接続される中央処理装置とが
保守診断インタフェースを介して保守診断処理装置に接
続された情報処理システムの命令試験方式に関する。
[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to an instruction testing method for an information processing device, and in particular, the present invention relates to an instruction testing method for an information processing device, and in particular, a method for testing instructions between a main storage device and a central processing unit connected to the main storage device via a maintenance diagnosis interface. The present invention relates to an instruction test method for an information processing system connected to a maintenance diagnosis processing device.

(従来の技術〕 従来、この種の情報処理装置の命令試験方式は、試験命
令の実行の他、試験環境の設定および試験結果のチェッ
ク等も試験対象装置である中央処理装置上で実行させる
方式となっていた。
(Prior Art) Conventionally, the command test method for this type of information processing device is a method in which, in addition to executing test commands, setting the test environment and checking the test results are also executed on the central processing unit that is the device under test. It became.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上述した従来の命令試験方式は、中央処理装置の命令試
験を行うときに試験環境の設定および試験結果のチェッ
ク等も試験対象装置である中央処理装置上で実行してい
るので、中央処理装置の命令試験実行部以外で障害のあ
る命令を使用する可能性があり、このような場合には試
験環境の設定部、試験結果のチェック部および命令試験
実行部の何れで障害が発生したのかを判断するのに多く
の時間を要し、中央処理装置の機能評価期間が長くなっ
てしまうという欠点がある。
In the conventional instruction testing method described above, when performing an instruction test of a central processing unit, the test environment setting and test result check are also executed on the central processing unit, which is the device under test. There is a possibility that the faulty instruction is used in a part other than the instruction test execution part, and in such a case, it is necessary to determine whether the fault occurred in the test environment setting part, the test result checking part, or the instruction test execution part. This method has the disadvantage that it takes a lot of time to perform the evaluation, and the period for evaluating the functions of the central processing unit becomes long.

本発明の目的は、上述の点に鑑み、命令試験の実行のみ
を試験対象装置である中央処理装置上で行い、試験環境
の設定、試験結果のチェック等を保守診断処理装置に行
わせるようにした保守診断処理装置管理による命令試験
方式を提供することにある。
In view of the above-mentioned points, an object of the present invention is to perform only the instruction test on the central processing unit that is the device to be tested, and have the maintenance diagnosis processing device perform the setting of the test environment, checking the test results, etc. The purpose of the present invention is to provide a command test method based on maintenance diagnosis processing equipment management.

〔問題点を解決するための手段〕[Means for solving problems]

本発明の保守診断処理装置管理による命令試験方式は、
主記憶装置とこの主記憶装置に接続される中央処理装置
とが保守診断インタフェースを介して保守診断処理装置
に接続された情報処理システムの命令試験方式において
、前記保守診断処理装置が、前記中央処理装置の命令試
験を実行しこの命令試験の結果を前記主記憶装置上に格
納する機能を持った前記中央処理装置のための機能評価
プログラムを前記主記憶装置上に格納する格納手段と、
前記機能評価プログラムに起動をかけて実行させる起動
手段と、+iiJ記機能評価プログラムの実行終了を監
視する監視手段と、前記機能評価プログラムの実行結果
をチェックするチェック手段とを含む。
The command test method using the maintenance diagnosis processing device management of the present invention is as follows:
In an instruction test method of an information processing system in which a main storage device and a central processing unit connected to the main storage device are connected to the maintenance diagnosis processing device via a maintenance diagnosis interface, the maintenance diagnosis processing device storage means for storing a function evaluation program for the central processing unit on the main storage device, which has a function of executing an instruction test of the device and storing the result of the instruction test on the main storage device;
The functional evaluation program includes a starting means for starting and executing the functional evaluation program, a monitoring means for monitoring the completion of execution of the functional evaluation program described in +iiJ, and a checking means for checking the execution result of the functional evaluation program.

〔実施例〕〔Example〕

次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明の一実施例の保守診断処理!la置装理
による命令試験方式が適用された情報処理システムの構
成図である。
FIG. 1 shows maintenance diagnosis processing according to an embodiment of the present invention! 1 is a configuration diagram of an information processing system to which an instruction test method using an LA device is applied; FIG.

この情報処理システムにおいては、主記憶装置11およ
びこれに接続される中央処理装置12を備えた情報処理
装置lと、中央処理装置■2の機能評価プログラムを主
記憶装置11に格納する格納手段22、格納された機能
評価プログラムに起動をかける起動手段23、命令試験
の実行終了を監視する監視手段24および実行結果をチ
ェックするチェック手段21を備えた保守診断処理装置
2とが保守診断インタフェース3を介して接続されてい
る。
This information processing system includes an information processing device 1 that includes a main storage device 11 and a central processing unit 12 connected thereto, and a storage unit 22 that stores a function evaluation program for the central processing device 2 in the main storage device 11. , a maintenance diagnosis processing device 2 equipped with a starting means 23 for starting a stored function evaluation program, a monitoring means 24 for monitoring the completion of execution of an instruction test, and a checking means 21 for checking the execution result, and a maintenance diagnosis interface 3. connected via.

第2図を参照すると、保守診断処理装置2における処理
は、機能評価プログラムの格納ステップ41 @能評価
プログラムの起動ステップ42、試験終了の監視ステッ
プ43および試験結果のチェ7クステツプ44からなる
Referring to FIG. 2, the processing in the maintenance diagnosis processing device 2 consists of a function evaluation program storage step 41, a function evaluation program activation step 42, a test completion monitoring step 43, and a test result check step 44.

次に、このように構成された本実施例の保守診断処理装
置管理による命令試験方式の動作について説明する。
Next, the operation of the instruction testing method using the maintenance/diagnosis processing device management of the present embodiment configured as described above will be explained.

まず、使用者が保守診断処理装置2に対して中央処理装
置12の機能評価プログラムの主記憶装置11への格納
要求を入力すると、保守診断処理装置2は格納要求に基
づいてステップ41で機能評価プログラムの格納手段2
2により機能評価プログラムを保守診断処理装置2の有
する補助記憶装置(図示せず)から保守診断インタフェ
ース3を介して主記憶装置11に格納する。次に、ステ
ップ42で機能評価プログラムの起動手段23により保
守診断インタフェース3を介して主記憶装置11上に格
納された機能評価プログラムが起動され、中央処理装置
12は命令試験を実行して命令試験の結果を主記憶装置
ll上に格納する。続いて、ステップ43で試験終了の
監視手段24により保守診断インタフェース3を介して
中央処理装置12の命令カウンタの内容を読み取り、試
験の終了をチェックする。試験の終了がチェックされる
と、ステップ44で試験の実行結果のチェック手段21
によって保守診断インクフェース3を介して主記憶装置
11上に格納された試験の実行結果をチェックする。使
用者は、保守診断処理装置2の有する表示装置(図示せ
ず)に主記憶装置11上に格納されている命令試験の実
行結果を出力し、確認することができる。
First, when the user inputs a request to the maintenance diagnosis processing device 2 to store the function evaluation program of the central processing unit 12 in the main storage device 11, the maintenance diagnosis processing device 2 performs a function evaluation program in step 41 based on the storage request. Program storage means 2
2, the function evaluation program is stored in the main storage device 11 from the auxiliary storage device (not shown) included in the maintenance diagnosis processing device 2 via the maintenance diagnosis interface 3. Next, in step 42, the function evaluation program starting means 23 starts the function evaluation program stored in the main storage device 11 via the maintenance diagnosis interface 3, and the central processing unit 12 executes an instruction test. The result is stored on the main memory ll. Subsequently, in step 43, the test end monitoring means 24 reads the contents of the instruction counter of the central processing unit 12 via the maintenance diagnosis interface 3 to check whether the test has ended. When the completion of the test is checked, in step 44, the test execution result checking means 21
The test execution results stored in the main storage device 11 via the maintenance diagnosis interface 3 are checked. The user can output and check the execution results of the command tests stored in the main storage device 11 on a display device (not shown) included in the maintenance diagnosis processing device 2.

上述の説明から判るように、中央処理装置12の命令試
験が保守診断処理装置2の管理のもとに行われる。
As can be seen from the above description, command testing of the central processing unit 12 is performed under the control of the maintenance diagnostic processing unit 2.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、中央処理装置の機能評価
プログラムを主記憶装置に格納する格納手段、機能評価
プログラムを起動する起動手段、試験の実行終了を監視
する監視手段および試験の実行結果をチェックするチェ
ック手段を備えた保守診断処理装置の制御のもとで中央
処理装置の命令試験を行うことにより、中央処理装置の
命令試験を試験環境の設定部や試験結果のチェック部等
を含まない命令試験実行部のみの環境下で実行すること
ができ、障害の検出が命令試験実行部に限られることに
より障害の判断が容易になり、中央処理装置の総合的な
機能評価が短期間でできる効果がある。
As explained above, the present invention provides a storage means for storing a function evaluation program of a central processing unit in the main memory, a starting means for starting the function evaluation program, a monitoring means for monitoring the completion of the test execution, and a monitoring means for monitoring the execution results of the test. By performing the command test of the central processing unit under the control of a maintenance diagnosis processing device equipped with checking means, the command test of the central processing unit does not include a test environment setting section or a test result checking section. It can be executed in an environment where the instruction test execution unit is the only one, and since failure detection is limited to the instruction test execution unit, it is easier to determine failures and a comprehensive functional evaluation of the central processing unit can be performed in a short period of time. effective.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の保守診断処理装置管理による命令試験
方式が通用された情作処理システムの構成図、 第2図は第1図中に示した保守診断処理装置での処理を
示す流れ図である。 図において、 l・・・情報処理装置、 2・・・保守診断処理装置、 3・・・保守診断インタフェース、 11・・・主記憶装置、 12・・・中央処理装置、 21・・・試験の実行結果のチェック手段、22・・・
機能評価プログラムの格納手段、23・・・機能評価プ
ログラムの起動手段、24・・・試験終了の監視手段で
ある。
FIG. 1 is a configuration diagram of an information processing system in which the command test method based on the maintenance diagnosis processing device management of the present invention is applied, and FIG. 2 is a flowchart showing the processing in the maintenance diagnosis processing device shown in FIG. 1. be. In the figure, l... information processing device, 2... maintenance diagnosis processing device, 3... maintenance diagnosis interface, 11... main storage device, 12... central processing unit, 21... test Execution result checking means, 22...
Storage means for the functional evaluation program, 23... means for starting the functional evaluation program, 24... means for monitoring the end of the test.

Claims (1)

【特許請求の範囲】 主記憶装置とこの主記憶装置に接続される中央処理装置
とが保守診断インタフェースを介して保守診断処理装置
に接続された情報処理システムの命令試験方式において
、 前記保守診断処理装置が、 前記中央処理装置の命令試験を実行しこの命令試験の結
果を前記主記憶装置上に格納する機能を持った前記中央
処理装置のための機能評価プログラムを前記主記憶装置
上に格納する格納手段と、前記機能評価プログラムに起
動をかけて実行させる起動手段と、 前記機能評価プログラムの実行終了を監視する監視手段
と、 前記機能評価プログラムの実行結果をチェックするチェ
ック手段と、 を含むことを特徴とする保守診断処理装置管理による命
令試験方式。
[Scope of Claim] In an instruction test method for an information processing system in which a main storage device and a central processing unit connected to the main storage device are connected to a maintenance diagnosis processing device via a maintenance diagnosis interface, the maintenance diagnosis processing The device stores on the main storage device a function evaluation program for the central processing unit, which has a function of executing an instruction test of the central processing unit and storing the result of the instruction test on the main storage device. A storage means, a starting means for starting and executing the functional evaluation program, a monitoring means for monitoring completion of execution of the functional evaluation program, and a checking means for checking an execution result of the functional evaluation program. A command test method based on maintenance diagnosis processing device management characterized by:
JP60280649A 1985-12-13 1985-12-13 Instruction test system by control of maintenance and diagnosis processor Pending JPS62139050A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60280649A JPS62139050A (en) 1985-12-13 1985-12-13 Instruction test system by control of maintenance and diagnosis processor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60280649A JPS62139050A (en) 1985-12-13 1985-12-13 Instruction test system by control of maintenance and diagnosis processor

Publications (1)

Publication Number Publication Date
JPS62139050A true JPS62139050A (en) 1987-06-22

Family

ID=17627996

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60280649A Pending JPS62139050A (en) 1985-12-13 1985-12-13 Instruction test system by control of maintenance and diagnosis processor

Country Status (1)

Country Link
JP (1) JPS62139050A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0576940U (en) * 1992-03-26 1993-10-19 株式会社京三製作所 Track circuit power receiving device
JPH0576939U (en) * 1992-03-26 1993-10-19 株式会社京三製作所 Track circuit power receiving device
FR2694089A1 (en) * 1992-07-24 1994-01-28 Raymond Jacques Method for controlling the execution of product tests.

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0576940U (en) * 1992-03-26 1993-10-19 株式会社京三製作所 Track circuit power receiving device
JPH0576939U (en) * 1992-03-26 1993-10-19 株式会社京三製作所 Track circuit power receiving device
FR2694089A1 (en) * 1992-07-24 1994-01-28 Raymond Jacques Method for controlling the execution of product tests.

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