JPS583319A - Codec integrated circuit for single chip - Google Patents

Codec integrated circuit for single chip

Info

Publication number
JPS583319A
JPS583319A JP10086981A JP10086981A JPS583319A JP S583319 A JPS583319 A JP S583319A JP 10086981 A JP10086981 A JP 10086981A JP 10086981 A JP10086981 A JP 10086981A JP S583319 A JPS583319 A JP S583319A
Authority
JP
Japan
Prior art keywords
signal transmission
signal
transmission line
integrated circuit
test mode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10086981A
Other languages
Japanese (ja)
Inventor
Norio Ueno
上野 典夫
Seiji Kato
誠治 加藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP10086981A priority Critical patent/JPS583319A/en
Publication of JPS583319A publication Critical patent/JPS583319A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analogue/Digital Conversion (AREA)

Abstract

PURPOSE:To simply check AC signal transmission, by providing a switch changing over a 2-system signal transmission line into 1-system signal transmission line and a transmission functional check circuit. CONSTITUTION:When changeover switches SW1-SW3 are opened, the 1st system signal transmission line consisting of a transmission filter TRF and a coder CD and the 2nd system signal transmission line consisting of a decoder DEC and a reception filter RVF are formed. When a control signal is given to a terminal CTS, the switches SW1-SW3 are closed, the signal transmission lines of the 1st and 2nd systems are changed over to one system to be the test mode. When a synchronizing signal is given to a test mode terminal SPT, a test use AC signal from a test signal generating circuit TSG is inputted to a functional check circuit CHK via the DEC, the RVF, the TRF and the CD. Thus, the check of the AC signal transmission can be made simply.

Description

【発明の詳細な説明】 うに°シタ単一チップのコーデック集積(ロ)路に関す
る。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a single-chip codec integration circuit.

アナログ信号とテイジタル価号についての2系統の信号
変換回路な組合せ配置したものはコーデック(コーグ・
テコーダ)と通称され,第1図に示すように公知である
。第1図において80日 は半導体チップで、送信側フ
ィルタTRP・コーグCDで形成される第1系統信号伝
送路と、デコーダDOI!!・受信側フィルタRvFで
形成される第2系統gi号伝送路が同一チップに搭載さ
れている。第1系統信号伝送路の入力はアナログ信勺エ
ム、同出力はディジタル信号oD。
A codec (Korg) is a combination of two signal conversion circuits for analog signals and digital numbers.
It is commonly known as a tecoder and is well known as shown in FIG. In FIG. 1, 80th is a semiconductor chip, and the first system signal transmission line formed by the transmitting side filter TRP and KOG CD, and the decoder DOI! ! - The second system gi transmission line formed by the receiving side filter RvF is mounted on the same chip. The input of the first system signal transmission line is an analog signal EM, and the output is a digital signal oD.

第2系統信号伝送路の入力はディジタル信号よりで、同
出力はアナログ信号工Aである。アナログ信号とディジ
タル信号について相互変換する処理のための変換部を設
けているとき、所足動作開始前に試験を行なう必要があ
る。このときコーデックでは送信側フィルタは帯域通過
型であるため全体の直流導通試験もできない状態である
。そのためチップの外部から専用の試験器ン使、って種
々の試験を行なう必要がある。集積回路化されたためコ
ーデックは小型・軽量になるが試験器は大型で重く堰扱
いが不便であったから、装置実装前に調整が複雑となっ
た。
The input of the second signal transmission line is a digital signal, and the output is an analog signal A. When a conversion unit is provided for processing mutual conversion between analog and digital signals, it is necessary to perform a test before starting operation. At this time, since the transmitting side filter of the codec is a band-pass type, it is not possible to perform a DC continuity test on the entire codec. Therefore, it is necessary to perform various tests from outside the chip using a dedicated tester. Because the codec was integrated into an integrated circuit, it became smaller and lighter, but the tester was large and heavy and difficult to handle, making adjustments complicated before the equipment was installed.

本発明の目的は集積回路化され小型になったコーチツク
につぎ、製造過程において印加交流信号に対する試験回
路を搭載し、1!#性を簡易に〜チェックできる構成と
したコーチツク集積回路ン提供することKある。そのた
め本発明の要旨は2系統信号伝送路を1系統に切換える
複数の切換スイッチとl系統信号伝送路の一端に設けた
試験モード端子と他端に設けたチェック回路を具備し、
試験モード端子から交流年号を入力させることである。
The purpose of the present invention is to provide a small-sized coach truck that has been integrated into an integrated circuit, and to have a test circuit for applied AC signals installed during the manufacturing process. It is an object of the present invention to provide a coach integrated circuit having a structure that allows easy checking of the compatibility. Therefore, the gist of the present invention is to include a plurality of changeover switches for switching a two-system signal transmission path to one system, a test mode terminal provided at one end of the L-system signal transmission path, and a check circuit provided at the other end,
The purpose is to input the AC year from the test mode terminal.

 、 以下図面に示す本発明の実施例について説明する。第2
図は第1図と対応して示T本発明の実施例のブロック図
で、第1図と同一符号は同様のものを示テ。EIWl 
、 SW2 、 SW3  は2系統信号伝送路を1系
統に切換えるための切換スイッチで2例えはコンプリメ
ンタリMOB型半導体素子を使用した電子スイッチを使
用する。CTaは前記切換スイッチを制御するための信
号の印加端子、TAG は試験信号発生回路で第3図(
A)K示す例えば8Kllzの同期パルスからへ分周し
て2KHzfニーテイ7アクタ50チの矩形波(第3図
(至))を得るものである。8PTは5KHzの同期パ
ルスの入力端子ン示す、制御信号端子OTBから各切換
スイッチへの接M線は第2図において省略しであるが、
信号の印加がないとき切換スイッチ8W1〜8W3  
は図示の側にあるため、 より→0ム、エム→ODの2
系統信号伝送路はそれぞれ1J、1図の場合と同じ動作
をする。次に端子0テ8に制御信号の印加をすると切換
スイッチは全部図示と反対側圧切換るため、信号伝送路
はT 8 G−+8 W 3−+l) B O−+R’
V F−48W、1→T RF−+OD40 HK−+
B W 2−+OD l:廻るl系統信号伝送路となる
。ここでCHKは信号伝送路機能チェック回路で具体的
構成は後述する。
Embodiments of the present invention shown in the drawings will be described below. Second
This figure is a block diagram of an embodiment of the present invention corresponding to FIG. 1, and the same reference numerals as in FIG. 1 indicate similar parts. EIWl
, SW2, and SW3 are changeover switches for switching two signal transmission lines to one system, and for example, electronic switches using complementary MOB type semiconductor elements are used. CTa is a signal application terminal for controlling the changeover switch, and TAG is a test signal generation circuit as shown in Fig. 3 (
A) For example, a synchronous pulse of 8 Kllz is frequency-divided to obtain a 2 KHzf knee 7 actor 50 square wave (see FIG. 3). 8PT is the input terminal for the 5KHz synchronization pulse. The tangent lines M from the control signal terminal OTB to each changeover switch are omitted in Fig. 2.
When no signal is applied, selector switches 8W1 to 8W3
Since is on the side shown in the diagram, → 0 M, M → OD 2
The system signal transmission lines are each 1J and operate in the same way as in the case of Figure 1. Next, when a control signal is applied to terminal 0te8, all the changeover switches switch to the opposite side pressure than shown in the figure, so the signal transmission path is T8G-+8W3-+l)BO-+R'
V F-48W, 1→T RF-+OD40 HK-+
B W 2-+OD l: Becomes a rotating l-system signal transmission path. Here, CHK is a signal transmission path function check circuit whose specific configuration will be described later.

テコーダD鵞0は前記2KH2の矩形波をディジタル信
号として入力されるので、それン復調し、受信フィルタ
RVF Z連子と出力には2 KHzの正弦波が得られ
る。なお第3図(B)はデコーダDBOへのディジタル
入力信号で、信号例!第1表に示す。
Since the 2KH2 rectangular wave is input as a digital signal to the tecoder D-0, it demodulates it, and a 2KHz sine wave is obtained at the reception filter RVF Z link and output. Note that FIG. 3(B) shows the digital input signal to the decoder DBO, and is an example of the signal! Shown in Table 1.

第1表 受信フィルタRVIFの出力信号の正弦波は次のように
なる。
The sine wave of the output signal of the reception filter RVIF in Table 1 is as follows.

α1は受信フィルタの損失±0J(iB、  最終項は
直流成分ン示T。
α1 is the loss of the receiving filter ±0J (iB), and the final term is the DC component T.

次にこの正弦波ン送信側フィルタテRFK加えると通過
帯域が0.3〜0.4KHzであるからその出力は b ’(t)=α1×α2X0.69601355X3
im(2πft+#1 +#2)α2は送信フィルタの
損失を示テ コーグCDにおいて送信側フィルタ出力18ビツトの符
号化!すると8Kllz毎に符号′か4種類得られ、 
2.KHzの繰返しである。
Next, when we add this sine wave to the transmitting side filter TERFK, the passband is 0.3 to 0.4KHz, so the output is b'(t) = α1×α2X0.69601355X3
im(2πft+#1+#2)α2 indicates the loss of the transmitting filter.Encoding of the transmitting side filter output 18 bits in Techog CD! Then, for every 8 Kllz, you will get 4 types of codes,
2. KHz repetition.

符号化出カン示すとflPJ2表になる・@3表 第3図(0)はこの符号他出カン全体的に示し第3図(
ロ)はその符号BY拡大して示すものである。
Showing the encoded output, it becomes the flPJ2 table.
B) is shown enlarged by the symbol BY.

第2表の符号化出力は送信フィルタTRIF、受信フィ
ルタRVF f)q性のばらつきにより若干変化するが
±0.4dB(Xl、035または0.966)程度で
あれば第2表の符号化出力と一致する。
The encoded output in Table 2 varies slightly due to variations in the transmission filter TRIF and reception filter RVF f), but if it is about ±0.4 dB (Xl, 035 or 0.966), the encoded output in Table 2 will be the same. matches.

そのためチェック回路OHKにおいて予め第2表符号化
出力を同期をとって発生させ、且つコーグODの出力と
比較テる。その対応がとれた−とき出力に1″、とれな
いとき“Ll−V出力させる。即ちチェック回路QBK
として信号発生器・比較回路・判定回路ン含ませる。
Therefore, the check circuit OHK generates the Table 2 encoded output in advance in synchronization and compares it with the output of the Korg OD. When the correspondence is established, the output is 1'', and when it is not, the output is set to ``Ll-V''. That is, check circuit QBK
Including a signal generator, comparison circuit, and judgment circuit.

なお第2表符号化出力のムの信号“10001011”
Kついて10001101”から“10001001”
の範囲程度に幅!もたせて判断しても実用上差支えない
Note that the encoded output signal in Table 2 is “10001011”.
“10001101” with “K” to “10001001”
Width to the extent of! There is no practical problem in making a judgment based on this.

このようKして本発明によるとパターン発生器を具備し
たコーデックについてl系統信号伝送路の他端にチェッ
ク回路を設け、同一波形を確認しているため、ティジタ
ル・アナログ信号の変換過程l含めた総合試験ができる
。装量に実装Tるとき半導体チップとして良否を簡単に
判定できそのとき外部の試験器を要しないため便利であ
る。
According to the present invention, a check circuit is provided at the other end of the signal transmission path of the codec equipped with a pattern generator to confirm the same waveform, so that the conversion process of the digital/analog signal is included. You can take a comprehensive exam. It is convenient because it can easily determine whether the semiconductor chip is good or bad when it is mounted on a semiconductor chip, and an external tester is not required.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の単一チップのコーチツク集積回路ン示す
図、 第2図は本発明の実施例の構成を示T図、第3rI!J
は第2図中の各部の信号波形図ン示す。 SCS・・・半導体チップ TRF・・・送信側フィルタ RV IF−・・受信側フィルタ CD・・・コーグ    DIO・・・デコーダaア〒
・・・同期信号入力端子 8W1.tW2,8WS・・・信号伝送路切換スイッチ
0T8−−切換スイッチ制御信号印加端子’l’8G・
・・試験11号発生向路 OHK・・・機能チェック回路 特許出願人 富士通株式会社 代 埋 人 弁坤土鈴木栄祐
FIG. 1 is a diagram showing a conventional single-chip coach integrated circuit, FIG. 2 is a diagram showing the configuration of an embodiment of the present invention, and FIG. J
2 shows signal waveform diagrams of various parts in FIG. SCS...Semiconductor chip TRF...Transmitting side filter RV IF-...Receiving side filter CD...Kog DIO...Decoder aa
... Synchronous signal input terminal 8W1. tW2, 8WS... Signal transmission path changeover switch 0T8 -- Changeover switch control signal application terminal 'l'8G.
...Test No. 11 generation direction OHK...Function check circuit patent applicant Eisuke Benkondo Suzuki, representative of Fujitsu Limited

Claims (1)

【特許請求の範囲】 1 アナログ信号に対する送信@フィルタとディジタル
信号への変換器と、ディジタル信号からアナログ信号へ
の変換器と受信飼フィルタとの2系統信号伝送路を同一
半導体チップ上に搭載した単一チップのコーデック集積
回路において、前記2系統信号伝送路を1系統信号伝送
路に切換える複数の切換スイッチと。 該1系統信号伝送路の一端に設けた試験モード端子と、
同l系統信号伝送路の他端に設けた伝送路機能チェック
回路とを具備し、試験モード端子に時間的に変化する?
1勺を印加して試験モードに切換られているl系統信号
伝送路が出力する91号により伝送路の機能をチェック
すること1kl!#徴とする単一チップのコーデック集
積回路。 2 試験モード端子には所定サン1りング周波数のV4
の周波数の矩形波l入力させ、l系統信号伝送路の他端
にはテイジタル信号のノ(ターンvlN認Tる回路を設
け、l系統信号伝送路が交流的に正常動作lしているこ
とを認識できることを特徴とする特許請求の範囲第1墳
記載の単一チップのコーデック集積回路。 31系統伝送路の他端で得られるべきテイジタル信号パ
ターンヶ定めて、該信号)曵ターンを発生させる回路を
試験モード端子九入力させ、該信号パターンと伝送路他
端の信号田方とを比較し対応の適否を出力させて判定す
ることt特徴とする特許請求の範囲第1項記載の単一チ
ップのコーデック集積回路。
[Claims] 1. Two signal transmission lines, including a transmission @ filter for an analog signal and a converter to a digital signal, a converter from a digital signal to an analog signal, and a receiving filter, are mounted on the same semiconductor chip. In a single-chip codec integrated circuit, a plurality of changeover switches for switching the two-system signal transmission path to a single-system signal transmission path. a test mode terminal provided at one end of the single system signal transmission path;
It is equipped with a transmission line function check circuit provided at the other end of the same system signal transmission line, and changes over time to the test mode terminal.
Check the function of the transmission line using No. 91 output from the l system signal transmission line which is switched to test mode by applying 1kl! # Single-chip codec integrated circuit with features. 2 The test mode terminal is connected to V4 at the specified sampling frequency.
A rectangular wave with a frequency of A single-chip codec integrated circuit according to claim 1, characterized in that the codec integrated circuit can be recognized. A single-chip codec according to claim 1, characterized in that a test mode terminal (9) is input, the signal pattern is compared with a signal field at the other end of the transmission path, and the suitability of correspondence is output and determined. integrated circuit.
JP10086981A 1981-06-29 1981-06-29 Codec integrated circuit for single chip Pending JPS583319A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10086981A JPS583319A (en) 1981-06-29 1981-06-29 Codec integrated circuit for single chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10086981A JPS583319A (en) 1981-06-29 1981-06-29 Codec integrated circuit for single chip

Publications (1)

Publication Number Publication Date
JPS583319A true JPS583319A (en) 1983-01-10

Family

ID=14285315

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10086981A Pending JPS583319A (en) 1981-06-29 1981-06-29 Codec integrated circuit for single chip

Country Status (1)

Country Link
JP (1) JPS583319A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2682241A1 (en) * 1991-10-02 1993-04-09 Samsung Electronics Co Ltd PCM-CODEC INTEGRATED CIRCUIT FOR A TELEPHONY SWITCHING SYSTEM.

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2682241A1 (en) * 1991-10-02 1993-04-09 Samsung Electronics Co Ltd PCM-CODEC INTEGRATED CIRCUIT FOR A TELEPHONY SWITCHING SYSTEM.

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