JPS5759354A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS5759354A
JPS5759354A JP13371080A JP13371080A JPS5759354A JP S5759354 A JPS5759354 A JP S5759354A JP 13371080 A JP13371080 A JP 13371080A JP 13371080 A JP13371080 A JP 13371080A JP S5759354 A JPS5759354 A JP S5759354A
Authority
JP
Japan
Prior art keywords
resistor
region
single crystal
functioning
wiring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13371080A
Other languages
Japanese (ja)
Inventor
Kei Kirita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP13371080A priority Critical patent/JPS5759354A/en
Publication of JPS5759354A publication Critical patent/JPS5759354A/en
Pending legal-status Critical Current

Links

Landscapes

  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)

Abstract

PURPOSE:To form the characteristics of a resistance element with high accuracy in the semiconductor device using one part of wiring consisting of a semiconductor such as Si, to which impurities are doped, as the resistance element. CONSTITUTION:An unevenness functioning as nuclei for artificial crystal growth is formed in a region 13a in which is resistor of an oxide film 13b on a semiconductor substrate in Si, etc. must be shaped, and a non-single crystal Si film in polycrystal silicon, etc. serving as wiring connected to a diffusion region 12, etc. is formed on the unevenness. When impurities are each diffused in regions functioning as an electrode 15''c and wiring 15''b among the Si film in high concentration and in a region serving as the resistor 15''a in low concentration and energy rays having high density such as laser rays are irradiated to the region functioning as the resistor and the region is changed into a single crystal, there is no crystal grain boundary in the single crystal resistor, and diffusion velocity is also slow. Consequently, the resistor can be formed with high accuracy.
JP13371080A 1980-09-27 1980-09-27 Manufacture of semiconductor device Pending JPS5759354A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13371080A JPS5759354A (en) 1980-09-27 1980-09-27 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13371080A JPS5759354A (en) 1980-09-27 1980-09-27 Manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS5759354A true JPS5759354A (en) 1982-04-09

Family

ID=15111075

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13371080A Pending JPS5759354A (en) 1980-09-27 1980-09-27 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5759354A (en)

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