JPS55109928A - Measuring method for thin plate by x-rays - Google Patents
Measuring method for thin plate by x-raysInfo
- Publication number
- JPS55109928A JPS55109928A JP1609079A JP1609079A JPS55109928A JP S55109928 A JPS55109928 A JP S55109928A JP 1609079 A JP1609079 A JP 1609079A JP 1609079 A JP1609079 A JP 1609079A JP S55109928 A JPS55109928 A JP S55109928A
- Authority
- JP
- Japan
- Prior art keywords
- rays
- thin plate
- pigment
- calcium carbonate
- density
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE: To determine easily and accurately the surface density of a material such as atoms and pigment by measuring photographic density through an X-ray film, by irradiating a thin plate, original paper applied with pigment, etc., including metal atoms, with X-rays produced by two fixed selected bulb voltages.
CONSTITUTION: On original paper 5a such as paper and a plastic film, pigment 5b such as calcium carbonate is applied, charged or laminated to form thin plate 5. This thin plate 5 is irradiated with X-rays by selecting X-ray bulb voltage greater and less than the maximum value of mass absorption coefficient μb of calcium carbonate, thereby measuring through X-ray film 5 the photographic density by transmitted X-rays. Next, the condition, μa1μb2-μb1μa2≠0, is satisfied on the basis of equation I to determine accurately surface density values Wa and Wb of the original paper and calcium carbonate. Further, when the photographic density is measured by irradiating atoms and pigment independently with X-rays by bulb voltages nearly equal in absorption coeffcient, the surface density of the thin plate of them is determined. Here, I1, I01, I2 and I02 represent actually-measured absorbance.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1609079A JPS55109928A (en) | 1979-02-16 | 1979-02-16 | Measuring method for thin plate by x-rays |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1609079A JPS55109928A (en) | 1979-02-16 | 1979-02-16 | Measuring method for thin plate by x-rays |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55109928A true JPS55109928A (en) | 1980-08-23 |
JPS6236162B2 JPS6236162B2 (en) | 1987-08-05 |
Family
ID=11906819
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1609079A Granted JPS55109928A (en) | 1979-02-16 | 1979-02-16 | Measuring method for thin plate by x-rays |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55109928A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2018109548A (en) * | 2016-12-28 | 2018-07-12 | 富士通株式会社 | Analysis device of particulate and analysis method of particulate |
-
1979
- 1979-02-16 JP JP1609079A patent/JPS55109928A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2018109548A (en) * | 2016-12-28 | 2018-07-12 | 富士通株式会社 | Analysis device of particulate and analysis method of particulate |
Also Published As
Publication number | Publication date |
---|---|
JPS6236162B2 (en) | 1987-08-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5398781A (en) | Electron ray exposure unit | |
JPS55109928A (en) | Measuring method for thin plate by x-rays | |
JPS5324990A (en) | Burnup measuring method in irradiated | |
EP0130088A3 (en) | Plasma developable negative resist compositions for electron beam, x-ray and optical lithography | |
JPS52110634A (en) | Information recording material | |
JPS52131097A (en) | Radiation shielding material of sheet form with flexibility | |
JPS5773609A (en) | Measuring method for position and diameter of buried reinforcement in concrete | |
JPS5347832A (en) | Method for controlling surface potential of photosensitive body in electronic copying machine | |
JPS5742129A (en) | Detector for position of mark in electron ray exposure | |
JPS53147465A (en) | Forming method of patterns for lift-off | |
Bell | The Photographic Action of Radium Gamma Rays | |
JPS5459193A (en) | Fluorescent x-ray sulfur analytical apparatus | |
Ehrlich | A photographic personnel dosimeter for X-radiation in the range from 30 KeV to beyond 1 MeV | |
JPS53138477A (en) | Polyethylene terephthalate film | |
JPS5565107A (en) | Measuring method for film thickness | |
Morrison et al. | A Note on the Determination of Half-value Layers of Soft X rays | |
JPS55106305A (en) | Measuring method for pattern area | |
JPS56153209A (en) | Film thickness measuring method using fluorescent x-ray | |
JPS5784457A (en) | Recording body for electrostatic transfer and recording method using it | |
Kerr | Using low energy β-sources for radiography | |
JPS5528083A (en) | Focusing type optical transmission body array | |
JPS53126888A (en) | Multilayer intensifying screen and method of using the same | |
JPS53130033A (en) | Electron beam sensitive material | |
JPS5249837A (en) | Toner for fixing by ultraviolet rays | |
JPS56157807A (en) | Measuring method for thickness of coated film |