JPS55109928A - Measuring method for thin plate by x-rays - Google Patents
Measuring method for thin plate by x-raysInfo
- Publication number
- JPS55109928A JPS55109928A JP1609079A JP1609079A JPS55109928A JP S55109928 A JPS55109928 A JP S55109928A JP 1609079 A JP1609079 A JP 1609079A JP 1609079 A JP1609079 A JP 1609079A JP S55109928 A JPS55109928 A JP S55109928A
- Authority
- JP
- Japan
- Prior art keywords
- rays
- thin plate
- pigment
- calcium carbonate
- density
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE: To determine easily and accurately the surface density of a material such as atoms and pigment by measuring photographic density through an X-ray film, by irradiating a thin plate, original paper applied with pigment, etc., including metal atoms, with X-rays produced by two fixed selected bulb voltages.
CONSTITUTION: On original paper 5a such as paper and a plastic film, pigment 5b such as calcium carbonate is applied, charged or laminated to form thin plate 5. This thin plate 5 is irradiated with X-rays by selecting X-ray bulb voltage greater and less than the maximum value of mass absorption coefficient μb of calcium carbonate, thereby measuring through X-ray film 5 the photographic density by transmitted X-rays. Next, the condition, μa1μb2-μb1μa2≠0, is satisfied on the basis of equation I to determine accurately surface density values Wa and Wb of the original paper and calcium carbonate. Further, when the photographic density is measured by irradiating atoms and pigment independently with X-rays by bulb voltages nearly equal in absorption coeffcient, the surface density of the thin plate of them is determined. Here, I1, I01, I2 and I02 represent actually-measured absorbance.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1609079A JPS55109928A (en) | 1979-02-16 | 1979-02-16 | Measuring method for thin plate by x-rays |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1609079A JPS55109928A (en) | 1979-02-16 | 1979-02-16 | Measuring method for thin plate by x-rays |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS55109928A true JPS55109928A (en) | 1980-08-23 |
| JPS6236162B2 JPS6236162B2 (en) | 1987-08-05 |
Family
ID=11906819
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1609079A Granted JPS55109928A (en) | 1979-02-16 | 1979-02-16 | Measuring method for thin plate by x-rays |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55109928A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018109548A (en) * | 2016-12-28 | 2018-07-12 | 富士通株式会社 | Analysis device of particulate and analysis method of particulate |
-
1979
- 1979-02-16 JP JP1609079A patent/JPS55109928A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018109548A (en) * | 2016-12-28 | 2018-07-12 | 富士通株式会社 | Analysis device of particulate and analysis method of particulate |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6236162B2 (en) | 1987-08-05 |
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