JPS5723240A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS5723240A JPS5723240A JP9722480A JP9722480A JPS5723240A JP S5723240 A JPS5723240 A JP S5723240A JP 9722480 A JP9722480 A JP 9722480A JP 9722480 A JP9722480 A JP 9722480A JP S5723240 A JPS5723240 A JP S5723240A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- etching
- accumulated
- constitution
- sio2
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/76224—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using trench refilling with dielectric materials
- H01L21/76232—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using trench refilling with dielectric materials of trenches having a shape other than rectangular or V-shape, e.g. rounded corners, oblique or rounded trench walls
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Local Oxidation Of Silicon (AREA)
- Element Separation (AREA)
Abstract
PURPOSE:To obtain a finely constructed field region, by providing on a Si substrate a plurality of vertical groove and by etching SiO2 accumulated to a width more than than half of an opening's shorter side as far as the substrate surface is wholly exposed. CONSTITUTION:A resist mask 102 is applied on a P type Si substrate 101, and vertical grooves 103 are provided by reactive etching, whereinto B are injected and subjected to an heat treatment to form a P<+> channel stoppers 104. A CVDSiO2 105 is accumulated to a thickness more than half of an opening S, thereafter, the SiO2 is removed by etching with NH4F as far as the substrate 101 is exposed, thus a buried field layer 106 is completed. An MOS device is formed in a separated element forming region. Said constitution will form the field layer 106 of 1mum in width integrate the device to a high degree and prevent leaking of an electric current between elements by means of the deeply formed grooves, providing a highly efficient device.
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9722480A JPS5723240A (en) | 1980-07-16 | 1980-07-16 | Manufacture of semiconductor device |
US06/282,642 US4394196A (en) | 1980-07-16 | 1981-07-13 | Method of etching, refilling and etching dielectric grooves for isolating micron size device regions |
DE8686116670T DE3177250D1 (en) | 1980-07-16 | 1981-07-14 | METHOD FOR PRODUCING A SEMICONDUCTOR ARRANGEMENT WITH DIELECTRIC INSULATION ZONES. |
DE8181105523T DE3177018D1 (en) | 1980-07-16 | 1981-07-14 | Method of manufacturing a semiconductor device comprising a dielectric insulating region |
EP86116670A EP0245538B1 (en) | 1980-07-16 | 1981-07-14 | Method for manufacturing a semiconductor device comprising dielectric isolation regions |
EP81105523A EP0044082B1 (en) | 1980-07-16 | 1981-07-14 | Method of manufacturing a semiconductor device comprising a dielectric insulating region |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9722480A JPS5723240A (en) | 1980-07-16 | 1980-07-16 | Manufacture of semiconductor device |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9638686A Division JPS61234046A (en) | 1986-04-25 | 1986-04-25 | Manufacture of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5723240A true JPS5723240A (en) | 1982-02-06 |
Family
ID=14186656
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9722480A Pending JPS5723240A (en) | 1980-07-16 | 1980-07-16 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5723240A (en) |
-
1980
- 1980-07-16 JP JP9722480A patent/JPS5723240A/en active Pending
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