JPS57198648A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS57198648A JPS57198648A JP56084025A JP8402581A JPS57198648A JP S57198648 A JPS57198648 A JP S57198648A JP 56084025 A JP56084025 A JP 56084025A JP 8402581 A JP8402581 A JP 8402581A JP S57198648 A JPS57198648 A JP S57198648A
- Authority
- JP
- Japan
- Prior art keywords
- plating
- resist
- semiconductor device
- wiring
- mask
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/11—Manufacturing methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
Abstract
PURPOSE:To contrive the fineness of wiring and the improvement of yield by a method wherein the first resist mask is applied and a wiring layer is made by plating with the same thickness as that of the mask or thinner and the second resist mask is applied to provide a projected electrode by plating. CONSTITUTION:Pt wirings 2 exist on an Si substrate 1 formed elements. A photo resist pattern 3 with thicker than planned Au plating thickness or the same thickness is provided by selecting forming condition. After applying Au plating with predetermined thickness, the resist 3 is removed, and the second photo resist pattern 5 is made. At that time, no cracked sections exist at the Au cross section. Therefore, a thin film is acceptable and no pin holes are generated. Next, a projected electrode 6 is provided by Au plating to remove the resist and a semiconductor device is completed. In this composition, a semiconductor device having plating wiring can be made with good yield and high productivity.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56084025A JPS57198648A (en) | 1981-06-01 | 1981-06-01 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56084025A JPS57198648A (en) | 1981-06-01 | 1981-06-01 | Manufacture of semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57198648A true JPS57198648A (en) | 1982-12-06 |
JPS6248899B2 JPS6248899B2 (en) | 1987-10-16 |
Family
ID=13819011
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56084025A Granted JPS57198648A (en) | 1981-06-01 | 1981-06-01 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57198648A (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52120683A (en) * | 1976-03-31 | 1977-10-11 | Licentia Gmbh | Method of making multiilayered metalic electrodes for semiconductor elements |
JPS52128059A (en) * | 1976-04-20 | 1977-10-27 | Nec Corp | Manufacture of semiconductor device |
-
1981
- 1981-06-01 JP JP56084025A patent/JPS57198648A/en active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52120683A (en) * | 1976-03-31 | 1977-10-11 | Licentia Gmbh | Method of making multiilayered metalic electrodes for semiconductor elements |
JPS52128059A (en) * | 1976-04-20 | 1977-10-27 | Nec Corp | Manufacture of semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
JPS6248899B2 (en) | 1987-10-16 |
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