JPS57122346A - Impact testing apparatus for coated film - Google Patents
Impact testing apparatus for coated filmInfo
- Publication number
- JPS57122346A JPS57122346A JP810881A JP810881A JPS57122346A JP S57122346 A JPS57122346 A JP S57122346A JP 810881 A JP810881 A JP 810881A JP 810881 A JP810881 A JP 810881A JP S57122346 A JPS57122346 A JP S57122346A
- Authority
- JP
- Japan
- Prior art keywords
- chips
- coated film
- test
- fall
- impact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/30—Investigating strength properties of solid materials by application of mechanical stress by applying a single impulsive force, e.g. by falling weight
- G01N3/303—Investigating strength properties of solid materials by application of mechanical stress by applying a single impulsive force, e.g. by falling weight generated only by free-falling weight
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
PURPOSE:To perform the impact test of the coated film quickly and positively by providing a plurality of chip guides and holding chips at a desired heights. CONSTITUTION:Test pieces 1... on the surface of which the coated film is formed are mounted at the location including impact point 4, to which the chips 5 fall, on an inclined surface 2a of a receiving table 2 by a supporting member 3. On the upper part of said surface 2a, tubular chip guides 6... which guide the fall of the chips 5 and have desired lengths are provided so as to face the test piece 1 by a holder 7. The chips 5 are held at the desired heights by the excitation of electromagnets 11. When these electromagnets 11... are demagnetized, the chips having the desired weights at the desired heights fall, and the impact test by a plurality of the test pieces can be concurrently performed. Therefore, the impact test of the coating film can be performed quickly and positively.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP810881A JPS57122346A (en) | 1981-01-23 | 1981-01-23 | Impact testing apparatus for coated film |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP810881A JPS57122346A (en) | 1981-01-23 | 1981-01-23 | Impact testing apparatus for coated film |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57122346A true JPS57122346A (en) | 1982-07-30 |
Family
ID=11684092
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP810881A Pending JPS57122346A (en) | 1981-01-23 | 1981-01-23 | Impact testing apparatus for coated film |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57122346A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08136429A (en) * | 1994-11-11 | 1996-05-31 | Nec Corp | Shock destructive test method and device |
CN104749050A (en) * | 2015-04-01 | 2015-07-01 | 南华大学 | Particle impact loading device |
CN109297837A (en) * | 2018-11-13 | 2019-02-01 | 大连民族大学 | A kind of drop impact loading device |
-
1981
- 1981-01-23 JP JP810881A patent/JPS57122346A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08136429A (en) * | 1994-11-11 | 1996-05-31 | Nec Corp | Shock destructive test method and device |
CN104749050A (en) * | 2015-04-01 | 2015-07-01 | 南华大学 | Particle impact loading device |
CN109297837A (en) * | 2018-11-13 | 2019-02-01 | 大连民族大学 | A kind of drop impact loading device |
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