JPS5546578A - Method of mounting integrated circuit - Google Patents
Method of mounting integrated circuitInfo
- Publication number
- JPS5546578A JPS5546578A JP12077478A JP12077478A JPS5546578A JP S5546578 A JPS5546578 A JP S5546578A JP 12077478 A JP12077478 A JP 12077478A JP 12077478 A JP12077478 A JP 12077478A JP S5546578 A JPS5546578 A JP S5546578A
- Authority
- JP
- Japan
- Prior art keywords
- pad
- inspecting
- chip
- board
- chips
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0555—Shape
- H01L2224/05552—Shape in top view
- H01L2224/05553—Shape in top view being rectangular
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/4847—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond
- H01L2224/48472—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond the other connecting portion not on the bonding area also being a wedge bond, i.e. wedge-to-wedge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4911—Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49171—Fan-out arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19107—Disposition of discrete passive components off-chip wires
Abstract
PURPOSE: To readily replace chips of an integrated circuit by providing inspecting pad integral with a bonding pad on a printed board, inspecting IC chips secured onto the board with inspecting pad, and connecting a signal pattern thereto only when the chip is passed.
CONSTITUTION: A bonding pad 13 and an inspecting pad 14 integral with the pad 13 are formed on a printed board 11, and patterns 16 are arranged in space therewith correspondingly. The board 11 is thus formed, and IC chips 12 are secured onto the central portion of the board 11. Then, pad 12a provided at the chip 12 is bonded to the pad 13 using a wire 17. Then, the inspecting probe is pushed in contact with the pad 14 to thus inspect the chip 12 to connect the pad 14 to the pad 16 connected with a signal pattern 15 only at passing time via a wire 18 and to replace the chip 12 before connecting the pad 14 to the pad 16 at eliminating time.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12077478A JPS5546578A (en) | 1978-09-30 | 1978-09-30 | Method of mounting integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12077478A JPS5546578A (en) | 1978-09-30 | 1978-09-30 | Method of mounting integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5546578A true JPS5546578A (en) | 1980-04-01 |
Family
ID=14794661
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12077478A Pending JPS5546578A (en) | 1978-09-30 | 1978-09-30 | Method of mounting integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5546578A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58189969U (en) * | 1982-01-29 | 1983-12-16 | 株式会社三和電気製作所 | Internal magnet type instrument |
US5002895A (en) * | 1987-04-17 | 1991-03-26 | Thomson-Csf | Wire bonding method with a frame, for connecting an electronic component for testing and mounting |
US5561086A (en) * | 1993-06-18 | 1996-10-01 | Lsi Logic Corporation | Techniques for mounting semiconductor dies in die-receiving areas having support structure having notches |
KR100224657B1 (en) * | 1996-04-06 | 1999-10-15 | 윤종용 | Pin pad display method of semiconductor ic |
EP0867932A3 (en) * | 1997-01-31 | 2000-05-17 | Robert Bosch Gmbh | Method for making wire connections |
WO2001020669A3 (en) * | 1999-09-16 | 2001-10-04 | Koninkl Philips Electronics Nv | Use of additional bonding finger rows to improve wire bond density |
-
1978
- 1978-09-30 JP JP12077478A patent/JPS5546578A/en active Pending
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58189969U (en) * | 1982-01-29 | 1983-12-16 | 株式会社三和電気製作所 | Internal magnet type instrument |
JPS6329257Y2 (en) * | 1982-01-29 | 1988-08-05 | ||
US5002895A (en) * | 1987-04-17 | 1991-03-26 | Thomson-Csf | Wire bonding method with a frame, for connecting an electronic component for testing and mounting |
US5561086A (en) * | 1993-06-18 | 1996-10-01 | Lsi Logic Corporation | Techniques for mounting semiconductor dies in die-receiving areas having support structure having notches |
KR100224657B1 (en) * | 1996-04-06 | 1999-10-15 | 윤종용 | Pin pad display method of semiconductor ic |
EP0867932A3 (en) * | 1997-01-31 | 2000-05-17 | Robert Bosch Gmbh | Method for making wire connections |
US6232561B1 (en) | 1997-01-31 | 2001-05-15 | Robert Bosch Gmbh | Process for producing wire connections on an electronic component assembly carrier made by the process |
WO2001020669A3 (en) * | 1999-09-16 | 2001-10-04 | Koninkl Philips Electronics Nv | Use of additional bonding finger rows to improve wire bond density |
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