JPS5692474A - Aging tester of ic - Google Patents
Aging tester of icInfo
- Publication number
- JPS5692474A JPS5692474A JP17009979A JP17009979A JPS5692474A JP S5692474 A JPS5692474 A JP S5692474A JP 17009979 A JP17009979 A JP 17009979A JP 17009979 A JP17009979 A JP 17009979A JP S5692474 A JPS5692474 A JP S5692474A
- Authority
- JP
- Japan
- Prior art keywords
- ics
- printed board
- open connectors
- terminals
- plug plates
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE: To enable various kinds of ICs to be tested easily only through mounting operation of plug plates by mounting the plug plates to open connectors thereby forming a testing circuit relating to all the ICs on a substrate.
CONSTITUTION: Open connectors 6 are disposed between IC sockets 2 on a printed board 1, and plug plates 7 are embedded in these open connectors 6. The open connectors 6 are interspersedly disposed over the entire surface of the printed board 1. A plurality of terminals of the printed wires connected to the input terminals of ICs are led out to the side part 1c of the printed board 1 from the terminal T1 up to Tn, and signals are applied from an oscillator OSC to these terminals T1WTn.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17009979A JPS5692474A (en) | 1979-12-25 | 1979-12-25 | Aging tester of ic |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17009979A JPS5692474A (en) | 1979-12-25 | 1979-12-25 | Aging tester of ic |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5692474A true JPS5692474A (en) | 1981-07-27 |
Family
ID=15898613
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17009979A Pending JPS5692474A (en) | 1979-12-25 | 1979-12-25 | Aging tester of ic |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5692474A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04198776A (en) * | 1990-11-28 | 1992-07-20 | Mitsubishi Electric Corp | Burn-in device |
CN105301403A (en) * | 2015-11-16 | 2016-02-03 | 宁波工程学院 | Timer aging test monitoring device |
-
1979
- 1979-12-25 JP JP17009979A patent/JPS5692474A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04198776A (en) * | 1990-11-28 | 1992-07-20 | Mitsubishi Electric Corp | Burn-in device |
CN105301403A (en) * | 2015-11-16 | 2016-02-03 | 宁波工程学院 | Timer aging test monitoring device |
CN105301403B (en) * | 2015-11-16 | 2018-09-11 | 宁波工程学院 | A kind of timer burn-in test monitoring device |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE3065137D1 (en) | Electrical test probe for use in testing circuits on printed circuit boards and the like | |
DE3479341D1 (en) | Adapter for a printed-circuit board testing device | |
MY112140A (en) | Jig for measuring the characteristics of a semiconductor, manufacturing method for the same, and usage of the same | |
TW358885B (en) | Apparatus and method for testing non-componented printed circuit boards | |
MY122960A (en) | Method and apparatus for testing electronic devices | |
JPS5692474A (en) | Aging tester of ic | |
KR930023825A (en) | Probe for In-Circuit Emulators with Flexible Printed Circuit Boards | |
WO2000004585A3 (en) | Chip carrier device and method for the production of a chip carrier device with an electrical test | |
JPS6464285A (en) | Printed board | |
JPS5546578A (en) | Method of mounting integrated circuit | |
JPS5679262A (en) | Testing method for leadless parts | |
JPS5487070A (en) | Simultaneous multi-contact probe | |
JPS5627667A (en) | Method of estimating semiconductor device | |
JPS57128938A (en) | Device for measuring characteristic of semiconductor | |
JPS52128071A (en) | Automatic test unit | |
JPH05242939A (en) | Ic socket for measuring plcc | |
JPS56138934A (en) | Testing device | |
JPS53145576A (en) | Measuring method of electrical characteristics of semiconductor wafers and probe card used in said method | |
JPS5857787A (en) | Printed board | |
JPS5381084A (en) | Testing method of integrated circuit | |
JPH05264653A (en) | Soj-type ic socket | |
JPS5661665A (en) | Testing method for operation limit of electronic device | |
JPS649377A (en) | Testing method and sheet for integrated circuit package | |
JPS6484630A (en) | Measuring jig for semiconductor integrated circuit | |
JPS545668A (en) | Test equipment for electronic device |