JPS55113968A - Method of testing integrated circuit - Google Patents

Method of testing integrated circuit

Info

Publication number
JPS55113968A
JPS55113968A JP2212279A JP2212279A JPS55113968A JP S55113968 A JPS55113968 A JP S55113968A JP 2212279 A JP2212279 A JP 2212279A JP 2212279 A JP2212279 A JP 2212279A JP S55113968 A JPS55113968 A JP S55113968A
Authority
JP
Japan
Prior art keywords
measured
gate circuits
integrated circuit
testing integrated
gate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2212279A
Other languages
Japanese (ja)
Inventor
Akio Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP2212279A priority Critical patent/JPS55113968A/en
Publication of JPS55113968A publication Critical patent/JPS55113968A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: To shorten the testing time and the number of steps of test required for a measurement by measuring simultaneously four gate circuits with standard values of the case of one gate circuit.
CONSTITUTION: In order to test simultaneously four gate circuits, all input terminals 1aW4a are grounded, and all output terminals 1bW4b are short-circuited. Then, a voltage E is applied to the output terminals and an output leakage current is measured. In this simultaneous measurement, the respective gate circuits are measured only when the measured value exceeds the standard value of one gate circuit.
COPYRIGHT: (C)1980,JPO&Japio
JP2212279A 1979-02-27 1979-02-27 Method of testing integrated circuit Pending JPS55113968A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2212279A JPS55113968A (en) 1979-02-27 1979-02-27 Method of testing integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2212279A JPS55113968A (en) 1979-02-27 1979-02-27 Method of testing integrated circuit

Publications (1)

Publication Number Publication Date
JPS55113968A true JPS55113968A (en) 1980-09-02

Family

ID=12074068

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2212279A Pending JPS55113968A (en) 1979-02-27 1979-02-27 Method of testing integrated circuit

Country Status (1)

Country Link
JP (1) JPS55113968A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5951368A (en) * 1982-09-17 1984-03-24 Nec Corp Measurement of leak current for semiconductor element

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5951368A (en) * 1982-09-17 1984-03-24 Nec Corp Measurement of leak current for semiconductor element

Similar Documents

Publication Publication Date Title
JPS55113968A (en) Method of testing integrated circuit
US7078887B1 (en) PLL loop filter capacitor test circuit and method for on chip testing of analog leakage of a circuit
JPS5627667A (en) Method of estimating semiconductor device
JPS5322757A (en) Testing apparatus of electric a ppliances
JPS5683045A (en) Wafer probe
JPS54151478A (en) Pin connection checking system of integrated circuits being tested in integrated circuit testing apparatus
JPS55122170A (en) Method of measuring lag time of integrated circuit
JPS5750666A (en) Testing device for function of circuit
JPS5297776A (en) Tramcar circuit line insulation testing apparatus
JPS55107964A (en) Device for evaluation of integrated circuit
JPS5587059A (en) Test method
JPS5381084A (en) Testing method of integrated circuit
JPS5245234A (en) Device for testing circuit
JPS574559A (en) Testing method of integrated circuit
JPS5690271A (en) Testing method for logic device
JPS5472983A (en) Measuring method for semiconductor element
JPS5269108A (en) Testing apparatus for electric car
JPS53145576A (en) Measuring method of electrical characteristics of semiconductor wafers and probe card used in said method
JPS5320981A (en) Voltage-withstand tester
JPS5655875A (en) Testing device for integrated circuit
JPS57191566A (en) Simple measuring method for resistance value
JPS52176A (en) Electronic part operational testing circuit
JPS5681464A (en) Testing method for equivalence of transformer for reverse capacitor type meter
JPS6469971A (en) Checking apparatus of characteristics of semiconductor element
JPS55153353A (en) Semiconductor device