JPS5587059A - Test method - Google Patents

Test method

Info

Publication number
JPS5587059A
JPS5587059A JP16364778A JP16364778A JPS5587059A JP S5587059 A JPS5587059 A JP S5587059A JP 16364778 A JP16364778 A JP 16364778A JP 16364778 A JP16364778 A JP 16364778A JP S5587059 A JPS5587059 A JP S5587059A
Authority
JP
Japan
Prior art keywords
tpd
value
tester
measured
register
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16364778A
Other languages
Japanese (ja)
Inventor
Kenichi Kishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP16364778A priority Critical patent/JPS5587059A/en
Publication of JPS5587059A publication Critical patent/JPS5587059A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PURPOSE: To obtain the measuring value closer to true value with high accuracy, by obtaining the error related to the tester as to an arbitrary sample among tested circuit (e.g. IC) and subtracting it from the tester measuring value of tested circuit of the same kind.
CONSTITUTION: Taking up an arbitrary tested circuit. e.g., IC11, the propagation delay time tpd0 between the input and output pins corresponded is manually measured with an oscilloscope, and the value is stored in the register 2 of the tester 1. Next, the IC11 is measured with the tester 1, the switch 4 is selected to the position a, the measured value tpd1 is fed to the difference circuit 5, tpd1-tpd0=Δ is obtained and it is stored in the register 3. After the preparation like this, IC11 of the same types is mounted on the measuring tool 10 of the tester 1, the propagation time tpd is measured, the switch 4 is selected to the position b, the value tpd2 is fed to the difference circuit 6, and the difference tpd2-Δ between the content Δ of the register 3 and it is obtained as the value closer to the true value.
COPYRIGHT: (C)1980,JPO&Japio
JP16364778A 1978-12-23 1978-12-23 Test method Pending JPS5587059A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16364778A JPS5587059A (en) 1978-12-23 1978-12-23 Test method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16364778A JPS5587059A (en) 1978-12-23 1978-12-23 Test method

Publications (1)

Publication Number Publication Date
JPS5587059A true JPS5587059A (en) 1980-07-01

Family

ID=15777912

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16364778A Pending JPS5587059A (en) 1978-12-23 1978-12-23 Test method

Country Status (1)

Country Link
JP (1) JPS5587059A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4878984A (en) * 1972-01-22 1973-10-23

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4878984A (en) * 1972-01-22 1973-10-23

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