JPS5472983A - Measuring method for semiconductor element - Google Patents
Measuring method for semiconductor elementInfo
- Publication number
- JPS5472983A JPS5472983A JP14046077A JP14046077A JPS5472983A JP S5472983 A JPS5472983 A JP S5472983A JP 14046077 A JP14046077 A JP 14046077A JP 14046077 A JP14046077 A JP 14046077A JP S5472983 A JPS5472983 A JP S5472983A
- Authority
- JP
- Japan
- Prior art keywords
- time
- measurement
- measurements
- constant current
- terminal voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
PURPOSE: To shorten the time for repetitive measurements of semiconductor elements, by storing a terminal voltage, obtained by flowing a constant current to an element before the measurement, as its initial value and by sending out a start signal for repetitive measurements using this value as the standard.
CONSTITUTION: Before the test measurement, a constant current is flowed to find terminal voltage Vo at temperature (to). Next, since the element is heated through the 1st test measurement, the 2nd measurement should be done after the element becomes cool. As a result, measurements require a long time, and for the purpose, a constant current is flowed at the 2nd and 3rd measurements to find terminal voltage V1, V2,Vx, and final Vo corresponding to temperatures (t1), (t2), (tx), and (t0) at that time. Then, those characteristics are used for measurments to send out the 2nd start signal when the voltage reaches Vo. However, there is no need to waite for this invariably and characteristics at the time of Vx right before Vo are not different. In this way, the measurement time is shortened without breaking down the element.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14046077A JPS5472983A (en) | 1977-11-22 | 1977-11-22 | Measuring method for semiconductor element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14046077A JPS5472983A (en) | 1977-11-22 | 1977-11-22 | Measuring method for semiconductor element |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5472983A true JPS5472983A (en) | 1979-06-11 |
Family
ID=15269106
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14046077A Pending JPS5472983A (en) | 1977-11-22 | 1977-11-22 | Measuring method for semiconductor element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5472983A (en) |
-
1977
- 1977-11-22 JP JP14046077A patent/JPS5472983A/en active Pending
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