JPS5472983A - Measuring method for semiconductor element - Google Patents

Measuring method for semiconductor element

Info

Publication number
JPS5472983A
JPS5472983A JP14046077A JP14046077A JPS5472983A JP S5472983 A JPS5472983 A JP S5472983A JP 14046077 A JP14046077 A JP 14046077A JP 14046077 A JP14046077 A JP 14046077A JP S5472983 A JPS5472983 A JP S5472983A
Authority
JP
Japan
Prior art keywords
time
measurement
measurements
constant current
terminal voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14046077A
Other languages
Japanese (ja)
Inventor
Keiichi Nakagawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Home Electronics Ltd
NEC Corp
Original Assignee
NEC Home Electronics Ltd
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Home Electronics Ltd, Nippon Electric Co Ltd filed Critical NEC Home Electronics Ltd
Priority to JP14046077A priority Critical patent/JPS5472983A/en
Publication of JPS5472983A publication Critical patent/JPS5472983A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PURPOSE: To shorten the time for repetitive measurements of semiconductor elements, by storing a terminal voltage, obtained by flowing a constant current to an element before the measurement, as its initial value and by sending out a start signal for repetitive measurements using this value as the standard.
CONSTITUTION: Before the test measurement, a constant current is flowed to find terminal voltage Vo at temperature (to). Next, since the element is heated through the 1st test measurement, the 2nd measurement should be done after the element becomes cool. As a result, measurements require a long time, and for the purpose, a constant current is flowed at the 2nd and 3rd measurements to find terminal voltage V1, V2,Vx, and final Vo corresponding to temperatures (t1), (t2), (tx), and (t0) at that time. Then, those characteristics are used for measurments to send out the 2nd start signal when the voltage reaches Vo. However, there is no need to waite for this invariably and characteristics at the time of Vx right before Vo are not different. In this way, the measurement time is shortened without breaking down the element.
COPYRIGHT: (C)1979,JPO&Japio
JP14046077A 1977-11-22 1977-11-22 Measuring method for semiconductor element Pending JPS5472983A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14046077A JPS5472983A (en) 1977-11-22 1977-11-22 Measuring method for semiconductor element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14046077A JPS5472983A (en) 1977-11-22 1977-11-22 Measuring method for semiconductor element

Publications (1)

Publication Number Publication Date
JPS5472983A true JPS5472983A (en) 1979-06-11

Family

ID=15269106

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14046077A Pending JPS5472983A (en) 1977-11-22 1977-11-22 Measuring method for semiconductor element

Country Status (1)

Country Link
JP (1) JPS5472983A (en)

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