JPS5437582A - Measuring method for capacity of three-terminal semiconductor element - Google Patents
Measuring method for capacity of three-terminal semiconductor elementInfo
- Publication number
- JPS5437582A JPS5437582A JP10385477A JP10385477A JPS5437582A JP S5437582 A JPS5437582 A JP S5437582A JP 10385477 A JP10385477 A JP 10385477A JP 10385477 A JP10385477 A JP 10385477A JP S5437582 A JPS5437582 A JP S5437582A
- Authority
- JP
- Japan
- Prior art keywords
- capacity
- semiconductor element
- measuring method
- terminal semiconductor
- terminals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE: To measure the capacity between terminals independently by connecting terminals except terminals to be measured to the grounded terminal of an electrostatic-capacity measuring instrument.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10385477A JPS5437582A (en) | 1977-08-29 | 1977-08-29 | Measuring method for capacity of three-terminal semiconductor element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10385477A JPS5437582A (en) | 1977-08-29 | 1977-08-29 | Measuring method for capacity of three-terminal semiconductor element |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5437582A true JPS5437582A (en) | 1979-03-20 |
Family
ID=14365019
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10385477A Pending JPS5437582A (en) | 1977-08-29 | 1977-08-29 | Measuring method for capacity of three-terminal semiconductor element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5437582A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS583718A (en) * | 1981-06-30 | 1983-01-10 | Kawasaki Steel Corp | Side guide for strip material rolling |
JPS583717A (en) * | 1981-06-30 | 1983-01-10 | Kawasaki Steel Corp | Through type side guide for strip material rolling |
JPS583716A (en) * | 1981-06-30 | 1983-01-10 | Kawasaki Steel Corp | Through type side guide for strip material rolling |
JPS58119402A (en) * | 1982-01-06 | 1983-07-15 | Kawasaki Steel Corp | Rolling method of bar steel |
JPS5930403A (en) * | 1982-08-10 | 1984-02-18 | Nippon Steel Corp | Rolling method of wire rod |
JPS60121007A (en) * | 1983-12-05 | 1985-06-28 | Kobe Steel Ltd | Continuous rolling method by using flat roll |
JP2017090266A (en) * | 2015-11-11 | 2017-05-25 | 三菱電機株式会社 | Resonance device in parasite capacitance measurement system of semiconductor device, parasite capacitance measurement system of semiconductor device, and measurement method of parasite capacitance of semiconductor device |
-
1977
- 1977-08-29 JP JP10385477A patent/JPS5437582A/en active Pending
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS583718A (en) * | 1981-06-30 | 1983-01-10 | Kawasaki Steel Corp | Side guide for strip material rolling |
JPS583717A (en) * | 1981-06-30 | 1983-01-10 | Kawasaki Steel Corp | Through type side guide for strip material rolling |
JPS583716A (en) * | 1981-06-30 | 1983-01-10 | Kawasaki Steel Corp | Through type side guide for strip material rolling |
JPS6040932B2 (en) * | 1981-06-30 | 1985-09-13 | 川崎製鉄株式会社 | Side guide for strip rolling using horizontal flat rolls |
JPS6111133B2 (en) * | 1981-06-30 | 1986-04-01 | Kawasaki Steel Co | |
JPS6116202B2 (en) * | 1981-06-30 | 1986-04-28 | Kawasaki Steel Co | |
JPS58119402A (en) * | 1982-01-06 | 1983-07-15 | Kawasaki Steel Corp | Rolling method of bar steel |
JPS5930403A (en) * | 1982-08-10 | 1984-02-18 | Nippon Steel Corp | Rolling method of wire rod |
JPS60121007A (en) * | 1983-12-05 | 1985-06-28 | Kobe Steel Ltd | Continuous rolling method by using flat roll |
JP2017090266A (en) * | 2015-11-11 | 2017-05-25 | 三菱電機株式会社 | Resonance device in parasite capacitance measurement system of semiconductor device, parasite capacitance measurement system of semiconductor device, and measurement method of parasite capacitance of semiconductor device |
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