JPS5017739A - - Google Patents
Info
- Publication number
- JPS5017739A JPS5017739A JP49051401A JP5140174A JPS5017739A JP S5017739 A JPS5017739 A JP S5017739A JP 49051401 A JP49051401 A JP 49051401A JP 5140174 A JP5140174 A JP 5140174A JP S5017739 A JPS5017739 A JP S5017739A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318558—Addressing or selecting of subparts of the device under test
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7317606A FR2330014A1 (fr) | 1973-05-11 | 1973-05-11 | Procede de test de bloc de circuits logiques integres et blocs en faisant application |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5017739A true JPS5017739A (ja) | 1975-02-25 |
JPS5247292B2 JPS5247292B2 (ja) | 1977-12-01 |
Family
ID=9119374
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP49051401A Expired JPS5247292B2 (ja) | 1973-05-11 | 1974-05-10 |
Country Status (5)
Country | Link |
---|---|
US (1) | US3924144A (ja) |
JP (1) | JPS5247292B2 (ja) |
DE (1) | DE2413805C2 (ja) |
FR (1) | FR2330014A1 (ja) |
GB (1) | GB1457564A (ja) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5792832A (en) * | 1980-12-01 | 1982-06-09 | Nippon Telegr & Teleph Corp <Ntt> | Data process system of electron beam exposing device |
JPS5820294U (ja) * | 1981-08-03 | 1983-02-08 | 東光産業株式会社 | 軌道用作業車 |
JPS5936200U (ja) * | 1982-08-30 | 1984-03-07 | ミカサ株式会社 | スタンド型x線装置における脚柱の伸縮装置 |
JPS62249893A (ja) * | 1986-04-04 | 1987-10-30 | 株式会社ジャパニック | 昇降装置 |
JPS62259993A (ja) * | 1986-05-02 | 1987-11-12 | 株式会社ジャパニック | 昇降装置 |
JPH07167923A (ja) * | 1994-10-03 | 1995-07-04 | Oki Electric Ind Co Ltd | テスト用回路付集積回路 |
US6370663B1 (en) | 1998-01-05 | 2002-04-09 | Nec Corporation | Semiconductor integrated circuit |
Families Citing this family (36)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3958110A (en) * | 1974-12-18 | 1976-05-18 | Ibm Corporation | Logic array with testing circuitry |
US4009437A (en) * | 1976-03-31 | 1977-02-22 | Burroughs Corporation | Net analyzer for electronic circuits |
US4071902A (en) * | 1976-06-30 | 1978-01-31 | International Business Machines Corporation | Reduced overhead for clock testing in a level system scan design (LSSD) system |
JPS5341952A (en) * | 1976-09-29 | 1978-04-15 | Fujitsu Ltd | Two-way transmission system |
SU802970A1 (ru) * | 1977-04-08 | 1981-02-07 | Предприятие П/Я В-8495 | Устройство дл функционального конт-РОл бОльшиХ иНТЕгРАльНыХ CXEM |
US4180772A (en) * | 1977-05-31 | 1979-12-25 | Fujitsu Limited | Large-scale integrated circuit with integral bi-directional test circuit |
US4183460A (en) * | 1977-12-23 | 1980-01-15 | Burroughs Corporation | In-situ test and diagnostic circuitry and method for CML chips |
US4286173A (en) * | 1978-03-27 | 1981-08-25 | Hitachi, Ltd. | Logical circuit having bypass circuit |
AU530415B2 (en) * | 1978-06-02 | 1983-07-14 | International Standard Electric Corp. | Integrated circuits |
FR2432175A1 (fr) * | 1978-07-27 | 1980-02-22 | Cii Honeywell Bull | Procede pour tester un systeme logique et systeme logique pour la mise en oeuvre de ce procede |
DE2839950B1 (de) * | 1978-09-14 | 1979-10-25 | Ibm Deutschland | Einrichtung zur Feststellung der Laenge beliebiger Schieberegister |
US4225957A (en) * | 1978-10-16 | 1980-09-30 | International Business Machines Corporation | Testing macros embedded in LSI chips |
DE2905271A1 (de) * | 1979-02-12 | 1980-08-21 | Philips Patentverwaltung | Integrierte schaltungsanordnung in mos-technik mit feldeffekttransistoren |
DE2905294A1 (de) * | 1979-02-12 | 1980-08-21 | Philips Patentverwaltung | Integrierte schaltungsanordnung in mos-technik mit feldeffekttransistoren |
FR2451672A1 (fr) * | 1979-03-15 | 1980-10-10 | Nippon Electric Co | Circuit logique integre pour l'execution de tests |
DE2917126C2 (de) * | 1979-04-27 | 1983-01-27 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Verfahren zum Prüfen einer integrierten Schaltung und Anordnung zur Durchführung des Verfahrens |
US4377757A (en) * | 1980-02-11 | 1983-03-22 | Siemens Aktiengesellschaft | Logic module for integrated digital circuits |
DE3176315D1 (en) * | 1980-04-11 | 1987-08-20 | Siemens Ag | Device for testing a digital circuit with test circuits enclosed in this circuit |
US4357703A (en) * | 1980-10-09 | 1982-11-02 | Control Data Corporation | Test system for LSI circuits resident on LSI chips |
FR2506045A1 (fr) * | 1981-05-15 | 1982-11-19 | Thomson Csf | Procede et dispositif de selection de circuits integres a haute fiabilite |
DE3232215A1 (de) * | 1982-08-30 | 1984-03-01 | Siemens AG, 1000 Berlin und 8000 München | Monolithisch integrierte digitale halbleiterschaltung |
EP0109770B1 (en) * | 1982-11-20 | 1986-12-30 | International Computers Limited | Testing digital electronic circuits |
US4608669A (en) * | 1984-05-18 | 1986-08-26 | International Business Machines Corporation | Self contained array timing |
JPH073865B2 (ja) * | 1984-08-07 | 1995-01-18 | 富士通株式会社 | 半導体集積回路及び半導体集積回路の試験方法 |
DE3526485A1 (de) * | 1985-07-24 | 1987-02-05 | Heinz Krug | Schaltungsanordnung zum pruefen integrierter schaltungseinheiten |
US4644265A (en) * | 1985-09-03 | 1987-02-17 | International Business Machines Corporation | Noise reduction during testing of integrated circuit chips |
JPH0746120B2 (ja) * | 1986-03-10 | 1995-05-17 | 株式会社東芝 | テスト容易化回路及びテスト方法 |
JPS62220879A (ja) * | 1986-03-22 | 1987-09-29 | Hitachi Ltd | 半導体装置 |
JPH0691140B2 (ja) * | 1986-07-11 | 1994-11-14 | 日本電気株式会社 | 半導体集積回路 |
DE3713070A1 (de) * | 1987-04-16 | 1988-11-03 | Siemens Ag | Schaltungsanordnung fuer teileinheiten eines aus mehreren teileinheiten zusammengesetzten speicherprogrammiert gesteuerten geraetes oder systems, zum beispiel datenverarbeitungsanlage |
DE3801220A1 (de) * | 1988-01-18 | 1989-07-27 | Siemens Ag | Vielstufiger binaerzaehler mit einer ausstattung zur durchfuehrung von testlaeufen |
JP2513762B2 (ja) * | 1988-01-29 | 1996-07-03 | 株式会社東芝 | 論理回路 |
US5271019A (en) * | 1991-03-15 | 1993-12-14 | Amdahl Corporation | Scannable system with addressable scan reset groups |
DE4132072A1 (de) * | 1991-09-26 | 1993-04-08 | Grundig Emv | Pruefeinrichtung fuer integrierte schaltkreise |
KR100676556B1 (ko) | 1998-11-09 | 2007-01-30 | 사이러스 로직, 인코포레이티드 | 자기 하드 디스크 드라이브를 위한 혼합-신호 싱글-칩집적 시스템 전자장치 |
TW411543B (en) * | 1999-01-15 | 2000-11-11 | Via Tech Inc | Chip testing system |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3466544A (en) * | 1965-10-18 | 1969-09-09 | Boeing Co | Integrated circuits having integrated test transformation networks incorporated therewith on common substrate chips |
US3742254A (en) * | 1971-01-27 | 1973-06-26 | Texas Instruments Inc | Automatic mos grounding circuit |
US3758761A (en) * | 1971-08-17 | 1973-09-11 | Texas Instruments Inc | Self-interconnecting/self-repairable electronic systems on a slice |
US3790885A (en) * | 1972-03-27 | 1974-02-05 | Ibm | Serial test patterns for mosfet testing |
US3789205A (en) * | 1972-09-28 | 1974-01-29 | Ibm | Method of testing mosfet planar boards |
-
1973
- 1973-05-11 FR FR7317606A patent/FR2330014A1/fr active Granted
-
1974
- 1974-03-22 DE DE2413805A patent/DE2413805C2/de not_active Expired
- 1974-04-03 US US457333A patent/US3924144A/en not_active Expired - Lifetime
- 1974-04-08 GB GB1543074A patent/GB1457564A/en not_active Expired
- 1974-05-10 JP JP49051401A patent/JPS5247292B2/ja not_active Expired
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5792832A (en) * | 1980-12-01 | 1982-06-09 | Nippon Telegr & Teleph Corp <Ntt> | Data process system of electron beam exposing device |
JPS632139B2 (ja) * | 1980-12-01 | 1988-01-18 | Nippon Denshin Denwa Kk | |
JPS5820294U (ja) * | 1981-08-03 | 1983-02-08 | 東光産業株式会社 | 軌道用作業車 |
JPH0120395Y2 (ja) * | 1981-08-03 | 1989-06-16 | ||
JPS5936200U (ja) * | 1982-08-30 | 1984-03-07 | ミカサ株式会社 | スタンド型x線装置における脚柱の伸縮装置 |
JPS62249893A (ja) * | 1986-04-04 | 1987-10-30 | 株式会社ジャパニック | 昇降装置 |
JPH0521837B2 (ja) * | 1986-04-04 | 1993-03-25 | Hikoma Seisakusho Kk | |
JPS62259993A (ja) * | 1986-05-02 | 1987-11-12 | 株式会社ジャパニック | 昇降装置 |
JPH0521839B2 (ja) * | 1986-05-02 | 1993-03-25 | Hikoma Seisakusho Kk | |
JPH07167923A (ja) * | 1994-10-03 | 1995-07-04 | Oki Electric Ind Co Ltd | テスト用回路付集積回路 |
US6370663B1 (en) | 1998-01-05 | 2002-04-09 | Nec Corporation | Semiconductor integrated circuit |
Also Published As
Publication number | Publication date |
---|---|
FR2330014B1 (ja) | 1978-04-28 |
DE2413805C2 (de) | 1983-08-04 |
JPS5247292B2 (ja) | 1977-12-01 |
FR2330014A1 (fr) | 1977-05-27 |
US3924144A (en) | 1975-12-02 |
DE2413805A1 (de) | 1974-11-28 |
GB1457564A (en) | 1976-12-08 |