JPH07326778A - Sensor module - Google Patents

Sensor module

Info

Publication number
JPH07326778A
JPH07326778A JP6117011A JP11701194A JPH07326778A JP H07326778 A JPH07326778 A JP H07326778A JP 6117011 A JP6117011 A JP 6117011A JP 11701194 A JP11701194 A JP 11701194A JP H07326778 A JPH07326778 A JP H07326778A
Authority
JP
Japan
Prior art keywords
substrate
sensor element
hole
infrared sensor
bare chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP6117011A
Other languages
Japanese (ja)
Inventor
Sadayuki Sumi
貞幸 角
Shigenari Takami
茂成 高見
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP6117011A priority Critical patent/JPH07326778A/en
Publication of JPH07326778A publication Critical patent/JPH07326778A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched

Landscapes

  • Light Receiving Elements (AREA)

Abstract

PURPOSE:To prevent the deformation of a heat insulating film by providing ventilating means for allowing outside air to intrude into the through holes of an infrared sensor chip on the surface of a small substrate which is the main body of a bare chip mounting substrate. CONSTITUTION:An infrared sensor chip 6 is bonded to a small substrate 13 with die bonding paste. Grooves 13a are formed on the substrate 13 as ventilating means, with the positions and lengths of the grooves 13a being set so that each groove 13a can pass below each through hole 7a and can become a passage for outside air intruding into the hole 7a. Therefore, the deformation of a heat insulating film 8 on the substrate 13 can be prevented, because the air pressure in the holes 7a becomes the same as the air pressure outside the holes 7a.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、赤外線、紫外線等を検
出するセンサーモジュールに関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sensor module for detecting infrared rays, ultraviolet rays and the like.

【0002】[0002]

【従来の技術】従来、赤外線、紫外線等を検出するセン
サーの構成単位として、 CANパッケージに封止されたセ
ンサー素子及びそのセンサー素子の出力信号を処理する
信号処理用IC及びその信号処理用ICの周辺部品を1枚の
基板上に実装したセンサーモジュールという構成が用い
られていた。
2. Description of the Related Art Conventionally, a sensor element encapsulated in a CAN package, a signal processing IC for processing an output signal of the sensor element, and a signal processing IC thereof have been used as a constituent unit of a sensor for detecting infrared rays, ultraviolet rays, and the like. A configuration called a sensor module in which peripheral components are mounted on one board has been used.

【0003】図2に赤外線を検出する赤外線センサーモ
ジュールの一例を示す。図2で、(a)は赤外線センサ
ーモジュールの表側(赤外線を受光する側)の構造を示
した斜視図、(b)は赤外線センサーモジュールの裏側
の構造を示した斜視図である。図2で、1は本体基板、
2はセンサー素子である赤外線センサー素子を内蔵した
CANパッケージ、3はクワッドフラットパッケージ形の
信号処理用IC、4は本体部分が本体基板1の表側に実装
された、LED、電解コンデンサ等のリード端子付き部
品、5は基板1の裏面側に実装された表面実装用のチッ
プ部品である。2aは CANパッケージ2の上部に形成さ
れた開口に固着されたプラスチックフィルターで、赤外
線のみを CANパッケージ2の内部に透過させるものであ
る。
FIG. 2 shows an example of an infrared sensor module for detecting infrared rays. In FIG. 2, (a) is a perspective view showing the structure of the front side (side receiving infrared rays) of the infrared sensor module, and (b) is a perspective view showing the structure of the back side of the infrared sensor module. In FIG. 2, 1 is a main substrate,
2 has built-in infrared sensor element which is a sensor element
CAN package, 3 is a quad flat package type signal processing IC, 4 is a main body mounted on the front side of the main board 1, LED and parts with lead terminals such as electrolytic capacitors, 5 is the back side of the board 1. Is a chip component for surface mounting. Reference numeral 2a is a plastic filter fixed to an opening formed in the upper part of the CAN package 2 and transmits only infrared rays to the inside of the CAN package 2.

【0004】次に、図3に基づいて CANパッケージ2に
内蔵される赤外線センサー素子6の一例を説明する。図
で、(a)は表面側の構造を示す斜視図、(b)はA−
A断面図である。図において、略正方形平板状の半導体
基板7の表面には熱絶縁膜8が形成され、さらにその上
部には赤外線を感知する4個の熱検知部9(検知部)が
実装されている。その他、各熱検知部9を電気的に接続
する配線部分10及び半導体基板7との接続のためにボ
ンディングワイヤーの一端が接合される電極パッド11
が熱絶縁膜8上に形成されている。熱検知部9の下部の
半導体基板部分は除去されており、略四角錐台上の貫通
穴7aが形成されている。このように、貫通穴7a上の
熱絶縁膜8上に熱検知部9を形成することによって、赤
外線を受けて温度上昇した熱検知部9の熱が伝導によっ
て逃げにくくなり赤外線検出の感度を高めることができ
る。
Next, an example of the infrared sensor element 6 incorporated in the CAN package 2 will be described with reference to FIG. In the figure, (a) is a perspective view showing the structure on the front side, and (b) is A-.
FIG. In the figure, a heat insulating film 8 is formed on the surface of a semiconductor substrate 7 having a substantially square plate shape, and four heat detecting portions 9 (detecting portions) for detecting infrared rays are mounted on the heat insulating film 8. Besides, an electrode pad 11 to which one end of a bonding wire is joined in order to connect with the wiring portion 10 for electrically connecting each heat detecting portion 9 and the semiconductor substrate 7.
Are formed on the heat insulating film 8. The semiconductor substrate portion under the heat detection unit 9 is removed, and a through hole 7a having a substantially truncated pyramid shape is formed. In this way, by forming the heat detecting portion 9 on the heat insulating film 8 on the through hole 7a, the heat of the heat detecting portion 9 whose temperature has been increased by receiving infrared rays is less likely to escape by conduction, and the sensitivity of infrared ray detection is increased. be able to.

【0005】[0005]

【発明が解決しようとする課題】図3に示したような赤
外線センサー素子6の場合、例えば、図2に示したよう
に CANパッケージ2に封止されていた。これは赤外線セ
ンサー素子6の信頼性及び感度を保持するためと、赤外
線を CANパッケージ2の内部に透過させるセンサー受光
窓2aを設けることができるパッケージにする必要があ
るからである。しかし、 CANパッケージ2は小型化が困
難で、また、高感度が要求される場合は内部に特定の封
入ガスを充填しなければならないのでコスト高になると
いう問題点があった。
In the case of the infrared sensor element 6 as shown in FIG. 3, it is sealed in the CAN package 2 as shown in FIG. 2, for example. This is because it is necessary to maintain the reliability and sensitivity of the infrared sensor element 6 and to make the package capable of providing the sensor light receiving window 2a that allows infrared rays to pass through inside the CAN package 2. However, the CAN package 2 is difficult to miniaturize, and if high sensitivity is required, the interior of the CAN package 2 must be filled with a specific enclosed gas, resulting in high cost.

【0006】赤外線センサー素子6を CAN封止せずに赤
外線センサーモジュールを構成する方法としては、本体
基板1の他に、一方の面に赤外線センサー素子6をベア
チップ実装し他方の面に信号処理用ICのベアチップを実
装したベアチップ実装基板を設けて、そのベアチップ実
装基板を本体基板1に実装する方法があった。図4にそ
のベアチップ実装基板12の一例を示す。図4は、ベア
チップ実装基板12の側面図で、13は一方の面に赤外
線センサー素子6がダイボンドされた小基板、14は小
基板13の他方の面にダイボンドされたベアチップ状の
信号処理用IC、15は、赤外線センサー素子6と小基板
13、または、信号処理用IC14と小基板13とを接続
するボンディングワイヤ、16は信号処理用IC14及び
それに接続されたボンディングワイヤ15を保護する封
止樹脂である。赤外線センサー素子6及び信号処理用IC
14は、ダイボンドペースト(図示省略)によって小基
板13上にダイボンドされている。
As a method of constructing an infrared sensor module without sealing the infrared sensor element 6 in CAN, in addition to the main substrate 1, the infrared sensor element 6 is bare-chip mounted on one surface and the signal processing IC is mounted on the other surface. There is a method of providing a bare chip mounting substrate on which the bare chip of (1) is mounted and mounting the bare chip mounting substrate on the main body substrate 1. FIG. 4 shows an example of the bare chip mounting substrate 12. FIG. 4 is a side view of the bare chip mounting substrate 12, 13 is a small substrate having the infrared sensor element 6 die-bonded on one surface thereof, and 14 is a bare chip-shaped signal processing IC die-bonded to the other surface of the small substrate 13. , 15 are bonding wires connecting the infrared sensor element 6 and the small substrate 13, or the signal processing IC 14 and the small substrate 13, and 16 is a sealing resin for protecting the signal processing IC 14 and the bonding wires 15 connected thereto. Is. Infrared sensor element 6 and signal processing IC
14 is die-bonded onto the small substrate 13 with a die-bonding paste (not shown).

【0007】次に、図5に赤外線センサーモジュールの
一例を示す。図5で、(a)はベアチップ実装基板12
を本体基板17に実装する前の状態を示す本体基板表側
の斜視図、(b)はベアチップ実装基板12を本体基板
17に実装する前の状態を示す本体基板裏側の斜視図、
(c)はベアチップ実装基板12を基板17に実装した
状態を示す本体基板表側の斜視図、(d)はベアチップ
実装基板12を本体基板17に実装した状態を示す本体
基板裏側の斜視図である。
Next, FIG. 5 shows an example of an infrared sensor module. In FIG. 5, (a) shows the bare chip mounting substrate 12
Is a front perspective view of the main body substrate showing a state before being mounted on the main body substrate 17, (b) is a rear perspective view of the main body substrate showing a state before mounting the bare chip mounting substrate 12 on the main body substrate 17,
(C) is a perspective view of the front side of the main body substrate showing the bare chip mounting substrate 12 mounted on the substrate 17, and (d) is a perspective view of the back side of the main substrate showing the bare chip mounting substrate 12 mounted on the main substrate 17. .

【0008】図5で、本体基板17には両面に回路パタ
ーンが形成されていると共に、平面視略矩形状のセンサ
ー受光窓17aが中央部分に形成されている。また、本
体基板17には電解コンデンサ等のリード付電子部品1
8、表面実装用のチップ部品19等が実装されている。
In FIG. 5, a circuit pattern is formed on both sides of the main body substrate 17, and a sensor light receiving window 17a having a substantially rectangular shape in plan view is formed in the central portion. In addition, the main body board 17 has an electronic component 1 with leads such as an electrolytic capacitor
8. Chip components 19 for surface mounting, etc. are mounted.

【0009】図に示すように、赤外線センサー素子6の
上部の受光面が本体基板17に形成されたセンサー受光
窓17aに臨みベアチップ実装基板12がセンサー受光
窓17aの一方の開口を塞ぐようにベアチップ実装基板
12は本体基板17に接着剤によって固着されている。
また、センサー受光窓17aの他方の開口を塞ぐように
プラスチックフィルター20が本体基板17に取り付け
られている。このように本体基板17の内部に赤外線セ
ンサー素子6を配置することによって、赤外線をプラス
チックフィルター20を介して赤外線センサー素子6に
入射させることができると共に、赤外線センサー素子6
を保護することができるので、パッケージが不要となり
封止工程の簡略化によるコスト低減、小型化を図ること
ができた。
As shown in the figure, the bare chip mounting substrate 12 has a light-receiving surface on the upper side of the infrared sensor element 6 facing a sensor light-receiving window 17a formed in the main body substrate 17 so as to cover one opening of the sensor light-receiving window 17a. The mounting substrate 12 is fixed to the main body substrate 17 with an adhesive.
A plastic filter 20 is attached to the main body substrate 17 so as to close the other opening of the sensor light receiving window 17a. By arranging the infrared sensor element 6 inside the main body substrate 17 as described above, infrared rays can be made incident on the infrared sensor element 6 through the plastic filter 20, and at the same time, the infrared sensor element 6 can be made incident.
Since the package can be protected, the package is not necessary, and the cost can be reduced and the size can be reduced by simplifying the sealing process.

【0010】しかし、赤外線センサー素子6を小基板1
3上にダイボンドペーストでダイボンドした後に、赤外
線センサー素子6の特性劣化が発生したり破壊が発生す
るという問題点があった。この問題点の原因を図6に基
づいて説明する。図6は小基板13上へ赤外線センサー
素子6を実装するダイボンド工程を示す工程図である。
まず、(a)に示すように、小基板13の赤外線センサ
ー素子6実装位置の所定箇所にダイボンドペースト21
を供給し、赤外線センサー素子6を実装位置に配置す
る。(b)は配置した状態を示す断面図である。次に、
リフロー等により加熱すると、(c)に示したように、
赤外線センサー素子6に形成された貫通穴6aの内部の
気体が膨張して貫通穴6aの外部にぬける。その状態で
ダイボンドペースト21は、赤外線センサー素子6の下
面で、貫通穴6aの開口の周囲に広がるので、貫通穴6
aはダイボンドペースト21によって外気と遮断される
ことになり、ダイボンドペースト21を硬化させるため
冷却すると、貫通穴6aの内部の圧力が外気圧より小さ
くなり、(d)に示すように、熱絶縁膜8が下方に凹状
に歪んでしまう。この現象が赤外線センサー素子6の劣
化、または、破壊の発生の原因となっていた。
However, the infrared sensor element 6 is attached to the small substrate 1.
After die-bonding the die 3 with the die-bonding paste, there was a problem that the characteristics of the infrared sensor element 6 were deteriorated or destroyed. The cause of this problem will be described with reference to FIG. FIG. 6 is a process diagram showing a die bonding process for mounting the infrared sensor element 6 on the small substrate 13.
First, as shown in (a), the die bond paste 21 is applied to a predetermined position of the mounting position of the infrared sensor element 6 on the small substrate 13.
And the infrared sensor element 6 is placed at the mounting position. (B) is sectional drawing which shows the state arrange | positioned. next,
When heated by reflow, etc., as shown in (c),
The gas inside the through hole 6a formed in the infrared sensor element 6 expands and penetrates the outside of the through hole 6a. In this state, the die bond paste 21 spreads around the opening of the through hole 6a on the lower surface of the infrared sensor element 6, so that the through hole 6
a is shielded from the outside air by the die bond paste 21, and when the die bond paste 21 is cooled to harden it, the pressure inside the through hole 6a becomes smaller than the outside pressure, and as shown in FIG. 8 is distorted downward in a concave shape. This phenomenon has caused the infrared sensor element 6 to deteriorate or break.

【0011】本発明は上記課題に鑑みなされたもので、
その目的とするところは、赤外線センサー素子をダイボ
ンドする際の脆弱な赤外線センサーチップの劣化または
破壊の発生を防止して、封止工程の簡素化による低コス
ト化、及び、小型化を図ることができるセンサーモジュ
ールの構造を提供することにある。
The present invention has been made in view of the above problems,
The purpose is to prevent the occurrence of deterioration or destruction of the fragile infrared sensor chip when die-bonding the infrared sensor element, and to achieve cost reduction and simplification by simplifying the sealing process. It is to provide a structure of a sensor module that can.

【0012】[0012]

【課題を解決するための手段】上記目的を達成するた
め、本発明のセンサーモジュールは、表面から裏面まで
達する貫通穴を備えた平板状の半導体基板と、前記貫通
穴の表面側開口を覆ってその周辺部が前記半導体基板に
支持された熱絶縁膜と、前記貫通穴上方の前記熱絶縁膜
上に形成された検知部とを備えたセンサー素子と、信号
処理用ICとを実装したセンサーモジュールにおいて、セ
ンサー受光窓が形成された本体基板に、一方の面に前記
センサー素子を実装し他方の面に前記信号処理用ICをベ
アチップ実装したベアチップ実装基板を、前記センサー
受光窓に前記センサー素子が臨むように実装すると共
に、前記貫通穴へ外気を侵入させるための通気手段を前
記ベアチップ実装基板の本体である小基板上に設けたこ
とを特徴とするものである。
In order to achieve the above object, the sensor module of the present invention includes a flat plate-shaped semiconductor substrate having a through hole extending from the front surface to the back surface and a front surface side opening of the through hole. A sensor module having a thermal insulation film whose peripheral portion is supported by the semiconductor substrate, a sensor element having a detection part formed on the thermal insulation film above the through hole, and a signal processing IC. In the main body substrate on which the sensor light receiving window is formed, a bare chip mounting substrate on which the sensor element is mounted on one surface and the signal processing IC is bare chip mounted on the other surface, and the sensor element is mounted on the sensor light receiving window. It is characterized in that it is mounted so as to face it, and ventilation means for allowing outside air to enter the through hole is provided on a small substrate which is the main body of the bare chip mounting substrate. It

【0013】[0013]

【作用】本発明のセンサーモジュールでは、ベアチップ
実装基板の本体である小基板上に、赤外線センサー素子
に形成された貫通穴へ外気を侵入させるための通気手段
を設けている。これにより、ダイボンドペーストで貫通
穴が外気と遮断されるのを防止することができるので熱
絶縁膜が歪むのを防止することができる。
In the sensor module of the present invention, ventilation means is provided on the small substrate, which is the main body of the bare chip mounting substrate, for allowing outside air to enter the through holes formed in the infrared sensor element. As a result, it is possible to prevent the die-bonding paste from blocking the through holes from the outside air, and thus prevent the thermal insulating film from being distorted.

【0014】[0014]

【実施例】図1に本発明のセンサーモジュールに用いる
ベアチップ実装基板の一実施例を示す。但し、図4に示
した構成と同等構成については同符号を付し詳細な説明
を省略することとする。図1は、ベアチップ実装基板1
2の側面図で、13は一方の面に赤外線センサー素子6
がダイボンドされた小基板、14は小基板13の他方の
面にダイボンドされたベアチップ状の信号処理用IC、1
5は、赤外線センサー素子6と小基板13、または、信
号処理用IC14と小基板13とを接続するボンディング
ワイヤ、16は信号処理用IC14及びそれに接続された
ボンディングワイヤ15を保護する封止樹脂である。赤
外線センサー素子6及び信号処理用IC14は、ダイボン
ドペースト(図示省略)によって小基板13上にダイボ
ンドされている。また、13aは通気手段として小基板
13上に2個形成された溝で、それぞれの溝13aは、
2つの貫通穴7aの下方を通過するように、言い換える
と、外気が貫通穴7aに侵入するための通路となるよう
に、その形成位置及び長さが設定されている。このよう
に構成することにより、貫通穴7aの内部の気圧は外気
圧と同気圧となるので熱絶縁膜8が歪むのを防止するこ
とができる。
EXAMPLE FIG. 1 shows an example of a bare chip mounting substrate used in the sensor module of the present invention. However, the same components as those shown in FIG. 4 will be assigned the same reference numerals and detailed explanations thereof will be omitted. FIG. 1 shows a bare chip mounting board 1.
In the side view of FIG. 2, 13 is the infrared sensor element 6 on one side.
Is a die-bonded small substrate, 14 is a bare chip-shaped signal processing IC die-bonded to the other surface of the small substrate 13, 1
5 is a bonding wire for connecting the infrared sensor element 6 and the small substrate 13, or the signal processing IC 14 and the small substrate 13, and 16 is a sealing resin for protecting the signal processing IC 14 and the bonding wire 15 connected thereto. is there. The infrared sensor element 6 and the signal processing IC 14 are die-bonded on the small substrate 13 with a die-bonding paste (not shown). Further, 13a is a groove formed on the small substrate 13 as a ventilation means, and each groove 13a is
The formation position and length are set so as to pass below the two through holes 7a, in other words, to form a passage for outside air to enter the through holes 7a. With this configuration, the atmospheric pressure inside the through hole 7a becomes the same as the atmospheric pressure, so that the thermal insulating film 8 can be prevented from being distorted.

【0015】なお、実施例では、通気手段は溝13aで
あるとして説明したが、実施例に限定されず、外気が貫
通穴7aに侵入するための通路となる形状であればよ
い。また、センサー素子は赤外線センサー素子に限定さ
れるものではない。
Although the ventilation means is described as the groove 13a in the embodiment, it is not limited to the embodiment, and any shape may be used as a passage for the outside air to enter the through hole 7a. The sensor element is not limited to the infrared sensor element.

【0016】[0016]

【発明の効果】以上のように、本発明のセンサーモジュ
ールでは、ベアチップ実装基板の本体である小基板に、
外気が赤外線センサーチップの貫通穴に侵入するための
通気手段を設けたので、熱絶縁膜の歪みの発生を防止す
ることができ、小型化を図ることができる。また、封止
構造を簡略化することができるので低コスト化を図るこ
ともできる。
As described above, in the sensor module of the present invention, the small substrate that is the main body of the bare chip mounting substrate is
Since the ventilation means for allowing the outside air to enter the through hole of the infrared sensor chip is provided, it is possible to prevent distortion of the heat insulating film and reduce the size. Further, since the sealing structure can be simplified, the cost can be reduced.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明のセンサーモジュールに用いられるベア
チップ実装基板の一実施例を示す側面図である。
FIG. 1 is a side view showing an embodiment of a bare chip mounting substrate used for a sensor module of the present invention.

【図2】従来のセンサーモジュールの一例を示す斜視図
である。
FIG. 2 is a perspective view showing an example of a conventional sensor module.

【図3】赤外線センサーチップの構造を示す図で、
(a)は斜視図、(b)はA−A断面図である。
FIG. 3 is a diagram showing the structure of an infrared sensor chip,
(A) is a perspective view and (b) is an AA sectional view.

【図4】従来のセンサーモジュールに用いられるベアチ
ップ実装基板の一例を示す側面図である。
FIG. 4 is a side view showing an example of a bare chip mounting substrate used for a conventional sensor module.

【図5】センサーモジュールの一例を示す斜視図であ
る。
FIG. 5 is a perspective view showing an example of a sensor module.

【図6】従来のセンサーモジュールのベアチップ実装基
板のダイボンド工程を説明する断面図である。
FIG. 6 is a cross-sectional view illustrating a die bonding process of a bare chip mounting substrate of a conventional sensor module.

【符号の説明】[Explanation of symbols]

6 赤外線センサー素子(センサー素
子) 7 半導体基板 7a 貫通穴 8 熱絶縁膜 9 熱検知部(検知部) 12 ベアチップ実装基板 13 小基板 13a 溝(通気手段) 14 信号処理用IC 17 本体基板 17a センサー受光窓
6 Infrared Sensor Element (Sensor Element) 7 Semiconductor Substrate 7a Through Hole 8 Thermal Insulation Film 9 Heat Detection Section (Detection Section) 12 Bare Chip Mounting Board 13 Small Board 13a Groove (Ventilation Means) 14 Signal Processing IC 17 Main Board 17a Sensor Light Reception window

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 表面から裏面まで達する貫通穴を備えた
平板状の半導体基板と、前記貫通穴の表面側開口を覆っ
てその周辺部が前記半導体基板に支持された熱絶縁膜
と、前記貫通穴上方の前記熱絶縁膜上に形成された検知
部とを備えたセンサー素子と、信号処理用ICとを実装し
たセンサーモジュールにおいて、センサー受光窓が形成
された本体基板に、一方の面に前記センサー素子を実装
し他方の面に前記信号処理用ICをベアチップ実装したベ
アチップ実装基板を、前記センサー受光窓に前記センサ
ー素子が臨むように実装すると共に、前記貫通穴へ外気
を侵入させるための通気手段を前記ベアチップ実装基板
の本体である小基板上に設けたことを特徴とするセンサ
ーモジュール。
1. A flat semiconductor substrate having a through hole extending from the front surface to the back surface, a heat insulating film having a peripheral portion supported by the semiconductor substrate and covering a front surface side opening of the through hole, and the through hole. A sensor element having a detection unit formed on the heat insulating film above the hole, and a sensor module in which a signal processing IC is mounted, in a main body substrate on which a sensor light receiving window is formed, the one surface of which is described above. A bare chip mounting substrate on which a sensor element is mounted and the signal processing IC is mounted on the other surface as a bare chip is mounted so that the sensor element faces the sensor light receiving window, and ventilation is provided to allow outside air to enter the through hole. A sensor module, wherein the means is provided on a small substrate which is a main body of the bare chip mounting substrate.
JP6117011A 1994-05-30 1994-05-30 Sensor module Withdrawn JPH07326778A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6117011A JPH07326778A (en) 1994-05-30 1994-05-30 Sensor module

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6117011A JPH07326778A (en) 1994-05-30 1994-05-30 Sensor module

Publications (1)

Publication Number Publication Date
JPH07326778A true JPH07326778A (en) 1995-12-12

Family

ID=14701250

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6117011A Withdrawn JPH07326778A (en) 1994-05-30 1994-05-30 Sensor module

Country Status (1)

Country Link
JP (1) JPH07326778A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6551853B2 (en) 2000-05-12 2003-04-22 Denso Corporation Sensor having membrane structure and method for manufacturing the same
DE102004008148B4 (en) * 2003-02-20 2014-03-13 Denso Corporation Sensor with membrane and method of manufacturing the sensor
CN107621272A (en) * 2016-07-15 2018-01-23 Tdk株式会社 Sensor unit

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6551853B2 (en) 2000-05-12 2003-04-22 Denso Corporation Sensor having membrane structure and method for manufacturing the same
DE102004008148B4 (en) * 2003-02-20 2014-03-13 Denso Corporation Sensor with membrane and method of manufacturing the sensor
CN107621272A (en) * 2016-07-15 2018-01-23 Tdk株式会社 Sensor unit
CN107621272B (en) * 2016-07-15 2021-06-04 Tdk株式会社 Sensor unit

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