JPH0224995A - Electroluminescence element - Google Patents

Electroluminescence element

Info

Publication number
JPH0224995A
JPH0224995A JP63175530A JP17553088A JPH0224995A JP H0224995 A JPH0224995 A JP H0224995A JP 63175530 A JP63175530 A JP 63175530A JP 17553088 A JP17553088 A JP 17553088A JP H0224995 A JPH0224995 A JP H0224995A
Authority
JP
Japan
Prior art keywords
emitting layer
light emitting
phosphor
transparent electrode
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63175530A
Other languages
Japanese (ja)
Inventor
Tsunemi Oiwa
大岩 恒美
Osamu Ishida
修 石田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Maxell Ltd
Original Assignee
Hitachi Maxell Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Maxell Ltd filed Critical Hitachi Maxell Ltd
Priority to JP63175530A priority Critical patent/JPH0224995A/en
Publication of JPH0224995A publication Critical patent/JPH0224995A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To make electric field resting on a phosphor layer uniform so as to improve brightness, in an EL element where a phosphor layer and a dielectric layer are provided between a transparent electrode and a rear electrode, by providing an insulating film consisting of oxide or nitride whose dielectric constant is specified beforehand between the transparent electrode and the light emitting layer in the specified width. CONSTITUTION:When providing a transparent electrode 2 consisting of an ITO film on a transparent substrate 1 such as polyethylene terephthalate, etc., and forming a phospherlayer 4 thereon, those are done as follows. That is, an insulating film 3 consisting of oxide or nitride whose dielectric constants is below 25 is provided beforehand between the electrode 2 and the light emitting layer 4 in the thickness of 5 to 10000nm. Thereafter, a dielectric layer 5 is formed on the light emitting layer 4, and is covered with a rear electrode 6, and these contents are sealed with armors 7 whose ends are fixed with adhesives 8. Since the insulating film 3 whose dielectric constant is small and whose thickness is thin are put between the electrode 2 and the light emitting layer 4 this way, unequal electric field is not applied to a phosphor which constitutes the light emitting layer 4, and the brightness improves.

Description

【発明の詳細な説明】 〔産業上の利用分野) 本発明はエレクトロルミネセンス素子に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to electroluminescent devices.

〔従来の技術〕[Conventional technology]

分散型のエレクトロルミネセンス素子では、発光層は蛍
光体とバインダーとの混合物からなり、第3図に示すよ
うに、透明電極2上に発光層4が直接形成されていた(
例えば、特開昭57−80695号公報)。
In the dispersion type electroluminescent device, the light emitting layer is made of a mixture of a phosphor and a binder, and as shown in FIG. 3, the light emitting layer 4 is formed directly on the transparent electrode 2 (
For example, Japanese Patent Application Laid-Open No. 57-80695).

〔発明が解決しようとする課題] しかし、上記エレクトロルミネセンス素子では、蛍光体
の誘電率とバインダーの誘電率とが異なるため、蛍光体
に不均一な電界がかかり、輝度が低くなるという問題が
あった。
[Problems to be Solved by the Invention] However, in the above electroluminescent device, since the dielectric constant of the phosphor and the dielectric constant of the binder are different, a non-uniform electric field is applied to the phosphor, resulting in a problem of low brightness. there were.

本発明は、上記のように、従来のエレクトロルミネセン
ス素子では、蛍光体に不均一な電界がかかり、それによ
って輝度が低下したという問題点を解決し、以って高輝
度のエレクトロルミネセンス素子を提供することを目的
とする。
As described above, the present invention solves the problem that in conventional electroluminescent devices, a non-uniform electric field is applied to the phosphor, resulting in a reduction in brightness. The purpose is to provide

〔課題を解決するための手段〕[Means to solve the problem]

本発明は、透明電極と発光層との間に比誘電率が25以
下の酸化物または窒化物からなる絶縁薄膜を5〜1,0
00nmの厚さに設けることによって、蛍光体に不均一
な電界がかかるのを防止して、高輝度を呈し得るように
したものである。
The present invention provides an insulating thin film made of an oxide or nitride with a dielectric constant of 25 or less between the transparent electrode and the light emitting layer.
By providing the phosphor with a thickness of 0.00 nm, it is possible to prevent a non-uniform electric field from being applied to the phosphor, thereby making it possible to exhibit high brightness.

すなわち、上記酸化物または窒化物からなる絶縁薄膜を
透明電極と発光層との間に設けることによって、発光層
にかかる電界が上記絶縁薄膜によって規制されるように
なり、従来のように蛍光体の誘電率とバインダーの誘電
率との相違に基づいて蛍光体に不均一な電界がかかるの
が防止され、均一な電界が蛍光体にかかるようになって
、エレクトロルミネセンス素子が高輝度を呈するように
なる。また、上記絶縁薄膜によって蛍光体と透明電極と
が接触しなくなり、発光時に蛍光体と透明電極との接触
部分で過大電流が流れて発光効率が低下するのが防止さ
れるようになり、この面からも輝度が向上する。
That is, by providing an insulating thin film made of the above oxide or nitride between the transparent electrode and the light-emitting layer, the electric field applied to the light-emitting layer is regulated by the insulating thin film, and the phosphor is Based on the difference between the dielectric constant and the dielectric constant of the binder, a non-uniform electric field is prevented from being applied to the phosphor, and a uniform electric field is applied to the phosphor, so that the electroluminescent device exhibits high brightness. become. In addition, the insulating thin film prevents contact between the phosphor and the transparent electrode, and prevents excessive current from flowing at the contact area between the phosphor and the transparent electrode during light emission and reducing luminous efficiency. Brightness also improves.

つぎに本発明のエレクトロルミネセンス素子の構成を図
面を参照しつつ説明する。
Next, the structure of the electroluminescent device of the present invention will be explained with reference to the drawings.

第1図は本発明に係るエレクトロルミネセンス素子の一
例を示す断面図である0図中、1は透明基板、2は透明
電極、3は比誘電率が25以下の酸化物または窒化物か
らなる絶縁薄膜であり、4は発光層、5は誘電層、6は
背面電極、7は防湿フィルムからなる外装体で、8は接
着剤である。なお、この第1図には図示されていないが
、透明電極2および背面電極6からはそれぞれリード体
が引き出され、外部の駆動電源と接続できるようになっ
ている。
FIG. 1 is a cross-sectional view showing an example of an electroluminescent device according to the present invention. In FIG. 1, 1 is a transparent substrate, 2 is a transparent electrode, and 3 is an oxide or nitride with a dielectric constant of 25 or less. It is an insulating thin film, 4 is a light emitting layer, 5 is a dielectric layer, 6 is a back electrode, 7 is an exterior body made of a moisture-proof film, and 8 is an adhesive. Although not shown in FIG. 1, lead bodies are drawn out from the transparent electrode 2 and the back electrode 6, respectively, so that they can be connected to an external drive power source.

透明基板lには例えば厚さが10〜50μrn程度のポ
リエチレンテレフタレートフィルムが用いられ、透明電
極2はインジウム−スズ酸化物膜(以下、ITO膜とい
う)からなり、上記透明基板I上に真空蒸着法やスパッ
タ法などにより形成される。
For example, a polyethylene terephthalate film with a thickness of about 10 to 50 μrn is used for the transparent substrate I, and the transparent electrode 2 is made of an indium-tin oxide film (hereinafter referred to as an ITO film), which is formed on the transparent substrate I by a vacuum evaporation method. It is formed by a sputtering method or the like.

絶縁薄膜3は、後に例示するような比誘電率が25以下
の酸化物または窒化物からなり、真空蒸着法やスパッタ
法などで上記透明型8i2上に形成される0発光層4は
蛍光体とバインダーとの混合物からなり、蛍光体として
はZnSを母体にし、これにCu、CIやCu、AI、
Cu、Mnなとの賦活剤が添加されたものが用いられて
おり、バインダーとしてはシアノエチル化セルロースや
シアノエチル化プルランなどの高誘電率有機物が用いら
れている。誘電層5はBaTi0zなどの高誘電率酸化
物と前述のシアノエチル化セルロース、シアノエチル化
プルランなどの高誘電率有機物よりなるバインダーとの
混合物からなる。これら発光層4および誘電層5を模式
的に拡大して示すと第2図のとおりであり、この第2図
に基づいて説明すると、発光層4ではシアンエチル化セ
ルロースやシアノエチル化プルランなどの高誘電率有機
物からなるバインダー4b中に蛍光体4aが分散して存
在しており、誘電層5では前記同様の高誘電率有機物か
らなるバインダー5b中にBaTi0.などの高誘電率
酸化物5aが分散して存在している。このように、発光
層4ではバインダー4b中に蛍光体4aが分散して存在
しているので、第3図に示すように、透明電極2上に直
接発光層4が形成されている従来構造のエレクトロルミ
ネセンス素子では、発光層4の蛍光体4aの誘電率とバ
インダー4bの誘電率との相違により蛍光体4aに不均
一な電界がかかり、輝度が低くなるという欠点が見られ
るが、本発明のエレクトロルミネセンス素子では、透明
電極2と発光層4との間に絶縁薄膜3が設けられている
ので、発光層4にかかる電界が絶縁薄膜3によって規制
され、蛍光体に不均一な電界がかかるのが防止されて、
均一な電界が蛍光体にかかるようになり、エレクトロル
ミネセンス素子が高輝度を呈するようになる。また、第
3図に示すように、透明電極2上に発光層4が直接形成
されている従来構造のエレクトロルミネセンス素子では
、蛍光体と透明電極2とが接触しているので、発光時に
蛍光体と透明電極2との接触部分で過大電流が流れて発
光効率が低下するという欠点も見られるが、本発明のエ
レクトロルミネセンス素子では、透明電極2と発光層4
との間に絶縁薄膜3が設けられているので、蛍光体と透
明電極2とが接触しなくなり、したがって、発光時に蛍
光体と透明電極2との接触部分で過大電流が流れて発光
効率が低下するのが防止されるようになり、この面から
も輝度が向上する。
The insulating thin film 3 is made of an oxide or nitride with a dielectric constant of 25 or less, as will be exemplified later, and the light emitting layer 4 formed on the transparent mold 8i2 by vacuum evaporation or sputtering is made of a phosphor. It consists of a mixture with a binder, and the phosphor is ZnS as a matrix, and Cu, CI, Cu, AI,
Those to which activators such as Cu and Mn are added are used, and high dielectric constant organic substances such as cyanoethylated cellulose and cyanoethylated pullulan are used as binders. The dielectric layer 5 is made of a mixture of a high dielectric constant oxide such as BaTiOz and a binder made of a high dielectric constant organic substance such as the aforementioned cyanoethylated cellulose or cyanoethylated pullulan. The light-emitting layer 4 and the dielectric layer 5 are schematically shown in enlarged form as shown in FIG. 2. Based on FIG. The phosphor 4a is dispersed in a binder 4b made of a dielectric constant organic substance, and in the dielectric layer 5, BaTi0. High dielectric constant oxides 5a such as oxides 5a are present in a dispersed manner. In this way, in the light-emitting layer 4, the phosphor 4a is dispersed in the binder 4b, so as shown in FIG. In an electroluminescent device, there is a drawback that a non-uniform electric field is applied to the phosphor 4a due to the difference between the dielectric constant of the phosphor 4a of the light emitting layer 4 and the dielectric constant of the binder 4b, resulting in low brightness. In this electroluminescent device, since the insulating thin film 3 is provided between the transparent electrode 2 and the light emitting layer 4, the electric field applied to the light emitting layer 4 is regulated by the insulating thin film 3, and a non-uniform electric field is generated on the phosphor. This is prevented,
A uniform electric field will be applied to the phosphor, and the electroluminescent device will exhibit high brightness. Furthermore, as shown in FIG. 3, in an electroluminescent element with a conventional structure in which a light emitting layer 4 is directly formed on a transparent electrode 2, since the phosphor and the transparent electrode 2 are in contact with each other, the fluorescent material emits light when emitting light. However, in the electroluminescent device of the present invention, the transparent electrode 2 and the light emitting layer 4
Since the insulating thin film 3 is provided between the phosphor and the transparent electrode 2, there is no contact between the phosphor and the transparent electrode 2. Therefore, when emitting light, an excessive current flows in the contact area between the phosphor and the transparent electrode 2, reducing luminous efficiency. The brightness is improved from this point of view as well.

背面電極6は厚さが50μm程度のアルミニウム箔また
は厚さ10〜50μmのポリエチレンテレフタレートフ
ィルム上に形成した厚さ100〜500nmのアルミニ
ウム蒸着膜からなり、外装体7としての防湿フィルムに
は厚さ100〜500am程度のポリクロロトリフルオ
ロエチレンシートが使用されている。
The back electrode 6 is made of an aluminum vapor-deposited film with a thickness of 100 to 500 nm formed on an aluminum foil with a thickness of about 50 μm or a polyethylene terephthalate film with a thickness of 10 to 50 μm. A polychlorotrifluoroethylene sheet of about 500 am is used.

そして、上記透明基板1、透明電極2、絶縁薄膜3、発
光層4、誘電層5、背面電極6などの素子内容物は上記
防湿フィルムからなる外装体7で覆われ、外装体7.7
同士の接合部は接着剤8で接着されて、素子内部が密閉
状態となるようにされている。
Element contents such as the transparent substrate 1, the transparent electrode 2, the insulating thin film 3, the light emitting layer 4, the dielectric layer 5, and the back electrode 6 are covered with the exterior body 7 made of the moisture-proof film.
The joints between them are bonded with an adhesive 8, so that the inside of the element is sealed.

前記の絶縁薄膜3を構成する材料は酸化物または窒化物
からなるが、これらの酸化物または窒化物は誘電率が2
5以下のもので、特に誘電率が3〜20の範囲のものが
好ましい、この絶縁薄膜3を構成する酸化物としては、
例えばAI!0ff(比誘電率8) 、Ta5ks (
比誘電率25) 、YgCh (比誘電率+5) 、S
 i Ox (比誘電率5)などが用いられ、窒化物と
しては例えばAIN (比誘電率8)、s 13N4 
(比誘電率5)などが用いられる。これら酸化物または
窒化物からなる絶縁El膜3は真空蒸着法、スパンタ法
などで透明電極2上に形成され、その厚みは5〜1,0
00nmの範囲であることが必要であり、特に10〜3
00nmの範囲が好ましい、すなわち、上記絶縁薄膜3
の厚みが5nmより薄くなると蛍光体にかかる電界を均
一にする効果が少なくなり、また絶縁薄膜3の厚みが1
.000nmより厚くなるとその厚み増加によって蛍光
体の発光状態が外部から視認しに(くなり坪度が低下す
る。
The material constituting the insulating thin film 3 is made of oxide or nitride, and these oxides or nitrides have a dielectric constant of 2.
The oxide constituting this insulating thin film 3 is preferably one having a dielectric constant of 5 or less, particularly in the range of 3 to 20.
For example, AI! 0ff (relative permittivity 8), Ta5ks (
Relative permittivity 25), YgCh (relative permittivity +5), S
iOx (relative permittivity 5), etc. are used, and examples of nitrides include AIN (relative permittivity 8), s13N4
(relative dielectric constant 5), etc. are used. The insulating El film 3 made of these oxides or nitrides is formed on the transparent electrode 2 by a vacuum evaporation method, a spunter method, etc., and has a thickness of 5 to 1.0
It needs to be in the range of 00 nm, especially in the range of 10 to 3
00 nm range is preferable, that is, the above insulating thin film 3
When the thickness of the insulating thin film 3 becomes thinner than 5 nm, the effect of making the electric field applied to the phosphor uniform becomes less.
.. When the thickness exceeds 000 nm, the luminescent state of the phosphor becomes more visible from the outside due to the increased thickness, and the dimensional stability decreases.

本発明において、絶縁薄膜3を構成するのに用いる酸化
物または窒化物の比誘電率を25以下に特定するのは、
比誘電率が大きくなると、透明電極2から発光層4にか
かる電界を絶縁薄II!43で規制することが困難にな
り、また厚み増加による杯度の低下を考慮すると形成し
うる膜厚の上限が1,000nm程度になるため、それ
らを考慮すると、比誘電率を25以下にしておくことが
必要となるからである。
In the present invention, the dielectric constant of the oxide or nitride used to form the insulating thin film 3 is specified to be 25 or less because
When the relative permittivity increases, the electric field applied from the transparent electrode 2 to the light emitting layer 4 is reduced by a thin insulator II! 43, and considering the decrease in coverage due to the increase in thickness, the upper limit of the film thickness that can be formed is about 1,000 nm. This is because it is necessary to keep the

〔実施例〕〔Example〕

つぎに実施例をあげて本発明をさらに詳細に説明する。 Next, the present invention will be explained in more detail with reference to Examples.

実施例1 透明基体となる厚さ50μmのポリエチレンテレフタレ
ートフィルム上に厚さ200nmのITOIQを真空蒸
着法によって形成して透明電極とし、この透明電極上に
絶縁薄膜として第1表に試料N1111〜I−5で示す
各膜厚みのA1□0.膜を真空蒸着法により形成した。
Example 1 A transparent electrode was formed by forming ITOIQ with a thickness of 200 nm by vacuum evaporation on a polyethylene terephthalate film with a thickness of 50 μm as a transparent substrate, and samples N1111 to I- A1□0. of each film thickness shown in 5. The film was formed by vacuum evaporation.

つぎに、上記A1□0.膜からなる絶縁薄膜上に、シア
ノエチル化プルランおよびZnS:Cu、CIをn−メ
チル−2−ピロリドンに分散させて調製した発光層形成
用のペーストをスクリーン印刷法で塗布し、乾燥して厚
さ60μmの発光層を形成し、ついで該発光層上にBa
Ti0+とシアノエチル化プルランをn−メチル−2−
ピロリドンに分散させて調製した誘電層形成用のペース
トをスクリーン印刷法で塗布し、乾燥して厚さ20μm
の誘電層を形成し、該誘電層上に厚さ50μmのアルミ
ニウム笛をラミネートして背面電極とした。そして、透
明電極と背面電極にそれぞれリード体を接続したのち、
全体を厚さ300μmのポリクロロトリフロロエチレン
よりなる防湿フィルムで上下より挟み、防湿フィルム同
士の接合部を接着剤で接着して封止し、エレクトロルミ
ネセンス素子を作製した。
Next, the above A1□0. A paste for forming a light-emitting layer prepared by dispersing cyanoethylated pullulan, ZnS:Cu, and CI in n-methyl-2-pyrrolidone is applied onto the insulating thin film consisting of the film using a screen printing method, and the paste is dried to form a thick layer. A light emitting layer of 60 μm is formed, and then Ba is deposited on the light emitting layer.
Ti0+ and cyanoethylated pullulan were combined with n-methyl-2-
A paste for forming a dielectric layer prepared by dispersing it in pyrrolidone was applied by screen printing and dried to a thickness of 20 μm.
A dielectric layer was formed, and an aluminum whistle having a thickness of 50 μm was laminated on the dielectric layer to form a back electrode. Then, after connecting the lead bodies to the transparent electrode and the back electrode,
The entire structure was sandwiched between upper and lower moisture-proof films made of polychlorotrifluoroethylene with a thickness of 300 μm, and the joints between the moisture-proof films were sealed with an adhesive to produce an electroluminescent device.

実施例2〜6 実施例1におけるA1.O,に代えて、それぞれT a
 、0..5in2、Y Z Ox、Si*N4、AI
Nを用い、それら酸化物または窒化物からなる絶縁薄膜
の厚みを300nmにした以外は実施例1と同様にして
エレクトロルミネセンス素子を作製した。
Examples 2 to 6 A1 in Example 1. In place of O, respectively, T a
,0. .. 5in2, YZ Ox, Si*N4, AI
An electroluminescent device was produced in the same manner as in Example 1 except that N was used and the thickness of the insulating thin film made of these oxides or nitrides was 300 nm.

比較例1 A1□0.からなる絶縁薄膜を形成しなかったほかは実
施例1と同様にしてエレクトロルミネセンス素子を作製
した。
Comparative example 1 A1□0. An electroluminescent device was produced in the same manner as in Example 1 except that the insulating thin film consisting of the following was not formed.

比較例2 A1.Olからなる絶縁薄膜の厚みを2nmに変えたほ
かは実施例1と同様にしてエレクトロルミネセンス素子
を作製した。
Comparative Example 2 A1. An electroluminescent device was produced in the same manner as in Example 1 except that the thickness of the insulating thin film made of Ol was changed to 2 nm.

比較例3 A1□03からなる絶縁薄膜の厚みを2,000nmに
変えたほかは実施例1と同様にしてエレクトロルミネセ
ンス素子を作製した。
Comparative Example 3 An electroluminescent device was produced in the same manner as in Example 1 except that the thickness of the insulating thin film made of A1□03 was changed to 2,000 nm.

上記のように作製した各エレクトロルミネセンス素子に
4001(zの正弦波を印加し、電圧100■の輝度を
測定した。その結果を第1表に示す。
A sine wave of 4001 (z) was applied to each electroluminescent device produced as described above, and the luminance at a voltage of 100 cm was measured. The results are shown in Table 1.

第 第1表に示すように、絶縁薄膜を5〜1,000 nr
nのlγみに設けた実施例のエレクトロルミネセンス素
子は、従来品に相当する比較例1のエレクトロルミネセ
ンス素子に比べて、高輝度であった。
As shown in Table 1, the insulating thin film is 5 to 1,000 nr
The electroluminescent element of the example provided at lγ of n had higher luminance than the electroluminescent element of Comparative Example 1, which corresponds to a conventional product.

〔発明の効果) 以上説明したように、本発明では、透明電極と発光層と
の間に比誘電率の小さい酸化物または窒化物からなる絶
縁薄膜を5〜1,000nmの厚みに設けることによっ
て、発光層にかかる電界を上記絶縁薄膜で規制し、蛍光
体に不均一な電界がかかるのを防止して、輝度を高める
ことができた。
[Effects of the Invention] As explained above, in the present invention, by providing an insulating thin film made of an oxide or nitride with a low dielectric constant between the transparent electrode and the light emitting layer, the thickness of the insulating film is 5 to 1,000 nm. By regulating the electric field applied to the light-emitting layer with the insulating thin film, it was possible to prevent uneven electric fields from being applied to the phosphor, thereby increasing brightness.

【図面の簡単な説明】 第1図は本発明に係るエレクトロルミネセンス素子の一
例を示す断面図であり、第2図はエレクトロルミネセン
ス素子の発光層と誘電層を模式的に拡大して示す断面図
である。第3図は従来のエレクトロルミネセンス素子を
示す断面図である。 2・・・透明電極、 3・・・絶縁薄膜、 4・・・発
光層、5・・・誘電層、 6・・・背面電極 2・・透明電極 3・絶縁薄膜 4 発光層
[BRIEF DESCRIPTION OF THE DRAWINGS] FIG. 1 is a sectional view showing an example of an electroluminescent device according to the present invention, and FIG. 2 is a schematic enlarged view of a light emitting layer and a dielectric layer of the electroluminescent device. FIG. FIG. 3 is a sectional view showing a conventional electroluminescent device. 2...Transparent electrode, 3...Insulating thin film, 4...Light emitting layer, 5...Dielectric layer, 6...Back electrode 2...Transparent electrode 3, Insulating thin film 4 Light emitting layer

Claims (3)

【特許請求の範囲】[Claims] (1) 透明電極2と背面電極6との間に少なくとも発
光層4および誘電層5を設けるエレクトロルミネセンス
素子であって、透明電極2と発光層4との間に比誘電率
が25以下の酸化物または窒化物からなる絶縁薄膜3を
5〜1,000nmの厚みに設けたことを特徴とするエ
レクトロルミネセンス素子。
(1) An electroluminescent element in which at least a light-emitting layer 4 and a dielectric layer 5 are provided between the transparent electrode 2 and the back electrode 6, and the dielectric constant between the transparent electrode 2 and the light-emitting layer 4 is 25 or less. An electroluminescent device characterized in that an insulating thin film 3 made of oxide or nitride is provided with a thickness of 5 to 1,000 nm.
(2) 酸化物がAl_2O_3、Ta_2O_5、S
iO_2およびY_2O_3から選ばれる少なくとも1
種である請求項1記載のエレクトロルミネセンス素子。
(2) The oxides are Al_2O_3, Ta_2O_5, S
At least one selected from iO_2 and Y_2O_3
The electroluminescent device according to claim 1, which is a seed.
(3) 窒化物がAINおよびSi_3N_4から選ば
れる少なくとも1種であるエレクトロルミネセンス素子
(3) An electroluminescent element in which the nitride is at least one selected from AIN and Si_3N_4.
JP63175530A 1988-07-14 1988-07-14 Electroluminescence element Pending JPH0224995A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63175530A JPH0224995A (en) 1988-07-14 1988-07-14 Electroluminescence element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63175530A JPH0224995A (en) 1988-07-14 1988-07-14 Electroluminescence element

Publications (1)

Publication Number Publication Date
JPH0224995A true JPH0224995A (en) 1990-01-26

Family

ID=15997679

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63175530A Pending JPH0224995A (en) 1988-07-14 1988-07-14 Electroluminescence element

Country Status (1)

Country Link
JP (1) JPH0224995A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61134491A (en) * 1984-11-30 1986-06-21 フロントエンジニアリング株式会社 Controller of boring machine
JPH05326149A (en) * 1992-05-20 1993-12-10 Fukuvi Chem Ind Co Ltd Dispersed electroluminescence
DE4123230B4 (en) * 1990-07-18 2005-05-25 Planar Systems Oy Phosphor layer of an electroluminescent component

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61134491A (en) * 1984-11-30 1986-06-21 フロントエンジニアリング株式会社 Controller of boring machine
JPH0224995B2 (en) * 1984-11-30 1990-05-31 Furonto Enjiniaringu Kk
DE4123230B4 (en) * 1990-07-18 2005-05-25 Planar Systems Oy Phosphor layer of an electroluminescent component
JPH05326149A (en) * 1992-05-20 1993-12-10 Fukuvi Chem Ind Co Ltd Dispersed electroluminescence

Similar Documents

Publication Publication Date Title
US5770920A (en) Electroluminescent lamp having a terpolymer binder
EP0188881B1 (en) Electroluminescence device
JPH0224995A (en) Electroluminescence element
JPH0744072B2 (en) EL device and manufacturing method thereof
JPH0758636B2 (en) Electroluminescent lamp
JPH0765950A (en) Dispersion type el element
JPH06310279A (en) Electroluminescence lamp
JP2002216968A (en) El lamp
JPH07142173A (en) Organic dispersion el panel
JPH08148278A (en) El apparatus
KR20040013503A (en) Electroluminescence device with high luminescence
JPH06223969A (en) Organic dispersion type el panel
JPH0123917B2 (en)
JPH07122367A (en) Dispersion type field emission element
JPH047558B2 (en)
JPH01272095A (en) Electroluminescent element and manufacture thereof
JPH04190588A (en) Thin film el element
JPH04282244A (en) Electric field light-emitting element
JPH0757874A (en) Element for dispersion type el panel
JPH04220996A (en) El element
JP2001176671A (en) Electroluminescent element and its manufacturing method
JPH06151059A (en) Electroluminescent lamp manufacture thereof
JPS5954194A (en) Electric field light emitting element
JPH02197080A (en) Distributed el panel
JPH06260284A (en) Dispersion type el element