JPH0142387B2 - - Google Patents
Info
- Publication number
- JPH0142387B2 JPH0142387B2 JP56180151A JP18015181A JPH0142387B2 JP H0142387 B2 JPH0142387 B2 JP H0142387B2 JP 56180151 A JP56180151 A JP 56180151A JP 18015181 A JP18015181 A JP 18015181A JP H0142387 B2 JPH0142387 B2 JP H0142387B2
- Authority
- JP
- Japan
- Prior art keywords
- printed wiring
- wiring board
- contact
- contact pins
- test fixture
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 22
- 238000007689 inspection Methods 0.000 claims description 17
- 238000000034 method Methods 0.000 claims description 5
- 239000012212 insulator Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Description
【発明の詳細な説明】
本発明はコンピユータを用いたプリント配線板
の検査方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for inspecting printed wiring boards using a computer.
従来、プリント配線板検査装置は、良品である
事が確認された基準プリント配線板と、該基準プ
リント配線板のランド穴位置に対応して接触ピン
を設けたテストフイクスチヤーを用意し、該テス
トフイクスチヤーと該基準プリント配線板を重ね
て、該接触ピンを該プリント配線板のランド穴に
接触させ、該接触ピンを順次電気的に走査して、
先づ該基準プリント配線板の配線情報を読取つて
記憶する事によつて、検査準備を完了し、次に該
基準プリント配線板の代りに之と同一配置のラン
ド穴と、配線パターンを有する良否不明の被検査
プリント配線板を用いて、該接触ピンを該プリン
ト配線板のランド穴に接触させ、前記と同様に該
接触ピンを順次電気的に走査して、該被検査プリ
ント配線板の配線情報を読取り乍ら、既に記憶さ
れて居る基準プリント配線板の配線情報と比較
し、同一であるか否かで、良否の判定を行つて居
た。 Conventionally, printed wiring board inspection equipment prepares a reference printed wiring board that has been confirmed to be good, and a test fixture with contact pins corresponding to the land hole positions of the reference printed wiring board. Overlapping the test fixture and the reference printed wiring board, bringing the contact pins into contact with the land holes of the printed wiring board, and sequentially electrically scanning the contact pins,
The inspection preparation is completed by first reading and storing the wiring information of the reference printed wiring board, and then, in place of the reference printed wiring board, a pass/fail test having land holes and wiring patterns in the same arrangement as that of the reference printed wiring board is completed. Using an unknown printed wiring board to be inspected, the contact pins are brought into contact with the land holes of the printed wiring board, and the contact pins are sequentially electrically scanned in the same manner as above to check the wiring of the printed wiring board to be inspected. While reading the information, it is compared with the wiring information of the reference printed wiring board that has already been stored, and the quality is determined based on whether the information is the same or not.
尚、前記接触ピンは、印加圧力によつて、伸縮
する構造を有し、又、配線情報とは、例えば、或
る接触ピン番号と他の接触ピン番号との間が電気
的に導通であるか、開放であるかを示す。しか
し、此の様な検査装置では、被検査プリント配線
板の種類に合わせて、テストフイクスチヤーをそ
れぞれ用意し交換しなければならないので、多種
少量生産のプリント配線板を検査するのは、コス
ト的に困難であつた。 Note that the contact pin has a structure that expands and contracts depending on applied pressure, and the wiring information is, for example, information that indicates electrical continuity between a certain contact pin number and another contact pin number. or open. However, with this kind of inspection equipment, test fixtures must be prepared and replaced depending on the type of printed wiring board to be inspected, so it is costly to inspect printed wiring boards that are produced in small quantities in a wide variety. It was difficult.
上記問題点を克服するために、第１図に示す様
に、接触ピン１を、絶縁基板２に、例えば、2.54
mmの格子状に配列した、汎用テストフイクスチヤ
ー３が考えられた。此の方式をとると、例えば約
32cm×40cmの有効寸法を有するプリント配線板を
検査するための、テストフイクスチヤーの接触ピ
ンの数は、約20000本となるが、前述した様なプ
リント配線板の種別毎にテストフイクスチヤーを
別々に用意する必要がなくなる。そして、此の汎
用テストフイクスチヤー３の接触ピン１が、被検
査プリントのランド穴以外の位置に当つて誤動作
を生じたり、傷をつけたりするのを防止するため
に、同図に示す様に被検査プリント配線板４のラ
ンド穴５，６，７に対応した穴８が形成された絶
縁体薄板から成る、マスク９を用意し第２図に示
す様に、接触ピン１ａ，１ｂ，１ｃ…の内被検査
プリント配線板４のランド穴位置と対応する接触
ピンのみを該プリント配線板と接触させ、他の接
触ピンは、該マスク９によつて接触を阻止されて
居る状態とする。 In order to overcome the above problems, as shown in FIG.
A general-purpose test fixture 3 arranged in a grid of mm was considered. If you use this method, for example, about
The number of contact pins on a test fixture for inspecting a printed wiring board with effective dimensions of 32cm x 40cm is approximately 20,000, but there are different test fixtures for each type of printed wiring board as described above. There is no need to prepare them separately. In order to prevent the contact pin 1 of this general-purpose test fixture 3 from hitting a position other than the land hole of the print to be inspected, causing malfunction or damage, as shown in the figure, A mask 9 made of a thin insulating plate in which holes 8 corresponding to the land holes 5, 6, 7 of the printed wiring board 4 to be inspected are formed is prepared, and as shown in FIG. 2, contact pins 1a, 1b, 1c, . . . Of these, only the contact pins corresponding to the land hole positions of the printed wiring board 4 to be inspected are brought into contact with the printed wiring board, and the other contact pins are prevented from contacting by the mask 9.
此の状態で、該接触ピンのすべてを順次電気的
に走査して、該プリント配線板の配線情報を読取
つて記憶したり、或は又配線情報を読取つて、既
に記憶してある配線情報と比較して検査を行なう
事が考えられた。 In this state, all of the contact pins are sequentially electrically scanned to read and store the wiring information on the printed wiring board, or to read the wiring information and combine it with the already stored wiring information. The idea was to conduct a comparative test.
しかし乍ら、此の様な検査方法では、例えば、
被検査プリント配線板のランド穴が4000個の場合
であつても、20000本接触ピンの総てを電気的に
走査して居るので、実際上は、検査には全く関係
のない16000本の接触ピンに対する走査が、無駄
な時間を発生する事となつた。 However, with this type of testing method, for example,
Even if the printed wiring board to be inspected has 4,000 land holes, all 20,000 contact pins are electrically scanned, so in reality, 16,000 contacts are completely unrelated to the inspection. Scanning for pins resulted in wasted time.
一般的に、基準プリント配線板から配線情報を
読取るのに要する時間は、プリント配線板の良否
判定を行う検査時間と比較して、非常に長時間を
要する場合が多い。 Generally, the time required to read wiring information from a reference printed wiring board is often much longer than the inspection time required to determine the quality of the printed wiring board.
従つて、本発明は、実際に必要とする接触ピン
のみを走査する様にして、短時間で基準プリント
配線板から配線情報を読取る事の出来る、プリン
ト配線板の検査方法を提供する事を目的とするも
のである。 Therefore, an object of the present invention is to provide a printed wiring board inspection method that can read wiring information from a reference printed wiring board in a short time by scanning only the contact pins that are actually required. That is.
以下、本発明の詳細を図面に基づき説明する。 Hereinafter, the details of the present invention will be explained based on the drawings.
第３図は、上記の目的に使用するコンピユータ
制御汎用プリント配線板検査装置の構成の一例を
示すもので３９は前述した接触ピン群を有するテ
ストフイクスチヤー、３１は検査装置全体を制御
するプロセツサー、３２は操作用コンソール、３
３及び３４は、記憶部で、３３は制御に必要なソ
フトウエア領域、３４は書込み及び読出し可能な
RAM領域を示す。３５はインターフエース部、
３６は制御部、３７は配線情報記憶部、３８はテ
ストフイクスチヤー３９の各接触ピンを順次電気
的に走査する走査部である。 FIG. 3 shows an example of the configuration of a computer-controlled general-purpose printed wiring board inspection device used for the above purpose, in which 39 is a test fixture having the aforementioned contact pin group, and 31 is a processor that controls the entire inspection device. , 32 is an operation console, 3
3 and 34 are storage units, 33 is a software area necessary for control, and 34 is a writable and readable area.
Indicates RAM area. 35 is the interface section,
36 is a control section, 37 is a wiring information storage section, and 38 is a scanning section that sequentially electrically scans each contact pin of the test fixture 39.
先づ、第４図に示す様に、上述した格子状に配
列した接触ピン１を有するテストフイクスチヤー
３、被検査プリント配線板のランド穴に対応した
位置に穴８を形成した絶縁体薄板から成るマスク
９、及び短絡板１０を用意する。 First, as shown in FIG. 4, a test fixture 3 having contact pins 1 arranged in a grid pattern as described above, and an insulating thin plate having holes 8 formed at positions corresponding to the land holes of the printed wiring board to be tested are installed. A mask 9 and a shorting plate 10 are prepared.
短絡板１０は、導電体より成り、上述した接触
ピン１と接触すると、該ピン１と電気的に導通す
る性質を有して居り、接触状態をより良くするた
めに、同図の如く接触ピン１と対応した位置に穴
１１を形成しても良い。従つて、複数の接触ピン
１が該短絡板１０と接触すると、該接触ピン相互
間は、導通状態となる。 The shorting plate 10 is made of a conductive material and has the property of electrically conducting with the contact pin 1 mentioned above when it comes into contact with the pin 1. A hole 11 may be formed at a position corresponding to 1. Therefore, when the plurality of contact pins 1 come into contact with the shorting plate 10, the contact pins become electrically conductive.
第４図に於て、接触ピン１を、マスク９を介し
て短絡板１０に押圧すると、マスク穴と対応する
位置の接触ピンのみが短絡板１０に接触して、該
接触ピン相互間が導通状態となるが、マスク９の
穴は、被検査プリント配線板のランド穴と対応し
た位置に形成されて居るので、結局被検査プリン
ト配線板のランド穴と対応した位置の接触ピン相
互間が導通状態となる。 In FIG. 4, when the contact pin 1 is pressed against the short circuit plate 10 through the mask 9, only the contact pins at positions corresponding to the mask holes contact the short circuit plate 10, and conduction occurs between the contact pins. However, since the holes in the mask 9 are formed at positions corresponding to the land holes of the printed wiring board to be inspected, conduction is established between the contact pins at positions corresponding to the land holes of the printed wiring board to be inspected. state.
従つて、すべての接触ピンを順次電気的に走査
すると、相互間が導通状態となつて居る接触ピン
番号を識別する事が可能となるので、記憶部のソ
フトウエア領域３３に格納した、「接触ピン番号
登録プログラム」を走らせてインターフエース３
５、制御部３６を介して走査部３８を制御し、相
互間が導通状態にある接触ピン番号を、RAM領
域３４に記憶させるが、此の段階を「登録」と称
する事とする。 Therefore, by sequentially electrically scanning all the contact pins, it is possible to identify the contact pin numbers that are electrically connected to each other. Run the “Pin Number Registration Program” and enter Interface 3.
5. The scanning unit 38 is controlled via the control unit 36 to store the contact pin numbers that are electrically connected to each other in the RAM area 34. This step will be referred to as "registration".
次に、該短絡板１０を取外し、代りに第２図に
示す様に基準プリント配線板４を用意し、接触ピ
ン１をマスク９を介して４に押圧すると、前述し
た様に、４のランド穴５，６，７…のみに接触ピ
ン１ａ，１ｂ，１ｃ…が接触する事となるが、該
接触ピン番号は、上述した通り、既に第３図の
RAM領域３４に登録されて居るので、「配線情
報検出プログラム」を走らせて該登録ピン番号を
順次読出し乍ら、登録ピン号の接触ピン相互間の
みを順次走査して配線情報を読取り、配線情報記
憶部３７に格納する。 Next, the shorting plate 10 is removed, the reference printed wiring board 4 is prepared as shown in FIG. 2, and the contact pin 1 is pressed against the contact pin 4 through the mask 9. The contact pins 1a, 1b, 1c, etc. will come into contact only with the holes 5, 6, 7, etc., but as mentioned above, the contact pin numbers are already the same as those shown in Fig. 3.
Since it is registered in the RAM area 34, run the "wiring information detection program" to sequentially read out the registered pin numbers, and scan only the contact pins of the registered pin numbers sequentially to read the wiring information. It is stored in the storage unit 37.
尚、第３図では配線情報記憶部３７は、プロセ
ツサー３１とインターフエース３５を介した独立
したハードウエア３７として示してあるがプロセ
ツサー３１より直接アクセス可能なRAM領域３
４をあてる事も可能である。又、登録されて居な
い接触ピンに関する配線情報は、「配線情報検出
プログラム」に依る事なく、すべて開放として３
７に格納しておけば良い。 Although the wiring information storage unit 37 is shown as an independent hardware 37 connected to the processor 31 and the interface 35 in FIG.
It is also possible to guess 4. In addition, all wiring information related to unregistered contact pins is set to 3 as open, regardless of the "wiring information detection program".
It is best to store it in 7.
此の段階を、「配線情報の読込み」と称する事
とするが、以上で被検査プリント配線板の検査準
備を完了する。 This step will be referred to as "reading wiring information," and the preparation for testing the printed wiring board to be tested is completed.
上述した、「登録」及び「配線情報の読込み」
を行う事によつて、「配線情報検出プログラム」
で走査される接触ピンの数は大巾に減る事となる
ので、検査準備に要する時間は大巾に節約される
事が明白である。 "Registration" and "Reading wiring information" mentioned above
By performing the "Wiring information detection program"
Since the number of contact pins to be scanned is greatly reduced, it is clear that the time required for test preparation is significantly saved.
又、次回の検査準備を行う際に、上記の「登
録」及び「配線情報の読込み」を繰返す手間を省
くために、図示して居ないが、上記の配線情報記
憶部３７に格納してあるデータを、コンピユータ
制御の磁気テープ等に移しておき、次回の検査準
備の際に該磁気テープから、３７へ格納すれば、
尚一層の時間短縮が可能となるのは勿論である。 In addition, in order to save the trouble of repeating the above-mentioned "registration" and "reading of wiring information" when preparing for the next inspection, although not shown, the above-mentioned wiring information storage section 37 stores the above-mentioned wiring information. If the data is transferred to computer-controlled magnetic tape, etc., and stored from the magnetic tape to 37 when preparing for the next inspection,
Of course, it is possible to further reduce the time.
「検査」の段階では、第２図に於て、基準プリ
ント配線板４の代りに基準プリント配線板と同一
配置のランド穴と配線パターンを有する良否不明
の被検査プリント配線板４を用意する。そして
「配線情報の読込み」と同様に、接触ピン１をマ
スク９を介して、４に押圧し、第３図のソフトウ
エア領域３３に格納してある「検査プログラム」
を走らせて、該接触ピン相互間の配線情報を、配
線情報記憶部３７に格納されて居る基準プリント
配線板の配線情報と順次比較して、良否の判定を
行う。 In the "inspection" stage, in place of the reference printed wiring board 4 in FIG. 2, a printed wiring board 4 to be inspected of unknown quality is prepared which has land holes and wiring patterns arranged in the same manner as the reference printed wiring board. Then, in the same way as "reading wiring information", contact pin 1 is pressed to 4 through mask 9, and the "inspection program" stored in software area 33 in FIG.
is run to sequentially compare the wiring information between the contact pins with the wiring information of the reference printed wiring board stored in the wiring information storage section 37 to determine the quality.
一般的には、「検査」段階では検査に要する時
間は、「配線情報の読込み」に要する時間より短
かい場合が多いので実際には、接触ピン数を限定
して、走査する必要のない場合が多いが、上述し
た「登録」ピンのみを走査する方式をとれば検査
時間を短縮出来る事は勿論である。 Generally, the time required for inspection at the "inspection" stage is often shorter than the time required for "reading wiring information," so in reality, if the number of contact pins is limited and scanning is not necessary. However, if the above-mentioned method of scanning only the "registration" pins is adopted, the inspection time can of course be shortened.
以上の様に本発明は、接触ピンを格子状に配列
したテストフイクスチヤーと、被検査プリント配
線板に対応する穴あきマスクを備え、該プリント
配線板のランド穴に接触するピン番号を「登録」
し、次に該「登録」接触ピン相互間のみを走査し
て「配線情報の読込み」を行うようにしたので、
基準プリント配線板の配線情報の読込みの所要時
間を大巾に短縮する事ができる。 As described above, the present invention includes a test fixture in which contact pins are arranged in a grid pattern, and a perforated mask corresponding to the printed wiring board to be inspected, and pin numbers that contact the land holes of the printed wiring board are designated as "Registration"
Then, we scanned only between the "registered" contact pins and "read wiring information".
The time required to read the wiring information of the reference printed wiring board can be greatly reduced.
第１図は、汎用テストフイクスチヤーの説明
図、第２は被検査プリント配線板をマスクを介し
て、汎用テストフイクスチヤーに押圧した説明
図、第３図はコンピユータ制御汎用プリント配線
板検査装置の構成の一例を示す図、第４図は短絡
板を用いる場合の説明図。
１……接触ピン、３……汎用テストフイクスチ
ヤ、５，６，７……ランド穴、８……穴、９……
マスク、１０……短絡板。
Figure 1 is an explanatory diagram of a general-purpose test fixture, the second is an explanatory diagram of a printed wiring board to be inspected pressed against the general-purpose test fixture through a mask, and Figure 3 is a computer-controlled general-purpose printed wiring board inspection. A diagram showing an example of the configuration of the device, and FIG. 4 is an explanatory diagram when using a short circuit plate. 1... Contact pin, 3... General purpose test fixture, 5, 6, 7... Land hole, 8... Hole, 9...
Mask, 10...Short circuit board.
Claims (1)
めに格子状に配列された接触ピンを備えた汎用テ
ストフイクスチヤーと、被検査プリント配線板の
ランド穴位置に対応して穴が形成された絶縁体か
ら成るマスクと、該接触ピンと接触した時に該接
触ピン相互間を電気的に短絡する短絡板と、被検
査プリント配線板用の基準プリント配線板とを用
意し、先づ、該マスクと該短絡板とを重ねて、該
マスクの穴を貫通して該テストフイクスチヤーの
接触ピンを該短絡板に接触させて短絡板に接触す
るピン番号を登録する事を第１ステツプとし次
に、該テストフイクスチヤーの接触ピンを該マス
クの穴を貫通して該基準プリント配線板のランド
穴に接触させて前記登録されたピン番号間の配線
情報を読取る事を第２ステツプとして、検査準備
を完了する事を特徴とするプリント配線板の検査
方法。1. A general-purpose test fixture equipped with contact pins arranged in a grid to enable inspection of various printed wiring boards, and holes formed in correspondence with the land hole positions of the printed wiring board to be inspected. Prepare a mask made of an insulator, a shorting plate that electrically shorts between the contact pins when they come into contact with each other, and a reference printed wiring board for the printed wiring board to be inspected. The first step is to overlap the short-circuit plate, pass through the hole in the mask, bring the contact pin of the test fixture into contact with the short-circuit plate, and register the pin number that contacts the short-circuit plate. The second step is to read the wiring information between the registered pin numbers by bringing the contact pins of the test fixture into contact with the land holes of the reference printed wiring board through the holes of the mask. A printed wiring board inspection method characterized by completing preparation.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56180151A JPS5880891A (en) | 1981-11-10 | 1981-11-10 | Method of inspecting printed circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56180151A JPS5880891A (en) | 1981-11-10 | 1981-11-10 | Method of inspecting printed circuit board |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5880891A JPS5880891A (en) | 1983-05-16 |
| JPH0142387B2 true JPH0142387B2 (en) | 1989-09-12 |
Family
ID=16078285
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56180151A Granted JPS5880891A (en) | 1981-11-10 | 1981-11-10 | Method of inspecting printed circuit board |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5880891A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017003295A (en) * | 2015-06-05 | 2017-01-05 | 三菱電機株式会社 | Measurement device and semiconductor device measurement method |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59122555U (en) * | 1983-02-08 | 1984-08-17 | 株式会社フジクラ | Printed circuit board inspection equipment |
| WO2018078752A1 (en) * | 2016-10-26 | 2018-05-03 | 三菱電機株式会社 | Inspection device and inspection method |
-
1981
- 1981-11-10 JP JP56180151A patent/JPS5880891A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017003295A (en) * | 2015-06-05 | 2017-01-05 | 三菱電機株式会社 | Measurement device and semiconductor device measurement method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5880891A (en) | 1983-05-16 |
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