JP6538844B2 - 検体測定用チップ、検体測定装置、および検体測定方法 - Google Patents
検体測定用チップ、検体測定装置、および検体測定方法 Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/272—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration for following a reaction, e.g. for determining photometrically a reaction rate (photometric cinetic analysis)
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
- G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
- G01N21/7703—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
- G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
- G01N2021/7769—Measurement method of reaction-produced change in sensor
- G01N2021/7779—Measurement method of reaction-produced change in sensor interferometric
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- Analytical Chemistry (AREA)
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- General Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
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Description
10…光源
11…導入部
13…伝搬部
15…測定装置
17…導出部
30…受光部
31…測定部
32…制御部
101…伝搬層
102…リガンド
105…基材
107…中間層
109…伝搬層
201…被検出物質(アナライト)
501…円柱構造
502,503…溝
Claims (13)
- 光を導入する導入部と、
互いに対向する2つの主面を有し、前記光を該主面間で複数回全反射しながら伝搬させる伝搬部と、
前記2つの主面のうち少なくとも1つの主面において、検体中の被検出物質と反応する反応物質が前記光の伝搬する方向に直交する方向にストライプ状に周期配置され、前記伝搬部を伝搬した前記光の前記直交する方向の位相を変化させる反応部と、
前記伝搬部を伝搬した前記光を導出する導出部と、
を備えた検体測定用チップ。 - 請求項1に記載の検体測定用チップであって、
前記反応部は、前記被検出物質と前記反応物質との反応による前記伝搬部の周辺における屈折率の変化により、前記伝搬部を伝搬した前記光の前記直交する方向の位相分布を変化させることを特徴とする検体測定用チップ。 - 請求項1または請求項2に記載の検体測定用チップであって、
前記反応部は、前記直交する方向に沿って前記反応物質が異なる密度を有する領域を有することを特徴とする検体測定用チップ。 - 請求項1または請求項2に記載の検体測定用チップであって、
前記反応部は、前記直交する方向に沿って前記反応物質が前記伝搬部の前記主面に部分的に形成されている領域を有することを特徴とする検体測定用チップ。 - 請求項1または請求項2に記載の検体測定用チップであって、
前記反応部は、前記直交する方向に沿って凹凸が前記伝搬部の前記主面に部分的に形成されている領域を有することを特徴とする検体測定用チップ。 - 請求項1乃至請求項5のいずれかに記載の検体測定用チップであって、
前記反応部は、前記光の波長の少なくとも5倍以上の周期でストライプ状に配置されていることを特徴とする検体測定用チップ。 - 請求項1乃至請求項6のいずれかに記載の検体測定用チップであって、
前記反応部は、前記伝搬部を挟む両主面に形成されていることを特徴とする検体測定用チップ。 - 請求項1乃至請求項7のいずれかに記載の検体測定用チップが配置される検体測定装置であって、
前記検体測定用チップの前記導入部に前記光を導く光源と、
前記導出部から出射された光を受光する受光部と、
前記受光部で受光される光のビームパターンを分析する制御部と、
を備えた検体測定装置。 - 請求項8に記載の検体測定装置であって、
前記光は、ガウスビームであることを特徴とする検体測定装置。 - 請求項8または請求項9に記載の検体測定装置であって、
前記制御部は、前記光のビームパターンの変化を検出する検出処理を行うことを特徴とする検体測定装置。 - 請求項8乃至請求項10のいずれかに記載の検体測定装置であって、
前記制御部は、前記光のビームパターンの0次回折光の強度と1次回折光の強度とを検出する検出処理を行うことを特徴とする検体測定装置。 - 請求項1乃至請求項7のいずれかに記載の検体測定用チップを用いた検体測定方法であって、
前記導入部に光を導入し、前記導出部から出射される光のビームパターンを検出する第1測定ステップと、
被検出物質が含まれた検体を、前記検体測定用チップに接触させる接触ステップと、
前記被検出物質が含まれた検体を接触させた後、前記導出部から出射される光のビームパターンを検出する第2測定ステップと、
前記第1測定ステップで測定したビームパターンと、前記第2測定ステップで測定したビームパターンと、を比較し、これらビームパターンの変化を検出する検出ステップと、
を備えた検体測定方法。 - 請求項12に記載の検体測定方法であって、
前記検出ステップは、前記第1測定ステップおよび前記第2測定ステップでそれぞれ測定したビームパターンの0次回折光の強度と1次回折光の強度とを検出することを特徴とする検体測定方法。
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PCT/JP2016/066817 WO2017006679A1 (ja) | 2015-07-07 | 2016-06-07 | 測定用チップ、測定装置、および測定方法 |
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CN111033234B (zh) * | 2017-08-31 | 2024-04-26 | 古野电气株式会社 | 测量装置及测量方法 |
WO2020015872A1 (de) * | 2018-07-18 | 2020-01-23 | Dr. Johannes Heidenhain Gmbh | Diffraktiver biosensor |
NL2023516B1 (en) * | 2019-05-28 | 2020-12-08 | Illumina Inc | Manufacturing a flowcell with a planar waveguide |
RU2727560C1 (ru) * | 2020-01-28 | 2020-07-22 | Общество с ограниченной ответственностью "ИоффеЛЕД" | Монолитный датчик химического состава вещества |
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JPS646842A (en) * | 1987-06-30 | 1989-01-11 | Ricoh Kk | Detecting device |
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US5866430A (en) * | 1996-06-13 | 1999-02-02 | Grow; Ann E. | Raman optrode processes and devices for detection of chemicals and microorganisms |
ATE202630T1 (de) * | 1996-08-16 | 2001-07-15 | Zeptosens Ag | Optische detektionsvorrichtung |
US6738141B1 (en) | 1999-02-01 | 2004-05-18 | Vir A/S | Surface plasmon resonance sensor |
CA2360932A1 (en) * | 1999-02-01 | 2000-08-10 | Vir A/S | A surface plasmon resonance sensor |
CA2403427C (en) | 2000-03-22 | 2013-04-30 | M. Cynthia Goh | Method and apparatus for assay for multiple analytes |
US7314749B2 (en) | 2001-09-13 | 2008-01-01 | Axela Biosensors Inc. | Method and apparatus for assay based on light diffraction |
JP2003185569A (ja) | 2001-12-14 | 2003-07-03 | Mitsubishi Chemicals Corp | 表面プラズモン共鳴を利用した試料の分析装置及び表面プラズモン共鳴分析用センサチップ |
JP2004085437A (ja) * | 2002-08-28 | 2004-03-18 | Mitsubishi Heavy Ind Ltd | 表面プラズモン共鳴を用いた物質センサ |
US7212693B2 (en) * | 2003-12-22 | 2007-05-01 | Lucent Technologies Inc. | Optical substance analyzer |
JP4290128B2 (ja) * | 2005-02-25 | 2009-07-01 | キヤノン株式会社 | センサ |
JP2008014732A (ja) | 2006-07-04 | 2008-01-24 | Tohoku Univ | 表面プラズモン共鳴測定装置 |
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EP2693164A1 (en) | 2012-08-03 | 2014-02-05 | Universidad Politécnica de Madrid | Interferometric detection method |
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US20180202930A1 (en) | 2018-07-19 |
CN107709974B (zh) | 2020-09-29 |
JPWO2017006679A1 (ja) | 2018-04-19 |
WO2017006679A1 (ja) | 2017-01-12 |
EP3321663A4 (en) | 2018-12-12 |
EP3321663B1 (en) | 2021-03-24 |
EP3321663A1 (en) | 2018-05-16 |
US10732104B2 (en) | 2020-08-04 |
CN107709974A (zh) | 2018-02-16 |
EP3862747A1 (en) | 2021-08-11 |
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