JP5411698B2 - サンプルの表面を観察するための装置及び方法 - Google Patents
サンプルの表面を観察するための装置及び方法 Download PDFInfo
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- JP5411698B2 JP5411698B2 JP2009530981A JP2009530981A JP5411698B2 JP 5411698 B2 JP5411698 B2 JP 5411698B2 JP 2009530981 A JP2009530981 A JP 2009530981A JP 2009530981 A JP2009530981 A JP 2009530981A JP 5411698 B2 JP5411698 B2 JP 5411698B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/103—Detecting, measuring or recording devices for testing the shape, pattern, colour, size or movement of the body or parts thereof, for diagnostic purposes
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/44—Detecting, measuring or recording for evaluating the integumentary system, e.g. skin, hair or nails
- A61B5/441—Skin evaluation, e.g. for skin disorder diagnosis
- A61B5/442—Evaluating skin mechanical properties, e.g. elasticity, hardness, texture, wrinkle assessment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4711—Multiangle measurement
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- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Surgery (AREA)
- Veterinary Medicine (AREA)
- Engineering & Computer Science (AREA)
- Biomedical Technology (AREA)
- Heart & Thoracic Surgery (AREA)
- Medical Informatics (AREA)
- Molecular Biology (AREA)
- Biophysics (AREA)
- Animal Behavior & Ethology (AREA)
- Public Health (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Dermatology (AREA)
- Dentistry (AREA)
- Oral & Maxillofacial Surgery (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Microscoopes, Condenser (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
Claims (10)
- サンプルの特定の表面領域の様相を観察するための装置であって、
当該装置の外側に置かれた前記サンプルの前記特定の表面領域を既定の方向から照光するための光源と、
前記特定の表面領域を観察するための手段とを有し、
前記特定の表面領域を観察するための手段は、前記特定の表面領域に対し異なる方向に置かれた多数の実質的な平面鏡と前記多数の実質的な平面鏡を観察するための光学系とを有し、これにより、前記多数の実質的な平面鏡は、異なる方向から観察された、前記特定の表面領域の複数の画像を前記光学系の画像受信部へ反射することを特徴とする、装置。 - 前記多数の実質的な平面鏡は、観察される前記特定の表面領域の位置から略等しい距離に置かれることを特徴とする、請求項1に記載の装置。
- 前記多数の実質的な平面鏡は、前記光学系の前記画像受信部から略等しい距離に置かれることを特徴とする、請求項1又は2に記載の装置。
- 前記光学系の前記画像受信部及び観察される前記特定の表面領域は、互いに近くに置かれ、それにより、観察される前記特定の表面領域の位置と前記多数の実質的な平面鏡との間の平均距離は、観察される前記特定の表面領域の位置と前記光学系の前記画像受信部との間の距離より10倍よりも大きいことを特徴とする、請求項1、2又は3に記載の装置。
- 前記光学系の前記画像受信部は球面鏡であり、それにより、前記多数の実質的な平面鏡は、前記特定の表面領域の複数の画像を前記球面鏡へ反射するので、前記特定の表面領域の異なる画像が前記球面鏡を介して観察されることができることを特徴とする、請求項1乃至4の何れか一項に記載の装置。
- 5枚以上の平面鏡が存在することを特徴とする、請求項1乃至5の何れか一項に記載の装置。
- 前記光学系は、前記表面の写像を記録するためのカメラを有し、前記写像は、異なる方向から撮られた、観察される前記特定の表面領域の複数の画像を有することを特徴とする、請求項1乃至6の何れか一項に記載の装置。
- 前記光源の位置は調節可能であるため、前記サンプルの前記特定の表面領域は、異なる既定方向から照光されることができることを特徴とする、請求項1乃至7の何れか一項に記載の装置。
- 当該装置は、前記多数の実質的な平面鏡の前に置かれている球形スクリーンを有し、前記スクリーンは、光ビームが通過することができる1つ以上の開口及び前記光学系の前記画像受信部がそれを介して観察されることができる開口を備えることを特徴とする、請求項1乃至8の何れか一項に記載の装置。
- 前記球形スクリーンは、電子命令で拡散を行わせることができる材料でコーティングされた透過材料から作られることを特徴とする、請求項9に記載の装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP06121782.4 | 2006-10-05 | ||
EP06121782 | 2006-10-05 | ||
PCT/IB2007/053943 WO2008041162A1 (en) | 2006-10-05 | 2007-09-28 | An apparatus and a method for observing the surface of a sample |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2010506163A JP2010506163A (ja) | 2010-02-25 |
JP2010506163A5 JP2010506163A5 (ja) | 2010-11-04 |
JP5411698B2 true JP5411698B2 (ja) | 2014-02-12 |
Family
ID=39027495
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009530981A Expired - Fee Related JP5411698B2 (ja) | 2006-10-05 | 2007-09-28 | サンプルの表面を観察するための装置及び方法 |
Country Status (8)
Country | Link |
---|---|
US (1) | US8077319B2 (ja) |
EP (1) | EP2074408A1 (ja) |
JP (1) | JP5411698B2 (ja) |
KR (1) | KR101396146B1 (ja) |
CN (1) | CN101523195B (ja) |
BR (1) | BRPI0718200A8 (ja) |
RU (1) | RU2473887C2 (ja) |
WO (1) | WO2008041162A1 (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2252208B1 (en) * | 2008-03-18 | 2014-05-14 | Koninklijke Philips N.V. | Apparatus for skin imaging, system for skin analysis |
EP2451527B1 (en) | 2009-07-09 | 2018-11-21 | Koninklijke Philips N.V. | Skin radiation apparatus |
US9816683B2 (en) * | 2011-10-20 | 2017-11-14 | Appotronics Corporation Limited | Light sources system and projection device using the same |
KR102475651B1 (ko) | 2015-12-30 | 2022-12-09 | 엘지이노텍 주식회사 | 인체 착용장치 및 이의 동작 방법 |
DE102016108079A1 (de) * | 2016-05-02 | 2017-11-02 | Carl Zeiss Microscopy Gmbh | Artefaktreduktion bei der winkelselektiven beleuchtung |
KR102303073B1 (ko) * | 2019-11-14 | 2021-09-17 | 아나나스엘엘씨 유한책임회사 | 다면 비전 검사 알고리즘 및 이를 이용한 시스템 |
KR102310449B1 (ko) * | 2019-11-14 | 2021-10-12 | 아나나스엘엘씨 유한책임회사 | 개선된 구조의 다면 비전 검사 시스템 및 검사 방법 |
KR102547544B1 (ko) * | 2021-05-25 | 2023-06-27 | 한국기계연구원 | 3차원 조리개 모듈 및 이의 제조방법 |
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HU188795B (en) * | 1982-05-28 | 1986-05-28 | Koezponti Elelmiszeripari Kutato Intezet,Hu | Detecting arrangement for meassuring the intensity of radiation scattering at a given angle from a sample exposed to radiation of given angle of incidence |
SU1326004A1 (ru) * | 1985-07-30 | 1990-07-23 | Институт Полупроводников Ан Усср | Устройство дл контрол дефектов оптических поверхностей |
US4815858A (en) * | 1987-10-09 | 1989-03-28 | The United States Of America As Represented By The Secretary Of The Navy | Reflectometers |
US5309339A (en) | 1992-06-24 | 1994-05-03 | The Schepens Eye Research Institute, Inc. | Concentrator for laser light |
US5256871A (en) * | 1992-12-22 | 1993-10-26 | Emhart Glass Machinery Investments Inc. | Machine for video inspection of glass containers with intersecting light beams |
US5485263A (en) * | 1994-08-18 | 1996-01-16 | United Parcel Service Of America, Inc. | Optical path equalizer |
US5845002A (en) * | 1994-11-03 | 1998-12-01 | Sunkist Growers, Inc. | Method and apparatus for detecting surface features of translucent objects |
IL113428A0 (en) | 1995-04-20 | 1995-07-31 | Yissum Res Dev Co | Glossmeter |
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US5912741A (en) * | 1997-10-10 | 1999-06-15 | Northrop Grumman Corporation | Imaging scatterometer |
JP3631365B2 (ja) | 1998-02-10 | 2005-03-23 | 日本ペイント株式会社 | 変角分光反射率の測定方法 |
US6424413B1 (en) | 1998-06-12 | 2002-07-23 | Gretagmacbeth Llc | Multi-channel integrating sphere |
JP4763134B2 (ja) * | 1998-12-21 | 2011-08-31 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | スキャッタメータ |
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ES2184656T1 (es) | 2000-11-20 | 2003-04-16 | Dow Global Technologies Inc | Metodo para caracterizar el aspecto de un objeto particular, para predecir el aspecto de un objeto, y para fabricar un objeto que tiene un aspecto predeterminado, que opcionalmente ha sido determinado sobre la base de un objeto de referencia. |
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EP1599720B1 (en) * | 2003-02-28 | 2010-05-05 | Koninklijke Philips Electronics N.V. | A scatterometer and a method for inspecting a surface |
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-
2007
- 2007-09-28 WO PCT/IB2007/053943 patent/WO2008041162A1/en active Application Filing
- 2007-09-28 KR KR1020097006757A patent/KR101396146B1/ko not_active IP Right Cessation
- 2007-09-28 EP EP07826573A patent/EP2074408A1/en not_active Withdrawn
- 2007-09-28 BR BRPI0718200A patent/BRPI0718200A8/pt not_active IP Right Cessation
- 2007-09-28 JP JP2009530981A patent/JP5411698B2/ja not_active Expired - Fee Related
- 2007-09-28 RU RU2009116927/28A patent/RU2473887C2/ru not_active IP Right Cessation
- 2007-09-28 CN CN2007800371103A patent/CN101523195B/zh not_active Expired - Fee Related
- 2007-09-28 US US12/443,737 patent/US8077319B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP2074408A1 (en) | 2009-07-01 |
BRPI0718200A2 (pt) | 2017-10-24 |
CN101523195A (zh) | 2009-09-02 |
US8077319B2 (en) | 2011-12-13 |
US20100091291A1 (en) | 2010-04-15 |
KR20090064557A (ko) | 2009-06-19 |
KR101396146B1 (ko) | 2014-05-19 |
WO2008041162A1 (en) | 2008-04-10 |
BRPI0718200A8 (pt) | 2017-12-05 |
JP2010506163A (ja) | 2010-02-25 |
CN101523195B (zh) | 2012-04-25 |
RU2473887C2 (ru) | 2013-01-27 |
RU2009116927A (ru) | 2010-11-10 |
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