JP4998004B2 - 抵抗測定方法 - Google Patents
抵抗測定方法 Download PDFInfo
- Publication number
- JP4998004B2 JP4998004B2 JP2007035009A JP2007035009A JP4998004B2 JP 4998004 B2 JP4998004 B2 JP 4998004B2 JP 2007035009 A JP2007035009 A JP 2007035009A JP 2007035009 A JP2007035009 A JP 2007035009A JP 4998004 B2 JP4998004 B2 JP 4998004B2
- Authority
- JP
- Japan
- Prior art keywords
- pair
- probe
- pads
- resistance
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2829—Testing of circuits in sensor or actuator systems
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/455—Arrangements for functional testing of heads; Measuring arrangements for heads
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Description
3 被測定素子(DUT)
4、6 パッド
5 電気接続パターン
10 測定装置
15(15a−15f)プローブ
20 マトリクススイッチ
Claims (1)
- 各々が被測定素子と当該被測定素子に電気的に接続された一対のパッドとを有する3個以上の組の前記被測定素子に、6端子抵抗測定が可能な測定装置を利用して電流を流すと共に前記被測定素子に生じる電圧を測定し、電流と電圧から前記被測定素子の抵抗値を算出する抵抗測定方法において、
3個以上の組の前記被測定素子を環状に直列接続する試験用の電気接続パターンを形成し、前記3個以上の組の前記被測定素子の一対のパッドに前記測定装置の一対の電圧測定用プローブを接触させ、前記一対のパッドの各々と前記電気接続パターンで電気接続された一対のパッドに前記測定装置の一対の電流印加用プローブを接触させ、残りの試験用の電気接続パターンで互いに接続された一対以上のパッドの中の一対のパッドに前記測定装置の一対のガード用プローブを接触させることを特徴とする抵抗測定方法。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007035009A JP4998004B2 (ja) | 2007-02-15 | 2007-02-15 | 抵抗測定方法 |
US12/030,382 US20080197864A1 (en) | 2007-02-15 | 2008-02-13 | Resistance measuring method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007035009A JP4998004B2 (ja) | 2007-02-15 | 2007-02-15 | 抵抗測定方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008197056A JP2008197056A (ja) | 2008-08-28 |
JP4998004B2 true JP4998004B2 (ja) | 2012-08-15 |
Family
ID=39706106
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007035009A Expired - Fee Related JP4998004B2 (ja) | 2007-02-15 | 2007-02-15 | 抵抗測定方法 |
Country Status (2)
Country | Link |
---|---|
US (1) | US20080197864A1 (ja) |
JP (1) | JP4998004B2 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6121278B2 (ja) * | 2013-07-25 | 2017-04-26 | 日置電機株式会社 | 切替制御回路および測定装置 |
CN103454503B (zh) * | 2013-08-30 | 2015-10-28 | 安徽省宁国天成电工有限公司 | 一种导线电阻测定装置 |
JP6150691B2 (ja) * | 2013-09-12 | 2017-06-21 | 日置電機株式会社 | 切替制御回路および測定装置 |
CN104897965A (zh) * | 2015-06-10 | 2015-09-09 | 中国电力科学研究院 | 一种电阻自动化测试*** |
CN109387698B (zh) * | 2017-08-04 | 2021-01-29 | 常州轻工职业技术学院 | 一种板材电阻的测量装置及其方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63228078A (ja) * | 1987-03-17 | 1988-09-22 | Matsushita Electric Ind Co Ltd | コンタクト抵抗の評価方法 |
JP4734706B2 (ja) * | 2000-11-01 | 2011-07-27 | Jsr株式会社 | 電気抵抗測定用コネクター並びに回路基板の電気抵抗測定装置および測定方法 |
JP3652671B2 (ja) * | 2002-05-24 | 2005-05-25 | 沖電気工業株式会社 | 測定用配線パターン及びその測定方法 |
JP4473093B2 (ja) * | 2004-10-20 | 2010-06-02 | 日置電機株式会社 | 抵抗測定装置および抵抗測定方法 |
US7105856B1 (en) * | 2005-03-31 | 2006-09-12 | United Microelectronics Corp. | Test key having a chain circuit and a kelvin structure |
-
2007
- 2007-02-15 JP JP2007035009A patent/JP4998004B2/ja not_active Expired - Fee Related
-
2008
- 2008-02-13 US US12/030,382 patent/US20080197864A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
US20080197864A1 (en) | 2008-08-21 |
JP2008197056A (ja) | 2008-08-28 |
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