JP4992910B2 - 基板検査装置 - Google Patents
基板検査装置 Download PDFInfo
- Publication number
- JP4992910B2 JP4992910B2 JP2008548132A JP2008548132A JP4992910B2 JP 4992910 B2 JP4992910 B2 JP 4992910B2 JP 2008548132 A JP2008548132 A JP 2008548132A JP 2008548132 A JP2008548132 A JP 2008548132A JP 4992910 B2 JP4992910 B2 JP 4992910B2
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- JP
- Japan
- Prior art keywords
- pallet
- speed
- substrate
- inspection
- air cylinder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
- B65G49/061—Lifting, gripping, or carrying means, for one or more sheets forming independent means of transport, e.g. suction cups, transport frames
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
- B65D19/00—Pallets or like platforms, with or without side walls, for supporting loads to be lifted or lowered
- B65D19/38—Details or accessories
- B65D19/40—Elements for spacing platforms from supporting surface
- B65D19/42—Arrangements or applications of rollers or wheels
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
- B65G49/068—Stacking or destacking devices; Means for preventing damage to stacked sheets, e.g. spaces
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67706—Mechanical details, e.g. roller, belt
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/6773—Conveying cassettes, containers or carriers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67748—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a single workpiece
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68742—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G2249/00—Aspects relating to conveying systems for the manufacture of fragile sheets
- B65G2249/02—Controlled or contamination-free environments or clean space conditions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Description
Claims (4)
- 基板検査を行う検査室と、前記検査室との間で基板の搬出入を行うロードロック室とを備える基板検査装置であって、
前記検査室とのロードロック室との間において前記基板を支持するパレットを移動するパレット搬送装置を備え、
前記パレット搬送装置は、前記パレットを上下方向に移動する昇降機構を備え、
前記昇降機構は、当該昇降機構の動作において、当該昇降機構の駆動速度を切り替えてパレット上に支持する基板に加わる衝撃を緩和する衝撃緩和機構を有し、
前記衝撃緩和機構は、
前記昇降機構の動作開始時と動作終了前の少なくとも何れか一方において駆動速度を低速に切り替え、前記低速期間を除く駆動期間の駆動速度を高速に切り替え、
前記昇降機構の上昇動作において、高速の駆動速度で上昇動作を開始し、上昇動作終了前の所定期間における駆動速度を低速に切り替え、
前記昇降機構の下降動作において、低速の駆動速度で下降動作を開始し、下降開始後の所定期間経過後に駆動速度を高速に切り替えることを特徴とする、基板検査装置。 - 前記昇降機構は、気体圧によって駆動するエアシリンダ機構であり、
前記衝撃緩和機構は、前記エアシリンダ機構に異なる流量の気体を供給する高速圧空ラインと低速圧空ラインの2系統の圧空ラインを有し、
前記所定期間には、低速圧空ラインにより前記エアシリンダ機構に供給する単位時間当たりの気体の供給量を減少させてエアシリンダ機構を低速で駆動し、
前記所定期間を除く駆動期間には、高速圧空ラインにより前記エアシリンダ機構に供給する単位時間当たりの気体の供給量を増加させてエアシリンダ機構を高速で駆動することを特徴とする請求項1に記載の基板検査装置。 - 前記パレット搬送装置は複数台のパレットを移動し、
前記複数台のパレットの内の一台のパレットを水平方向に移動させる搬送機構を備え、
前記昇降機構は、前記複数台のパレットを上下方向に個別に移動自在とするとともに、前記搬送機構との間においてパレットの移し替えを自在とし、前記搬送機構との間で上下方向に移動することによって前記パレットの移し替えを行うことを特徴とする、請求項1または2に記載の基板検査装置。 - 前記昇降機構を前記ロードロック室内に設け、
前記搬送機構は、前記検査室内に第1の搬送ローラを備え、前記ロードロック室内に第2の搬送ローラを備え、
前記ロードロック室内において、前記昇降機構と前記第2の搬送ロータは、複数台のパレットを前記第1の搬送ロータとの間で搬出入することを特徴とする、請求項3に記載の基板検査装置。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2006/324248 WO2008068845A1 (ja) | 2006-12-05 | 2006-12-05 | パレット搬送装置、および基板検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2008068845A1 JPWO2008068845A1 (ja) | 2010-03-11 |
JP4992910B2 true JP4992910B2 (ja) | 2012-08-08 |
Family
ID=39491765
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008548132A Expired - Fee Related JP4992910B2 (ja) | 2006-12-05 | 2006-12-05 | 基板検査装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US20100068011A1 (ja) |
JP (1) | JP4992910B2 (ja) |
KR (1) | KR101073271B1 (ja) |
CN (1) | CN101528571A (ja) |
WO (1) | WO2008068845A1 (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2010029637A1 (ja) * | 2008-09-12 | 2010-03-18 | 株式会社島津製作所 | プローブピンコンタクト確認装置、および液晶基板検査装置 |
JP5743437B2 (ja) * | 2009-07-09 | 2015-07-01 | キヤノン株式会社 | 露光装置、露光方法、搬送方法及びデバイスの製造方法 |
TWI485799B (zh) | 2009-12-10 | 2015-05-21 | Orbotech Lt Solar Llc | 自動排序之直線型處理裝置 |
US8459276B2 (en) | 2011-05-24 | 2013-06-11 | Orbotech LT Solar, LLC. | Broken wafer recovery system |
WO2021045286A1 (ko) * | 2019-09-06 | 2021-03-11 | 주식회사 이노글로벌 | 빈 공간이 형성된 테스트 소켓 |
JP7322801B2 (ja) * | 2020-05-13 | 2023-08-08 | 株式会社ダイフク | 容器取扱設備 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000228435A (ja) * | 1999-02-08 | 2000-08-15 | Dainippon Screen Mfg Co Ltd | 基板処理装置 |
JP2005233997A (ja) * | 2004-02-17 | 2005-09-02 | Shimadzu Corp | 液晶基板検査装置 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3799057A (en) * | 1972-01-26 | 1974-03-26 | Palmer Shile Co | Electrical control system |
US4382739A (en) * | 1980-12-24 | 1983-05-10 | International Business Machines Corporation | Light actuating force elevator drive mechanism |
GB2095861B (en) * | 1981-03-31 | 1985-01-03 | Toyoda Automatic Loom Works | Fork lift control system |
US5072574A (en) * | 1990-05-15 | 1991-12-17 | Sunclipse, Inc. | Vacuum packaging machine |
JP3109995B2 (ja) * | 1996-09-25 | 2000-11-20 | 株式会社パブコ | 昇降装置の制御装置及び方法 |
JP3442948B2 (ja) * | 1996-12-09 | 2003-09-02 | 大日本スクリーン製造株式会社 | 基板処理装置 |
US6206176B1 (en) * | 1998-05-20 | 2001-03-27 | Applied Komatsu Technology, Inc. | Substrate transfer shuttle having a magnetic drive |
US6517303B1 (en) * | 1998-05-20 | 2003-02-11 | Applied Komatsu Technology, Inc. | Substrate transfer shuttle |
KR100394576B1 (ko) * | 2001-06-12 | 2003-08-14 | 삼성전자주식회사 | 반도체 제조설비의 웨이퍼 리프트 속도 및 동작시간모니터링장치 |
JP4222007B2 (ja) * | 2002-11-19 | 2009-02-12 | 村田機械株式会社 | 搬送システム |
-
2006
- 2006-12-05 WO PCT/JP2006/324248 patent/WO2008068845A1/ja active Application Filing
- 2006-12-05 JP JP2008548132A patent/JP4992910B2/ja not_active Expired - Fee Related
- 2006-12-05 US US12/516,234 patent/US20100068011A1/en not_active Abandoned
- 2006-12-05 KR KR1020097011406A patent/KR101073271B1/ko not_active IP Right Cessation
- 2006-12-05 CN CN200680056239A patent/CN101528571A/zh active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000228435A (ja) * | 1999-02-08 | 2000-08-15 | Dainippon Screen Mfg Co Ltd | 基板処理装置 |
JP2005233997A (ja) * | 2004-02-17 | 2005-09-02 | Shimadzu Corp | 液晶基板検査装置 |
Also Published As
Publication number | Publication date |
---|---|
KR101073271B1 (ko) | 2011-10-12 |
JPWO2008068845A1 (ja) | 2010-03-11 |
WO2008068845A1 (ja) | 2008-06-12 |
KR20090079975A (ko) | 2009-07-22 |
US20100068011A1 (en) | 2010-03-18 |
CN101528571A (zh) | 2009-09-09 |
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