JP4507799B2 - 粒度分布測定装置 - Google Patents
粒度分布測定装置 Download PDFInfo
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- JP4507799B2 JP4507799B2 JP2004284615A JP2004284615A JP4507799B2 JP 4507799 B2 JP4507799 B2 JP 4507799B2 JP 2004284615 A JP2004284615 A JP 2004284615A JP 2004284615 A JP2004284615 A JP 2004284615A JP 4507799 B2 JP4507799 B2 JP 4507799B2
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- 239000002245 particle Substances 0.000 title claims description 104
- 239000007788 liquid Substances 0.000 claims description 36
- 238000005259 measurement Methods 0.000 claims description 34
- 239000000463 material Substances 0.000 claims description 9
- 239000000843 powder Substances 0.000 description 22
- 238000004062 sedimentation Methods 0.000 description 16
- 238000003756 stirring Methods 0.000 description 13
- 230000003287 optical effect Effects 0.000 description 7
- 230000005484 gravity Effects 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 239000002609 medium Substances 0.000 description 3
- 229920003023 plastic Polymers 0.000 description 3
- 239000012780 transparent material Substances 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 230000001133 acceleration Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000002612 dispersion medium Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000006247 magnetic powder Substances 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 239000011324 bead Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Images
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- Investigating Or Analysing Materials By Optical Means (AREA)
Description
Vt=(ρp−ρw)D2g/18μ …(1)
ここで、ρp:粒子の密度、ρw:媒液の密度、D:粒子の直径、g:重力加速度、μ:媒液の粘度、である。この式は粒子径が大きい方が速く沈降することを示している。粒子径の条件によっては粒子の沈降速度はアレン則やニュートン則に従うが、いずれにしても粒子径の大きい方が速く沈降する。
Claims (2)
- 測定セル内の液体中に分散させた粒子にレーザ光を照射し該粒子によって散乱される散乱光の空間強度分布を測定して該粒子の粒度分布を算出する粒度分布測定装置において、被測定対象となる粒子群の密度と最大直径、および、前記液体の密度と粘度を元に得られる前記粒子の最大沈降速度と測定に要する時間とから導かれる前記粒子群の最大沈降距離よりも前記測定セルの鉛直方向の長さを長くするとともに、該長さを250mm以上とし、さらに、前記測定セルに対する前記レーザ光の照射部位を前記測定セル内の液面から下方に計って前記最大沈降距離よりも下の部分としたことを特徴とする粒度分布測定装置。
- 請求項1記載の粒度分布測定装置において、前記測定セルは前記レーザ光の照射部位のみを該レーザ光を透過する材料で構成し、他の部分は他の材料で構成したことを特徴とする粒度分布測定装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004284615A JP4507799B2 (ja) | 2004-09-29 | 2004-09-29 | 粒度分布測定装置 |
CNB2005100853414A CN100432652C (zh) | 2004-09-29 | 2005-07-22 | 粒度分布测定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004284615A JP4507799B2 (ja) | 2004-09-29 | 2004-09-29 | 粒度分布測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006098212A JP2006098212A (ja) | 2006-04-13 |
JP4507799B2 true JP4507799B2 (ja) | 2010-07-21 |
Family
ID=36238178
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2004284615A Active JP4507799B2 (ja) | 2004-09-29 | 2004-09-29 | 粒度分布測定装置 |
Country Status (2)
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JP (1) | JP4507799B2 (ja) |
CN (1) | CN100432652C (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101881719B (zh) * | 2010-06-28 | 2012-01-04 | 中国科学院西安光学精密机械研究所 | 聚丙烯腈聚合液中凝胶粒子的检验方法 |
KR101458320B1 (ko) * | 2013-08-29 | 2014-11-04 | 전북대학교산학협력단 | 종말침강속도를 이용한 점도 측정장치 및 측정방법 |
CN104483165B (zh) * | 2014-11-21 | 2017-07-28 | 江苏博迁新材料股份有限公司 | 一种超细磁性粉体中大粒径粉的取样方法 |
JP6260521B2 (ja) * | 2014-11-25 | 2018-01-17 | 株式会社島津製作所 | 粒子解析装置及び粒子解析方法 |
CN104458512B (zh) * | 2014-12-01 | 2016-09-07 | 华中科技大学 | 一种测量颗粒群分形维数的方法 |
JP6864908B2 (ja) * | 2016-03-28 | 2021-04-28 | 国立研究開発法人 海上・港湾・航空技術研究所 | 鉱石の摩耗度評価方法及び鉱石の摩耗度測定装置 |
CN106290087B (zh) * | 2016-09-21 | 2023-05-02 | 迈安德集团有限公司 | 微细粒级物料自动分级实验*** |
US11047786B2 (en) | 2016-11-16 | 2021-06-29 | Horiba, Ltd. | Apparatus and method for measuring particle size distribution, and program for particle size distribution measuring apparatus |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002062248A (ja) * | 2000-07-01 | 2002-02-28 | Malvern Instruments Ltd | 粒子サイズの分布を特定するための装置及び方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58160842A (ja) * | 1982-03-18 | 1983-09-24 | Horiba Ltd | 光透過式粒度分布測定方法 |
US4457624A (en) * | 1982-05-10 | 1984-07-03 | The United States Of America As Represented By The Secretary Of The Interior | Suspended sediment sensor |
AT393169B (de) * | 1985-06-05 | 1991-08-26 | Staudinger Gernot | Verfahren und vorrichtung zur korngroessenanalyse |
US4696571A (en) * | 1985-10-25 | 1987-09-29 | The United States Of America As Represented By The Secretary Of The Interior | Suspended sediment sensor |
CN2041041U (zh) * | 1987-11-19 | 1989-07-12 | 河海大学 | 宽域粒度分析仪的探测装置 |
JPH02212742A (ja) * | 1989-02-13 | 1990-08-23 | Kowa Co | 液中微粒子測定装置 |
JPH0438442A (ja) * | 1990-06-04 | 1992-02-07 | Sumitomo Chem Co Ltd | 粒度分布自動測定装置 |
JPH0572106A (ja) * | 1991-09-17 | 1993-03-23 | Shimadzu Corp | 粒度分布測定装置 |
JPH10213534A (ja) * | 1997-01-29 | 1998-08-11 | Shimadzu Corp | 粒度分布測定装置 |
CN1202412C (zh) * | 2003-07-01 | 2005-05-18 | 武汉理工大学 | 沉降式激光反射像点粒度测量方法 |
-
2004
- 2004-09-29 JP JP2004284615A patent/JP4507799B2/ja active Active
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2005
- 2005-07-22 CN CNB2005100853414A patent/CN100432652C/zh not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002062248A (ja) * | 2000-07-01 | 2002-02-28 | Malvern Instruments Ltd | 粒子サイズの分布を特定するための装置及び方法 |
Also Published As
Publication number | Publication date |
---|---|
JP2006098212A (ja) | 2006-04-13 |
CN1755347A (zh) | 2006-04-05 |
CN100432652C (zh) | 2008-11-12 |
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