JP4150337B2 - 位置測定装置 - Google Patents
位置測定装置 Download PDFInfo
- Publication number
- JP4150337B2 JP4150337B2 JP2003512646A JP2003512646A JP4150337B2 JP 4150337 B2 JP4150337 B2 JP 4150337B2 JP 2003512646 A JP2003512646 A JP 2003512646A JP 2003512646 A JP2003512646 A JP 2003512646A JP 4150337 B2 JP4150337 B2 JP 4150337B2
- Authority
- JP
- Japan
- Prior art keywords
- scanning
- signal
- mark
- reference mark
- scale
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000003287 optical effect Effects 0.000 claims abstract description 17
- 230000000737 periodic effect Effects 0.000 claims abstract description 8
- 238000005259 measurement Methods 0.000 claims description 33
- 230000008878 coupling Effects 0.000 claims description 5
- 238000010168 coupling process Methods 0.000 claims description 5
- 238000005859 coupling reaction Methods 0.000 claims description 5
- 230000010349 pulsation Effects 0.000 description 10
- 238000000034 method Methods 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 3
- 238000011109 contamination Methods 0.000 description 3
- 230000001419 dependent effect Effects 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000003491 array Methods 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000009499 grossing Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
- G01D5/36—Forming the light into pulses
- G01D5/366—Particular pulse shapes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/244—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains
- G01D5/245—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains using a variable number of pulses in a train
- G01D5/2454—Encoders incorporating incremental and absolute signals
- G01D5/2455—Encoders incorporating incremental and absolute signals with incremental and absolute tracks on the same encoder
- G01D5/2457—Incremental encoders having reference marks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
- G01D5/36—Forming the light into pulses
- G01D5/38—Forming the light into pulses by diffraction gratings
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optical Transform (AREA)
- Length Measuring Devices By Optical Means (AREA)
Description
−スケールが、測定目盛りを備え、この測定目盛りを走査することによって周期的な測定信号が発生可能であり、
−スケールが、少なくとも1つの非周期的な基準マークを備え、この基準マークを非周期的な走査格子により走査することによって、基準マーク信号が発生可能であり、この基準マーク信号を介して、基準マークの位置に対して位置測定の絶対性が形成され、
−スケールが、基準マークの隣の一方の側と基準マークの隣の他方の側にそれぞれ1つの光学的に走査可能な領域マークを備え、この領域マークを走査ビームにより光電走査することによって、領域信号が発生可能であり、この領域信号の特性によって、走査装置が基準マークの一方の側に存在するのか、他方の側に存在するのかが識別可能であり、そして、
−領域マーク及び基準マークが、共通のトラック内に配設されており、
−領域マークが、光学的に異なるように偏向させる要素であり、これらの要素が、入射する走査ビームを、基準マークの一方の側では第1の光検出器に偏向させ、基準マークの他方の側では少なくとも1つの第2の光検出器に偏向させ、第1の光検出器の走査信号を第2の光検出器の走査信号と結合することにより結果として生じる領域信号の振幅によって、走査装置が基準マーク信号の一方の側に存在するのか、他方の側に存在するのかが識別可能である、位置測定装置を提供することにある。
2 走査装置
3 測定目盛り
4 基準マーク
5,6 領域マーク
7 光源
8 コリメータ
9 走査プレート
10 光検出装置
11 走査ビーム
12 走査ビーム
13 走査フィールド
13.1 フィールド
13.2 フィールド
20 差回路
21 加算装置
22 比較装置
23 加算装置
24 差回路
25 加算装置
26 比較装置
50,60 リミット領域
51,61 ブラインド
111〜113 光検出器
131〜134 光検出器
B 領域信号
B0 基準値
B1 信号
B2 信号
L リミット信号
L1 信号
M 合計
M1〜M3 測定信号
R 基準マーク信号
R1 逆脈動基準マーク信号
R2 脈動基準マーク信号
X 測定方向
Claims (9)
- スケール(1)とこのスケールに対して相対的に測定方向(X)に可動の走査装置(2)とを有し、
−スケール(1)が、測定目盛り(3)を備え、この測定目盛り(3)を走査することによって周期的な測定信号(M1,M2,M3)が発生可能であり、
−スケール(1)が、少なくとも1つの非周期的な基準マーク(4)を備え、この基準マーク(4)を非周期的な走査格子により走査することによって、基準マーク信号(R1,R2)が発生可能であり、この基準マーク信号を介して、基準マークの位置に対して位置測定の絶対性が形成され、
−スケール(1)が、基準マーク(4)の隣の一方の側と基準マーク(4)の隣の他方の側にそれぞれ1つの光学的に走査可能な領域マーク(5,6)を備え、この領域マーク(5,6)を走査ビーム(12)により光電走査することによって、領域信号(B)が発生可能であり、この領域信号の特性によって、走査装置(2)が基準マーク(4)の一方の側に存在するのか、他方の側に存在するのかが識別可能である、位置測定装置において、
−領域マーク(5,6)及び基準マーク(4)が、共通のトラック内に配設されていること、
−領域マークが、光学的に異なるように偏向させる要素(5,6)であり、これらの要素が、入射する走査ビーム(12)を、基準マーク(4)の一方の側では第1の光検出器(131)に偏向させ、基準マーク(4)の他方の側では少なくとも1つの第2の光検出器(133,134)に偏向させ、第1の光検出器(131)の走査信号(R1)を第2の光検出器(133,134)の走査信号(B1)と結合することにより結果として生じる領域信号(B)の振幅によって、走査装置(2)が基準マーク信号(4)の一方の側に存在するのか、他方の側に存在するのかが識別可能であることを特徴とする位置測定装置。 - 光学的に偏向させる要素が、異なった格子パラメータを有する格子(5,6)であることを特徴とする請求項1に記載の位置測定装置。
- 測定目盛り(3)、基準マーク(4)及び領域マーク(5,6)が、位相格子であることを特徴とする請求項2に記載の位置測定装置。
- 第1及び第2の光検出器(131,133,134)が、基準マーク(4)に入射する走査ビーム(12)がこれら第1及び第2の光検出器(131;133,134)の少なくとも1つに整向されるように配設されていることを特徴とする請求項1〜3のいずれか1つに記載の位置測定装置。
- 基準マーク(4)の第1の側の領域マーク(5)が、反射型又は透過型に形成されており、基準マーク(4)の第2の側の領域マーク(6)が、回折格子として形成されていることを特徴とする請求項1〜4のいずれか1つに記載の位置測定装置。
- スケール(1)が、リミット領域(50,60)を備え、リミット領域(50,60)が、領域マーク(5,6)の光学的な作用を部分的に変化させることによって形成されていることを特徴とする請求項1〜5のいずれか1つに記載の位置測定装置。
- リミット領域(50,60)が、領域マーク(5,6)を部分的にカバーすることによって形成されていることを特徴とする請求項6に記載の位置測定装置。
- リミット領域(50,60)を形成するために、それぞれ1つのブラインド(51,61)が領域マーク(5,6)に取り付けられていることを特徴とする請求項7に記載の位置測定装置。
- 領域信号(B)を形成するために、走査信号(R1,B1)の減算を包含する第1の結合規則により、第1の光検出器(131)の走査信号(R1)が第2の光検出器(133,134)の走査信号(B1)と組み合せられ、リミット信号(L)を形成するために、走査信号(R1,B1)の加算を包含する第1の結合規則とは異なった第2の結合規則により、第1の光検出器(131)の走査信号(R1)が第2の光検出器(133,134)の走査信号(B1)と組み合わされることを特徴とする請求項6〜8のいずれか1つに記載の位置測定装置。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10132521A DE10132521A1 (de) | 2001-07-09 | 2001-07-09 | Positionsmesseinrichtung |
PCT/EP2002/007453 WO2003006926A1 (de) | 2001-07-09 | 2002-07-05 | Positionsmesseinrichtung |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2004534247A JP2004534247A (ja) | 2004-11-11 |
JP4150337B2 true JP4150337B2 (ja) | 2008-09-17 |
Family
ID=7690656
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003512646A Expired - Fee Related JP4150337B2 (ja) | 2001-07-09 | 2002-07-05 | 位置測定装置 |
Country Status (8)
Country | Link |
---|---|
US (1) | US7057161B2 (ja) |
EP (1) | EP1407231B1 (ja) |
JP (1) | JP4150337B2 (ja) |
CN (1) | CN1235020C (ja) |
AT (1) | ATE538365T1 (ja) |
DE (1) | DE10132521A1 (ja) |
ES (1) | ES2376656T3 (ja) |
WO (1) | WO2003006926A1 (ja) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10244234A1 (de) * | 2002-09-23 | 2004-03-25 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
DE10329374A1 (de) * | 2003-06-30 | 2005-01-20 | Dr. Johannes Heidenhain Gmbh | Abtastbaueinheit einer Positionsmesseinrichtung |
DE10353808B4 (de) * | 2003-11-14 | 2015-09-03 | Dr. Johannes Heidenhain Gmbh | Messteilung für eine Positionsmesseinrichtung und Positionsmesseinrichtung |
GB0413711D0 (en) * | 2004-06-21 | 2004-07-21 | Renishaw Plc | Scale and readhead apparatus |
DE602004006877T2 (de) * | 2004-11-23 | 2008-02-07 | Fagor, S.Coop, Mondragon | Linearpositionsgeber mit Temperaturkompensation |
DE102005002189B4 (de) * | 2005-01-17 | 2007-02-15 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Vorrichtung zum Ermitteln der Winkelposition eines Lichtstrahls und Verfahren zum Betreiben einer Vorrichtung zum Ermitteln der Winkelposition eines Lichtstrahls |
KR20080045219A (ko) * | 2005-09-21 | 2008-05-22 | 코닌클리케 필립스 일렉트로닉스 엔.브이. | 물체의 움직임을 검출하기 위한 시스템 |
DE102006021484A1 (de) * | 2006-05-09 | 2007-11-15 | Dr. Johannes Heidenhain Gmbh | Optische Positionsmesseinrichtung |
DE102007056612A1 (de) * | 2007-11-23 | 2009-05-28 | Dr. Johannes Heidenhain Gmbh | Optische Positionsmesseinrichtung |
JP5178819B2 (ja) * | 2008-03-31 | 2013-04-10 | Thk株式会社 | 位置検出装置及びこれを用いたリニアアクチュエータ |
EP2636991A1 (en) * | 2012-03-07 | 2013-09-11 | Hexagon Metrology S.p.A. | Measuring machine with compensation system for errors due to the thermal deformation of a scale of a linear transducer |
JP6161870B2 (ja) * | 2012-03-12 | 2017-07-12 | Dmg森精機株式会社 | 位置検出装置 |
DE102014215633A1 (de) | 2013-11-28 | 2015-05-28 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
DE102014209004A1 (de) * | 2014-05-13 | 2015-11-19 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
DE102014218483B4 (de) * | 2014-09-15 | 2016-10-13 | Deckel Maho Pfronten Gmbh | Positionsmesseinrichtung zum Einsatz an einer Werkzeugmaschine |
DE102015201297B4 (de) * | 2015-01-26 | 2024-03-14 | Bundesdruckerei Gmbh | Vorrichtung und Verfahren zum Bestimmen einer Ausrichtung zwischen einer Vorderseitenmarkierung und einer Rückseitenmarkierung eines Dokumentenkörpers |
DE102015207275B4 (de) * | 2015-04-22 | 2018-06-07 | Robert Bosch Gmbh | Maßverkörperung mit signalkompensierenden Markierungen |
CN106141789B (zh) * | 2015-07-31 | 2018-08-31 | 宁夏巨能机器人***有限公司 | 一种堆垛料道的定位装置及其定位方法 |
DE102016200847A1 (de) * | 2016-01-21 | 2017-07-27 | Dr. Johannes Heidenhain Gesellschaft Mit Beschränkter Haftung | Optische Positionsmesseinrichtung |
DE102016211150A1 (de) * | 2016-06-22 | 2017-12-28 | Dr. Johannes Heidenhain Gmbh | Optische Positionsmesseinrichtung |
CN107462168A (zh) * | 2017-08-31 | 2017-12-12 | 广东工业大学 | 一种新型阵列光电传感器光栅位移检测***及方法 |
DE102018202556A1 (de) * | 2018-02-20 | 2019-08-22 | Dr. Johannes Heidenhain Gmbh | Optische Positionsmesseinrichtung |
CN109459271B (zh) * | 2018-12-21 | 2024-04-30 | 武汉飞流智能技术有限公司 | 一种取水管线定位装置 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3308814C2 (de) * | 1983-03-12 | 1985-02-07 | Dr. Johannes Heidenhain Gmbh, 8225 Traunreut | Meßeinrichtung |
DE3334609C1 (de) | 1983-09-24 | 1984-11-22 | Dr. Johannes Heidenhain Gmbh, 8225 Traunreut | Laengen- oder Winkelmesseinrichtung |
DE3416864C2 (de) | 1984-05-08 | 1986-04-10 | Dr. Johannes Heidenhain Gmbh, 8225 Traunreut | Photoelektrische Meßeinrichtung |
DE59103694D1 (de) | 1991-02-11 | 1995-01-12 | Heidenhain Gmbh Dr Johannes | Photoelektrische Positionsmesseinrichtung. |
DE4111873C2 (de) | 1991-04-11 | 1995-05-11 | Boehringer Werkzeugmaschinen | Meßeinrichtung an einer Werkzeugmaschine zum Bestimmen des jeweiligen Standorts eines beweglichen Bauteils |
DE9209801U1 (de) | 1992-07-22 | 1992-09-17 | Dr. Johannes Heidenhain Gmbh, 8225 Traunreut | Längen- oder Winkelmeßeinrichtung |
EP0669519B1 (de) | 1994-02-23 | 2000-05-03 | Dr. Johannes Heidenhain GmbH | Positionsmessvorrichtung |
US6229140B1 (en) * | 1995-10-27 | 2001-05-08 | Canon Kabushiki Kaisha | Displacement information detection apparatus |
AT410485B (de) | 1997-07-30 | 2003-05-26 | Rsf Elektronik Gmbh | Positionsmesseinrichtung |
-
2001
- 2001-07-09 DE DE10132521A patent/DE10132521A1/de not_active Withdrawn
-
2002
- 2002-07-05 JP JP2003512646A patent/JP4150337B2/ja not_active Expired - Fee Related
- 2002-07-05 EP EP02764630A patent/EP1407231B1/de not_active Expired - Lifetime
- 2002-07-05 WO PCT/EP2002/007453 patent/WO2003006926A1/de active Application Filing
- 2002-07-05 ES ES02764630T patent/ES2376656T3/es not_active Expired - Lifetime
- 2002-07-05 AT AT02764630T patent/ATE538365T1/de active
- 2002-07-05 CN CNB028138880A patent/CN1235020C/zh not_active Expired - Fee Related
- 2002-07-05 US US10/483,971 patent/US7057161B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE10132521A1 (de) | 2003-01-30 |
CN1235020C (zh) | 2006-01-04 |
EP1407231B1 (de) | 2011-12-21 |
CN1526065A (zh) | 2004-09-01 |
ATE538365T1 (de) | 2012-01-15 |
US7057161B2 (en) | 2006-06-06 |
US20040245442A1 (en) | 2004-12-09 |
ES2376656T3 (es) | 2012-03-15 |
EP1407231A1 (de) | 2004-04-14 |
JP2004534247A (ja) | 2004-11-11 |
WO2003006926A1 (de) | 2003-01-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4150337B2 (ja) | 位置測定装置 | |
JP4503822B2 (ja) | 位置測定装置 | |
US5003170A (en) | Reference signal generation apparatus for position detector with Fraunhofer diffraction | |
EP3052897B1 (en) | Measurement encoder | |
JP5164809B2 (ja) | 光学エンコーダ | |
JP5128368B2 (ja) | エンコーダ用のスケール及びエンコーダ | |
KR20080095911A (ko) | 광학식 엔코더 | |
US10768026B2 (en) | Optical element | |
JPH0410976B2 (ja) | ||
US6914235B2 (en) | Position measuring system and method for operating a position measuring system | |
JP4746297B2 (ja) | 光学式位置測定装置 | |
JP3881339B2 (ja) | 位置測定装置 | |
JP4580060B2 (ja) | 光学位置測定装置の走査ユニット | |
JP2005502036A5 (ja) | ||
US9303981B2 (en) | Position-measuring device | |
US7196319B2 (en) | Position-measuring device | |
KR101907478B1 (ko) | 광학적 위치 측정 장치 | |
JP2006266870A (ja) | 位置検出装置 | |
JP2021193354A (ja) | 光学式エンコーダ及び制御装置 | |
JP5113018B2 (ja) | リニアエンコーダ装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20050314 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20070727 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20070821 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20071120 |
|
A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20071128 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20071220 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20080624 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20080627 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110704 Year of fee payment: 3 |
|
R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 Ref document number: 4150337 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110704 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120704 Year of fee payment: 4 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120704 Year of fee payment: 4 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130704 Year of fee payment: 5 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |