JP4027805B2 - 試験および修復のための、回路および方法 - Google Patents
試験および修復のための、回路および方法 Download PDFInfo
- Publication number
- JP4027805B2 JP4027805B2 JP2002586357A JP2002586357A JP4027805B2 JP 4027805 B2 JP4027805 B2 JP 4027805B2 JP 2002586357 A JP2002586357 A JP 2002586357A JP 2002586357 A JP2002586357 A JP 2002586357A JP 4027805 B2 JP4027805 B2 JP 4027805B2
- Authority
- JP
- Japan
- Prior art keywords
- data
- address
- cell
- external test
- memory array
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/72—Masking faults in memories by using spares or by reconfiguring with optimized replacement algorithms
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/44—Indication or identification of errors, e.g. for repair
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Tests Of Electronic Circuits (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Debugging And Monitoring (AREA)
- Emergency Protection Circuit Devices (AREA)
- Monitoring And Testing Of Exchanges (AREA)
- Dram (AREA)
- Static Random-Access Memory (AREA)
Description
本発明に係る第1の試験方法について説明する。
図4は、本発明に係る第2の試験方法を、従来の試験方法と比較して示す。
図5は、本発明に係る第3の試験方法を、従来の試験方法と比較して示す。
Claims (9)
- 外部試験装置を用いて、複数の半導体チップに対して並列方式で試験を行う方法であって、
前記データの書込モード時において、
各半導体チップ内のメモリアレイにおける同一アドレスに対応するセルに対して、前記外部試験装置からの期待データと同一のデータを出力回路を介して並列的に書き込むステップと、
前記データの読出モード時において、
各半導体チップの前記メモリアレイにおける同一アドレスに対応するセルに記憶されているデータを並列的に読み出し、該各読み出されたデータを各半導体チップ内において前記外部試験装置からの前記期待データと比較するステップと
を具え、
ここで、該比較ステップにおいて、前記各半導体チップの前記メモリアレイのセルからの前記各記憶されたデータと、前記外部試験装置からの前記期待データとが一致しないとき、欠陥セルに対応するアドレスを前記各半導体チップのレジスタに記憶することを特徴とする方法。 - 前記各半導体チップの前記メモリアドレスに対応するセルに欠陥があることを示すビットを、前記レジスタに記憶するステップ
をさらに具えたことを特徴とする請求項1記載の試験を行う方法。 - 前記出力回路は、
前記データの書込モード時には、前記外部試験装置から前記各半導体チップの前記メモリアレイへ前記期待データと同一のデータの書込みを行い、前記データの読出モード時には、前記各半導体チップから前記外部試験装置への前記記憶されたデータの出力を阻止することを特徴とする請求項1又は2記載の方法。 - 前記各半導体チップの前記メモリアレイのセルと複数の冗長メモリセルのうちの1つの冗長メモリセルとの中から選択されたセルから読み出されたデータと、前記外部試験装置からの期待データとを比較する工程
をさらに具えたことを特徴とする請求項1ないし3のいずれかに記載の方法。 - 外部試験装置と接続され、データの書込み/読出し処理を行う半導体チップに組み込まれた回路であって、
複数のセルを有するメモリアレイと、
前記メモリアレイの各セルに対して、所定のアドレスを送出するアドレスラッチと、
前記データの書込みモード時において、前記メモリアレイにおける所定のアドレスに対応するセルに対して、前記外部試験装置から期待データと同一のデータを書き込む出力回路と、
前記データの読出しモード時において、前記メモリアレイの前記所定のアドレスに対応するセルに記憶されているデータを読み出し、該読み出されたデータを前記外部試験装置からの前記期待データと比較する比較器と、
前記比較により、前記メモリアレイのセルから読み出された前記記憶されたデータと前記外部試験装置からの前記期待データとが一致しないとき、該一致しないデータを記憶しているセルに対応するアドレスを記憶するレジスタと
具えたことを特徴とする回路。 - 前記レジスタは、前記メモリアドレスに対応するセルに欠陥があることを示すビットを記憶することを特徴とする請求項5記載の回路。
- 前記出力回路は、
前記データの書込みモード時には、前記外部試験装置から前記メモリアレイへ前記期待データと同一のデータの書込みを行い、前記データの読出しモード時には、前記メモリアレイから前記外部試験装置への前記記憶されたデータの出力を阻止することを特徴とする請求項5又は6記載の回路。 - 複数の冗長メモリセルをさらに具え、
前記比較器は、前記メモリアレイのセルと前記複数の冗長メモリセルのうちの1つの冗長メモリセルとの中から選択されたセルから読み出されたデータと、前記外部試験装置からの期待データとを比較することを特徴とする請求項5ないし7のいずれかに記載の回路。 - コンピュータシステムであって、
所定の信号を生成する機能を有するマイクロプロセッサと、
前記マイクロプロセッサに接続され、請求項5ないし8のいずれかに記載の回路と
を具え、
ここで、該回路に含まれる前記出力回路は、前記マイクロプロセッサから出力される前記所定の信号に基づいて、データの書込みモード時又は読出しモード時での処理を実行することを特徴とするコンピュータシステム。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/810,366 US6904552B2 (en) | 2001-03-15 | 2001-03-15 | Circuit and method for test and repair |
PCT/US2002/007270 WO2002089147A2 (en) | 2001-03-15 | 2002-03-11 | Circuit and method for memory test and repair |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2004528669A JP2004528669A (ja) | 2004-09-16 |
JP4027805B2 true JP4027805B2 (ja) | 2007-12-26 |
Family
ID=25203695
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2002586357A Expired - Fee Related JP4027805B2 (ja) | 2001-03-15 | 2002-03-11 | 試験および修復のための、回路および方法 |
Country Status (9)
Country | Link |
---|---|
US (2) | US6904552B2 (ja) |
EP (1) | EP1368812B1 (ja) |
JP (1) | JP4027805B2 (ja) |
KR (1) | KR100559022B1 (ja) |
CN (1) | CN100483557C (ja) |
AT (1) | ATE430980T1 (ja) |
AU (1) | AU2002338564A1 (ja) |
DE (1) | DE60232227D1 (ja) |
WO (1) | WO2002089147A2 (ja) |
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2001
- 2001-03-15 US US09/810,366 patent/US6904552B2/en not_active Expired - Lifetime
- 2001-05-24 US US09/864,682 patent/US6918072B2/en not_active Expired - Fee Related
-
2002
- 2002-03-11 WO PCT/US2002/007270 patent/WO2002089147A2/en active Application Filing
- 2002-03-11 AU AU2002338564A patent/AU2002338564A1/en not_active Abandoned
- 2002-03-11 JP JP2002586357A patent/JP4027805B2/ja not_active Expired - Fee Related
- 2002-03-11 EP EP02766724A patent/EP1368812B1/en not_active Expired - Lifetime
- 2002-03-11 CN CNB028098838A patent/CN100483557C/zh not_active Expired - Fee Related
- 2002-03-11 KR KR1020037011999A patent/KR100559022B1/ko not_active IP Right Cessation
- 2002-03-11 AT AT02766724T patent/ATE430980T1/de not_active IP Right Cessation
- 2002-03-11 DE DE60232227T patent/DE60232227D1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE60232227D1 (de) | 2009-06-18 |
WO2002089147A3 (en) | 2003-05-01 |
EP1368812B1 (en) | 2009-05-06 |
WO2002089147A2 (en) | 2002-11-07 |
KR20040041540A (ko) | 2004-05-17 |
ATE430980T1 (de) | 2009-05-15 |
CN100483557C (zh) | 2009-04-29 |
KR100559022B1 (ko) | 2006-03-10 |
AU2002338564A1 (en) | 2002-11-11 |
CN1509479A (zh) | 2004-06-30 |
US6904552B2 (en) | 2005-06-07 |
EP1368812A2 (en) | 2003-12-10 |
JP2004528669A (ja) | 2004-09-16 |
US20020133770A1 (en) | 2002-09-19 |
US6918072B2 (en) | 2005-07-12 |
US20020133767A1 (en) | 2002-09-19 |
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