JP3580838B2 - ディジタル環境でアナログ試験信号を使用する方法及び装置 - Google Patents
ディジタル環境でアナログ試験信号を使用する方法及び装置 Download PDFInfo
- Publication number
- JP3580838B2 JP3580838B2 JP22103793A JP22103793A JP3580838B2 JP 3580838 B2 JP3580838 B2 JP 3580838B2 JP 22103793 A JP22103793 A JP 22103793A JP 22103793 A JP22103793 A JP 22103793A JP 3580838 B2 JP3580838 B2 JP 3580838B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- circuit arrangement
- electronic circuit
- test
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Tests Of Electronic Circuits (AREA)
- Analogue/Digital Conversion (AREA)
- Compression, Expansion, Code Conversion, And Decoders (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP92202698 | 1992-09-07 | ||
EP93201098 | 1993-04-15 | ||
NL92202698:4 | 1993-04-15 | ||
NL93201098:6 | 1993-04-15 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH06174794A JPH06174794A (ja) | 1994-06-24 |
JP3580838B2 true JP3580838B2 (ja) | 2004-10-27 |
Family
ID=26131679
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP22103793A Expired - Fee Related JP3580838B2 (ja) | 1992-09-07 | 1993-09-06 | ディジタル環境でアナログ試験信号を使用する方法及び装置 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP3580838B2 (de) |
KR (1) | KR100364336B1 (de) |
DE (1) | DE69332499T2 (de) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002296329A (ja) * | 2001-03-30 | 2002-10-09 | Agilent Technologies Japan Ltd | 集積回路の試験装置 |
-
1993
- 1993-08-31 DE DE69332499T patent/DE69332499T2/de not_active Expired - Lifetime
- 1993-09-06 KR KR1019930017777A patent/KR100364336B1/ko not_active IP Right Cessation
- 1993-09-06 JP JP22103793A patent/JP3580838B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69332499D1 (de) | 2003-01-02 |
DE69332499T2 (de) | 2003-07-10 |
KR940007543A (ko) | 1994-04-27 |
KR100364336B1 (ko) | 2003-02-05 |
JPH06174794A (ja) | 1994-06-24 |
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