JP3580838B2 - ディジタル環境でアナログ試験信号を使用する方法及び装置 - Google Patents

ディジタル環境でアナログ試験信号を使用する方法及び装置 Download PDF

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Publication number
JP3580838B2
JP3580838B2 JP22103793A JP22103793A JP3580838B2 JP 3580838 B2 JP3580838 B2 JP 3580838B2 JP 22103793 A JP22103793 A JP 22103793A JP 22103793 A JP22103793 A JP 22103793A JP 3580838 B2 JP3580838 B2 JP 3580838B2
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Japan
Prior art keywords
signal
circuit arrangement
electronic circuit
test
testing
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Expired - Fee Related
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JP22103793A
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English (en)
Japanese (ja)
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JPH06174794A (ja
Inventor
ゼィエムストラ タコ
ペトルス ヘレナ スーレン ジェラルダス
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Koninklijke Philips NV
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Koninklijke Philips Electronics NV
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Publication of JPH06174794A publication Critical patent/JPH06174794A/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Mechanical Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analogue/Digital Conversion (AREA)
  • Compression, Expansion, Code Conversion, And Decoders (AREA)
JP22103793A 1992-09-07 1993-09-06 ディジタル環境でアナログ試験信号を使用する方法及び装置 Expired - Fee Related JP3580838B2 (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
EP92202698 1992-09-07
EP93201098 1993-04-15
NL92202698:4 1993-04-15
NL93201098:6 1993-04-15

Publications (2)

Publication Number Publication Date
JPH06174794A JPH06174794A (ja) 1994-06-24
JP3580838B2 true JP3580838B2 (ja) 2004-10-27

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ID=26131679

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Application Number Title Priority Date Filing Date
JP22103793A Expired - Fee Related JP3580838B2 (ja) 1992-09-07 1993-09-06 ディジタル環境でアナログ試験信号を使用する方法及び装置

Country Status (3)

Country Link
JP (1) JP3580838B2 (de)
KR (1) KR100364336B1 (de)
DE (1) DE69332499T2 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002296329A (ja) * 2001-03-30 2002-10-09 Agilent Technologies Japan Ltd 集積回路の試験装置

Also Published As

Publication number Publication date
DE69332499D1 (de) 2003-01-02
DE69332499T2 (de) 2003-07-10
KR940007543A (ko) 1994-04-27
KR100364336B1 (ko) 2003-02-05
JPH06174794A (ja) 1994-06-24

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