JP2018121333A - 照明装置、画像読取装置および画像形成装置 - Google Patents
照明装置、画像読取装置および画像形成装置 Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/57—Measuring gloss
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G15/00—Apparatus for electrographic processes using a charge pattern
- G03G15/50—Machine control of apparatus for electrographic processes using a charge pattern, e.g. regulating differents parts of the machine, multimode copiers, microprocessor control
- G03G15/5062—Machine control of apparatus for electrographic processes using a charge pattern, e.g. regulating differents parts of the machine, multimode copiers, microprocessor control by measuring the characteristics of an image on the copy material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
- G01N2021/8427—Coatings
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
- G01N2021/8905—Directional selective optics, e.g. slits, spatial filters
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/063—Illuminating optical parts
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G15/00—Apparatus for electrographic processes using a charge pattern
- G03G15/55—Self-diagnostics; Malfunction or lifetime display
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Abstract
【解決手段】第1の曲率の曲面状に複数のLEDを並べて配置した発光装置LEDA510と、発光装置LEDA510の光の照射方向に、第1の曲率よりも大きい第2の曲率の曲面状に配置された、ハニカム構造を有するハニカム部材513と、を備える。
【選択図】図3
Description
211 光沢用照明装置
213 画像センサ
501a、501b ベース
503 スペーサ
504 電源基板
505 コネクタ
506 ベースプレート
507a、507b シム
508 放熱体
509 フレキシブル基板
510 LEDA
511 ロッドレンズ
512a、512b レンズ支え
513 ハニカム部材
514 拡散透過フィルム
515a、515b 鏡面反射フィルム
517 防塵フィルム
518a、518b 遮光フィルム
Claims (7)
- 第1の曲率の曲面状に複数の発光素子を並べて配置した発光装置と、
前記発光装置の光の照射方向に、前記第1の曲率よりも大きい第2の曲率の曲面状に配置された、ハニカム構造を有するハニカム部材と、
を備える照明装置。 - 前記ハニカム部材は、少なくとも前記発光装置の前記複数の発光素子の配列方向である長手方向に伸縮可能である、
請求項1に記載の照明装置。 - 前記発光装置及び前記ハニカム部材は、同一の湾曲中心を有して前記長手方向に沿って湾曲している、
請求項2に記載の照明装置。 - 前記発光装置から照射され、前記ハニカム部材を透過した光の少なくとも一部を当該ハニカム部材の前記長手方向に沿って遮光する1以上の遮光部材を更に備える、
請求項2に記載の照明装置。 - 前記1以上の遮光部材は、
前記ハニカム部材の前記長手方向に直交する短手方向の上側を透過した光を当該ハニカム部材の前記長手方向に沿って遮光する第1の遮光部材と、
前記ハニカム部材の前記短手方向の下側を透過した光を当該ハニカム部材の前記長手方向に沿って遮光する第2の遮光部材と、
を含む請求項4に記載の照明装置。 - 検査対象物に対して光を照射する請求項1ないし4の何れか一項に記載の照明装置と、
前記照明装置から照射された光の正反射光の光量に基づき前記検査対象物の鏡面光沢の度合いを読み取る画像センサと、
を備える画像読取装置。 - 記録媒体に対して画像を記録する印刷装置と、
前記印刷装置により画像が記録された前記記録媒体を検査対象物とする請求項6に記載の画像読取装置と、
を備える画像形成装置。
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US15/880,989 US10401287B2 (en) | 2017-01-26 | 2018-01-26 | Lighting device, and apparatus and system incorporating the lighting device |
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JP2018121333A true JP2018121333A (ja) | 2018-08-02 |
JP6977584B2 JP6977584B2 (ja) | 2021-12-08 |
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CN114641684A (zh) * | 2019-08-30 | 2022-06-17 | 康宁股份有限公司 | 用于蜂窝体检查的***和方法 |
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Publication number | Priority date | Publication date | Assignee | Title |
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JPS5223170A (en) | 1975-08-18 | 1977-02-21 | Furukawa Electric Co Ltd | Method of improving characteristic of polyoxadiazole system resin plastics |
DE2701764A1 (de) * | 1977-01-18 | 1978-07-20 | Leitz Ernst Gmbh | Lichtflussregler |
JPH06208613A (ja) * | 1992-11-13 | 1994-07-26 | Laurel Bank Mach Co Ltd | パターン検出装置 |
US6031620A (en) * | 1997-05-01 | 2000-02-29 | Impact Systems, Inc. | Gloss sensor resistant to tilting and shifting paper and with improved calibration |
US6079854A (en) * | 1998-02-13 | 2000-06-27 | Ra; Dojin | Device and method for diffusing light |
JP4001855B2 (ja) * | 2003-10-28 | 2007-10-31 | 日本碍子株式会社 | ハニカム構造体の隔壁表面の凹凸検査方法及び検査装置 |
JP2007278713A (ja) * | 2006-04-03 | 2007-10-25 | Chuo Denshi Keisoku Kk | 塗装検査装置における照明方法 |
JP2009168653A (ja) * | 2008-01-17 | 2009-07-30 | Olympus Corp | 外観検査用照明装置及び外観検査装置 |
JP5720134B2 (ja) | 2010-04-20 | 2015-05-20 | 株式会社リコー | 画像検査装置及び画像形成装置 |
FI20126126L (fi) * | 2012-10-30 | 2014-05-01 | Metso Automation Oy | Menetelmä ja laite kiillon mittaamiseksi |
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- 2018-01-26 EP EP18153654.1A patent/EP3355123B8/en active Active
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JP6977584B2 (ja) | 2021-12-08 |
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EP3355123A1 (en) | 2018-08-01 |
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