JP2008064563A - 検査装置 - Google Patents
検査装置 Download PDFInfo
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- JP2008064563A JP2008064563A JP2006241779A JP2006241779A JP2008064563A JP 2008064563 A JP2008064563 A JP 2008064563A JP 2006241779 A JP2006241779 A JP 2006241779A JP 2006241779 A JP2006241779 A JP 2006241779A JP 2008064563 A JP2008064563 A JP 2008064563A
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- liquid crystal
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- 238000007689 inspection Methods 0.000 title claims abstract description 45
- 230000002093 peripheral effect Effects 0.000 claims description 16
- 239000000463 material Substances 0.000 claims description 14
- 238000004381 surface treatment Methods 0.000 claims description 4
- 239000004973 liquid crystal related substance Substances 0.000 abstract description 61
- 238000005259 measurement Methods 0.000 abstract description 9
- 230000001678 irradiating effect Effects 0.000 abstract description 2
- 230000007246 mechanism Effects 0.000 description 40
- 239000000758 substrate Substances 0.000 description 33
- 230000001105 regulatory effect Effects 0.000 description 9
- 230000008878 coupling Effects 0.000 description 6
- 238000010168 coupling process Methods 0.000 description 6
- 238000005859 coupling reaction Methods 0.000 description 6
- 230000000903 blocking effect Effects 0.000 description 3
- 238000009434 installation Methods 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000005337 ground glass Substances 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0437—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using masks, aperture plates, spatial light modulators, spatial filters, e.g. reflective filters
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1326—Liquid crystal optical waveguides or liquid crystal cells specially adapted for gating or modulating between optical waveguides
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
- G01J2001/083—Testing response of detector
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
【解決手段】液晶パネルを背面から照らして検査を行う検査装置である。開口を備えて装置本体側に取り付けられる固定ベースと、当該固定ベースの背面側に設けられて前記開口から前記液晶パネルの背面を照らすバックライトと、前記固定ベース上に4つ組み合わせて矩形状にかつ前記液晶パネルの寸法に合わせて移動可能に配置されてその内周側に可変開口を形成する可動ベースと、当該各可動ベースの外周側に設けられ、前記固定ベースの開口よりも前記可動ベースの可変開口が小さくなったとき当該可動ベースの外周側にできる隙間から漏れる前記バックライトの光を遮る遮光カバーとを備えた。
【選択図】図1
Description
前記実施形態では、遮光部材として、前記可動ベース21の外周側の隙間61を覆う遮光カバー25(板材)を用いたが、板材に限らず、フィルム等の他の部材でもよい。また、硬い板材で無くても、隙間61を覆って遮光できる部材であればよく、硬さは問わない。
Claims (3)
- 検査対象板を背面から照らして検査を行う検査装置であって、
開口を備えて装置本体側に取り付けられる固定ベースと、
当該固定ベースの背面側に設けられて前記開口から前記検査対象板の背面を照らすバックライトと、
前記固定ベース上に4つ組み合わせて矩形状にかつ前記検査対象板の寸法に合わせて移動可能に配置されてその内周側に可変開口を形成する可動ベースと、
当該各可動ベースの外周側に設けられ、前記固定ベースの開口よりも前記可動ベースの可変開口が小さくなったとき当該可動ベースの外周側にできる隙間から漏れる前記バックライトの光を遮る遮光部材と
を備えて構成されたことを特徴とする検査装置。 - 請求項1に記載の検査装置において、
前記遮光部材が、前記可動ベースの外周側の前記隙間を覆う板材又はフィルムで構成されたことを特徴とする検査装置。 - 請求項2に記載の検査装置において、
前記遮光部材を構成する板材又はフィルムの前記バックライト側面を、当該バックライトの光を吸収し、又は散乱させる表面処理を施したことを特徴とする検査装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006241779A JP5019827B2 (ja) | 2006-09-06 | 2006-09-06 | 検査装置 |
TW096128856A TWI343989B (en) | 2006-09-06 | 2007-08-06 | Inspection apparatus |
KR1020070082623A KR100873743B1 (ko) | 2006-09-06 | 2007-08-17 | 검사 장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006241779A JP5019827B2 (ja) | 2006-09-06 | 2006-09-06 | 検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008064563A true JP2008064563A (ja) | 2008-03-21 |
JP5019827B2 JP5019827B2 (ja) | 2012-09-05 |
Family
ID=39287412
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006241779A Active JP5019827B2 (ja) | 2006-09-06 | 2006-09-06 | 検査装置 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP5019827B2 (ja) |
KR (1) | KR100873743B1 (ja) |
TW (1) | TWI343989B (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100843951B1 (ko) | 2008-04-15 | 2008-07-03 | 오상협 | 백라이트 유닛 지그 팔레트 |
CN103672626A (zh) * | 2013-12-31 | 2014-03-26 | 京东方科技集团股份有限公司 | 一种背光模组调试装置 |
CN106019704A (zh) * | 2016-06-14 | 2016-10-12 | 广州创维平面显示科技有限公司 | 背光模组开发平台 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101456424B1 (ko) * | 2012-03-29 | 2014-10-31 | 주식회사 엘지화학 | 신규한 구조의 두께 검사 장치 |
KR101920224B1 (ko) * | 2012-07-27 | 2018-11-20 | 엘지디스플레이 주식회사 | 액정패널 검사장비 및 검사방법 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001021859A (ja) * | 1999-07-07 | 2001-01-26 | Advanced Display Inc | 液晶パネルの搬送トレイおよび点灯検査方法 |
JP2003015543A (ja) * | 2001-06-29 | 2003-01-17 | Micronics Japan Co Ltd | 表示用基板の検査装置 |
JP2006119031A (ja) * | 2004-10-22 | 2006-05-11 | Micronics Japan Co Ltd | パネルの検査装置に用いられる電気的接続装置 |
JP2007163726A (ja) * | 2005-12-13 | 2007-06-28 | Seiko Epson Corp | プロジェクタ及び光学部品 |
JP2008064682A (ja) * | 2006-09-08 | 2008-03-21 | Micronics Japan Co Ltd | 検査装置 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3480925B2 (ja) * | 2000-09-12 | 2003-12-22 | 株式会社双晶テック | ディスプレイパネル又はプローブブロックの支持枠体 |
KR100444251B1 (ko) * | 2003-05-13 | 2004-08-11 | 주식회사 파이컴 | 오토 프로브 유닛용 패널 캐리어의 액정패널 자동파지장치 |
KR100951904B1 (ko) | 2003-04-08 | 2010-04-09 | 삼성전자주식회사 | 액정표시모듈 신뢰성 테스트 장치 |
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2006
- 2006-09-06 JP JP2006241779A patent/JP5019827B2/ja active Active
-
2007
- 2007-08-06 TW TW096128856A patent/TWI343989B/zh active
- 2007-08-17 KR KR1020070082623A patent/KR100873743B1/ko active IP Right Grant
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001021859A (ja) * | 1999-07-07 | 2001-01-26 | Advanced Display Inc | 液晶パネルの搬送トレイおよび点灯検査方法 |
JP2003015543A (ja) * | 2001-06-29 | 2003-01-17 | Micronics Japan Co Ltd | 表示用基板の検査装置 |
JP2006119031A (ja) * | 2004-10-22 | 2006-05-11 | Micronics Japan Co Ltd | パネルの検査装置に用いられる電気的接続装置 |
JP2007163726A (ja) * | 2005-12-13 | 2007-06-28 | Seiko Epson Corp | プロジェクタ及び光学部品 |
JP2008064682A (ja) * | 2006-09-08 | 2008-03-21 | Micronics Japan Co Ltd | 検査装置 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100843951B1 (ko) | 2008-04-15 | 2008-07-03 | 오상협 | 백라이트 유닛 지그 팔레트 |
CN103672626A (zh) * | 2013-12-31 | 2014-03-26 | 京东方科技集团股份有限公司 | 一种背光模组调试装置 |
CN106019704A (zh) * | 2016-06-14 | 2016-10-12 | 广州创维平面显示科技有限公司 | 背光模组开发平台 |
Also Published As
Publication number | Publication date |
---|---|
KR100873743B1 (ko) | 2008-12-12 |
KR20080022499A (ko) | 2008-03-11 |
TWI343989B (en) | 2011-06-21 |
TW200827692A (en) | 2008-07-01 |
JP5019827B2 (ja) | 2012-09-05 |
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