JP2002507340A - 改善された充填比を有するcmos画像センサ - Google Patents
改善された充填比を有するcmos画像センサInfo
- Publication number
- JP2002507340A JP2002507340A JP50101199A JP50101199A JP2002507340A JP 2002507340 A JP2002507340 A JP 2002507340A JP 50101199 A JP50101199 A JP 50101199A JP 50101199 A JP50101199 A JP 50101199A JP 2002507340 A JP2002507340 A JP 2002507340A
- Authority
- JP
- Japan
- Prior art keywords
- transistor
- circuit
- voltage
- terminal
- aps
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 238000000034 method Methods 0.000 claims abstract description 24
- 238000007667 floating Methods 0.000 claims abstract description 17
- 238000009792 diffusion process Methods 0.000 claims abstract description 14
- 230000004044 response Effects 0.000 claims abstract description 6
- 230000003287 optical effect Effects 0.000 claims description 7
- 230000008878 coupling Effects 0.000 claims description 3
- 238000010168 coupling process Methods 0.000 claims description 3
- 238000005859 coupling reaction Methods 0.000 claims description 3
- 230000005669 field effect Effects 0.000 claims description 3
- 238000005070 sampling Methods 0.000 claims description 3
- 230000002596 correlated effect Effects 0.000 claims description 2
- 239000003990 capacitor Substances 0.000 description 34
- 230000008859 change Effects 0.000 description 32
- 238000012937 correction Methods 0.000 description 20
- 230000010354 integration Effects 0.000 description 10
- 230000008569 process Effects 0.000 description 9
- 230000006870 function Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 6
- 238000012545 processing Methods 0.000 description 6
- 230000008901 benefit Effects 0.000 description 5
- 230000000875 corresponding effect Effects 0.000 description 5
- 238000002955 isolation Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000012546 transfer Methods 0.000 description 4
- 230000003321 amplification Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 238000003199 nucleic acid amplification method Methods 0.000 description 3
- 230000003071 parasitic effect Effects 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 238000012935 Averaging Methods 0.000 description 2
- 230000000295 complement effect Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- SNKZJIOFVMKAOJ-UHFFFAOYSA-N 3-Aminopropanesulfonate Chemical compound NCCCS(O)(=O)=O SNKZJIOFVMKAOJ-UHFFFAOYSA-N 0.000 description 1
- 241000282376 Panthera tigris Species 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 239000008186 active pharmaceutical agent Substances 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000003750 conditioning effect Effects 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000010200 validation analysis Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
- H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
- H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/65—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to reset noise, e.g. KTC noise related to CMOS structures by techniques other than CDS
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
- H04N25/677—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction for reducing the column or line fixed pattern noise
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/766—Addressed sensors, e.g. MOS or CMOS sensors comprising control or output lines used for a plurality of functions, e.g. for pixel output, driving, reset or power
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Solid State Image Pick-Up Elements (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1 (a)浮遊拡散ノードで感知された光に応じて電圧を発生させる光検 出器と; (b)制御端子で上記浮遊拡散ノードに結合され、直接的に出力端子で出力ライ ンに結合可能な能動素子であって、上記出力ラインで、上記浮遊拡散ノード電圧 の大きさに関連した大きさを有する出力電圧を提供するように構成された前記能 動素子と; を備える、能動ピクセルセンサ(APS)回路。 2 上記能動素子は電解効果型トランジスタであり; 上記トランジスタの制御端子はゲート端子であり、上記トランジスタの出力端子 はソース端子であり; 出力ラインは電流ソースに結合され; 上記トランジスタはソースフォロワーモードで動作するように構成され、上記出 力ラインで出力電圧を提供する; 請求項1記載の回路。 3 上記出力ラインは相関二重サンプリング(CDS)回路の入力部に結合 され;上記CDS回路は、上記出力ラインに結合された電流ソースを備える、請求 項2記載の回路。 4 ソース端子で上記トランジスタのゲート端子に結合された第二トラン ジスタを更に備え、上記第二トランジスタは、上記トランジスタのゲート端子を 、上記光検出器内に蓄えられた電荷が読まれていない期間中、上記トランジスタ をスイッチオフする信号に結合し、上記回路が上記出力ラインから絶縁されてい る、請求項2記載の回路。 5 選択的に上記光検出器を上記浮遊拡散ノードに結合する為の 第三トランジスタを更に備える、請求項4記載の回路。 6 上記第二トランジスタのゲート端子は、上記光検出器内に蓄えられた 電荷が読まれていない期間中、ハイに切り替える位相リセット信号に結合され、 上記トランジスタ及び上記第二トランジスタのドレイン端子は、上記光検出器内 に蓄えられた電荷が読まれていない期間中、ローに切り替える列電圧信号に結合 される、請求項4記載の回路。 7 上記回路は、APSイメージ形成器のAPS回路のアレイの一つである、請 求項1記載の回路。 8 上記回路が、APSイメージ形成器のAPS回路のアレイの一つである場合 であって、上記アレイの各APS回路が、上記回路の上記トランジスタと同一に構 成されたソースフォロワー型トランジスタを備え、上記回路と上記アレイの同一 コラム内の各APS回路が、それそれのソースフォロワー型トランジスタのソース 端子で上記出力ラインに結合されている、請求項2記載の回路。 9 ソース端子で上記トランジスタのゲート端子に結合された第二トラン ジスタを更に備え、上記第二トランジスタは、上記回路の上記列以外のアレイの どんな列が読まれている期間中でも、上記トランジスタのスイッチを切る信号に 上記トランジスタのゲート端子を結合する、請求項8記載の回路。 10 上記光検出器は、バーチャルゲート埋め込み型nチャンネル光検出 器である、請求項1記載の回路。 11 浮遊拡散ノードに結合された(1)光検出器と、制御端子で上記浮 遊拡散ノードに結合され出力端子で直接的に出力ラインに結合 された(2)能動素子とを備えるAPS回路において、 (a)上記光検出器に蓄えられた電荷が読まれていない期間中に能動素子のスイ ッチを切り、それにより、上記回路が上記出力ラインから絶縁される上記能動素 子の制御端子に信号を印加するステップ(a)を有する方法。 12 上記能動素子が電解効果型トランジスタであり、上記トランジスタ の制御端子がゲート端子であり、上記トランジスタの出力端子がソース端子であ る場合、 上記光検出器内に蓄えられた電荷が読まれている期間中、上記光検出器は上記 光検出器により感知された光に応じて上記浮遊拡散ノードで電圧を発生させる場 合には、ドレイン供給電圧を上記トランジスタのドレイン端子に印加し、電流ソ ースを上記出力ラインに印加し、上記トランジスタがソースフォロワーモードに おいて動作して、上記浮遊拡散ノードの大きさに関連した大きさを有する出力ラ インで出力電圧を供給するように上記トランジスタのスイッチを入れる上記トラ ンジスタのケート端子に信号を印加するステップ(b)を更に有する、請求項1 1記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/867,577 US5920345A (en) | 1997-06-02 | 1997-06-02 | CMOS image sensor with improved fill factor |
US08/867,577 | 1997-06-02 | ||
PCT/US1998/011209 WO1998054890A1 (en) | 1997-06-02 | 1998-06-01 | Cmos image sensor with improved fill factor |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2002507340A true JP2002507340A (ja) | 2002-03-05 |
Family
ID=25350064
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP50101199A Ceased JP2002507340A (ja) | 1997-06-02 | 1998-06-01 | 改善された充填比を有するcmos画像センサ |
Country Status (6)
Country | Link |
---|---|
US (1) | US5920345A (ja) |
EP (1) | EP0986898B1 (ja) |
JP (1) | JP2002507340A (ja) |
KR (1) | KR100555609B1 (ja) |
DE (1) | DE69831071T2 (ja) |
WO (1) | WO1998054890A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002330351A (ja) * | 2001-04-27 | 2002-11-15 | Mitsubishi Electric Corp | 固体撮像素子 |
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US6320616B1 (en) * | 1997-06-02 | 2001-11-20 | Sarnoff Corporation | CMOS image sensor with reduced fixed pattern noise |
EP1711002A3 (en) * | 1997-08-15 | 2011-06-08 | Sony Corporation | Solid-state image sensor and method of driving same |
US6697108B1 (en) | 1997-12-31 | 2004-02-24 | Texas Instruments Incorporated | Fast frame readout architecture for array sensors with integrated correlated double sampling system |
DE69824381T2 (de) * | 1997-12-31 | 2005-06-16 | Texas Instruments Inc., Dallas | Matrixsensoren |
US6667768B1 (en) * | 1998-02-17 | 2003-12-23 | Micron Technology, Inc. | Photodiode-type pixel for global electronic shutter and reduced lag |
US6801258B1 (en) | 1998-03-16 | 2004-10-05 | California Institute Of Technology | CMOS integration sensor with fully differential column readout circuit for light adaptive imaging |
EP1086578A4 (en) * | 1998-03-16 | 2001-09-26 | California Inst Of Techn | CMOS INTEGRATION SENSOR WITH FULL DIFFERENTIAL COLUMN READING CIRCUIT FOR IMAGING BRIGHTNESS ADAPTIVES |
US6040570A (en) * | 1998-05-29 | 2000-03-21 | Sarnoff Corporation | Extended dynamic range image sensor system |
KR100279295B1 (ko) * | 1998-06-02 | 2001-02-01 | 윤종용 | 액티브 픽셀 센서 |
JP4200545B2 (ja) * | 1998-06-08 | 2008-12-24 | ソニー株式会社 | 固体撮像素子およびその駆動方法、並びにカメラシステム |
US6844897B1 (en) * | 1999-06-15 | 2005-01-18 | Micron Technology, Inc. | Active pixel sensor (APS) readout structure with amplification |
FR2795586B1 (fr) * | 1999-06-23 | 2002-09-13 | Ecole Nale Sup Artes Metiers | Dispositif electronique de lecture de pixels notamment pour capteur d'images matriciel a pixels actifs cmos |
US6975355B1 (en) | 2000-02-22 | 2005-12-13 | Pixim, Inc. | Multiple sampling via a time-indexed method to achieve wide dynamic ranges |
US6965408B2 (en) * | 2000-02-28 | 2005-11-15 | Canon Kabushiki Kaisha | Solid-state image pickup device having a photoelectric conversion unit and a punch-through current suppression circuit |
ATE272208T1 (de) * | 2000-03-13 | 2004-08-15 | Suisse Electronique Microtech | Bildgebendes pyrometer |
US7274396B2 (en) * | 2000-05-16 | 2007-09-25 | Micron Technology, Inc. | Image sensors with isolated flushed pixel reset |
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JP2003032709A (ja) * | 2001-07-12 | 2003-01-31 | Mitsubishi Electric Corp | 半導体撮像装置 |
EP1522158A4 (en) * | 2001-08-24 | 2006-03-29 | Dialog Semiconductor Gmbh | TOTALLY INTEGRATED SEMICONDUCTOR IMAGER AND CAMERA CIRCUITS |
US20030049925A1 (en) * | 2001-09-10 | 2003-03-13 | Layman Paul Arthur | High-density inter-die interconnect structure |
US20030076981A1 (en) * | 2001-10-18 | 2003-04-24 | Smith Gregory Hugh | Method for operating a pre-crash sensing system in a vehicle having a counter-measure system |
US6775605B2 (en) | 2001-11-29 | 2004-08-10 | Ford Global Technologies, Llc | Remote sensing based pre-crash threat assessment system |
US6819991B2 (en) * | 2001-11-29 | 2004-11-16 | Ford Global Technologies, Llc | Vehicle sensing based pre-crash threat assessment system |
US7158870B2 (en) * | 2002-01-24 | 2007-01-02 | Ford Global Technologies, Llc | Post collision restraints control module |
US6831572B2 (en) | 2002-01-29 | 2004-12-14 | Ford Global Technologies, Llc | Rear collision warning system |
US6721659B2 (en) | 2002-02-01 | 2004-04-13 | Ford Global Technologies, Llc | Collision warning and safety countermeasure system |
US6519519B1 (en) | 2002-02-01 | 2003-02-11 | Ford Global Technologies, Inc. | Passive countermeasure methods |
US6498972B1 (en) | 2002-02-13 | 2002-12-24 | Ford Global Technologies, Inc. | Method for operating a pre-crash sensing system in a vehicle having a countermeasure system |
US7009500B2 (en) | 2002-02-13 | 2006-03-07 | Ford Global Technologies, Llc | Method for operating a pre-crash sensing system in a vehicle having a countermeasure system using stereo cameras |
US6861634B2 (en) * | 2002-08-13 | 2005-03-01 | Micron Technology, Inc. | CMOS active pixel sensor with a sample and hold circuit having multiple injection capacitors and a fully differential charge mode linear synthesizer with skew control |
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US7738026B2 (en) * | 2005-05-02 | 2010-06-15 | Andrew G. Cartlidge | Increasing fill-factor on pixelated sensors |
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US7214920B2 (en) | 2005-05-06 | 2007-05-08 | Micron Technology, Inc. | Pixel with spatially varying metal route positions |
US7432491B2 (en) * | 2005-05-06 | 2008-10-07 | Micron Technology, Inc. | Pixel with spatially varying sensor positions |
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KR100691372B1 (ko) * | 2005-10-19 | 2007-03-12 | 삼성전기주식회사 | 신뢰성이 확보된 전해액을 포함하는 전기 습윤 장치 |
US7732748B2 (en) * | 2006-08-31 | 2010-06-08 | Aptina Imaging Corporation | Active pixel image sensor with reduced readout delay |
US8013920B2 (en) | 2006-12-01 | 2011-09-06 | Youliza, Gehts B.V. Limited Liability Company | Imaging system for creating an image of an object |
KR101633282B1 (ko) | 2009-09-09 | 2016-06-24 | 삼성전자주식회사 | 이미지 센서와 상기 이미지 센서를 포함하는 이미지 픽업 장치 |
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US5742047A (en) * | 1996-10-01 | 1998-04-21 | Xerox Corporation | Highly uniform five volt CMOS image photodiode sensor array with improved contrast ratio and dynamic range |
-
1997
- 1997-06-02 US US08/867,577 patent/US5920345A/en not_active Expired - Lifetime
-
1998
- 1998-06-01 DE DE69831071T patent/DE69831071T2/de not_active Expired - Fee Related
- 1998-06-01 KR KR1019997011301A patent/KR100555609B1/ko not_active IP Right Cessation
- 1998-06-01 WO PCT/US1998/011209 patent/WO1998054890A1/en active IP Right Grant
- 1998-06-01 EP EP98926174A patent/EP0986898B1/en not_active Expired - Lifetime
- 1998-06-01 JP JP50101199A patent/JP2002507340A/ja not_active Ceased
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002330351A (ja) * | 2001-04-27 | 2002-11-15 | Mitsubishi Electric Corp | 固体撮像素子 |
Also Published As
Publication number | Publication date |
---|---|
US5920345A (en) | 1999-07-06 |
EP0986898A4 (en) | 2003-03-26 |
EP0986898A1 (en) | 2000-03-22 |
KR100555609B1 (ko) | 2006-03-03 |
DE69831071T2 (de) | 2006-06-01 |
EP0986898B1 (en) | 2005-08-03 |
WO1998054890A1 (en) | 1998-12-03 |
DE69831071D1 (de) | 2005-09-08 |
KR20010013306A (ko) | 2001-02-26 |
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