JP2000171493A - 電流測定方法及び電流測定装置 - Google Patents

電流測定方法及び電流測定装置

Info

Publication number
JP2000171493A
JP2000171493A JP10343427A JP34342798A JP2000171493A JP 2000171493 A JP2000171493 A JP 2000171493A JP 10343427 A JP10343427 A JP 10343427A JP 34342798 A JP34342798 A JP 34342798A JP 2000171493 A JP2000171493 A JP 2000171493A
Authority
JP
Japan
Prior art keywords
current
capacitor
terminal
predetermined
potential
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP10343427A
Other languages
English (en)
Japanese (ja)
Inventor
Yoshihiro Hashimoto
好弘 橋本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP10343427A priority Critical patent/JP2000171493A/ja
Priority to KR1019990054466A priority patent/KR100334398B1/ko
Priority to TW088120961A priority patent/TW434873B/zh
Publication of JP2000171493A publication Critical patent/JP2000171493A/ja
Priority to US09/905,026 priority patent/US6492831B2/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
JP10343427A 1998-12-02 1998-12-02 電流測定方法及び電流測定装置 Withdrawn JP2000171493A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP10343427A JP2000171493A (ja) 1998-12-02 1998-12-02 電流測定方法及び電流測定装置
KR1019990054466A KR100334398B1 (ko) 1998-12-02 1999-12-02 전류 측정 방법 및 전류 측정 장치
TW088120961A TW434873B (en) 1998-12-02 1999-12-16 Current measurement method and current measurement device
US09/905,026 US6492831B2 (en) 1998-12-02 2001-07-13 Current measuring method and current measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10343427A JP2000171493A (ja) 1998-12-02 1998-12-02 電流測定方法及び電流測定装置

Publications (1)

Publication Number Publication Date
JP2000171493A true JP2000171493A (ja) 2000-06-23

Family

ID=18361439

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10343427A Withdrawn JP2000171493A (ja) 1998-12-02 1998-12-02 電流測定方法及び電流測定装置

Country Status (3)

Country Link
JP (1) JP2000171493A (ko)
KR (1) KR100334398B1 (ko)
TW (1) TW434873B (ko)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005516226A (ja) * 2002-01-30 2005-06-02 フォームファクター，インコーポレイテッド 被テスト集積回路用の予測適応電源
WO2007049331A1 (ja) * 2005-10-25 2007-05-03 Renesas Technology Corp. 接続装置、ｉｄｄｑテスト方法及び半導体集積回路
JP2007172766A (ja) * 2005-12-22 2007-07-05 Matsushita Electric Ind Co Ltd 半導体リーク電流検出器とリーク電流測定方法および電圧トリミング機能付半導体リーク電流検出器とリファレンス電圧トリミング方法およびこれらの半導体集積回路
JP2007523518A (ja) * 2003-12-10 2007-08-16 クウォリタウ・インコーポレーテッド 充電昇圧器を伴うパルス電流源回路
KR20180128708A (ko) * 2017-05-24 2018-12-04 포스필 주식회사 충방전 수단을 구비한 전류 계측 장치 및 이를 이용하는 전류 계측 방법
CN109799451A (zh) * 2019-04-16 2019-05-24 长沙丰灼通讯科技有限公司 一种生产线上的电流测试装置

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7714603B2 (en) 2000-01-18 2010-05-11 Formfactor, Inc. Predictive, adaptive power supply for an integrated circuit under test
JP2005516226A (ja) * 2002-01-30 2005-06-02 フォームファクター，インコーポレイテッド 被テスト集積回路用の予測適応電源
JP2007523518A (ja) * 2003-12-10 2007-08-16 クウォリタウ・インコーポレーテッド 充電昇圧器を伴うパルス電流源回路
WO2007049331A1 (ja) * 2005-10-25 2007-05-03 Renesas Technology Corp. 接続装置、ｉｄｄｑテスト方法及び半導体集積回路
JP2007172766A (ja) * 2005-12-22 2007-07-05 Matsushita Electric Ind Co Ltd 半導体リーク電流検出器とリーク電流測定方法および電圧トリミング機能付半導体リーク電流検出器とリファレンス電圧トリミング方法およびこれらの半導体集積回路
KR20180128708A (ko) * 2017-05-24 2018-12-04 포스필 주식회사 충방전 수단을 구비한 전류 계측 장치 및 이를 이용하는 전류 계측 방법
KR101970273B1 (ko) 2017-05-24 2019-04-18 포스필 주식회사 충방전 수단을 구비한 전류 계측 장치 및 이를 이용하는 전류 계측 방법
CN109799451A (zh) * 2019-04-16 2019-05-24 长沙丰灼通讯科技有限公司 一种生产线上的电流测试装置
CN109799451B (zh) * 2019-04-16 2019-07-12 长沙丰灼通讯科技有限公司 一种生产线上的电流测试装置

Also Published As

Publication number Publication date
KR20000047865A (ko) 2000-07-25
TW434873B (en) 2001-05-16
KR100334398B1 (ko) 2002-05-03

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Legal Events

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A300 Application deemed to be withdrawn because no request for examination was validly filed

Free format text: JAPANESE INTERMEDIATE CODE: A300

Effective date: 20060207