IT1400576B1 - Circuito integrato con dispositivo per la variazione del valore di un parametro operativo di un circuito elettronico e con lo stesso circuito elettronico. - Google Patents

Circuito integrato con dispositivo per la variazione del valore di un parametro operativo di un circuito elettronico e con lo stesso circuito elettronico.

Info

Publication number
IT1400576B1
IT1400576B1 ITMI2010A001092A ITMI20101092A IT1400576B1 IT 1400576 B1 IT1400576 B1 IT 1400576B1 IT MI2010A001092 A ITMI2010A001092 A IT MI2010A001092A IT MI20101092 A ITMI20101092 A IT MI20101092A IT 1400576 B1 IT1400576 B1 IT 1400576B1
Authority
IT
Italy
Prior art keywords
electronic circuit
change
value
operating parameter
circuit
Prior art date
Application number
ITMI2010A001092A
Other languages
English (en)
Inventor
Serge Pontarollo
Mario Ricca
Jean Camiolo
Michele Vaiana
Giuseppe Bruno
Original Assignee
St Microelectronics Grenoble 2
St Microelectronics Srl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by St Microelectronics Grenoble 2, St Microelectronics Srl filed Critical St Microelectronics Grenoble 2
Priority to ITMI2010A001092A priority Critical patent/IT1400576B1/it
Priority to US13/162,452 priority patent/US20120007663A1/en
Publication of ITMI20101092A1 publication Critical patent/ITMI20101092A1/it
Application granted granted Critical
Publication of IT1400576B1 publication Critical patent/IT1400576B1/it

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current
    • G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/462—Regulating voltage or current wherein the variable actually regulated by the final control device is dc as a function of the requirements of the load, e.g. delay, temperature, specific voltage/current characteristic
    • G05F1/465—Internal voltage generators for integrated circuits, e.g. step down generators

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Semiconductor Integrated Circuits (AREA)
ITMI2010A001092A 2010-06-17 2010-06-17 Circuito integrato con dispositivo per la variazione del valore di un parametro operativo di un circuito elettronico e con lo stesso circuito elettronico. IT1400576B1 (it)

Priority Applications (2)

Application Number Priority Date Filing Date Title
ITMI2010A001092A IT1400576B1 (it) 2010-06-17 2010-06-17 Circuito integrato con dispositivo per la variazione del valore di un parametro operativo di un circuito elettronico e con lo stesso circuito elettronico.
US13/162,452 US20120007663A1 (en) 2010-06-17 2011-06-16 Integrated circuit with device for adjustment of the operating parameter value of an electronic circuit and with the same electronic circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ITMI2010A001092A IT1400576B1 (it) 2010-06-17 2010-06-17 Circuito integrato con dispositivo per la variazione del valore di un parametro operativo di un circuito elettronico e con lo stesso circuito elettronico.

Publications (2)

Publication Number Publication Date
ITMI20101092A1 ITMI20101092A1 (it) 2011-12-18
IT1400576B1 true IT1400576B1 (it) 2013-06-14

Family

ID=42830462

Family Applications (1)

Application Number Title Priority Date Filing Date
ITMI2010A001092A IT1400576B1 (it) 2010-06-17 2010-06-17 Circuito integrato con dispositivo per la variazione del valore di un parametro operativo di un circuito elettronico e con lo stesso circuito elettronico.

Country Status (2)

Country Link
US (1) US20120007663A1 (it)
IT (1) IT1400576B1 (it)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101160681B1 (ko) 2011-10-19 2012-06-28 배경덕 이동 통신 단말기의 활성화 시에 특정 동작이 수행되도록 하기 위한 방법, 이동 통신 단말기 및 컴퓨터 판독 가능 기록 매체
US10120430B2 (en) * 2016-09-07 2018-11-06 Advanced Micro Devices, Inc. Dynamic reliability quality monitoring
US10318363B2 (en) 2016-10-28 2019-06-11 Advanced Micro Devices, Inc. System and method for energy reduction based on history of reliability of a system

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2851767B2 (ja) * 1992-10-15 1999-01-27 三菱電機株式会社 電圧供給回路および内部降圧回路
US5576656A (en) * 1994-12-20 1996-11-19 Sgs-Thomson Microelectronics, Inc. Voltage regulator for an output driver with reduced output impedance
JPH11232869A (ja) * 1998-02-16 1999-08-27 Mitsubishi Electric Corp 半導体回路装置
KR100308186B1 (ko) * 1998-09-02 2001-11-30 윤종용 반도체집적회로장치의기준전압발생회로
JP4767386B2 (ja) * 2000-02-28 2011-09-07 富士通セミコンダクター株式会社 内部電圧発生回路
JP4743938B2 (ja) * 2000-06-12 2011-08-10 ルネサスエレクトロニクス株式会社 半導体集積回路装置
FR2842917B1 (fr) * 2002-07-29 2005-02-11 St Microelectronics Sa Dispositif et procede d'ajustement d'un parametre de fonctionnement d'un circuit electronique analogique
JP2004146783A (ja) * 2002-08-28 2004-05-20 Fujitsu Ltd 半導体集積回路装置、および半導体集積回路装置の調整方法
US6703885B1 (en) * 2002-09-18 2004-03-09 Richtek Technology Corp. Trimmer method and device for circuits
US7248102B2 (en) * 2005-01-20 2007-07-24 Infineon Technologies Ag Internal reference voltage generation for integrated circuit testing
US7200066B2 (en) * 2005-07-18 2007-04-03 Dialog Semiconductor Manufacturing Ltd. Accurate power supply system for flash-memory including on-chip supply voltage regulator, reference voltage generation, power-on reset, and supply voltage monitor
TW200727588A (en) * 2006-01-11 2007-07-16 Richtek Techohnology Corp Voltage-supply apparatus and control method thereof
US20070290704A1 (en) * 2006-06-16 2007-12-20 Blessed Electronics Sdn. Bhd. (712261-V) Method and circuit for adjusting characteristics of packaged device without requiring dedicated pads/pins
JP4498400B2 (ja) * 2007-09-14 2010-07-07 Ｏｋｉセミコンダクタ株式会社 トリミング回路
US7863876B2 (en) * 2008-03-26 2011-01-04 Freescale Semiconductor, Inc. Built-in self-calibration (BISC) technique for regulation circuits used in non-volatile memory
JP5607963B2 (ja) * 2010-03-19 2014-10-15 スパンション エルエルシー 基準電圧回路および半導体集積回路

Also Published As

Publication number Publication date
ITMI20101092A1 (it) 2011-12-18
US20120007663A1 (en) 2012-01-12

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