IT1134111B - Circuito di prova dotato di dispositivi mos - Google Patents

Circuito di prova dotato di dispositivi mos

Info

Publication number
IT1134111B
IT1134111B IT25670/80A IT2567080A IT1134111B IT 1134111 B IT1134111 B IT 1134111B IT 25670/80 A IT25670/80 A IT 25670/80A IT 2567080 A IT2567080 A IT 2567080A IT 1134111 B IT1134111 B IT 1134111B
Authority
IT
Italy
Prior art keywords
test circuit
mos devices
circuit equipped
mos
devices
Prior art date
Application number
IT25670/80A
Other languages
English (en)
Other versions
IT8025670A0 (it
Inventor
Peter Draheim
Friedrich Hapke
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Publication of IT8025670A0 publication Critical patent/IT8025670A0/it
Application granted granted Critical
Publication of IT1134111B publication Critical patent/IT1134111B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
IT25670/80A 1979-11-02 1980-10-30 Circuito di prova dotato di dispositivi mos IT1134111B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2944149A DE2944149C2 (de) 1979-11-02 1979-11-02 Integrierte Schaltungsanordnung in MOS-Technik

Publications (2)

Publication Number Publication Date
IT8025670A0 IT8025670A0 (it) 1980-10-30
IT1134111B true IT1134111B (it) 1986-07-24

Family

ID=6084909

Family Applications (1)

Application Number Title Priority Date Filing Date
IT25670/80A IT1134111B (it) 1979-11-02 1980-10-30 Circuito di prova dotato di dispositivi mos

Country Status (6)

Country Link
US (1) US4398146A (it)
JP (1) JPS5674667A (it)
DE (1) DE2944149C2 (it)
FR (1) FR2468919A1 (it)
GB (1) GB2062879B (it)
IT (1) IT1134111B (it)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4612499A (en) * 1983-11-07 1986-09-16 Texas Instruments Incorporated Test input demultiplexing circuit
JPS61265829A (ja) * 1985-05-20 1986-11-25 Fujitsu Ltd 半導体集積回路
FR2594553B1 (fr) * 1985-10-16 1989-02-03 Bendix Electronics Sa Interface de test pour circuit integre en technologie mos
JPS62144532A (ja) * 1985-12-17 1987-06-27 三菱電機株式会社 グル−プ・ケ−ブルの延焼防止法
US4733168A (en) * 1986-03-21 1988-03-22 Harris Corporation Test enabling circuit for enabling overhead test circuitry in programmable devices
US4970454A (en) * 1986-12-09 1990-11-13 Texas Instruments Incorporated Packaged semiconductor device with test circuits for determining fabrication parameters
DE3840225A1 (de) * 1988-11-29 1990-05-31 Siemens Ag Teststruktur und verfahren zur dynamischen belastungsmessung von in einer integrierten schaltung enthaltenen transistoren
KR910006241B1 (ko) * 1988-12-14 1991-08-17 삼성전자 주식회사 복수 테스트모드 선택회로
US5019772A (en) * 1989-05-23 1991-05-28 International Business Machines Corporation Test selection techniques
US5636226A (en) * 1989-12-14 1997-06-03 Texas Instruments Incorporated Fault sensing circuit and method
US5030904A (en) * 1990-02-13 1991-07-09 Hewlett-Packard Company Diagnostic system for integrated circuits using existing pads
US5126659A (en) * 1990-07-13 1992-06-30 Motorola, Inc. Enablement of a test mode in an electronic module with limited pin-outs
JPH0743399B2 (ja) * 1990-08-15 1995-05-15 富士通株式会社 半導体回路
US5161159A (en) * 1990-08-17 1992-11-03 Sgs-Thomson Microelectronics, Inc. Semiconductor memory with multiple clocking for test mode entry
DE69120483T2 (de) * 1990-08-17 1996-11-14 Sgs Thomson Microelectronics Halbleiter-Speicher mit unterdrücktem Testmodus-Eingang während des Strom-Einschaltens
JP3381929B2 (ja) * 1990-12-27 2003-03-04 株式会社東芝 半導体装置
US5432440A (en) * 1991-11-25 1995-07-11 At&T Global Information Solutions Company Detection of tri-state logic signals
US5294883A (en) * 1992-08-04 1994-03-15 International Business Machines Corporation Test detector/shutoff and method for BiCMOS integrated circuit
KR0132756B1 (ko) * 1993-03-15 1998-04-16 원본미기재 이씨엘(ecl) 회로의 번인 방법 및 장치
US5982188A (en) * 1994-07-29 1999-11-09 Stmicroelectronics, Inc. Test mode control circuit of an integrated circuit device
US5627478A (en) * 1995-07-06 1997-05-06 Micron Technology, Inc. Apparatus for disabling and re-enabling access to IC test functions
US5712575A (en) * 1995-12-18 1998-01-27 Micron Technology, Inc. Super-voltage circuit with a fast reset
US5796266A (en) * 1996-03-18 1998-08-18 Micron Technology, Inc. Circuit and a method for configuring pad connections in an integrated device
EP0801401B1 (en) * 1996-04-02 2003-08-27 STMicroelectronics, Inc. Testing and repair of embedded memory
US5900739A (en) * 1996-09-24 1999-05-04 Advanced Micro Devices Inc. Method and apparatus for entering a test mode of an externally non-programmable device
US5944845A (en) 1997-06-26 1999-08-31 Micron Technology, Inc. Circuit and method to prevent inadvertent test mode entry
KR100311117B1 (ko) * 1998-06-29 2001-12-17 박종섭 반도체메모리소자의옵션기능테스트장치

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3772595A (en) * 1971-03-19 1973-11-13 Teradyne Inc Method and apparatus for testing a digital logic fet by monitoring currents the device develops in response to input signals
US3789205A (en) * 1972-09-28 1974-01-29 Ibm Method of testing mosfet planar boards
US4051352A (en) * 1976-06-30 1977-09-27 International Business Machines Corporation Level sensitive embedded array logic system
JPS5918742B2 (ja) * 1977-02-22 1984-04-28 シャープ株式会社 大規模集積回路
NL7704005A (nl) * 1977-04-13 1977-06-30 Philips Nv Geintegreerde schakeling.
DE2905271A1 (de) * 1979-02-12 1980-08-21 Philips Patentverwaltung Integrierte schaltungsanordnung in mos-technik mit feldeffekttransistoren
DE2905294A1 (de) * 1979-02-12 1980-08-21 Philips Patentverwaltung Integrierte schaltungsanordnung in mos-technik mit feldeffekttransistoren
DE2944148A1 (de) * 1979-11-02 1981-05-14 Philips Patentverwaltung Gmbh, 2000 Hamburg Integrierte schaltungsanordnung in mos-technik

Also Published As

Publication number Publication date
DE2944149A1 (de) 1981-05-14
IT8025670A0 (it) 1980-10-30
US4398146A (en) 1983-08-09
GB2062879A (en) 1981-05-28
GB2062879B (en) 1983-08-10
JPS5674667A (en) 1981-06-20
FR2468919A1 (fr) 1981-05-08
JPH0122909B2 (it) 1989-04-28
FR2468919B1 (it) 1983-11-18
DE2944149C2 (de) 1985-02-21

Similar Documents

Publication Publication Date Title
IT1134111B (it) Circuito di prova dotato di dispositivi mos
IT1080619B (it) Complesso di circuito integrato
IT1100803B (it) Struttura di circuito integrato
IT1088174B (it) Circuito integrato
IT1159142B (it) Circuito integrato perfezionato
IT1132865B (it) Circuito rivelatore di transizioni
IT8321651A0 (it) Circuito di prova di dispositivo ad effetto hall.
ES494024A0 (es) Un dispositivo transistor mejorado
FI800429A (fi) Kopplingsanordning
DK92080A (da) Moentdetekterende anordning
AR215918A1 (es) Circuito integrado
IT1110167B (it) Circuito integrato semiconduttore
DE3022122A1 (de) Halbleitervorrichtung
IT1131452B (it) Circuito di linea
ES489731A0 (es) Un dispositivo termostatico electronico
ES493345A0 (es) Un dispositivo conmutador inercial
ES496060A0 (es) Pastilla de circuito integrado
SE7901535L (sv) Halvledaranordning
ES493400A0 (es) Perfeccionamientos en dispositivos de circuito optico
BR8004593A (pt) Disjuntor de circuito
SE8001042L (sv) Halvledaranordning
IT1082372B (it) Circuito integrato
IT8068359A0 (it) Circuito di sintonia
IT1100271B (it) Circuito integrato
FI800728A (fi) Kopplingsanordning