ES496060A0 - Pastilla de circuito integrado - Google Patents

Pastilla de circuito integrado

Info

Publication number
ES496060A0
ES496060A0 ES496060A ES496060A ES496060A0 ES 496060 A0 ES496060 A0 ES 496060A0 ES 496060 A ES496060 A ES 496060A ES 496060 A ES496060 A ES 496060A ES 496060 A0 ES496060 A0 ES 496060A0
Authority
ES
Spain
Prior art keywords
integrated circuit
circuit pad
pad
integrated
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
ES496060A
Other languages
English (en)
Other versions
ES8202454A1 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sperry Corp
Original Assignee
Sperry Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sperry Corp filed Critical Sperry Corp
Publication of ES496060A0 publication Critical patent/ES496060A0/es
Publication of ES8202454A1 publication Critical patent/ES8202454A1/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Hardware Redundancy (AREA)
  • Tests Of Electronic Circuits (AREA)
ES496060A 1979-10-18 1980-10-17 Pastilla de circuito integrado Expired ES8202454A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US8637579A 1979-10-18 1979-10-18

Publications (2)

Publication Number Publication Date
ES496060A0 true ES496060A0 (es) 1982-01-16
ES8202454A1 ES8202454A1 (es) 1982-01-16

Family

ID=22198158

Family Applications (1)

Application Number Title Priority Date Filing Date
ES496060A Expired ES8202454A1 (es) 1979-10-18 1980-10-17 Pastilla de circuito integrado

Country Status (4)

Country Link
EP (1) EP0028091B1 (es)
JP (1) JPS5665254A (es)
DE (1) DE3063168D1 (es)
ES (1) ES8202454A1 (es)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5864557A (ja) * 1981-10-13 1983-04-16 Mitsubishi Electric Corp 電子計算機の故障点検指示方式
US6551844B1 (en) 1997-01-15 2003-04-22 Formfactor, Inc. Test assembly including a test die for testing a semiconductor product die
US6429029B1 (en) 1997-01-15 2002-08-06 Formfactor, Inc. Concurrent design and subsequent partitioning of product and test die
WO2000039848A2 (en) * 1998-12-31 2000-07-06 Formfactor, Inc. Test method and assembly including a test die for testing a semiconductor product die
WO2009056160A1 (en) 2007-11-03 2009-05-07 Robert Bosch Gbmh Method and system for detecting a failure in an error correcting unit
CN110471807A (zh) * 2019-07-25 2019-11-19 广州朗国电子科技有限公司 硬件故障检测方法、***、存储介质及一体机设备
CN112751688B (zh) * 2019-10-30 2023-08-01 中兴通讯股份有限公司 一种otn设备的流控处理方法、电子设备及存储介质
CN117589798B (zh) * 2024-01-19 2024-07-02 中诚华隆计算机技术有限公司 一种芯片故障检测方法、装置及电子设备

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3466544A (en) * 1965-10-18 1969-09-09 Boeing Co Integrated circuits having integrated test transformation networks incorporated therewith on common substrate chips
US3790885A (en) * 1972-03-27 1974-02-05 Ibm Serial test patterns for mosfet testing
US3961254A (en) * 1974-12-20 1976-06-01 International Business Machines Corporation Testing embedded arrays
US4096989A (en) * 1977-06-20 1978-06-27 The Bendix Corporation Monitoring apparatus for redundant control systems
GB2006522B (en) * 1977-10-03 1982-01-27 Secretary Industry Brit Wafers having microelectronic circuit chips thereon
US4233682A (en) * 1978-06-15 1980-11-11 Sperry Corporation Fault detection and isolation system

Also Published As

Publication number Publication date
DE3063168D1 (en) 1983-06-16
EP0028091A1 (en) 1981-05-06
ES8202454A1 (es) 1982-01-16
JPS615172B2 (es) 1986-02-17
EP0028091B1 (en) 1983-05-11
JPS5665254A (en) 1981-06-02

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Legal Events

Date Code Title Description
FD1A Patent lapsed

Effective date: 19990601