GB1350049A - Device and method for the display of local disorientations in single crystals - Google Patents

Device and method for the display of local disorientations in single crystals

Info

Publication number
GB1350049A
GB1350049A GB433872A GB433872A GB1350049A GB 1350049 A GB1350049 A GB 1350049A GB 433872 A GB433872 A GB 433872A GB 433872 A GB433872 A GB 433872A GB 1350049 A GB1350049 A GB 1350049A
Authority
GB
United Kingdom
Prior art keywords
crystal
defects
slit
film
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB433872A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Publication of GB1350049A publication Critical patent/GB1350049A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/309—Accessories, mechanical or electrical features support of sample holder
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/316—Accessories, mechanical or electrical features collimators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/32—Accessories, mechanical or electrical features adjustments of elements during operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3306—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object rotates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3308—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object translates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/415—Imaging radiographic film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/604—Specific applications or type of materials monocrystal

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GB433872A 1971-02-03 1972-01-31 Device and method for the display of local disorientations in single crystals Expired GB1350049A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7103560A FR2123855A5 (de) 1971-02-03 1971-02-03

Publications (1)

Publication Number Publication Date
GB1350049A true GB1350049A (en) 1974-04-18

Family

ID=9071311

Family Applications (1)

Application Number Title Priority Date Filing Date
GB433872A Expired GB1350049A (en) 1971-02-03 1972-01-31 Device and method for the display of local disorientations in single crystals

Country Status (4)

Country Link
CH (1) CH565369A5 (de)
DE (1) DE2204678C3 (de)
FR (1) FR2123855A5 (de)
GB (1) GB1350049A (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107015267A (zh) * 2017-06-09 2017-08-04 河北格物仪器设备有限公司 探测器增益校正***及方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2107560A (en) * 1981-10-07 1983-04-27 Rolls Royce A method for determining the orientation of a crystal
DE3439471A1 (de) * 1984-10-27 1986-04-30 MTU Motoren- und Turbinen-Union München GmbH, 8000 München Verfahren und vorrichtung zum pruefen einkristalliner gegenstaende

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107015267A (zh) * 2017-06-09 2017-08-04 河北格物仪器设备有限公司 探测器增益校正***及方法
CN107015267B (zh) * 2017-06-09 2018-10-09 河北格物仪器设备有限公司 探测器增益校正***及方法

Also Published As

Publication number Publication date
DE2204678B2 (de) 1974-12-12
FR2123855A5 (de) 1972-09-15
DE2204678C3 (de) 1975-07-24
DE2204678A1 (de) 1972-08-17
CH565369A5 (de) 1975-08-15

Similar Documents

Publication Publication Date Title
US3868506A (en) X-ray diffraction instrument
GB1352727A (en) Method and device for detecting surface defects of a substan tially smooth material
Schwuttke Direct observation of imperfections in semiconductor crystals by anomalous transmission of X rays
DE2933047C2 (de) Verfahren und Vorrichtung der Röntgendiffraktion
US4084094A (en) Radiographic apparatus
GB1350049A (en) Device and method for the display of local disorientations in single crystals
US3728541A (en) X-ray diffractometer
Ito et al. Dynamic X‐Ray Diffractometer for Measuring Rheo‐Optical Behavior of Crystals in Polymer Solids
Black X-ray Topography
Robert et al. Quantitative lattice parameter mapping in Sr (NO3) 2 and Ba (NO3) 2 crystals
EP0040700B1 (de) Verfahren und Einrichtung zur Prüfung optischer Abbildungssysteme
Bonse et al. X-ray diffraction topography
Schlenker et al. Neutron‐diffraction section topography: Observing crystal slices before cutting them
GB1361736A (en) Device for analysing a substance by atomic absorption with back ground correction
GB1246410A (en) Improvements in methods and apparatus for the topography of crystals
US3855469A (en) Device for the display of local disorientations in single crystals
Herres et al. X-ray topography of natural beryl using synchrotron and conventional sources
US3816747A (en) Method and apparatus for measuring lattice parameter
US3411001A (en) Apparatus and process for eliminating preferred orientation in x-ray diffraction in crystals
US3504178A (en) Method for determining crystall-ographic orientation
SU1257482A1 (ru) Рентгенодифракционный способ исследовани структурных нарушений в тонких приповерхностных сло х кристаллов
DE1764503A1 (de) Tomografisches Gammastrahlen-Abtastgeraet
Gorton The X-ray spectrum of tungsten
SU522458A1 (ru) Рентгеновский трехкристальный спектрометр
SU1004833A1 (ru) Способ рентгеновской топографии монокристаллов

Legal Events

Date Code Title Description
PS Patent sealed
PLNP Patent lapsed through nonpayment of renewal fees