GB1350049A - Device and method for the display of local disorientations in single crystals - Google Patents

Device and method for the display of local disorientations in single crystals

Info

Publication number
GB1350049A
GB1350049A GB433872A GB433872A GB1350049A GB 1350049 A GB1350049 A GB 1350049A GB 433872 A GB433872 A GB 433872A GB 433872 A GB433872 A GB 433872A GB 1350049 A GB1350049 A GB 1350049A
Authority
GB
United Kingdom
Prior art keywords
crystal
defects
slit
film
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB433872A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Publication of GB1350049A publication Critical patent/GB1350049A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/309—Accessories, mechanical or electrical features support of sample holder
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/316—Accessories, mechanical or electrical features collimators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/32—Accessories, mechanical or electrical features adjustments of elements during operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3306—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object rotates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3308—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object translates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/415—Imaging radiographic film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/604—Specific applications or type of materials monocrystal

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

1350049 X-ray diffraction apparatus COMMISSARIAT A L'ENERGIE ATOMIQUE 31 Jan 1972 [3 Feb 1971] 4338/72 Heading H5R In an X-ray arrangement for the display of local defects in single crystals, applicable to crystals having a thickness up to several centimeters, the crystal is irradiated by a monochromatic X-ray beam having at the crystal a size comparable to the defects to be displayed; the crystal is moved, while under irradiation, in a direction perpendicular to that of the incident X-ray beam; and the diffracted beam selected by a stationary slit is received by a detector. With the apparatus shown, the presence of defects in the crystal 11 to be examined is first tested for by mounting the crystal on a carriage 22 which is traversed across the beam, upwardly in the arrangement shown, while the diffracted beam which passes through the slit 13 is received on the film 27; if the crystal were perfect, a single straightline would be formed on the film, but this is broadened due to changes in the diffraction angle produced by defects. If defects are detected, they are displayed by removing the film holder 27, adjusting the slit 15 to have a width not exceeding that of the diffracted beam from a perfect crystal, and arranging for the film 14 to be moved parallel to the movement of the crystal, but preferably opposite in sense, at a speed related to that of the crystal in the ratio of their respective distances from the X-ray source, whereby defects irradiated by the beam at a given position of the crystal are recorded, on a magnified scale, by a reduction in density of the image at the corresponding position on the film 14, due to the diffracted beam partly missing the slit 15. It is stated that the 3-dimensional position of the defective regions in the crystal may be determined by repeating the procedure several times using different reflections. Positioning of the slit 15, which is in the form of a slotted cylinder 32 mounted along a diameter of a disc 16, is effected by displacing the disc with the screw 33 and rotating it with a pinion meshing at 29 with teeth on the circumference of the disc, while the effective width is adjusted by rotating the cylinder with the screw 34.
GB433872A 1971-02-03 1972-01-31 Device and method for the display of local disorientations in single crystals Expired GB1350049A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7103560A FR2123855A5 (en) 1971-02-03 1971-02-03

Publications (1)

Publication Number Publication Date
GB1350049A true GB1350049A (en) 1974-04-18

Family

ID=9071311

Family Applications (1)

Application Number Title Priority Date Filing Date
GB433872A Expired GB1350049A (en) 1971-02-03 1972-01-31 Device and method for the display of local disorientations in single crystals

Country Status (4)

Country Link
CH (1) CH565369A5 (en)
DE (1) DE2204678C3 (en)
FR (1) FR2123855A5 (en)
GB (1) GB1350049A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107015267A (en) * 2017-06-09 2017-08-04 河北格物仪器设备有限公司 Detector gain corrects system and method

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2107560A (en) * 1981-10-07 1983-04-27 Rolls Royce A method for determining the orientation of a crystal
DE3439471A1 (en) * 1984-10-27 1986-04-30 MTU Motoren- und Turbinen-Union München GmbH, 8000 München METHOD AND DEVICE FOR TESTING SINGLE-CRYSTAL OBJECTS

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107015267A (en) * 2017-06-09 2017-08-04 河北格物仪器设备有限公司 Detector gain corrects system and method
CN107015267B (en) * 2017-06-09 2018-10-09 河北格物仪器设备有限公司 Detector gain corrects system and method

Also Published As

Publication number Publication date
DE2204678A1 (en) 1972-08-17
DE2204678C3 (en) 1975-07-24
DE2204678B2 (en) 1974-12-12
CH565369A5 (en) 1975-08-15
FR2123855A5 (en) 1972-09-15

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Legal Events

Date Code Title Description
PS Patent sealed
PLNP Patent lapsed through nonpayment of renewal fees