FR3096855B1 - Capteur d'image et son procédé de commande - Google Patents
Capteur d'image et son procédé de commande Download PDFInfo
- Publication number
- FR3096855B1 FR3096855B1 FR1905868A FR1905868A FR3096855B1 FR 3096855 B1 FR3096855 B1 FR 3096855B1 FR 1905868 A FR1905868 A FR 1905868A FR 1905868 A FR1905868 A FR 1905868A FR 3096855 B1 FR3096855 B1 FR 3096855B1
- Authority
- FR
- France
- Prior art keywords
- pixel
- node
- image sensor
- driving method
- capacitor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title abstract 2
- 239000003990 capacitor Substances 0.000 abstract 2
- 238000009792 diffusion process Methods 0.000 abstract 2
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/771—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising storage means other than floating diffusion
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/57—Control of the dynamic range
- H04N25/59—Control of the dynamic range by controlling the amount of charge storable in the pixel, e.g. modification of the charge conversion ratio of the floating node capacitance
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
Capteur d'image et son procédé de commande La présente description concerne un capteur d'image comprenant des pixels (1) comportant chacun :un premier transistor (118) et un premier interrupteur (120) connectés en série entre un premier noeud (124) d'application d'un potentiel (VD) et un noeud (122) interne du pixel, une grille du premier transistor (118) étant couplée à un noeud (106) de diffusion flottant du pixel ;un élément capacitif (110) dont une première borne est connectée au noeud de diffusion flottant du pixel ; et plusieurs ensembles (A, B) comprenant chacun une capacité (128) connectée en série avec un deuxième interrupteur (130) reliant la capacité au noeud interne (122),le capteur comprenant en outre un circuit (150) configuré pour, lors de chaque mémorisation d'une tension dans un des ensembles (A, B) d'un pixel, commander une augmentation d'une valeur déterminée d'une différence de potentiel entre le noeud de diffusion flottant et le noeud interne du pixel. Figure pour l'abrégé : Fig. 1
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1905868A FR3096855B1 (fr) | 2019-06-03 | 2019-06-03 | Capteur d'image et son procédé de commande |
CN202020983161.8U CN213403240U (zh) | 2019-06-03 | 2020-06-02 | 图像传感器 |
CN202010491656.3A CN112040152B (zh) | 2019-06-03 | 2020-06-02 | 图像传感器及其控制方法 |
US16/890,877 US11451730B2 (en) | 2019-06-03 | 2020-06-02 | Image sensor using a global shutter and method for controlling same |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1905868 | 2019-06-03 | ||
FR1905868A FR3096855B1 (fr) | 2019-06-03 | 2019-06-03 | Capteur d'image et son procédé de commande |
Publications (2)
Publication Number | Publication Date |
---|---|
FR3096855A1 FR3096855A1 (fr) | 2020-12-04 |
FR3096855B1 true FR3096855B1 (fr) | 2022-08-05 |
Family
ID=68138372
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1905868A Active FR3096855B1 (fr) | 2019-06-03 | 2019-06-03 | Capteur d'image et son procédé de commande |
Country Status (3)
Country | Link |
---|---|
US (1) | US11451730B2 (fr) |
CN (2) | CN112040152B (fr) |
FR (1) | FR3096855B1 (fr) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR3096855B1 (fr) * | 2019-06-03 | 2022-08-05 | St Microelectronics Grenoble 2 | Capteur d'image et son procédé de commande |
FR3096856B1 (fr) | 2019-06-03 | 2021-06-25 | St Microelectronics Grenoble 2 | Capteur d'image et son procédé de commande |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6903771B2 (en) | 2000-03-02 | 2005-06-07 | Canon Kabushiki Kaisha | Image pickup apparatus |
US6727946B1 (en) | 1999-12-14 | 2004-04-27 | Omnivision Technologies, Inc. | APS soft reset circuit for reducing image lag |
US6919551B2 (en) | 2002-08-29 | 2005-07-19 | Micron Technology Inc. | Differential column readout scheme for CMOS APS pixels |
US7365784B2 (en) | 2003-04-15 | 2008-04-29 | Micron Technology, Inc. | Column sample-and-hold cell for CMOS APS sensor |
FR2854529A1 (fr) | 2003-04-30 | 2004-11-05 | St Microelectronics Sa | Procede d'echantillonnage du signal delivre par un pixel actif d'un capteur d'image, et capteur correspondant |
GB0411648D0 (en) | 2004-05-25 | 2004-06-30 | Fillfactory N V | Method and pixel for performing correlated double sampling |
US20070041063A1 (en) * | 2005-08-18 | 2007-02-22 | Matsushita Electric Industrial Co., Ltd. | Image sensor |
US20080122962A1 (en) | 2006-11-29 | 2008-05-29 | Omnivision Technologies, Inc. | Image sensors with output noise reduction mechanisms |
EP2109306B1 (fr) | 2008-04-07 | 2015-03-11 | CMOSIS nv | Réseau de pixels avec obturateur global |
TWI433307B (zh) * | 2008-10-22 | 2014-04-01 | Sony Corp | 固態影像感測器、其驅動方法、成像裝置及電子器件 |
JP2011229120A (ja) | 2010-03-30 | 2011-11-10 | Sony Corp | 固体撮像装置、固体撮像装置の信号処理方法、及び、電子機器 |
WO2011155442A1 (fr) * | 2010-06-11 | 2011-12-15 | 株式会社ブルックマンテクノロジ | Imageur à semi-conducteurs de type amplification |
FR2973162B1 (fr) | 2011-03-23 | 2013-11-22 | E2V Semiconductors | Capteur d'image a tres haute dynamique |
KR20130072804A (ko) | 2011-12-22 | 2013-07-02 | 에스케이하이닉스 주식회사 | 신호 샘플링 회로 및 이를 포함하는 이미지 센서 |
CN103259985B (zh) * | 2013-05-17 | 2016-08-17 | 昆山锐芯微电子有限公司 | Cmos图像传感器、像素单元及其控制方法 |
US10154222B2 (en) | 2014-11-17 | 2018-12-11 | Tohoku University | Optical sensor, signal reading method therefor, solid-state imaging device, and signal reading method therefor |
US9602750B2 (en) * | 2014-11-25 | 2017-03-21 | Semiconductor Components Industries, Llc | Image sensor pixels having built-in variable gain feedback amplifier circuitry |
US9591245B2 (en) * | 2015-04-14 | 2017-03-07 | Semiconductor Components Industries, Llc | Image sensor pixels with adjustable body bias |
CA3047698C (fr) * | 2016-12-19 | 2020-03-24 | BAE Systems Imaging Solutions Inc. | Schema d'obturateur global reduisant les effets d'un courant d'obscurite |
FR3094598A1 (fr) | 2019-03-29 | 2020-10-02 | Stmicroelectronics (Grenoble 2) Sas | Pixel et son procédé de commande |
FR3096856B1 (fr) | 2019-06-03 | 2021-06-25 | St Microelectronics Grenoble 2 | Capteur d'image et son procédé de commande |
FR3096855B1 (fr) * | 2019-06-03 | 2022-08-05 | St Microelectronics Grenoble 2 | Capteur d'image et son procédé de commande |
-
2019
- 2019-06-03 FR FR1905868A patent/FR3096855B1/fr active Active
-
2020
- 2020-06-02 CN CN202010491656.3A patent/CN112040152B/zh active Active
- 2020-06-02 US US16/890,877 patent/US11451730B2/en active Active
- 2020-06-02 CN CN202020983161.8U patent/CN213403240U/zh not_active Withdrawn - After Issue
Also Published As
Publication number | Publication date |
---|---|
FR3096855A1 (fr) | 2020-12-04 |
CN112040152B (zh) | 2023-08-18 |
CN112040152A (zh) | 2020-12-04 |
US11451730B2 (en) | 2022-09-20 |
CN213403240U (zh) | 2021-06-08 |
US20200382738A1 (en) | 2020-12-03 |
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Effective date: 20201204 |
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