FR2701120B1 - Appareil de test de mémoire. - Google Patents
Appareil de test de mémoire.Info
- Publication number
- FR2701120B1 FR2701120B1 FR9401021A FR9401021A FR2701120B1 FR 2701120 B1 FR2701120 B1 FR 2701120B1 FR 9401021 A FR9401021 A FR 9401021A FR 9401021 A FR9401021 A FR 9401021A FR 2701120 B1 FR2701120 B1 FR 2701120B1
- Authority
- FR
- France
- Prior art keywords
- test device
- memory test
- memory
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C29/56008—Error analysis, representation of errors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/38—Response verification devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/72—Masking faults in memories by using spares or by reconfiguring with optimized replacement algorithms
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31935—Storing data, e.g. failure memory
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C2029/5602—Interface to device under test
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C2029/5604—Display of error information
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C2029/5606—Error catch memory
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/011,003 US5588115A (en) | 1993-01-29 | 1993-01-29 | Redundancy analyzer for automatic memory tester |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2701120A1 FR2701120A1 (fr) | 1994-08-05 |
FR2701120B1 true FR2701120B1 (fr) | 1997-08-14 |
Family
ID=21748439
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9401021A Expired - Fee Related FR2701120B1 (fr) | 1993-01-29 | 1994-01-31 | Appareil de test de mémoire. |
Country Status (7)
Country | Link |
---|---|
US (1) | US5588115A (fr) |
JP (1) | JP3650411B2 (fr) |
KR (1) | KR100328357B1 (fr) |
DE (1) | DE4402796C2 (fr) |
FR (1) | FR2701120B1 (fr) |
IT (1) | IT1267996B1 (fr) |
TW (1) | TW318931B (fr) |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7468977B1 (en) | 1995-07-12 | 2008-12-23 | Nortel Networks Limited | LAN/ATM switch having local packet switching and an ATM core fabric |
US7031296B1 (en) | 1995-09-29 | 2006-04-18 | Nortel Networks Limited | Method and apparatus for managing the flow of data within a switching device |
US6427185B1 (en) | 1995-09-29 | 2002-07-30 | Nortel Networks Limited | Method and apparatus for managing the flow of data within a switching device |
US5720031A (en) * | 1995-12-04 | 1998-02-17 | Micron Technology, Inc. | Method and apparatus for testing memory devices and displaying results of such tests |
KR0172347B1 (ko) * | 1995-12-23 | 1999-03-30 | 김광호 | 반도체 메모리장치의 병렬테스트 회로 |
US5754556A (en) * | 1996-07-18 | 1998-05-19 | Teradyne, Inc. | Semiconductor memory tester with hardware accelerators |
US6009536A (en) * | 1996-09-20 | 1999-12-28 | Micron Electronics, Inc. | Method for using fuse identification codes for masking bad bits on memory modules |
US6332183B1 (en) | 1998-03-05 | 2001-12-18 | Micron Technology, Inc. | Method for recovery of useful areas of partially defective synchronous memory components |
US6314527B1 (en) | 1998-03-05 | 2001-11-06 | Micron Technology, Inc. | Recovery of useful areas of partially defective synchronous memory components |
US6381707B1 (en) | 1998-04-28 | 2002-04-30 | Micron Technology, Inc. | System for decoding addresses for a defective memory array |
US6381708B1 (en) | 1998-04-28 | 2002-04-30 | Micron Technology, Inc. | Method for decoding addresses for a defective memory array |
US6496876B1 (en) | 1998-12-21 | 2002-12-17 | Micron Technology, Inc. | System and method for storing a tag to identify a functional storage location in a memory device |
US6442724B1 (en) * | 1999-04-02 | 2002-08-27 | Teradyne, Inc. | Failure capture apparatus and method for automatic test equipment |
US6536005B1 (en) | 1999-10-26 | 2003-03-18 | Teradyne, Inc. | High-speed failure capture apparatus and method for automatic test equipment |
US6675335B1 (en) * | 1999-12-29 | 2004-01-06 | Advanced Micro Devices, Inc. | Method and apparatus for exercising external memory with a memory built-in self-test |
US6578157B1 (en) | 2000-03-06 | 2003-06-10 | Micron Technology, Inc. | Method and apparatus for recovery of useful areas of partially defective direct rambus rimm components |
US7269765B1 (en) | 2000-04-13 | 2007-09-11 | Micron Technology, Inc. | Method and apparatus for storing failing part locations in a module |
US6499118B1 (en) * | 2000-05-17 | 2002-12-24 | Teradyne, Inc. | Redundancy analysis method and apparatus for ATE |
KR100399435B1 (ko) * | 2001-02-27 | 2003-09-29 | 주식회사 하이닉스반도체 | 반도체 메모리 장치와 그의 리페어 해석 방법 |
US7051253B2 (en) * | 2001-08-16 | 2006-05-23 | Infineon Technologies Richmond Lp | Pseudo fail bit map generation for RAMS during component test and burn-in in a manufacturing environment |
DE10145717A1 (de) * | 2001-09-17 | 2003-04-10 | Infineon Technologies Ag | Verfahren zum Testen integrierter Halbleiterspeichereinrichtungen |
US6842866B2 (en) * | 2002-10-25 | 2005-01-11 | Xin Song | Method and system for analyzing bitmap test data |
DE10256487B4 (de) * | 2002-12-03 | 2008-12-24 | Infineon Technologies Ag | Integrierter Speicher und Verfahren zum Testen eines integrierten Speichers |
DE60320745D1 (de) * | 2003-02-12 | 2008-06-19 | Infineon Technologies Ag | Verfahren und MBISR (Memory Built-In Self Repair) zum Reparieren eines Speichers |
US7509543B2 (en) * | 2003-06-17 | 2009-03-24 | Micron Technology, Inc. | Circuit and method for error test, recordation, and repair |
DE10337284B4 (de) * | 2003-08-13 | 2014-03-20 | Qimonda Ag | Integrierter Speicher mit einer Schaltung zum Funktionstest des integrierten Speichers sowie Verfahren zum Betrieb des integrierten Speichers |
JP4514028B2 (ja) * | 2004-05-20 | 2010-07-28 | ルネサスエレクトロニクス株式会社 | 故障診断回路及び故障診断方法 |
KR100579049B1 (ko) * | 2004-05-22 | 2006-05-12 | 삼성전자주식회사 | 메모리 테스트 장치 및 이를 수행하는 방법 |
US20050283669A1 (en) * | 2004-06-03 | 2005-12-22 | Adkisson Richard W | Edge detect circuit for performance counter |
US7676530B2 (en) * | 2004-06-03 | 2010-03-09 | Hewlett-Packard Development Company, L.P. | Duration minimum and maximum circuit for performance counter |
US7624319B2 (en) * | 2004-06-03 | 2009-11-24 | Hewlett-Packard Development Company, L.P. | Performance monitoring system |
JP2006048767A (ja) * | 2004-07-30 | 2006-02-16 | Elpida Memory Inc | 半導体メモリ試験装置 |
KR100609540B1 (ko) | 2005-03-18 | 2006-08-08 | 주식회사 하이닉스반도체 | 불량 셀 처리 회로를 포함하는 불휘발성 강유전체 메모리장치 및 제어 방법 |
US7395465B2 (en) * | 2006-01-13 | 2008-07-01 | International Business Machines Corporation | Memory array repair where repair logic cannot operate at same operating condition as array |
US20080270854A1 (en) * | 2007-04-24 | 2008-10-30 | Micron Technology, Inc. | System and method for running test and redundancy analysis in parallel |
CN101441587B (zh) * | 2007-11-19 | 2011-05-18 | 辉达公司 | 用于自动分析gpu测试结果的方法和*** |
US11360840B2 (en) | 2020-01-20 | 2022-06-14 | Samsung Electronics Co., Ltd. | Method and apparatus for performing redundancy analysis of a semiconductor device |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4414665A (en) * | 1979-11-21 | 1983-11-08 | Nippon Telegraph & Telephone Public Corp. | Semiconductor memory device test apparatus |
USRE32388E (en) * | 1980-01-09 | 1987-03-31 | Burroughs Corporation | Apparatus for analyzing semiconductor memories |
US4309657A (en) * | 1980-01-09 | 1982-01-05 | Burroughs Corporation | Apparatus for analyzing semiconductor memories |
US4389715A (en) * | 1980-10-06 | 1983-06-21 | Inmos Corporation | Redundancy scheme for a dynamic RAM |
US4736373A (en) * | 1981-08-03 | 1988-04-05 | Pacific Western Systems, Inc. | Memory tester having concurrent failure data readout and memory repair analysis |
US4450560A (en) * | 1981-10-09 | 1984-05-22 | Teradyne, Inc. | Tester for LSI devices and memory devices |
EP0125633B1 (fr) * | 1983-05-11 | 1990-08-08 | Hitachi, Ltd. | Appareil de test pour mémoire redondante |
EP0197363B1 (fr) * | 1985-03-26 | 1990-05-30 | Siemens Aktiengesellschaft | Procédé d'exploitation d'une mémoire à semi-conducteur avec possibilité de test parallèle intégré et circuit d'évaluation pour la réalisation de ce procédé |
US4876685A (en) * | 1987-06-08 | 1989-10-24 | Teradyne, Inc. | Failure information processing in automatic memory tester |
JP2938470B2 (ja) * | 1989-06-01 | 1999-08-23 | 三菱電機株式会社 | 半導体記憶装置 |
US5157664A (en) * | 1989-09-21 | 1992-10-20 | Texas Instruments Incorporated | Tester for semiconductor memory devices |
US5138619A (en) * | 1990-02-15 | 1992-08-11 | National Semiconductor Corporation | Built-in self test for integrated circuit memory |
US5280486A (en) * | 1990-03-16 | 1994-01-18 | Teradyne, Inc. | High speed fail processor |
FR2665793B1 (fr) * | 1990-08-10 | 1993-06-18 | Sgs Thomson Microelectronics | Circuit integre de memoire avec redondance et adressage ameliore en mode de test. |
JPH04177700A (ja) * | 1990-11-13 | 1992-06-24 | Toshiba Corp | メモリ不良解析装置 |
-
1993
- 1993-01-29 US US08/011,003 patent/US5588115A/en not_active Expired - Lifetime
-
1994
- 1994-01-29 KR KR1019940001692A patent/KR100328357B1/ko not_active IP Right Cessation
- 1994-01-31 IT IT94TO000048A patent/IT1267996B1/it active IP Right Grant
- 1994-01-31 DE DE4402796A patent/DE4402796C2/de not_active Expired - Fee Related
- 1994-01-31 JP JP00990794A patent/JP3650411B2/ja not_active Expired - Lifetime
- 1994-01-31 FR FR9401021A patent/FR2701120B1/fr not_active Expired - Fee Related
- 1994-02-02 TW TW083100868A patent/TW318931B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JPH06295598A (ja) | 1994-10-21 |
ITTO940048A0 (it) | 1994-01-31 |
JP3650411B2 (ja) | 2005-05-18 |
ITTO940048A1 (it) | 1995-07-31 |
DE4402796C2 (de) | 2003-02-06 |
KR100328357B1 (ko) | 2002-06-20 |
US5588115A (en) | 1996-12-24 |
KR940018944A (ko) | 1994-08-19 |
TW318931B (fr) | 1997-11-01 |
FR2701120A1 (fr) | 1994-08-05 |
IT1267996B1 (it) | 1997-02-20 |
DE4402796A1 (de) | 1994-08-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20110930 |