FR2548382B1 - Dispositif de test de circuit numerique - Google Patents

Dispositif de test de circuit numerique

Info

Publication number
FR2548382B1
FR2548382B1 FR8409211A FR8409211A FR2548382B1 FR 2548382 B1 FR2548382 B1 FR 2548382B1 FR 8409211 A FR8409211 A FR 8409211A FR 8409211 A FR8409211 A FR 8409211A FR 2548382 B1 FR2548382 B1 FR 2548382B1
Authority
FR
France
Prior art keywords
test device
digital circuit
circuit test
digital
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8409211A
Other languages
English (en)
French (fr)
Other versions
FR2548382A1 (fr
Inventor
Joel Wright Gannett
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
American Telephone and Telegraph Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Telephone and Telegraph Co Inc filed Critical American Telephone and Telegraph Co Inc
Publication of FR2548382A1 publication Critical patent/FR2548382A1/fr
Application granted granted Critical
Publication of FR2548382B1 publication Critical patent/FR2548382B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
FR8409211A 1983-06-20 1984-06-13 Dispositif de test de circuit numerique Expired FR2548382B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/506,070 US4551838A (en) 1983-06-20 1983-06-20 Self-testing digital circuits

Publications (2)

Publication Number Publication Date
FR2548382A1 FR2548382A1 (fr) 1985-01-04
FR2548382B1 true FR2548382B1 (fr) 1987-12-04

Family

ID=24013045

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8409211A Expired FR2548382B1 (fr) 1983-06-20 1984-06-13 Dispositif de test de circuit numerique

Country Status (9)

Country Link
US (1) US4551838A (de)
JP (1) JPH0641968B2 (de)
BE (1) BE899941A (de)
CA (1) CA1213325A (de)
DE (1) DE3422287A1 (de)
FR (1) FR2548382B1 (de)
GB (1) GB2141829B (de)
IT (1) IT1175519B (de)
NL (1) NL192355C (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6068624A (ja) * 1983-09-26 1985-04-19 Toshiba Corp Ｌｓｉの自己検査装置
JPS60213873A (ja) * 1984-04-06 1985-10-26 Advantest Corp ロジツクアナライザ
US4644265A (en) * 1985-09-03 1987-02-17 International Business Machines Corporation Noise reduction during testing of integrated circuit chips
US4890270A (en) * 1988-04-08 1989-12-26 Sun Microsystems Method and apparatus for measuring the speed of an integrated circuit device
US5488615A (en) * 1990-02-28 1996-01-30 Ail Systems, Inc. Universal digital signature bit device
US5230000A (en) * 1991-04-25 1993-07-20 At&T Bell Laboratories Built-in self-test (bist) circuit
US5515383A (en) * 1991-05-28 1996-05-07 The Boeing Company Built-in self-test system and method for self test of an integrated circuit

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3783254A (en) * 1972-10-16 1974-01-01 Ibm Level sensitive logic system
JPS5352029A (en) * 1976-10-22 1978-05-12 Fujitsu Ltd Arithmetic circuit unit
DE2842750A1 (de) * 1978-09-30 1980-04-10 Ibm Deutschland Verfahren und anordnung zur pruefung von durch monolithisch integrierten halbleiterschaltungen dargestellten sequentiellen schaltungen
US4225957A (en) * 1978-10-16 1980-09-30 International Business Machines Corporation Testing macros embedded in LSI chips
DE2902375C2 (de) * 1979-01-23 1984-05-17 Siemens AG, 1000 Berlin und 8000 München Logikbaustein für integrierte Digitalschaltungen
FR2451672A1 (fr) * 1979-03-15 1980-10-10 Nippon Electric Co Circuit logique integre pour l'execution de tests
US4320509A (en) * 1979-10-19 1982-03-16 Bell Telephone Laboratories, Incorporated LSI Circuit logic structure including data compression circuitry
US4377757A (en) * 1980-02-11 1983-03-22 Siemens Aktiengesellschaft Logic module for integrated digital circuits
US4340857A (en) * 1980-04-11 1982-07-20 Siemens Corporation Device for testing digital circuits using built-in logic block observers (BILBO's)
NL8004176A (nl) * 1980-07-21 1982-02-16 Philips Nv Inrichting voor het testen van een schakeling met digitaal werkende en kombinatorisch werkende onderdelen.

Also Published As

Publication number Publication date
JPS6015570A (ja) 1985-01-26
IT8421499A0 (it) 1984-06-19
GB2141829A (en) 1985-01-03
GB8415145D0 (en) 1984-07-18
NL192355C (nl) 1997-06-04
CA1213325A (en) 1986-10-28
NL192355B (nl) 1997-02-03
US4551838A (en) 1985-11-05
FR2548382A1 (fr) 1985-01-04
GB2141829B (en) 1987-03-18
BE899941A (fr) 1984-10-15
JPH0641968B2 (ja) 1994-06-01
DE3422287A1 (de) 1984-12-20
NL8401925A (nl) 1985-01-16
DE3422287C2 (de) 1993-09-23
IT1175519B (it) 1987-07-01

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Legal Events

Date Code Title Description
ST Notification of lapse