NL192355B - Digitale ketentestinrichting. - Google Patents

Digitale ketentestinrichting.

Info

Publication number: NL192355B
Authority: NL; Netherlands
Prior art keywords: test device; chain test; digital chain; digital; test
Prior art date: 1983-06-20

Application number

NL8401925A

Other languages

English (en)

Other versions

NL192355C (nl

NL8401925A (nl

Original Assignee

At & T Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1983-06-20

Filing date

1984-06-18

Publication date

1997-02-03

1984-06-18 Application filed by At & T Corp filed Critical At & T Corp

1985-01-16 Publication of NL8401925A publication Critical patent/NL8401925A/nl

1997-02-03 Publication of NL192355B publication Critical patent/NL192355B/nl

1997-06-04 Application granted granted Critical

1997-06-04 Publication of NL192355C publication Critical patent/NL192355C/nl

Links

Classifications

- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/27—Built-in tests
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled

Landscapes

Engineering & Computer Science (AREA)
General Engineering & Computer Science (AREA)
Theoretical Computer Science (AREA)
Computer Hardware Design (AREA)
Quality & Reliability (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Tests Of Electronic Circuits (AREA)
Test And Diagnosis Of Digital Computers (AREA)
For Increasing The Reliability Of Semiconductor Memories (AREA)
Techniques For Improving Reliability Of Storages (AREA)

NL8401925A 1983-06-20 1984-06-18 Digitale ketentestinrichting. NL192355C (nl)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
US06/506,070 US4551838A (en)	1983-06-20	1983-06-20	Self-testing digital circuits
US50607083		1983-06-20

Publications (3)

Publication Number	Publication Date
NL8401925A NL8401925A (nl)	1985-01-16
NL192355B true NL192355B (nl)	1997-02-03
NL192355C NL192355C (nl)	1997-06-04

Family

ID=24013045

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
NL8401925A NL192355C (nl)	1983-06-20	1984-06-18	Digitale ketentestinrichting.

Country Status (9)

Country	Link
US (1)	US4551838A (nl)
JP (1)	JPH0641968B2 (nl)
BE (1)	BE899941A (nl)
CA (1)	CA1213325A (nl)
DE (1)	DE3422287A1 (nl)
FR (1)	FR2548382B1 (nl)
GB (1)	GB2141829B (nl)
IT (1)	IT1175519B (nl)
NL (1)	NL192355C (nl)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS6068624A (ja) *	1983-09-26	1985-04-19	Toshiba Corp	Ｌｓｉの自己検査装置
JPS60213873A (ja) *	1984-04-06	1985-10-26	Advantest Corp	ロジツクアナライザ
US4644265A (en) *	1985-09-03	1987-02-17	International Business Machines Corporation	Noise reduction during testing of integrated circuit chips
US4890270A (en) *	1988-04-08	1989-12-26	Sun Microsystems	Method and apparatus for measuring the speed of an integrated circuit device
US5488615A (en) *	1990-02-28	1996-01-30	Ail Systems, Inc.	Universal digital signature bit device
US5230000A (en) *	1991-04-25	1993-07-20	At&T Bell Laboratories	Built-in self-test (bist) circuit
US5515383A (en) *	1991-05-28	1996-05-07	The Boeing Company	Built-in self-test system and method for self test of an integrated circuit

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3783254A (en) *	1972-10-16	1974-01-01	Ibm	Level sensitive logic system
JPS5352029A (en) *	1976-10-22	1978-05-12	Fujitsu Ltd	Arithmetic circuit unit
DE2842750A1 (de) *	1978-09-30	1980-04-10	Ibm Deutschland	Verfahren und anordnung zur pruefung von durch monolithisch integrierten halbleiterschaltungen dargestellten sequentiellen schaltungen
US4225957A (en) *	1978-10-16	1980-09-30	International Business Machines Corporation	Testing macros embedded in LSI chips
DE2902375C2 (de) *	1979-01-23	1984-05-17	Siemens AG, 1000 Berlin und 8000 München	Logikbaustein für integrierte Digitalschaltungen
FR2451672A1 (fr) *	1979-03-15	1980-10-10	Nippon Electric Co	Circuit logique integre pour l'execution de tests
US4320509A (en) *	1979-10-19	1982-03-16	Bell Telephone Laboratories, Incorporated	LSI Circuit logic structure including data compression circuitry
US4377757A (en) *	1980-02-11	1983-03-22	Siemens Aktiengesellschaft	Logic module for integrated digital circuits
US4340857A (en) *	1980-04-11	1982-07-20	Siemens Corporation	Device for testing digital circuits using built-in logic block observers (BILBO's)
NL8004176A (nl) *	1980-07-21	1982-02-16	Philips Nv	Inrichting voor het testen van een schakeling met digitaal werkende en kombinatorisch werkende onderdelen.

1983
- 1983-06-20 US US06/506,070 patent/US4551838A/en not_active Expired - Lifetime
1984
- 1984-06-06 CA CA000455999A patent/CA1213325A/en not_active Expired
- 1984-06-13 FR FR8409211A patent/FR2548382B1/fr not_active Expired
- 1984-06-14 GB GB08415145A patent/GB2141829B/en not_active Expired
- 1984-06-15 DE DE19843422287 patent/DE3422287A1/de active Granted
- 1984-06-18 BE BE0/213162A patent/BE899941A/fr not_active IP Right Cessation
- 1984-06-18 NL NL8401925A patent/NL192355C/nl not_active IP Right Cessation
- 1984-06-19 IT IT21499/84A patent/IT1175519B/it active
- 1984-06-20 JP JP59125449A patent/JPH0641968B2/ja not_active Expired - Fee Related

Also Published As

Publication number	Publication date
JPS6015570A (ja)	1985-01-26
IT8421499A0 (it)	1984-06-19
GB2141829A (en)	1985-01-03
GB8415145D0 (en)	1984-07-18
NL192355C (nl)	1997-06-04
CA1213325A (en)	1986-10-28
US4551838A (en)	1985-11-05
FR2548382A1 (fr)	1985-01-04
GB2141829B (en)	1987-03-18
BE899941A (fr)	1984-10-15
JPH0641968B2 (ja)	1994-06-01
DE3422287A1 (de)	1984-12-20
NL8401925A (nl)	1985-01-16
DE3422287C2 (nl)	1993-09-23
IT1175519B (it)	1987-07-01
FR2548382B1 (fr)	1987-12-04

Legal Events

Date	Code	Title	Description
1991-08-01	BA	A request for search or an international-type search has been filed
1991-09-02	BB	A search report has been drawn up
1991-09-02	BC	A request for examination has been filed
1994-11-16	DNT	Communications of changes of names of applicants whose applications have been laid open to public inspection	Free format text: AT&T CORP.
2003-03-03	V1	Lapsed because of non-payment of the annual fee	Effective date: 20030101

Publication	Publication Date	Title
DE3485792D1 (de)	1992-08-06	Digitale signalverarbeitungseinrichtungen.
NO166825C (no)	1991-09-04	Hoeyspennings-tilkoplingsanordning.
DE3687608D1 (de)	1993-03-11	Digitale bildumsetzungsvorrichtung.
DE3480953D1 (de)	1990-02-08	Testverfahren.
DE3788565D1 (de)	1994-02-03	Digitales Messgerät.
DE3588155D1 (de)	1997-06-12	Digitale IC-Vorrichtung
DE3485968D1 (de)	1992-12-03	Spezifischer bindungstest.
DE3483249D1 (de)	1990-10-25	Vereinfachte pruefvorrichtung.
IT1176163B (it)	1987-08-18	Dispositivo assortitore
DE3480624D1 (de)	1990-01-04	Wickeleinrichtung.
FI843115A0 (fi)	1984-08-08	Digital satellitcentral.
NL192355B (nl)	1997-02-03	Digitale ketentestinrichting.
DE3484199D1 (de)	1991-04-04	Stellungsmessgeraet.
NL192607B (nl)	1997-07-01	Zeefinrichting.
ES284538Y (es)	1986-02-16	Dispositivo cribador.
ATE33897T1 (de)	1988-05-15	Signalgeraet.
ATA393484A (de)	1990-02-15	Kette
BR8305291A (pt)	1984-11-13	Dispositivo anti-ofuscante
KR850000462U (ko)	1985-02-28	조작장치
DE3482728D1 (de)	1990-08-23	Inkrementale wegmesseinrichtung.
NO156974C (no)	1987-12-30	Kjettingskive.
DK451484D0 (da)	1984-09-21	Maaleinstrument
NO153992C (no)	1986-07-02	Forbindelsesinnretning.
IT1224118B (it)	1990-09-26	Pronosticatore digitale
ATE63000T1 (de)	1991-05-15	Immuntest.