NL192355B - Digitale ketentestinrichting. - Google Patents
Digitale ketentestinrichting.Info
- Publication number
- NL192355B NL192355B NL8401925A NL8401925A NL192355B NL 192355 B NL192355 B NL 192355B NL 8401925 A NL8401925 A NL 8401925A NL 8401925 A NL8401925 A NL 8401925A NL 192355 B NL192355 B NL 192355B
- Authority
- NL
- Netherlands
- Prior art keywords
- test device
- chain test
- digital chain
- digital
- test
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/27—Built-in tests
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/506,070 US4551838A (en) | 1983-06-20 | 1983-06-20 | Self-testing digital circuits |
US50607083 | 1983-06-20 |
Publications (3)
Publication Number | Publication Date |
---|---|
NL8401925A NL8401925A (nl) | 1985-01-16 |
NL192355B true NL192355B (nl) | 1997-02-03 |
NL192355C NL192355C (nl) | 1997-06-04 |
Family
ID=24013045
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL8401925A NL192355C (nl) | 1983-06-20 | 1984-06-18 | Digitale ketentestinrichting. |
Country Status (9)
Country | Link |
---|---|
US (1) | US4551838A (nl) |
JP (1) | JPH0641968B2 (nl) |
BE (1) | BE899941A (nl) |
CA (1) | CA1213325A (nl) |
DE (1) | DE3422287A1 (nl) |
FR (1) | FR2548382B1 (nl) |
GB (1) | GB2141829B (nl) |
IT (1) | IT1175519B (nl) |
NL (1) | NL192355C (nl) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6068624A (ja) * | 1983-09-26 | 1985-04-19 | Toshiba Corp | Lsiの自己検査装置 |
JPS60213873A (ja) * | 1984-04-06 | 1985-10-26 | Advantest Corp | ロジツクアナライザ |
US4644265A (en) * | 1985-09-03 | 1987-02-17 | International Business Machines Corporation | Noise reduction during testing of integrated circuit chips |
US4890270A (en) * | 1988-04-08 | 1989-12-26 | Sun Microsystems | Method and apparatus for measuring the speed of an integrated circuit device |
US5488615A (en) * | 1990-02-28 | 1996-01-30 | Ail Systems, Inc. | Universal digital signature bit device |
US5230000A (en) * | 1991-04-25 | 1993-07-20 | At&T Bell Laboratories | Built-in self-test (bist) circuit |
US5515383A (en) * | 1991-05-28 | 1996-05-07 | The Boeing Company | Built-in self-test system and method for self test of an integrated circuit |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3783254A (en) * | 1972-10-16 | 1974-01-01 | Ibm | Level sensitive logic system |
JPS5352029A (en) * | 1976-10-22 | 1978-05-12 | Fujitsu Ltd | Arithmetic circuit unit |
DE2842750A1 (de) * | 1978-09-30 | 1980-04-10 | Ibm Deutschland | Verfahren und anordnung zur pruefung von durch monolithisch integrierten halbleiterschaltungen dargestellten sequentiellen schaltungen |
US4225957A (en) * | 1978-10-16 | 1980-09-30 | International Business Machines Corporation | Testing macros embedded in LSI chips |
DE2902375C2 (de) * | 1979-01-23 | 1984-05-17 | Siemens AG, 1000 Berlin und 8000 München | Logikbaustein für integrierte Digitalschaltungen |
FR2451672A1 (fr) * | 1979-03-15 | 1980-10-10 | Nippon Electric Co | Circuit logique integre pour l'execution de tests |
US4320509A (en) * | 1979-10-19 | 1982-03-16 | Bell Telephone Laboratories, Incorporated | LSI Circuit logic structure including data compression circuitry |
US4377757A (en) * | 1980-02-11 | 1983-03-22 | Siemens Aktiengesellschaft | Logic module for integrated digital circuits |
US4340857A (en) * | 1980-04-11 | 1982-07-20 | Siemens Corporation | Device for testing digital circuits using built-in logic block observers (BILBO's) |
NL8004176A (nl) * | 1980-07-21 | 1982-02-16 | Philips Nv | Inrichting voor het testen van een schakeling met digitaal werkende en kombinatorisch werkende onderdelen. |
-
1983
- 1983-06-20 US US06/506,070 patent/US4551838A/en not_active Expired - Lifetime
-
1984
- 1984-06-06 CA CA000455999A patent/CA1213325A/en not_active Expired
- 1984-06-13 FR FR8409211A patent/FR2548382B1/fr not_active Expired
- 1984-06-14 GB GB08415145A patent/GB2141829B/en not_active Expired
- 1984-06-15 DE DE19843422287 patent/DE3422287A1/de active Granted
- 1984-06-18 BE BE0/213162A patent/BE899941A/fr not_active IP Right Cessation
- 1984-06-18 NL NL8401925A patent/NL192355C/nl not_active IP Right Cessation
- 1984-06-19 IT IT21499/84A patent/IT1175519B/it active
- 1984-06-20 JP JP59125449A patent/JPH0641968B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPS6015570A (ja) | 1985-01-26 |
IT8421499A0 (it) | 1984-06-19 |
GB2141829A (en) | 1985-01-03 |
GB8415145D0 (en) | 1984-07-18 |
NL192355C (nl) | 1997-06-04 |
CA1213325A (en) | 1986-10-28 |
US4551838A (en) | 1985-11-05 |
FR2548382A1 (fr) | 1985-01-04 |
GB2141829B (en) | 1987-03-18 |
BE899941A (fr) | 1984-10-15 |
JPH0641968B2 (ja) | 1994-06-01 |
DE3422287A1 (de) | 1984-12-20 |
NL8401925A (nl) | 1985-01-16 |
DE3422287C2 (nl) | 1993-09-23 |
IT1175519B (it) | 1987-07-01 |
FR2548382B1 (fr) | 1987-12-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
BA | A request for search or an international-type search has been filed | ||
BB | A search report has been drawn up | ||
BC | A request for examination has been filed | ||
DNT | Communications of changes of names of applicants whose applications have been laid open to public inspection |
Free format text: AT&T CORP. |
|
V1 | Lapsed because of non-payment of the annual fee |
Effective date: 20030101 |